Patents
Patents for G03F 7 - Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printed surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor (127,176)
04/2002
04/02/2002US6365323 High performance curable polymers and processes for the preparation thereof
04/02/2002US6365322 Photoresist composition for deep UV radiation
04/02/2002US6365321 Blends of hydroxystyrene polymers for use in chemically amplified positive resist formulations
04/02/2002US6365319 Fluorinated polymers, inorganic oxides, and inorganic nitrides barrier layer; melamine-formaldehyde microcapsules; phenolic resin developer; photohardenable; better image quality and more consistence sensitometric response to pressure
04/02/2002US6365306 Photosensitive polymer composition, method for forming relief patterns, and electronic parts
04/02/2002US6365305 Polycaprolactone crystalline polymer and polyester thermoplastic polymer; vinyl acrylic copolymer deformable cushion layer; reduced mottle: lower lamination temperatures; better adhesion between colors
04/02/2002US6365302 Automatic overlap process using a plurality of linear patterns; faster with greater reproducibility and reliability semiconductor substrate with a photoresist film
04/02/2002US6365265 Photosensitive insulating paste and thick-film multi-layer circuit substrate
04/02/2002US6365263 Method for forming cross-linking photoresist and structures formed thereby
04/02/2002US6365059 Method for making a nano-stamp and for forming, with the stamp, nano-size elements on a substrate
04/02/2002US6364595 Reticle transfer system
04/02/2002US6364544 Automatic developing apparatus and method of replenishing replenisher for developer for said apparatuses
04/02/2002US6364465 Ink jet heads having photoresist layer containing poly (amic acid)
04/02/2002US6363950 Apparatus for processing substrate using process solutions having desired mixing ratios
04/02/2002US6363809 Precision scanning apparatus and method with fixed and movable guide members
04/02/2002CA2324942C Multiple-beam, diode-pumped imaging system
03/2002
03/28/2002WO2002026003A1 Method for converting laser radiation into x-radiation, in particular, into extreme ultraviolet (euv) radiation using a plasma generated by the laser radiation
03/28/2002WO2002025724A2 Correction of overlay offset between inspection layers in integrated circuits
03/28/2002WO2002025711A1 Method of measuring image characteristics and exposure method
03/28/2002WO2002025710A1 Exposure system, exposure method, and production method for device
03/28/2002WO2002025708A2 Methods and systems for semiconductor fabrication processes
03/28/2002WO2002025379A1 Developing solution for photoresist
03/28/2002WO2002025378A1 Ultraviolet-curable resin composition and photosolder resist ink containing the composition
03/28/2002WO2002025377A1 Photosensitive element, method for forming resist pattern, and method for manufacturing printed wiring board
03/28/2002WO2002025376A2 Oxime derivatives and the use thereof as latent acids
03/28/2002WO2002025375A2 Pinhole defect repair by resist flow
03/28/2002WO2002025374A2 Antireflective composition
03/28/2002WO2002025373A2 Method of design and fabrication of integrated circuits using regular arrays and gratings
03/28/2002WO2002024774A1 Carboxylated photosensitive resin, alkali-developable photocurable/heat-curable composition containing the same, and cured article obtained therefrom
03/28/2002WO2001091204A3 Displacement device
03/28/2002WO2001087634A3 Aqueous dispersions for color imaging
03/28/2002WO2001086352A3 Polymers for photoresist compositions for microlithography
03/28/2002WO2001065317A3 Method for evaluation of reticle image using aerial image simulator
03/28/2002WO2001065314A3 Patterning methods and systems using reflected interference patterns
03/28/2002WO2001063662A3 Resistor arrays for mask-alignment detection
03/28/2002WO2001037047A3 Nitrile/fluoroalcohol polymer-containing photoresists and associated processes for microlithography
03/28/2002US20020037991 Photosensitive resin composition
03/28/2002US20020037820 Compositions for cleaning organic and plasma etched residues for semiconductor devices
03/28/2002US20020037819 Removal polymer residues; mixture of water, alcohol and water soluble amines in solvent
03/28/2002US20020037625 Method of producing exposure mask
03/28/2002US20020037599 Semiconductor substrate, method of manufacturing the semiconductor substrate, semiconductor device and pattern forming method
03/28/2002US20020037479 Photoresist strippers containing reducing agents to reduce metal corrosion
03/28/2002US20020037476 Resist pattern forming method, frame plating method and manufacturing method of thin-film magnetic head
03/28/2002US20020037475 Photosensitive resin laminate, and signboard plate and signboard made of the laminate
03/28/2002US20020037472 Novel polymers and photoresist compositions comprising labile polymer backbones for short wave imaging
03/28/2002US20020037471 Resist film formed from polymer of acrylonitrile, acrylic acid and hydroxystyrene derivatives with an acid generator; excimer laser irradiated; given/specified exposure wavelength bands
03/28/2002US20020037462 Resist pattern forming apparatus and method thereof
03/28/2002US20020037461 Lithographic apparatus, device manufacturing method, and device manufactured thereby
03/28/2002US20020037460 Stage unit, measurement unit and measurement method, and exposure apparatus and exposure method
