Patents
Patents for G03F 7 - Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printed surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor (127,176)
01/2004
01/06/2004US6674513 Projection exposure methods and apparatus, and projection optical systems
01/06/2004US6674512 Uses the known relative movement between interferometer support blocks and a reference member
01/06/2004US6674511 Evaluation mask, focus measuring method and aberration measuring method
01/06/2004US6674510 Off-axis levelling in lithographic projection apparatus
01/06/2004US6674509 Scanning exposure apparatus and method
01/06/2004US6674085 Gas-actuated stages including reaction-force-canceling mechanisms for use in charged-particle-beam microlithography systems
01/06/2004US6673889 Radiation curable coating containing polyfuorooxetane
01/06/2004US6673850 Odorless photoinitiator compounds having chain transfer groups
01/06/2004US6673714 Method of fabricating a sub-lithographic sized via
01/06/2004US6673706 Using developer solution
01/06/2004US6673638 Method and apparatus for the production of process sensitive lithographic features
01/06/2004US6673637 Methods and systems for determining a presence of macro defects and overlay of a specimen
01/06/2004US6673526 Illumination from light sources to phase shifting masks through lenses and optical filters onto substrates; photolithography
01/06/2004US6673525 Coating photoresist layers on substrates, then baking, hydrosilylating and etching with oxygen to form miniature integrated circuit patterns
01/06/2004US6673523 Pattern formation method
01/06/2004US6673521 Use of a supercritical or liquified co2 is used in conjunction with an organometallic reagent enhances, without swelling, the diffusion of the reagent into the film and provides unexpectedly higher resolution top surface imaging.
01/06/2004US6673519 Suitable for imaging by digitally controlled laser radiation
01/06/2004US6673518 Polymer, resist composition and patterning process
01/06/2004US6673517 Polymer comprising units derived from 7-oxabicyclo(2.2.1)hept-2-ene derivatives; sensitive to high-energy radiation, resolution, etching resistance, and minimized swell; micropatterning with electron beams
01/06/2004US6673516 Coating composition for chemically amplified positive resist and method of patterning resist using the same
01/06/2004US6673515 Polymer, resist composition and patterning process
01/06/2004US6673513 Photosensitive polymer including copolymer of alkyl vinyl ether and resist composition containing the same
01/06/2004US6673512 Photoresists comprising homo(co)polycarbons, acid generators, curing agents and bases, used to form miniaturized patterns on semiconductors using x-rays or radiation beams; high sensitivity and resolution
01/06/2004US6673511 Resist composition
01/06/2004US6673509 Photopolymerizable recording element and process for preparing flexographic printing forms
01/06/2004US6673508 Comprises photosensitive silver halide particles, silver salt, reducing agent, vinyl polymer and/or hydrazine derivative; photothermography; for thermal development process without producing liquid waste
01/06/2004US6673287 Vapor phase surface modification of composite substrates to form a molecularly thin release layer
01/06/2004US6672210 Lithographic printing plate precursor with a graft polymerized hydrophilic layer
01/06/2004US6672193 Controlled cutting
01/06/2004US6672109 Silica glass member, method for producing the same, and projection aligners using the same
01/06/2004CA2245542C Composition exhibiting improved fluorescent response
01/06/2004CA2234110C Photosensitive resin composition
01/02/2004EP1376663A2 Method and system for forming a semiconductor device
01/02/2004EP1376268A1 Composition for hologram-recording material, hologram-recording medium, and process for producing the same
01/02/2004EP1376242A1 Over-coating agent for forming fine patterns and a method of forming fine patterns using it
01/02/2004EP1376241A1 Method for preparing lithographic printing plate
01/02/2004EP1376240A2 Laser beam control for an exposure apparatus
01/02/2004EP1376239A2 Cooling device for an optical element
01/02/2004EP1376238A2 A system for correcting aberration and distortion in EUV litography
01/02/2004EP1376237A2 Off-axis metrology of adaptive optical system
01/02/2004EP1376235A2 Full-contact type exposure device
01/02/2004EP1376234A1 Method for forming metal pattern
01/02/2004EP1376233A2 Method of producing a resin for a radiation-sensitive material
01/02/2004EP1376232A1 Photosensitive resin composition
01/02/2004EP1376231A1 Photosensitive polymer composition, method of forming relief patterns, and electronic equipment
01/02/2004EP1376230A1 Fine pattern forming method
01/02/2004EP1376229A1 Structure for pattern formation, method for pattern formation, and application thereof
