Patents
Patents for G03F 7 - Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printed surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor (127,176)
07/2002
07/10/2002CN1358328A Method for removing residues with reduced ethcing of oxide
07/10/2002CN1358281A Photosensitive element, photosensitive element roll, process for producing resist pattern with the same, resist pattern, substrate with overlying resist pattern, process for producing wiring pattern
07/10/2002CN1358224A Stripper composition for negative chemically amplified resist
07/10/2002CN1358131A Method for producing of three-dimensionally arranged conducting and connecting structures for volumetric and energy flows
07/10/2002CN1357802A Light-limiting polyimide film for surface to be knurled
07/10/2002CN1357799A Photosensitive planographic plate
07/10/2002CN1087464C Method of manufacturing optical information carrier, arrangement for carrying out the method and optical information carrier obtained by means of the method
07/10/2002CN1087445C Developing device for semiconductor device fabrication and its controlling method
07/10/2002CN1087444C Exposure method and apparatus
07/10/2002CN1087443C Ultraviolet-curable composition and method for forming cured-product patterns therefrom
07/10/2002CN1087442C Energy ray hardened resin composition and its preparing method
07/09/2002US6418353 Automating photolithography in the fabrication of integrated circuits
07/09/2002US6418352 Integrated material management module
07/09/2002US6418187 X-ray mask structure, and X-ray exposure method and apparatus using the same
07/09/2002US6417974 Objective, in particular an objective for a semiconductor lithography projection exposure machine, and a production method
07/09/2002US6417929 Optical measurement of lithographic power bias of minimum features
07/09/2002US6417927 Method and apparatus for accurately compensating both long and short term fluctuations in the refractive index of air in an interferometer
07/09/2002US6417922 Alignment device and lithographic apparatus comprising such a device
07/09/2002US6417914 Stage device and exposure apparatus
07/09/2002US6417912 Method and apparatus for controlling optical-parameters in a stepper
07/09/2002US6417677 Antistatic conductive pin mounting apparatus for a photomask
07/09/2002US6417559 Semiconductor wafer assemblies comprising photoresist over silicon nitride materials
07/09/2002US6417516 Electron beam lithographing method and apparatus thereof
07/09/2002US6417362 Piperazine derivatives; arteriosclerosis, pancreatitis, and cardiovascular disorder treatment; side effect reduction
07/09/2002US6417317 Condensation polymerization of trifunctional phenolic compound with ortho- and para-positioned hydrogens in presence of aldehyde or ketone; positive photoresists, coatings; heat resistance
07/09/2002US6417243 Monomers, oligomers and polymers comprising terminal oxirane groups, their process of preparation and their cationic polymerization under irradiation
07/09/2002US6417117 Spin coating spindle and chuck assembly
07/09/2002US6417113 Multilayer structure with electroconductive layer, silicide layer, silicon nitride layer, patterns of germanium silicon alloy and removal
07/09/2002US6417112 Removal of etch residues from integrated circuits with dielectric and copper material with water or solvents
07/09/2002US6417080 Method of processing residue of ion implanted photoresist, and method of producing semiconductor device
07/09/2002US6416952 Photolithographic and other means for manufacturing arrays
07/09/2002US6416939 Method for negative image recording
07/09/2002US6416938 Forming a film with plasma deposition on photosensitive film on substrate and silicon donor with silane, disilane and nonsilicon exposure to ultraviolet radiation
07/09/2002US6416936 Top surface imaging technique for top pole tip width control in magnetoresistive read/write head processing
07/09/2002US6416934 Manufacturing method of a surface acoustic wave device
07/09/2002US6416932 Producing patterns on substrates, coating on polymer, phenolic resin, heat sensitive, reduced adhesive interaction with inks for use in waterless lithographic printing
07/09/2002US6416931 Wherein lowering of brightness is suppressed in a plasma display panel
07/09/2002US6416930 Copolymers of vinylimidazole with a water-soluble film-forming monmer other than vinylimidazole and a fluorine containing surfactant; a semiconductor device can be produced without clogging of waste fluids in a waste pipe
07/09/2002US6416928 Onium salts, photoacid generators, resist compositions, and patterning process
07/09/2002US6416927 Chemically amplified resist compositions
07/09/2002US6416926 Terpolymer of thiabicycloester, norbornene acids and esters, and maleic anhydride; excellent adhesion; inexpensive
07/09/2002US6416925 Photoresists comprised of adamantane-containing addition polymers and acid generators; good resolution under very short ultraviolet radiation; uniform material
07/09/2002US6416922 Dry processing photography
07/09/2002US6416913 Scanning mask and work-piece to transfer pattern and changing imaging characteristics to correct for changes caused by thermal properties; reduced magnification error and distortion
07/09/2002US6416909 Alternating phase shift mask and method for fabricating the alignment monitor
07/09/2002US6416908 Projection lithography on curved substrates
