Patents
Patents for G03F 7 - Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printed surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor (127,176)
02/2002
02/21/2002US20020020832 Photosensitive resin composition
02/21/2002US20020020822 Electron beam illumination apparatus, electron beam exposure apparatus, and device manufacturing method
02/21/2002US20020020821 Method of manufacturing an optically scannable information carrier
02/21/2002US20020020820 Electron beam exposure apparatus and device manufacturing method
02/21/2002US20020020751 Substrate transfer apparatus, semiconductor manufacturing apparatus, and semiconductor device manufacturing method
02/21/2002US20020020318 Printing plates comprising modified pigment products
02/21/2002US20020020315 Method and device for balancing rotating bodies
02/21/2002US20020020220 Apparatus and method for measuring internal stress of reticle membrane
02/21/2002DE10128606A1 Balancing rotating bodies involves fixing weight element along defined path preferably at uniform radial distance from rotation axis, fixing in various balancing positions by shape locking
02/21/2002CA2417112A1 Process for producing coatings using surface-active photoinitiators
02/20/2002EP1180784A2 Method and apparatus for charged particle beam exposure
02/20/2002EP1180769A2 Information recording apparatus, information recording method and information recording medium
02/20/2002EP1180728A2 Quality control method for planographic printing plate
02/20/2002EP1180726A2 Illumination system for microlithography
02/20/2002EP1180725A2 Semiconductor substrate for improving pattern formation in photolithographic process
02/20/2002EP1180554A2 Method of depositing organosilicate layers
02/20/2002EP1180251A1 Wafer alignment
02/20/2002EP0914626A4 Seamless, maskless lithography system using spatial light modulator
02/20/2002CN2478143Y Sunlight solarization platemaking appts.
02/20/2002CN1337014A Chemical filtering for optimising the light transmittance of a gas
02/20/2002CN1337013A Photosensitive composition, and optical waveguide element and process for producing the same
02/20/2002CN1336573A Photoetching process
02/20/2002CN1336282A Method and apparatus for mfg. printed imaging carrier on preformed carrier material
02/20/2002CN1079548C Method for forming photoresist patterns
02/20/2002CN1079547C 光敏树脂组合物 The photosensitive resin composition
02/19/2002US6349085 High density recording medium with pit width to track pitch ratio in the range of 0.4 to 0.55 for push-pull tracking servo control
02/19/2002US6349005 Microlithographic reduction objective, projection exposure equipment and process
02/19/2002US6348941 Printing plate exposure apparatus for recording image data spirally
02/19/2002US6348418 Etching tungsten silicide with hydrogen peroxide; exposing metal silicide film to hexamethyldisilazane diluted with xylene to make hydrophobic; coating with amplification photoresist; photolithograpy
02/19/2002US6348405 Interconnection forming method utilizing an inorganic antireflection layer
02/19/2002US6348404 Wiring forming method
02/19/2002US6348357 Exposure apparatus with a pulsed laser
02/19/2002US6348303 Lithographic projection apparatus
02/19/2002US6348301 Baking to expand laterally; reducing width; etching film using photoresist as mask; semiconductors
02/19/2002US6348300 Irradiating periphery with light having specified wavelength until free of stickiness without impairing photosensitivity
02/19/2002US6348299 Forming photoresist pattern by providing on substrate layer containing polymer having pendant beta-hydroxy groups and tetralkoxy titanate, zirconate or hafnate, imagewise exposing to irradiation, developing
02/19/2002US6348298 Radiation sensitive composition
02/19/2002US6348297 Chemical amplification type positive resist
02/19/2002US6348296 Copolymer resin, preparation thereof, and photoresist using the same
02/19/2002US6348295 Methods for manufacturing electronic and electromechanical elements and devices by thin-film deposition and imaging
02/19/2002US6348294 Optical disk master
02/19/2002US6348289 System and method for controlling polysilicon feature critical dimension during processing
02/19/2002US6348288 Resolution enhancement method for deep quarter micron technology
02/19/2002US6348239 Depositing amorphous film of metal precursor complex on substrate, irradiating film to cause metal complex to undergo reaction which transforms metal complex into metal containing material adherent to substrate
02/19/2002US6348098 Flow controller
02/19/2002US6347891 Engraving system and method comprising different engraving devices
02/19/2002CA2023410C Device for generating x-radiation with a plasma source
02/14/2002WO2002013226A2 Spatial light modulator driven photocathode source electron beam pattern generator
02/14/2002WO2002013194A1 Method of manufacturing an optically scannable information carrier
