Patents
Patents for G03F 7 - Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printed surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor (127,176)
01/2004
01/15/2004US20040009429 Acid generating sulfonium compound, a resin having specific repeating units, which is decomposed by the action of an acid to increase it's solubility in an alkaline developing solution
01/15/2004US20040009428 Resist curable resin composition and cured article thereof
01/15/2004US20040009427 A sulfonium compound which generates an acid upon exposure to radiation, and a resin component (acrylic monomer containing a lactone group which becomes insoluble in alkali under the action of an acid generated from sulfonium compound)
01/15/2004US20040009426 Infrared photosensitive composition and image recording material for infrared exposure
01/15/2004US20040009425 Radiation durable organic compounds with high transparency at 157 nm, and method for preparing
01/15/2004US20040009424 Protecting groups for lithographic resist compositions
01/15/2004US20040009417 Method for making fine prints from oscillations in fresnel diffraction patterns in ultra high resolution lithography
01/15/2004US20040009416 Qualifying patterns, patterning processes, or patterning apparatus in the fabrication of microlithographic patterns
01/15/2004US20040009415 Optical apparatus comprising lenses and light sources positioned such that image distortion is suppressed, used to form lelctronics such as semiconductors or liquid crystal displays
01/15/2004US20040009414 Dye-containing curable composition, color filter and method of manufacturing the same
01/15/2004US20040009413 Substrate and masking multilayers having apertures for transmission of radiation to form patterns, and for generation of optics by printing onto photoresist layers and transferring the prints to radiation transparent layers
01/15/2004US20040009410 Integrated cooling substrate for extreme ultraviolet reticle
01/15/2004US20040009406 Optical recording medium comprising photoactive polymers used for holography and data processing; recording
01/15/2004US20040009295 Spin-coating method, determination method for spin-coating condition and mask blank
01/15/2004US20040008811 Compositions and methods involving direct write optical lithography
01/15/2004US20040008433 Wavefront aberration correction system
01/15/2004US20040008427 Optical system with compensated spatial dispersion
01/15/2004US20040008424 Adjustment of the partial coherence of the light energy in an imaging system
01/15/2004US20040008419 Variable focus lens by small changes of the equatorial lens diameter
01/15/2004US20040008408 Relay lens used in an illumination system of a lithography system
01/15/2004US20040008383 Method and apparatus for eliminating seams in screened image data for repetitive printing
01/15/2004US20040008353 CD metrology analysis using a finite difference method
01/15/2004US20040008348 Birefringence measurement apparatus, strain remover, polarimeter and exposure apparatus
01/15/2004US20040008334 Step and repeat imprint lithography systems
01/15/2004US20040008332 Exposure device
01/15/2004US20040008331 Lithographic apparatus and device manufacturing method
01/15/2004US20040008329 Exposure condition determination system
01/15/2004US20040008328 Optical device, method of cleaning the same, projection aligner, and method of producing the same
01/15/2004US20040008298 Preparing photo-patterned mono- or polychromatic, polarizing films; polarizer can be placed on the interior substrate surface of the Liquid Crystal Display (LCD) cell
01/15/2004US20040007990 Light generation apparatus, exposure apparatus, and device manufacturing method
01/15/2004US20040007920 Methods and apparatus for initializing a planar motor
01/15/2004US20040007680 Electron beam lithography apparatus using a patterned emitter
01/15/2004US20040007382 A photolithographic process for forming a semiconductor, heating carried out simultaneously with photo-radiation to deactivate substrate protection agents and the dissolution inhibitors
01/15/2004US20040007246 In-situ cleaning of light source collector optics
01/15/2004DE10329384A1 Phasenverschiebungsmaske für optische Lithographie Phase shift mask for optical lithography
01/15/2004DE10327257A1 Verfahren zur Bildung von Metallkolloidmustern A method of forming metal colloid patterns
01/15/2004DE10229818A1 Verfahren zur Fokusdetektion und Abbildungssystem mit Fokusdetektionssystem Method of focus detection and imaging system with focus detection system
01/15/2004DE10229614A1 Katadioptrisches Reduktionsobjektiv A catadioptric reduction objective
01/15/2004DE10227345A1 Verfahren zur Bestimmung lokaler Strukturen in optischen Kristallen Method for the determination of local structures in optical crystals
01/15/2004DE10227190A1 Verfahren zur Filterung von Strahlung A method for filtering radiation
01/14/2004EP1380899A2 Lithographic apparatus and device manufacturing method
01/14/2004EP1380898A1 Substrate holder and device manufacturing method
01/14/2004EP1380897A1 Lithographic apparatus and device manufacturing method
01/14/2004EP1380896A1 Optical system with compensated spatial dispersion
