Patents
Patents for G03F 7 - Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printed surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor (127,176)
01/2003
01/22/2003EP1277777A2 Stabilized cationically-curable compositions
01/22/2003EP1277776A1 Photocurable resin composition for sealing material and method of sealing
01/22/2003EP1277088A1 Optical reduction system with elimination of reticle diffraction induced bias
01/22/2003EP1277087A1 Opc optimization
01/22/2003EP1277086A1 Selectively colorable polymerizable compositions
01/22/2003EP1277085A1 Method for measuring diffusion of photogenerated catalyst in chemically amplified resists
01/22/2003EP1277073A2 Optical reduction system with control of illumination polarization
01/22/2003EP1276555A2 A method of fabricating coded particles
01/22/2003EP1053510B1 Process for producing a photoresist composition having a reduced tendency to produce particles
01/22/2003EP0983277B1 Polyborate coinitiators for photopolymerization
01/22/2003EP0976008B1 An apparatus and a method for illuminating a light-sensitive medium
01/22/2003CN1392973A Developing solution for photoresist
01/22/2003CN1392972A Method and apapratus for developing photosensitive resin relief printing plate
01/22/2003CN1392971A Photosensitive composition, cured article thereof, and printed circuit board using same
01/22/2003CN1392905A Method for producing metal mask and metal mask
01/22/2003CN1392596A Organic film forming method
01/22/2003CN1392594A Coating device and method for controlling film thickness to realize uniform film thickness
01/22/2003CN1392593A Mixed exposure method of combining contact exposure and direct electronic beam writing technology
01/22/2003CN1392592A Method for forming T-shaped gate with multilayer film and through once electronic beam exposure and multiple developing
01/22/2003CN1392454A Substrate processing device, liquid processing device and liquid processing method
01/22/2003CN1392453A Optical nearing correcting method
01/22/2003CN1392452A Phase error detection pattern and its use
01/22/2003CN1392060A Lithographic printing plate front body and method for producing lithographic printing plate
01/22/2003CN1099697C Process for producing semiconductor device
01/22/2003CN1099614C Method for providing sacrificial spacer for micro-mechanical devices
01/22/2003CN1099610C Method for manufacturing fine pattern, and color filter, shading pattern filter and color LCD element formed by using same
01/22/2003CN1099429C Fractionation of phenol for maldehyde condensate and photoresist compositions produced therefrom
01/21/2003US6509971 Interferometer system
01/21/2003US6509970 Wavelength monitoring apparatus for laser light for semiconductor exposure
01/21/2003US6509957 Stage device and exposure apparatus
01/21/2003US6509956 Projection exposure method, manufacturing method for device using same, and projection exposure apparatus
01/21/2003US6509955 Lens system for maskless photolithography
01/21/2003US6509954 Aperture stop having central aperture region defined by a circular ARC and peripheral region with decreased width, and exposure apparatus and method
01/21/2003US6509953 Apparatus for exposing a pattern onto an object with controlled scanning
01/21/2003US6509952 Method and system for selective linewidth optimization during a lithographic process
01/21/2003US6509951 Lithographic projection apparatus having a temperature controlled heat shield
01/21/2003US6509923 Inner drum type image recording device
01/21/2003US6509577 Systems and methods for exposing substrate periphery
01/21/2003US6509572 Charged particle beam lithography apparatus for forming pattern on semi-conductor
01/21/2003US6509571 Proximity exposure method by oblique irradiation with light
01/21/2003US6509481 Tetrahydrofuran compounds having alicyclic structure
01/21/2003US6509261 Wiring forming method
01/21/2003US6509252 Method of manufacturing semiconductor device
01/21/2003US6509251 Method of forming a resist pattern for blocking implantation of an impurity into a semiconductor substrate
01/21/2003US6509142 Apparatus and method for exposing substrates
01/21/2003US6509141 Removal of photoresist and photoresist residue from semiconductors using supercritical carbon dioxide process
01/21/2003US6509138 Solventless, resistless direct dielectric patterning
01/21/2003US6509137 For increasing photolithography process window magnitude; photoresist layer is formed on substrate, exposed through a photomask, followed by developing and stabilization; repeated until desired thickness obtained
01/21/2003US6509136 Process of drying a cast polymeric film disposed on a workpiece
01/21/2003US6509135 Polymer, resist composition and patterning process
01/21/2003US6509134 Used to generate resist images; in the manufacture of integrated circuits
01/21/2003US6509132 Lithographic printing plate precursor
