Patents
Patents for G03F 7 - Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printed surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor (127,176)
01/2003
01/28/2003US6512572 Exposure apparatus, method, and storage medium
01/28/2003US6512571 Anti-vibration system for exposure apparatus
01/28/2003US6512535 Laser drawing apparatus and laser drawing method
01/28/2003US6512237 Charged beam exposure method and charged beam exposure apparatus
01/28/2003US6512087 Fractionation of resins using a static mixer and a liquid-liquid centrifuge
01/28/2003US6512067 Polymer, resist composition and patterning process
01/28/2003US6512020 Oxime derivatives and the use thereof as latent acids
01/28/2003US6511916 Method for removing the photoresist layer in the damascene process
01/28/2003US6511897 Method of manufacturing semiconductor device as well as reticle and wafer used therein
01/28/2003US6511795 Process for making pictorial reproductions
01/28/2003US6511794 Method of forming resist pattern, and exposure device
01/28/2003US6511792 Organic solvent developer
01/28/2003US6511791 Exposure through reticle mask; repositioning; semiconductors, integrated circuits
01/28/2003US6511790 Containing either an amphoteric or cationic surfactant; sharp and clear images; inhibits insoluble binder and/or IR absorber and adherence of insoluble matter to plate surface; photolithography; stable processing
01/28/2003US6511789 Photochemical crosslinking; mixture or blend
01/28/2003US6511787 Acrylic resin containing hexafluoroisopropanol units having high transmittance to ultraviolet radiation having high transparency, substrate adhesion, alkali development, and acid-elimination capability for lithographic microprocessing
01/28/2003US6511786 Resist pattern is formed by using a chemically amplified resist material including a polyhydroxystyrene derivative and an acid generator as principal constituents
01/28/2003US6511785 Chemically amplified positive resist composition and patterning method
01/28/2003US6511783 Negative resist composition
01/28/2003US6511781 Polyhydroxystyrene resin having a protective base which varies in polarity by acid catalyst and photoacid generator, admixed with a styrene derivative which increases contrast in dissolving rate between exposed and unexposed resist
01/28/2003US6511703 Protective overcoat for replicated diffraction gratings
01/28/2003US6511547 Low temperature removal of photoresists from substrate surfaces using solutions comprising acyclic esters-2+ and water soluble alcohols or ethers
01/28/2003US6511540 Spin coating spindle and chuck assembly
01/28/2003US6511315 Multizonal layouts for coaters, developers, heaters and robots arround conveyors used for working semiconductors or liquid crystal displays
01/28/2003US6510755 Slide apparatus and its stage mechanism for use in vacuum
01/28/2003US6510730 System and method for facilitating selection of optimized optical proximity correction
01/25/2003CA2386593A1 Method and apparatus for structuring a surface to form hydrophilic and hydrophobic regions
01/23/2003WO2003007365A2 Semiconductor processing module with integrated feedback/feed forward metrology
01/23/2003WO2003007341A2 Tunable radiation source providing a planar irradiation pattern for processing semiconductor wafers
01/23/2003WO2003007085A1 Sulfoxide pyrolid(in)one alkanolamine stripping and cleaning composition
01/23/2003WO2003007084A1 Method for production of printed wiring board
01/23/2003WO2003007083A1 Method for producing intaglio printing plates
01/23/2003WO2003007082A1 Imaging system utilizing light emitting diodes for preparation of print screens
01/23/2003WO2003007081A1 Methods using topcoat for photoresist
01/23/2003WO2003007080A1 Method for forming fine pattern
01/23/2003WO2003007079A1 Resist compositions
01/23/2003WO2003007078A2 Photocurable resist inks
01/23/2003WO2003007077A2 Molecular transfer lithography
01/23/2003WO2003007076A2 Photosensitive compositions having mixtures of alkoxy and non-alkoxy diazonium salt containing compounds
01/23/2003WO2003007075A2 Method and apparatus for diffractive transfer of a mask grating
01/23/2003WO2003007046A1 Optical system and exposure apparatus having the optical system
01/23/2003WO2003007045A1 Projection optical system production method
01/23/2003WO2003006599A1 Microelectronic cleaning compositions containing ammonia-free fluoride salts
01/23/2003WO2003006598A1 Ammonia-free alkaline microelectronic cleaning compositions with improved substrate compatibility
01/23/2003WO2003006597A1 Ammonia-free alkaline microelectronic cleaning compositions with improved substrate compatibility
01/23/2003WO2003006413A1 Process for production of fluorine-containing norbornene derivatives
01/23/2003WO2003006407A1 Process for producing ether compound
01/23/2003WO2002095805A3 Laser parrering of devices
01/23/2003WO2002068527A3 NOVEL β-OXO COMPOUNDS AND THEIR USE IN PHOTORESIST