07/09/2002US6416907 Phase shift masks that reliably print densely-packed circuit layouts with small circuit features; reduced variation between print and circuit layouts; computer used to automate conversion of layout to phase shift mask; improved efficiency
07/09/2002US6416583 Film forming apparatus and film forming method
07/04/2002WO2002052624A1 Exposure device, optical member mounting member, optical member detaching jig, and method of manufacturing device
07/04/2002WO2002052623A1 Electron beam exposure system and electron beam irradiation position calibrating member
07/04/2002WO2002052622A1 Exposure mask, method for manufacturing the mask, and exposure method
07/04/2002WO2002052620A1 Wavefront aberration measuring instrument, wavefront aberration measuring method, exposure apparatus, and method for manufacturing microdevice
07/04/2002WO2002052351A1 Method of measuring overlay
07/04/2002WO2002052350A1 Method of measuring alignment of a substrate with respect to a reference alignment mark
07/04/2002WO2002052349A2 Process for removal of photoresist after post ion implantation
07/04/2002WO2002052348A1 Projection lithography using a phase shifting aperture
07/04/2002WO2002052347A1 Mitigation of radiation induced surface contamination
07/04/2002WO2002052346A1 Objective with at least one aspherical lens
07/04/2002WO2002052345A1 Method and device for mask cleaning, and device manufacturing system
07/04/2002WO2002052344A2 Manufacturing integrated circuits using phase-shifting masks
07/04/2002WO2002052303A2 Projection lens
07/04/2002WO2002052061A1 Radiation-induced self-terminating protective coatings
07/04/2002WO2002051637A1 Method for obtaining a lithographic printing surface
07/04/2002WO2002051636A1 Thermally convertible lithographic printing precursor
07/04/2002WO2002036652A3 Photopatternable sorbent and functionalized films
07/04/2002WO2002027406A3 Illumination system particularly for microlithography
07/04/2002WO2002027401A3 Illumination system particularly for microlithography
07/04/2002WO2002025724A3 Correction of overlay offset between inspection layers in integrated circuits
07/04/2002WO2002014954A3 Antireflective coating compositions
07/04/2002US20020087943 Exposure method, exposure system and recording medium
07/04/2002US20020087033 Novel tertiary alcohol compounds having an alicyclic structure
07/04/2002US20020086968 Polybenzoxazole precursors, photoresist solution, polybenzoxazole, and process for preparing a polybenzoxazole precursor
07/04/2002US20020086934 Anti-reflection coating forming composition
07/04/2002US20020086549 Resist mask having measurement marks for measuring the accuracy of overlay of a photomask disposed on semiconductor wafer
07/04/2002US20020086245 Method and apparatus for the manufacturing of reticles
07/04/2002US20020086244 Forming a protective layer on aluminum layer, thereby exposing protective layer to solution while reducing surface area of aluminum layer exposed to solution, to inhibit diffusion of solution through aluminum layer into tin oxide layer
07/04/2002US20020086242 Novel low defect developer rinse process for 0.15 micron cmos technology
07/04/2002US20020086239 Photosensitive composition
07/04/2002US20020086236 Suitable as electrically insulating protective layers for delicate, fragile conductive traces of the type produced by etching copper layers to form printed circuits
07/04/2002US20020086235 Planographic printing
07/04/2002US20020086234 Ammonium salt of organic acid and resist composition containing the same
07/04/2002US20020086233 Useful in a lithographic printing plates
07/04/2002US20020086232 Disposing active primer between receptor substrate and a thermal transfer donor; disposing transfer assist layer on active primer; selectively thermally transferring portion of transfer layer from donor to receptor
07/04/2002US20020086226 Photosensitive resin composition, resist composition, fabricating method for patterned substrate, and device
07/04/2002US20020086224 For use in photolithography for fabricating semiconductor devices, image pick-up devices, display devices such as liquid crystal panels, and magnetic heads
07/04/2002US20020086223 Photomask, the manufacturing method, a patterning method, and a semiconductor device manufacturing method
07/04/2002US20020086222 Photomask and manufacturing method of an electronic device therewith
07/04/2002US20020086221 Efficiency
07/04/2002US20020085842 Apparatus and method for recording on a black & white film information comprising a pattern of coloured light and apparatus and method for reconstructing from a black & white image such information
07/04/2002US20020085757 Surface position detecting method
07/04/2002US20020085606 Injection seeded laser with precise timing control
07/04/2002US20020085297 Method and device for improved lithographic critical dimension control
07/04/2002US20020085291 Mounting device for an optical element
07/04/2002US20020085286 Projection exposure device
07/04/2002US20020085276 Illumination optical apparatus and exposure apparatus provided with illumination optical apparatus
07/04/2002US20020085271 Broad spectrum ultraviolet catadioptric imaging system
07/04/2002US20020085192 Gas-actuated stages including reaction-force-canceling mechanisms for use in charged-particle-beam microlithography systems
07/04/2002US20020085191 Device for exposure of a peripheral area of a film circuit board
07/04/2002US20020085190 Manufacturing method in manufacturing line, manufacturing method for exposure apparatus, and exposure apparatus
07/04/2002US20020085188 Apparatus and method for compensating for distortion of a printed circuit workpiece substrate