Patents
Patents for G03F 7 - Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printed surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor (127,176)
03/2004
03/02/2004US6700644 Condenser for photolithography system
03/02/2004US6700643 Device for exposure of a peripheral area of a film circuit board
03/02/2004US6700642 Laser exposure apparatus
03/02/2004US6700641 Temperature control method and exposure apparatus thereby
03/02/2004US6700600 Beam positioning in microlithography writing
03/02/2004US6700095 Pattern generation system using a spatial light modulator
03/02/2004US6699951 Monomer and polymer for photoresist, photoresist composition, and phosphor layer composition for color cathode ray tube
03/02/2004US6699800 Pattern design method for lithography C/H process
03/02/2004US6699798 Promoting adhesion of fluoropolymer films to semiconductor substrates
03/02/2004US6699729 Method of forming planar color filters in an image sensor
03/02/2004US6699646 Handled under bright sodium safelight for inspection of coatings
03/02/2004US6699645 Using chemically amplified resist which comprises alkali insoluble base polymer and acid generator in which patternwise exposed film of resist is developed with organic alkaline developer in presence of surfactant; peel, crack resistance
03/02/2004US6699644 Process for forming a photoresist pattern comprising alkaline treatment
03/02/2004US6699643 Stamper manufacturing method
03/02/2004US6699641 Photosensitive bottom anti-reflective coating
03/02/2004US6699640 Applying ink; exposure to radiation; removal wastes;continuous cycles
03/02/2004US6699639 Projection-exposure methods and apparatus exhibiting increased throughput
03/02/2004US6699638 On a thermal crosslinking layer a water soluble overcoat layer, and at least one of these layers contains a compound capable of converting light into heat; easy to handle and causes no defects even when touched with fingers
03/02/2004US6699635 Positive photosensitive composition
03/02/2004US6699630 Method and apparatus for exposure, and device manufacturing method
03/02/2004US6699628 Synchronize movable stage, calibration plate, detectable label
03/02/2004US6699627 Semiconductor pattern overlay.
03/02/2004US6699626 Mask set for use in phase shift photolithography technique which is suitable to form random patterns
03/02/2004US6699624 Precision optical measurement of the two process layers on a semiconductor wafer, set of diffraction grating test patterns that are used in combination with rigorous diffraction grating analysis
03/02/2004US6699425 Device and method for transferring microstructures
03/02/2004US6699408 Method of making a fluoride crystalline optical lithography lens element blank
03/02/2004US6698944 Exposure apparatus, substrate processing unit and lithographic system, and device manufacturing method
03/02/2004US6698354 Method and device for producing a printing block
02/2004
02/26/2004WO2004017421A1 Micro t-shaped electrode fabricating method
02/26/2004WO2004017390A1 Method and compositions for hardening photoresist in etching processes
02/26/2004WO2004017388A2 Lithographic template and method of formation
02/26/2004WO2004017366A2 Reticle manipulating device
02/26/2004WO2004017143A2 Method for irradiating a resist
02/26/2004WO2004017142A1 Polymerizable composition, polymer, resist, and lithography methods
02/26/2004WO2004017141A1 Optical image recording material, hologram base body, method of optical image recording and process for producing optical image recording material and hologram base body
02/26/2004WO2004017139A2 Negative-working photosensitive composition and negative-working photosensitive planographic printing plate
02/26/2004WO2004016827A1 Remover solution
02/26/2004WO2004016689A1 Optical material containing photocurable fluoropolymer and photocurable fluororesin composition
02/26/2004WO2004016664A1 Fluorinated polymers useful as photoresists, and processes for microlithography
02/26/2004WO2004016406A1 Imprint lithography processes and systems
02/26/2004WO2003100525A3 Method for determining wavefront aberrations
02/26/2004WO2003100487A8 Polymer micro-ring resonator device and fabrication method
02/26/2004WO2003099782A3 Acetal protected polymers and photoresists compositions thereof
02/26/2004WO2003087934A3 Interferometry system error compensation in twin stage lithography tools
02/26/2004WO2003085456A3 Method and device for imaging a mask onto a substrate
02/26/2004WO2003042728A8 Achromatic fresnel optics for ultraviolet and x-ray radiation
02/26/2004WO2003040828A3 Real-time prediction of and correction of proximity resist heating in raster scan particle beam lithography
02/26/2004WO2003036339A3 Transfer of optical element patterns on a same side of a substrate already having feature thereon
02/26/2004WO2003030597A3 Machine and installation for tracing on a support
02/26/2004US20040040003 Use of overlay diagnostics for enhanced automatic process control
