Patents
Patents for G03F 7 - Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printed surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor (127,176)
07/2002
07/23/2002US6423456 Method for manufacture of electronic parts
07/23/2002US6423455 Method for fabricating a multiple masking layer photomask
07/23/2002US6423380 Spraying liquid dielelctric layers on a rotating substrate to form films having uniform thickness
07/23/2002US6423206 Method for electrochemical roughening of a substrate
07/23/2002US6423139 Chemical liquid treatment apparatus
07/23/2002US6423138 Coating apparatus having a cascade wall and metering blade, and a cleaning and recirculation arrangement for the coating apparatus
07/23/2002US6422918 Chemical-mechanical polishing of photoresist layer
07/23/2002US6422246 Method removing residual photoresist
07/18/2002WO2002056468A2 Method and system for efficient and accurate filtering and interpolation
07/18/2002WO2002056432A1 Smart laser with fast deformable grating
07/18/2002WO2002056354A1 Method for forming a pattern and a semiconductor device
07/18/2002WO2002056114A2 Projection system for euv lithography
07/18/2002WO2002056113A2 Method for producing an etching mask
07/18/2002WO2002056072A1 Method and system for manufacturing optical elements and optical element
07/18/2002WO2002055286A1 Protective film peeling machine for printed circuit boards
07/18/2002WO2002027405A3 Illumination system particularly for microlithography
07/18/2002WO2002022360A3 Printing plate
07/18/2002WO2002010857A3 Process for making a periodic profile
07/18/2002WO2002008836A3 Method and device for thermally treating a photoresist layer on a circuit substrate, especially a semiconductor wafer
07/18/2002WO2001084599A3 Uv-enhanced silylation process to increase etch resistance of ultra thin resists
07/18/2002WO2001080306A3 Automated process monitoring and analysis system for semiconductor processing
07/18/2002US20020095018 Comprising silicon-based compound and incorporatable organic absorbing compound that absorbs light at a wavelength less than 375 nm, wherein one of the silicon or absorber compounds comprises an alkyl, an alkoxy, a ketone, or an azo group
07/18/2002US20020094692 Method for carrying out a plasma etching process
07/18/2002US20020094688 Method of forming fine patterns
07/18/2002US20020094593 Method for adjusting optical properties of an anti-reflective coating layer
07/18/2002US20020094496 Applying in a predetermined pattern an activating light curable liquid to a portion of a substrate, surface area of the substrate is less than that of the template
07/18/2002US20020094495 Method for manufacture of fresnel lens sheet and method for manufacture of molding die for fresnel lens sheet
07/18/2002US20020094492 Binary photomask with chrome regions that define non-critical dimension features and also protect for phase shift exposure of critical dimensions
07/18/2002US20020094489 Photolithography for fine patterned resist layer having orthogonal cross-section profile with high photosensitivity and pattern resolution by exposure to excimer laser; for manufacture of semiconductors
07/18/2002US20020094488 Positive type photosensitive resin composition and method for forming resist pattern
07/18/2002US20020094485 Colored photosensitive composition
07/18/2002US20020094483 Pattern is transferred to photoresist on semiconductor wafer via reduction projection exposure to variety of waverlengths using photomask; photolithography
07/18/2002US20020094482 Method and apparatus for lithographically printing tightly nested and isolated device features using multiple mask exposures
07/18/2002US20020094382 Method of forming conductive pattern
07/18/2002US20020094370 Apparatus and method of forming liquid film
07/18/2002US20020094306 Gas recirculating system is blown into the sealed vacuum chamber so gas flow is in a predetermined direction along the processing portion; for semiconductor manufacture (X-ray exposure)
07/18/2002US20020094257 Workpiece sorter operating with modular bare workpiece stockers and/or closed container stockers
07/18/2002US20020094063 Laser plasma EUV light source apparatus and target used therefor
07/18/2002US20020094005 Fan for gas discharge laser
07/18/2002US20020093656 Exposure apparatus
07/18/2002US20020093648 Methods and systems for determining an implant characterstic and a presence of defects on a specimen
07/18/2002US20020093637 Reaction mass for a stage device
07/18/2002US20020093636 Illumination system and exposure apparatus and method
07/18/2002US20020093635 Position detection apparatus having a plurality of detection sections, and exposure apparatus
07/18/2002US20020093634 Quick chamber seals
07/18/2002US20020093632 Three-dimensional fabrication using entangled-photon lithography
07/18/2002US20020093600 Array substrate for a liquid crystal display device and method of manufacturing the same