01/21/2003US6509131 System preferably using microcapsule technology, and a method of applying a photographic image to a receptor element; CYCOLOR films or prints having images directly transferred e.g. shirt, without requiring the use of commercial equipment
01/21/2003US6509127 Method of electron-beam exposure
01/21/2003US6508949 Method for correcting characteristics of attenuated phase-shift mask
01/21/2003US6508940 Process for recovering onium hydroxides from solutions containing onium compounds
01/21/2003US6508887 Resist removing composition and resist removing method using the same
01/21/2003CA2225567C Heat-sensitive composition and method of making a lithographic printing form with it
01/21/2003CA2224441C Photogeneration of amines from .alpha.-aminoacetophenones
01/16/2003WO2003005424A1 Coating device and coating method
01/16/2003WO2003005129A1 Method for manufacturing photosensitive resin printing plate, and developer treatment device
01/16/2003WO2003005128A1 Sensor for determining radiated energy and use thereof
01/16/2003WO2003005127A1 Photosensitive resin composition, process of forming patterns with the same, and electronic components
01/16/2003WO2003005126A1 Resist curable resin composition and cured article thereof
01/16/2003WO2003005125A1 Method for the production of printing plate using particule growing acceleration by an additive polymer
01/16/2003WO2003005124A1 A stamp having an antisticking layer and a method of forming of repairing such a stamp
01/16/2003WO2003005123A2 Method for the production of microstructures and nanostructures using imprint lithography
01/16/2003WO2003005097A1 Projection optical system and exposure device having the projection optical system
01/16/2003WO2003005067A2 Method and apparatus to reduce effects of sheared wavefronts on interferometric phase measurements
01/16/2003WO2003004987A1 Optical member for optical lithography and evaluation method therefor
01/16/2003WO2003004719A1 Mask and substrate holder arrangement
01/16/2003WO2002047917A3 Receiver element for adjusting the focus of an imaging laser
01/16/2003WO2002046829A3 Dynamically stabilized contact lenses
01/16/2003WO2002041080A3 Process for reducing edge roughness in patterned photoresist
01/16/2003WO2002039720A3 Apparatus and method for global and local feature extraction in digital images
01/16/2003WO2001083844A3 Method for depositing metal and metal oxide films and patterned films
01/16/2003US20030014235 System and method for process matching
01/16/2003US20030013832 Novel styrene polymer, chemically amplified positive resist composition and patterning process
01/16/2003US20030013831 Novel polymer suitable for photoresist compositions
01/16/2003US20030013303 Full image exposure of field with alignment marks
01/16/2003US20030013258 Photomask esd protection and an anti-esd pod with such protection
01/16/2003US20030013213 Exposure system, device production method, semiconductor production factory, and exposure apparatus maintenance method
01/16/2003US20030013100 Nucleic acid reading and analysis system
01/16/2003US20030013049 Photoacid generator systems for short wavelength imaging
01/16/2003US20030013043 Method for making lithographic printing plate
01/16/2003US20030013039 Resist composition and patterning process
01/16/2003US20030013038 Resin which has a polymerization unit derived from p-hydroxystyrene and a polymerization unit having a group unstable against acid, and a dialkanesulfonate of isopropylidenedicyclohexanol
01/16/2003US20030013037 Maleimide-photoresist monomers containing halogen, polymers thereof and photoresist compositions comprising the same
01/16/2003US20030013036 Formed by nitrating a polyvinylphenol or a novalak and reacting the the hydroxy group with with a halide comprising an acid labile protecting group, such as 2-(1-bromoethyl)-1,3-difluorobenzene
01/16/2003US20030013035 Photosensitive compositions having mixtures of alkoxy and non-alkoxy diazonium salt containing compounds
01/16/2003US20030013026 Illumination tools and for detecting the presence of impure matters on the surface of the wafer.
01/16/2003US20030013023 Disposable hard mask for photomask plasma etching
01/16/2003US20030013022 Method for experimentally verifying imaging errors in photomasks
01/16/2003US20030012889 Method of treating a substrate
01/16/2003US20030012868 Method for dispensing flowable substances on microelectronic substrates
01/16/2003US20030012866 Acts as a positive electron beam resist, is transparent to ultraviolet light and depolymerizes when heated; forming nano-fluidic devices
01/16/2003US20030012373 Semiconductor manufacturing system and information management method
01/16/2003US20030012333 Illumination system, particularly for EUV lithography
01/16/2003US20030012332 Method for manufacturing a microstructure by using a high energy light source
01/16/2003US20030012245 Narrow band electric discharge gas laser having improved beam direction stability