01/23/2003WO2002059184A3 Molecular imprinting of small particles, and production of small particles from solid state reactants
01/23/2003WO2002048796A3 Projection system for euv lithography
01/23/2003WO2002021583A9 Aligner and method of manufacturing a device
01/23/2003WO2002008835A3 High-resolution overlay alignment methods and systems for imprint lithography
01/23/2003WO2002007211A3 Multi-layer registration control for photolithography processes
01/23/2003WO2001097270A3 Substrate cleaning apparatus and method
01/23/2003WO2001081976A3 Apparatus, system, and method for active compensation of aberrations in an optical system
01/23/2003US20030018443 Method for edge bias correction of topography-induced linewidth variation
01/23/2003US20030018406 Method and system for manufacturing semiconductor devices
01/23/2003US20030018153 Photolithography
01/23/2003US20030018150 Reflection-inhibiting resinn used in process for forming photoresist pattern
01/23/2003US20030017713 Workpiece stage of a resist curing device
01/23/2003US20030017644 Compound semiconductor device and manufacturing method thereof
01/23/2003US20030017631 Method of arranging exposed areas including a limited number of TEG regions on a semiconductor wafer
01/23/2003US20030017630 In-Line system having overlay accuracy measurement function and method for the same
01/23/2003US20030017484 Arrays for detecting nucleic acids
01/23/2003US20030017425 Pattern formation method
01/23/2003US20030017424 Method and apparatus for fabricating complex grating structures
01/23/2003US20030017420 Lower sulfite/sulfate concentration on the wafer due to plasma treatment translates into less moisture pick up and prevents high aspect ratio collapse; microelectronics
01/23/2003US20030017418 Method of processing a lithographic printing plate precursor
01/23/2003US20030017415 Where the acid generator is at least two compounds of a sulfonium salt compound not having an aromatic ring, a triarylsulfonium salt compound, and a compound having a phenacylsulfonium salt structure; far ultraviolet rays
01/23/2003US20030017414 Photosensitive resin composition
01/23/2003US20030017412 Photoresist monomers containing fluorine-substituted benzylcarboxylate and photoresist polymers comprising the same
01/23/2003US20030017411 Planographic printing plate precursor
01/23/2003US20030017404 Chemical amplification photoresist monomers, polymers therefrom and photoresist compositions containing the same
01/23/2003US20030017402 Extreme ultraviolet soft x-ray projection lithographic method and mask devices
01/23/2003US20030017256 For applying photoresist to semiconductor wafer via spin coating based on thickness values; lithography
01/23/2003US20030016780 Soft X-ray reduction projection exposure system, soft X-ray reduction projection exposure method and pattern formation method
01/23/2003US20030016521 Backlighting system for displays
01/23/2003US20030016363 Gas discharge ultraviolet wavemeter with enhanced illumination
01/23/2003US20030016342 Aligner
01/23/2003US20030016341 Exposure method and method of manufacturing semiconductor device
01/23/2003US20030016340 Lithographic projection apparatus, device manufacturing method, device manufactured thereby, and measurement method
01/23/2003US20030016338 Exposure apparatus and method
01/23/2003US20030016116 Method of depositing a thin metallic film and related apparatus
01/23/2003US20030015699 Integrated critical dimension control for semiconductor device manufacturing
01/23/2003US20030015674 Measuring configuration and method for measuring a critical dimension of at least one feature on a semiconductor wafer
01/23/2003US20030015669 Tunable radiation source providing a VUV wavelength planar illumination pattern for processing semiconductor wafers
01/23/2003US20030015494 Single layer resist lift-off process and apparatus for submicron structures
01/23/2003US20030015290 Substrate processing apparatus, substrate processing method, and exposure apparatus
01/23/2003US20030015274 Reflective hood for heat-shrinking film onto an open-topped container and method of using same
01/23/2003CA2453201A1 Imaging system utilizing light emitting diodes for preparation of print screens
01/22/2003EP1278236A1 Method of dicing a compound semiconductor wafer and compound semiconductor substrate thereby formed
01/22/2003EP1278231A2 Substrate processing apparatus, substrate precessing method, and exposure apparatus
01/22/2003EP1278103A1 Lithographic apparatus
01/22/2003EP1278094A2 Geometrical beamsplitter and method for manufacturing the same
01/22/2003EP1278089A2 Lithographic apparatus and device manufacturing method
01/22/2003EP1277830A1 Detergent composition
01/22/2003EP1277821A1 Near-infrared-absorbing composition and optical material
01/22/2003EP1277815A1 Water-based coating composition curable with actinic energy ray, coated metallic material with cured film of the composition, production process, and method of bonding coated metallic material
01/22/2003EP1277778A2 Stabilized cationically-curable compositions