02/26/2004US20040039153 Photosensitive compositions based on polycyclic polymers
02/26/2004US20040039150 Triazine ring based polymers for photoinduced liquid crystal alignment, liquid crystal alignment layer containing the same, liquid crystal element using the alignment layer and method of manufacturing the same
02/26/2004US20040039100 Photoresist; partial esterification product of a styrene maleic anhydride copolymer with (meth)acrylate and hydroxyl containing side chains and an amide containing (meth)acrylate
02/26/2004US20040038840 Useful for stripping photoresists and cleaning organic and inorganic compounds from a semiconductor substrate
02/26/2004US20040038552 Method for fabricating bulbous-shaped vias
02/26/2004US20040038549 Semiconductor apparatus fabrication method
02/26/2004US20040038532 Method for drying microstructure member
02/26/2004US20040038531 Method of manufacturing semiconductor apparatus
02/26/2004US20040038460 Methods of forming transistor gates; and methods of forming programmable read-only memory constructions
02/26/2004US20040038455 Use of overlay diagnostics for enhanced automatic process control
02/26/2004US20040038268 Support bound probes and methods of analysis using the same
02/26/2004US20040038155 Topcoat process to prevent image collapse
02/26/2004US20040038154 Separation-material composition for photo-resist and manufacturing method of semiconductor device
02/26/2004US20040038151 Multilayer elements containing photoresist compositions and their use in microlithography
02/26/2004US20040038150 Novel resins and photoresist compositions comprising same
02/26/2004US20040038149 For laser scanning exposure; irradiation polymerizaion with high pressure mercury lamp
02/26/2004US20040038148 Positive type radiation-sensitive resin composition for producing product formed by plating and process for producing product formed by plating
02/26/2004US20040038146 Optical recording material
02/26/2004US20040038139 Method and system for realtime CD microloading control
02/26/2004US20040038138 Comprises ink films colored by ink drops inside openings enclosed by banks demarcated and formed on a substrate; photoresists; photolithography; electrooptics; liquid crystal displays
02/26/2004US20040038137 Coating method for a color filter and aligning-assembling method by using the same
02/26/2004US20040038135 Photolithographic mask and methods for producing a structure and of exposing a wafer in a projection apparatus
02/26/2004US20040038134 Radiation-patterning tools, and methods of printing structures
02/26/2004US20040038010 Transcription plate for forming orientation layer
02/26/2004US20040037999 Fabrication method
02/26/2004US20040037959 Nanolithography, forming a pattern on a substrate by using a coated tip pen, coated with a compound, atomic force microscope imaging, drawing
02/26/2004US20040037487 Optical wiring substrate fabrication process and optical wiring substrate device
02/26/2004US20040037388 Illumination system particularly for microlithography
02/26/2004US20040037387 Illumination system particularly for microlithography
02/26/2004US20040037339 Laser discharge chamber passivation by plasma
02/26/2004US20040037338 High rep-rate laser with improved electrodes
02/26/2004US20040036991 Ultra-high resolution imaging devices
02/26/2004US20040036985 Structures and methods for reducing polarization aberration in integrated circuit fabrication systems
02/26/2004US20040036977 Optical illumination device, exposure device and exposure method
02/26/2004US20040036971 Methods for reducing polarization aberration in optical systems
02/26/2004US20040036961 Structures and methods for reducing polarization aberration in optical systems
02/26/2004US20040036940 Adaptive optic with discrete actuators for continuous deformation of a deformable mirror system
02/26/2004US20040036932 Phase volume hologram and method for producing the phase volume hologram
02/26/2004US20040036883 Projection exposure apparatus
02/26/2004US20040036850 Substrate attracting and holding system for use in exposure apparatus
02/26/2004US20040036849 Exposure apparatus, surface position adjustment unit, mask, and device manufacturing method
02/26/2004US20040036848 Lithographic apparatus and device manufacturing method
02/26/2004US20040036846 Mask producing method
02/26/2004US20040036201 Methods and apparatus of field-induced pressure imprint lithography
02/26/2004US20040036076 Semiconductor device and method of manufacturing same
02/26/2004US20040036040 Writing methodology to reduce write time, and system for performing same
02/26/2004US20040036037 Illumination system with a plurality of light sources
02/26/2004US20040036035 Positioning system for use in lithographic apparatus
02/26/2004US20040035820 Fabrication of MEMS devices with spin-on glass
02/26/2004US20040035690 For parallel synthesis and assay of biopolymers using light-directed generation of photo-generated reagents on microarray biochips