01/02/2004EP1376228A1 Structure for pattern formation, method for pattern formation, and application thereof
01/02/2004EP1376227A1 Structure for pattern formation, method for pattern formation, and application thereof
01/02/2004EP1376226A1 Structure for pattern formation, method for pattern formation, and application thereof
01/02/2004EP1376225A1 Structure for pattern formation, method for pattern formation, and application thereof
01/02/2004EP1376224A1 Structure for pattern formation, method for pattern formation, and application thereof
01/02/2004EP1376192A2 Adaptive optic with discrete actuators for continuous deformation of a deformable mirror system
01/02/2004EP1376191A1 Deformable mirror actuation system
01/02/2004EP1376185A2 Minimizing thermal distortion effects on EUV mirror
01/02/2004EP1376183A2 Optical-element mountings exhibiting reduced deformation of optical elements held thereby
01/02/2004EP1376103A2 Method for determining local structures in optical crystals
01/02/2004EP1376092A2 Method and device for controlling thermal distortion in elements of a lithography system
01/02/2004EP1376052A2 System and method for automated focus measuring of a lithography tool
01/02/2004EP1375699A1 Method for forming metal pattern
01/02/2004EP1375597A1 Radiation-sensitive composition changing in refractive index and utilization thereof
01/02/2004EP1375540A1 Ethylenic fluoromonomer containing hydroxyl or fluoroalkylcarbonyl group and fluoropolymer obtained by polymerizing the same
01/02/2004EP1375463A1 Optically active compound and photosensitive resin composition
01/02/2004EP1375136A1 Reusable printing plate
01/02/2004EP1374650A1 Method and device for producing extreme ultraviolet radiation and soft x-radiation
01/02/2004EP1374310A2 Nanofabrication
01/02/2004EP1374287A2 Process for forming sub-lithographic photoresist features
01/02/2004EP1374269A1 Method of producing a screen for a color display tube
01/02/2004EP1373985A1 Lithography system with beam guidance and method for producing digital holograms in a storage medium
01/02/2004EP1373983A1 Lithograph with a trigger mask and method of production of digital holograms in a storage medium
01/02/2004EP1373982A2 Method for adjusting the overlay of two masking planes in a photolithographic process for the production of an integrated circuit
01/02/2004EP1373981A2 Lithographer comprising a mobile lens and method for producing digital holograms in a storage medium
01/02/2004EP1373980A1 High performance, photoimageable resin compositions and printing plates prepared therefrom
01/02/2004EP1373979A1 Substrate improvements for thermally imageable composition and methods of preparation
01/02/2004EP1373943A2 Method and device for producing an optically antireflective surface
01/02/2004EP1373877A1 Base stabilization system
01/02/2004EP1373426A1 Structural bonding tapes and articles containing the same
01/02/2004EP1373331A2 Thermally cured underlayer for lithographic application
01/02/2004EP1373151A1 Oxygen doping of silicon oxyfluoride glass
01/02/2004EP0956518B1 Interferometer system and lithographic apparatus comprising such a system
01/02/2004EP0775940B2 Use of a photosensitive paste, method of producing a plasma display and plasma display obtainable thereby
01/01/2004US20040003368 Method and apparatus for performing rule-based gate shrink utilizing dipole illumination
01/01/2004US20040002773 Photoresist system
01/01/2004US20040002575 Photoresists; mixture with solvent and photoacid generator
01/01/2004US20040002224 Substrate processing system and substrate processing method
01/01/2004US20040002216 Method and system for forming a semiconductor device
01/01/2004US20040002020 Photoresist residue remover composition
01/01/2004US20040002019 Method for Preparing Lithographic Printing Plate
01/01/2004US20040002017 Polymers with mixed photoacid-labile groups and photoresists comprising same
01/01/2004US20040002011 Photolithography; measuring adjustment mask; forming grid pattern; calibration
01/01/2004US20040002010 Variation in light intensity; high density images; photolithography
01/01/2004US20040002008 Recording material formulations for holographic media
01/01/2004US20040002007 Oxime derivatives and the use thereof as latent acids
01/01/2004US20040001964 Method of manufacturing a structure having pores
01/01/2004US20040001961 Dry films; reducing dielectric interface
01/01/2004US20040001918 Uniform thickness; storage containers, discharging nozzle
01/01/2004US20040001244 Semiconductor device and method for forming the same using cubic crystalline optical system with reduced birefringence
01/01/2004US20040001192 System and method for automated focus measuring of a lithography tool
01/01/2004US20040001191 Scanning exposure apparatus and method
01/01/2004US20040001190 Projection exposure apparatus and device manufacturing method