01/14/2004EP1380895A1 Chemically amplified resist material and patterning method using the same
01/14/2004EP1380871A2 Relay lens used in an illumination system of a lithography system
01/14/2004EP1380439A1 Heat-sensitive composition, negative working lithographic printin plate precursor coated with the said composition and method for forming a negative image on the said plate
01/14/2004EP1380425A1 Method of producing microstructure, method of producing liquid discharge head, and liquid discharge head produced thereby
01/14/2004EP1380422A1 Method of manufacturing microstructure, method of manufacturing liquid discharge head, and liquid discharge head
01/14/2004EP1380000A2 Method and device for vibration control
01/14/2004EP1379923A2 Substrate alignment
01/14/2004EP1379922A2 Grating test patterns and methods for overlay metrology
01/14/2004EP1379921A1 Process for producing acid sensitive liquid composition containing a carbonate
01/14/2004EP1379920A2 Photoresist compositions comprising bases and surfactants for microlithography
01/14/2004EP1379918A1 Imageable element comprising graft polymer
01/14/2004EP1379331A2 Process for producing film forming resins for photoresist compositions
01/14/2004CN1468406A Digital photolithography system for making smooth diagonal components
01/14/2004CN1468391A 正感光性聚酰亚胺树脂组合物 Positive photosensitive polyimide resin composition
01/14/2004CN1468390A Photoinitiated reactions
01/14/2004CN1468050A Method of manufacturing printed wiring board and printed wiring board obtained by the manufacturing method
01/14/2004CN1467840A Semiconductor device and method of manufacturing the same
01/14/2004CN1467794A Pattern formation method
01/14/2004CN1467793A Treating solution applying method
01/14/2004CN1467792A 曝光条件确定系统 Exposure conditions determine the system
01/14/2004CN1467791A Litho process applying to mask ROM coding layout
01/14/2004CN1467790A Method for forming open-top pattern and application thereof
01/14/2004CN1467570A Pattern writing apparatus, pattern writing method and substrate
01/14/2004CN1467569A Projection exposure equipment
01/14/2004CN1467568A Method and apparatus for exposure
01/14/2004CN1467567A Planographic printing plate precursor
01/14/2004CN1467532A Exposure head and exposure apparatus
01/14/2004CN1467517A Fabrication method of optical wiring circuit and optical wiring baseboard having the same optical wiring circuit
01/14/2004CN1134826C Method for producing semiconductor device
01/14/2004CN1134706C Process for producing screen printing form and screen printing fabric of coated screen web
01/14/2004CN1134705C Smart photolithography
01/14/2004CN1134511C Water soluble resin composition
01/14/2004CN1134505C Photosensitive mixture and recording material produced therefrom
01/14/2004CN1134457C New alpha-aminoacetophenone photoinitiators
01/14/2004CN1134352C Method for decoratively shaping painted substrate surface
01/14/2004CN1134310C Method and device for treating substrates
01/14/2004CA2490975A1 A device having a light-absorbing mask and a method for fabricating same
01/13/2004US6678348 Integral lens for high energy particle flow, method for producing such lenses use thereof in analysis devices and devices for radiation therapy and lithography
01/13/2004US6678240 Method for optimizing the image properties of at least two optical elements as well as methods for optimizing the image properties of at least three optical elements
01/13/2004US6678099 Reflective color filter
01/13/2004US6678038 Apparatus and methods for detecting tool-induced shift in microlithography apparatus
01/13/2004US6678037 Lithographic apparatus, device manufacturing method, and device manufactured thereby
01/13/2004US6677600 EUV radiation source
01/13/2004US6677390 Photocurable composition containing iodonium salt compound
01/13/2004US6677242 Integrated shallow trench isolation approach
01/13/2004US6677166 Method for confirming alignment of a substrate support mechanism in a semiconductor processing system
01/13/2004US6677108 Exposure of photoresists to radiation; patterning
01/13/2004US6677107 Resist film is made to function as a light screening film, wherein the information detecting ability of the photo mask can be enhanced
01/13/2004US6677106 Widens the window of operation of standard used patterning compositions used in making thermally sensitive printing plates using a flood exposure method
01/13/2004US6677103 Positive-working photoresist composition
01/13/2004US6677102 Chemical amplifying type positive resist composition
01/13/2004US6677101 Reactivity, rigidity and adhesion to the substrate, and undergoes a low degree of swelling during development; resolution
01/13/2004US6677100 Copolymer of an acrylate or methacrylate monomer having a silyl (si), silanol, silanediol, silanetriol, germanyl (ge), or stannous (sn) group, and maleic anhydride; for excimer laser lithography
01/13/2004US6677099 Positive type photosensitive polyimide resin composition
01/13/2004US6677089 Charged particle beam exposure method with performing proximity effect correction by adjusting widths of patterns included in block pattern formed on a mask
01/13/2004US6677088 Photomask producing method and apparatus and device manufacturing method