02/14/2002WO2002012962A1 Aqueous surfactant solution for developing coating film layer
02/14/2002WO2002012961A1 System and method for making smooth diagonal components with a digital photolithography system
02/14/2002WO2002012960A2 Method of laminating a photoresist sheet to a substrate
02/14/2002WO2002012959A1 Photolithographic mask
02/14/2002WO2002012948A2 Pneumatic control system and method for shaping deformable mirrors in lithographic projection systems
02/14/2002WO2002012928A2 Diffraction spectral filter for use in extreme-uv lithography condenser
02/14/2002WO2002012927A2 Method and device for producing an optically antireflective surface
02/14/2002WO2002012871A1 X-ray measuring and testing system
02/14/2002WO2002012826A1 Dual-domain lateral shearing interferometer
02/14/2002WO2002012372A1 Hydroxypolyamides and photosensitive resin compositions containing the same
02/14/2002WO2002012350A2 Photoinitiated reactions
02/14/2002WO2001065600A3 Nanoscale patterning for the formation of extensive wires
02/14/2002WO2001062511A3 Dual-layer self-contained recording paper incorporating hollow microspheres
02/14/2002WO2001042996A3 Design of photomasks for semiconductor device fabrication
02/14/2002WO2000065301A9 Helium-neon laser light source generating two harmonically related, single-frequency wavelengths for use in displacement and dispersion measuring interferometry
02/14/2002WO2000046643A9 Masks for use in optical lithography below 180 nm
02/14/2002US20020019968 Method and apparatus for verifying mask pattern data according to given rules
02/14/2002US20020019729 Visual inspection and verification system
02/14/2002US20020019560 Novel photoresist cross-linker and photoresist composition comprising the same
02/14/2002US20020019558 Diamine and acid anhydride
02/14/2002US20020019545 Microstructure patterns for photoresists
02/14/2002US20020019500 Epoxy acrylates
02/14/2002US20020019136 Method of manufacturing optical element
02/14/2002US20020018965 Methods for reducing profile variation in photoresist trimming
02/14/2002US20020018964 Method of fabricating a suspended micro-structure with a sloped support and a suspended microstructure fabricated by the method
02/14/2002US20020018962 Photosensitive lithographic printing plate and method for making a printing plate
02/14/2002US20020018960 High etching resistance, heat resistance and adhesiveness; low ultraviolet light absorbance; can be developed in aqueous tetramethylammonium hydroxide solution; for fabricating circuits for high integration semiconductors
02/14/2002US20020018959 Solid imaging compositions for preparing polypropylene-like articles
02/14/2002US20020018946 Wherein lowering of brightness is suppressed in a plasma display panel
02/14/2002US20020018943 Color filters, liquid crystals display
02/14/2002US20020018942 Vacuum ultraviolet transmitting direct deposit vitrified silicon oxyfluoride lithography glass photomask blanks
02/14/2002US20020018941 Lithography; thin film covering pattern of absorptive material
02/14/2002US20020018861 Methods for the lithographic deposition of materials containing nanoparticles
02/14/2002US20020018857 Process and apparatus for coating on printing cylinders
02/14/2002US20020018599 Mask data correction apparatus, fourier transformation apparatus, up sampling apparatus, down sampling apparatus, method of manufacturing transfer mask, and method of manufacturing device having pattern structure
02/14/2002US20020018505 Wavelength and bandwidth monitor for excimer or molecular fluorine laser
02/14/2002US20020018309 Mirror projection system for a scanning lithographic projection apparatus, and lithographic apparatus comprising such a system
02/14/2002US20020018217 Optical critical dimension metrology system integrated into semiconductor wafer process tool
02/14/2002US20020018197 Illumination system and scanning exposure apparatus using the same
02/14/2002US20020018195 Moving mechanism in exposure apparatus, and exposure apparatus having the same
02/14/2002US20020018194 Lithographic projection apparatus and device manufacturing method
02/14/2002US20020018193 Exposure apparatus and device producing method using the same
02/14/2002US20020018192 Stage apparatus, scanning type exposure apparatus, and device produced with the same
02/14/2002US20020018191 Exposure apparatus and method of controlling the same
02/14/2002US20020018190 Exposure apparatus and device manufacturing method
02/14/2002US20020018189 Lithographic apparatus, device manufacturing method, and device manufactured thereby
02/14/2002US20020018188 Image-recording apparatus
02/14/2002US20020018111 Method for controlling exposure and scan-exposure apparatus
02/14/2002US20020017890 Electromagnetic alignment and scanning apparatus
02/14/2002US20020017889 Exposure apparatus and method utilizing isolated reaction frame
02/14/2002US20020017669 Semiconductor integrated circuit device, process for fabricating the same, and apparatus for fabricating the same