03/28/2002US20020037366 Dropping a coating solution containing solute and a solvent through discharge nozzle onto surface of substrate, mounted on horizontal turn table and turning substrate, soaking and holding a nozzle tip in soaking solution
03/28/2002US20020037363 Imaging an external appearance of the resin extruded from a resin application device; and automatically adjusting an amount of the resin extruded from the resin application device based on the external appearance
03/28/2002US20020036904 Illumination system with plural light sources, and exposure apparatus having the same
03/28/2002US20020036832 Partial objective in an illuminating systems
03/28/2002US20020036777 Light receiving apparatus, mark detecting apparatus using light receiving apparatus, exposing apparatus, maintenance method of exposing apparatus, manufacturing method of semiconductor device using exposing apparatus and semiconductor manufacturing plant
03/28/2002US20020036763 Lithographic apparatus, device manufacturing method, and device manufactured thereby
03/28/2002US20020036762 Projection exposure method and apparatus
03/28/2002US20020036761 Apparatus and method applied to exposure by charged beam
03/28/2002US20020036760 Exposure apparatus and device manufacturing method
03/28/2002US20020036759 Automatic exposing apparatus for both sides and exposing method thereof for works
03/28/2002US20020036758 Method of operating an optical imaging system, lithographic projection apparatus, device manufacturing method, and device manufactured thereby
03/28/2002US20020036357 Semiconductor device comprising layered positional detection marks and manufacturing method thereof
03/28/2002US20020036332 Residue-free overlay target
03/28/2002US20020036273 Methods for manufacturing reticles for charged-particle-beam microlithography exhibiting reduced proximity effects, and reticles produced using same
03/28/2002US20020036272 Charged-particle-beam microlithography methods and apparatus providing reduced reticle heating
03/28/2002US20020036188 Method for determining laser-induced compaction in fused silica
03/28/2002US20020036183 Method for forming pattern
03/28/2002US20020036006 Wet cleaning process and wet cleaning equipment
03/28/2002US20020036001 A container which retains the substrate has an inlet port for introducing a solution into the container in controllable manner and an outlet for discharging the solution, an oxygen water high concentration inlet pipe for feeding oxygen-water
03/28/2002US20020035938 Printing form and method of modifying the wetting characteristics of the printing form
03/28/2002DE10047779A1 Method for converting laser beams into X-rays like EUV rays uses amplitude/phase-modulated sub-nanosecond impulses to create plasma that has high radiation conversion efficiency and is generated by the laser beams.
03/28/2002DE10046379A1 System zur gezielten Deformation von optischen Elementen System for targeted deformation of optical elements
03/28/2002CA2421206A1 Oxime derivatives and the use thereof as latent acids
03/27/2002EP1191580A1 Stage device and exposure device
03/27/2002EP1191572A2 Short-arc discharge lamp
03/27/2002EP1191400A2 Stamper manufacturing method
03/27/2002EP1191378A1 Reflection/refraction optical system and projection exposure apparatus comprising the optical system
03/27/2002EP1191377A2 System for the controlled deformation of optical elements
03/27/2002EP1190850A2 Method for measuring strength of image forming surface of planographic printing plate, planographic printing plate and packaging structure for planographic printing plates
03/27/2002EP1190434A1 Real-time prediction of proximity resist heating and correction of raster scan electron beam lithography
03/27/2002EP1190277A1 Spin-on-glass anti-reflective coatings for photolithography
03/27/2002EP1189994A2 Oil soluble radiation curable metal-containing compounds and compositions
03/27/2002EP1189974A1 Polybenzoxazole precursors
03/27/2002EP1189964A1 Radiation curable coating containing polyfluorooxetane
03/27/2002EP1189760A1 Thermal transfer of a black matrix containing carbon black
03/27/2002EP1036488B1 Method and device for producing extreme ultraviolet and soft x-rays from a gaseous discharge
03/27/2002EP1025281A4 Synthesis of onium hydroxides from onium salts
03/27/2002EP0986777B1 Lithography system
03/27/2002EP0948756B1 A method for reducing metal ion contaminants in photoresist compositions containing an organic polar solvent by ion exchange
03/27/2002EP0906588B1 Photodefinable dielectric compositions
03/27/2002EP0900239B1 Photo-addressable substrates and photo-addressable side-group polymers with highly inducible double refraction
03/27/2002EP0801329B1 Radiation-sensitive composition and recording medium produced therefrom
03/27/2002CN2483832Y Glass casing for light source with raster
03/27/2002CN2483738Y Sebsemimicro projection photoetching objective lens
03/27/2002CN1342273A Photosensitive resin composition, photosensitive element comprising the same, process for producing resist pattern, and process for producing printed circuit board
03/27/2002CN1341517A 平版印刷版 Lithographic printing plate
03/27/2002CN1341516A Equipment and method for manufacturing lithographic printing plate
03/27/2002CN1341512A Seal-making equipment and its function change-over mechanism, exposition device and seal-making object detection device
03/26/2002US6363294 Method and system for semiconductor wafer fabrication process real-time in-situ interactive supervision
03/26/2002US6363167 Method for measuring size of fine pattern
03/26/2002US6363094 Gas discharge laser electrode with reduced sensitivity to adverse boundary layer effects