07/18/2002US20020093122 camouflaging surface treatments having reduced visibility to vision enhancing devices, and surfaces providing reduced muffling
07/18/2002US20020093119 Silicon micro-mold and method for fabrication
07/18/2002US20020093077 Positive-type photosensitive polyimide precursor and composition comprising the same
07/18/2002US20020093069 Organic anti-reflective coating polymer, anti-reflective coating composition and methods of preparation thereof
07/18/2002US20020092993 Scaling method for a digital photolithography system
07/18/2002US20020092964 Wafer edge exposure apparatus, and wafer edge exposure method
07/18/2002US20020092825 Creating a mask for producing a printing plate
07/18/2002US20020092436 Developing solution for photosensitive lithographic printing plate, plate-making method of lithographic printing plate, and photosensitive lithographic printing plate
07/18/2002US20020092369 Method for confirming alignment of a substrate support mechanism in a semiconductor processing system
07/18/2002DE10146476A1 Verfahren zum Herstellen einer Halbleitervorrichtung mit einem Passivierungsfilm und einem Pufferüberzugsfilm A method of manufacturing a semiconductor device with a passivation film and a buffer coating film
07/18/2002DE10064889A1 Aufzeichnungsmaterial mit negativ arbeitender, strahlungsempfindlicher Schicht, die Zusätze zur Förderung der Entwickelbarkeit enthält A recording material with negative working radiation-sensitive layer, the additives to promote the developability
07/18/2002DE10058990A1 Illuminating object to record visual product involves using at least one lens with electrically variable focal length; at least one optical arrangement based on domain inversion can be used
07/17/2002EP1223471A1 Substrate positioning apparatus and exposure apparatus
07/17/2002EP1223470A1 Method for forming pattern
07/17/2002EP1223469A1 Lithographic apparatus
07/17/2002EP1223468A1 Lithographic projection Apparatus and device manufacturing method
07/17/2002EP1223467A2 Positive image-forming material
07/17/2002EP1223196A2 Negative image-recording material and cyanine dye
07/17/2002EP1222842A1 Production of a dense mist of micrometric droplets in particular for extreme uv lithography
07/17/2002EP1222497A1 Uv-absorbing support layers and flexographic printing elements comprising same
07/17/2002EP1222496A1 Resist ink composition
07/17/2002EP1222233A1 A method for synthesizing polymeric azo dyes
07/17/2002EP1115545B1 Device and method for transferring microstructures
07/17/2002CN2501079Y Reflecting cover device for ultravioet ray lamp of exposure meter
07/17/2002CN2501078Y Float bottom frame device for exposure meter
07/17/2002CN2501077Y Energy integrating controller for exposure meter
07/17/2002CN1359349A Cassette buffering within a minienvironment
07/17/2002CN1359337A Thermal transfer of a black matrix containing carbon black
07/17/2002CN1359316A Method of removing organic materials from substrates
07/17/2002CN1359032A Photoinduction SiO2 gel preparation and microfine pattern making method thereof
07/17/2002CN1359031A Original plate for lithographic printing plate
07/17/2002CN1358610A 抛光方法 Polishing method
07/16/2002US6421820 Semiconductor device fabrication using a photomask with assist features
07/16/2002US6421573 Quasi-continuous wave lithography apparatus and method
07/16/2002US6421457 Process inspection using full and segment waveform matching
07/16/2002US6421188 Optical element
07/16/2002US6421180 Apparatus for generating a laser pattern on a photomask and associated methods
07/16/2002US6421129 Pattern reading apparatus
07/16/2002US6421123 Position detecting apparatus
07/16/2002US6421122 Inspection method, apparatus and system for circuit pattern
07/16/2002US6421113 Photolithography system including a SMIF pod and reticle library cassette designed for ESD protection
07/16/2002US6421112 Movable support in a vacuum chamber and its application in lithographic projection apparatuses
07/16/2002US6421111 Multiple image reticle for forming layers
07/16/2002US6420819 Packaged strain actuator
07/16/2002US6420766 Transistor having raised source and drain
07/16/2002US6420716 Servo control method and its application in a lithographic apparatus
07/16/2002US6420714 Electron beam imaging apparatus
07/16/2002US6420713 Image position and lens field control in electron beam systems
07/16/2002US6420271 Method of forming a pattern
07/16/2002US6420247 Method of forming structures on a semiconductor including doping profiles using thickness of photoresist
07/16/2002US6420224 Stepper alignment mark formation with dual field oxide process
07/16/2002US6420169 Device for generating preferential nucleotide sequences; for use as tools drug design
07/16/2002US6420101 Method of reducing post-development defects in and around openings formed in photoresist by use of non-patterned exposure