Patents
Patents for G03F 7 - Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printed surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor (127,176)
03/2004
03/16/2004US6707536 Projection exposure apparatus
03/16/2004US6707535 Device for exposure of a peripheral area
03/16/2004US6707534 Maskless conformable lithography
03/16/2004US6707533 Detection apparatus and exposure apparatus using the same
03/16/2004US6707532 Projection exposure apparatus
03/16/2004US6707530 Lithographic apparatus, device manufacturing method, and device manufactured thereby
03/16/2004US6707529 Exposure method and apparatus
03/16/2004US6707528 Exposure apparatus having independent chambers and methods of making the same
03/16/2004US6707107 Method of deforming a pattern and semiconductor device formed by utilizing deformed pattern
03/16/2004US6706826 Copolymer, process for producing the same, and resist composition
03/16/2004US6706609 Method of forming an alignment feature in or on a multi-layered semiconductor structure
03/16/2004US6706533 Determining concentration of solution using mathematical formula which relates concentration to electroconductivity at a given temperature
03/16/2004US6706466 Heat treating without removal of moisture
03/16/2004US6706464 Prevent short circuiting; solvent-free dielectric films; exposure to actinic radiation
03/16/2004US6706463 Heat sensitve element overcoating substrate; applying laser beams; development by rubbing
03/16/2004US6706462 Contains a colored layer containing filter dye besides an oxygen cutoff layer; solves safelight fog problem; use as computer-to-plate lithographic printing plate precursor
03/16/2004US6706461 Dyed photoresists and methods and articles of manufacture comprising same
03/16/2004US6706456 Method of determining exposure conditions, exposure method, device manufacturing method, and storage medium
03/16/2004US6706454 Method for the production of a printing plate using particle growing acceleration by an additive polymer
03/16/2004US6706453 Photolithographic formation of microscopic patterns in semiconductor; integrated circuits; resolution
03/16/2004US6706452 Method of manufacturing photomask and method of manufacturing semiconductor integrated circuit device
03/16/2004US6706321 Developing treatment method and developing treatment unit
03/16/2004US6705228 Uv light from a light source that is modified by a projection unit with respect to direction and/or intensity, trigger signals are evaluated by a receiver formed as the higher-level unit.
03/11/2004WO2004021450A1 Gate electrode and its fabricating method
03/11/2004WO2004021419A1 Projection optical system and exposure device
03/11/2004WO2004021418A1 Temperature control method and device, and exposure method and apparatus
03/11/2004WO2004021417A1 Maintenance system, substrate processing device, remote operation device, and communication method
03/11/2004WO2004021088A2 Lithographic method for small line printing
03/11/2004WO2004021086A1 Grating based spectral filter for eliminating out of band radiation in an extreme ultra-violet lithography system
03/11/2004WO2004021085A1 Optical subsystem, particularly for a projection exposure system comprising at least one optical element that can be brought into at least two positions
03/11/2004WO2004021084A2 Decal transfer microfabrication
03/11/2004WO2004021083A1 Device for transferring a pattern to an object
03/11/2004WO2004021080A1 Stereoflexography
03/11/2004WO2004020704A1 Apparatus and method for deposition of an electrophoretic emulsion
03/11/2004WO2004006011A3 Method and arrangement for the manipulation of reticles
03/11/2004WO2003093902A3 Lighting system, particularly for use in extreme ultraviolet (euv) lithography
03/11/2004WO2003087937A3 Waterborne printed circuit board coating compositions
03/11/2004WO2003068784A3 Acyl- and bisacylphosphine derivatives
03/11/2004WO2003058349A3 Method for the production of a flexographic plate and flexographic plate obtained according to said method
03/11/2004WO2003021360A3 Phase-shift-moire focus monitor
03/11/2004WO2002079882A3 Lithography method
03/11/2004US20040049762 Method for monitoring matched machine overlay
03/11/2004US20040049761 Hybrid optical proximity correction for alternating aperture phase shifting designs
03/11/2004US20040048978 Photosensitive resin composition, solder resist comprising the same, cover lay film, and printed circuit board
03/11/2004US20040048943 Accelerators for cationic polymerization catalyzed by iron-based catalyst
03/11/2004US20040048761 Cleaning composition
03/11/2004US20040048730 To be used in the near ultraviolet region
03/11/2004US20040048412 Method of fabricating a semiconductor
03/11/2004US20040048400 Reticle focus measurement method using multiple interferometric beams
03/11/2004US20040048204 For use in lithography to fabricate semiconductor devices; performance
03/11/2004US20040048201 Resist application method and device
03/11/2004US20040048200 Method for forming fine pattern on substrate by using resist pattern, and resist surface treatment agent
03/11/2004US20040048199 Imagewise exposure of the photopolymerizable relief-forming layer by means of actinic radiation, heating; removal of the softened, unpolymerized parts of the relief-forming layer with formation of a printing relief
03/11/2004US20040048198 Producing multilayer composite; allowing the thermally decomposing polymerization initiators to diffuse out of the depot layer; removal of depot layer; thermal crosslinking of the precursor layer to produce relief-forming layer
03/11/2004US20040048197 Photosensitive black matrix
03/11/2004US20040048196 Anti-reflective coating composition with improved spin bowl compatibility
03/11/2004US20040048194 Mehod for forming a tunable deep-ultraviolet dielectric antireflection layer for image transfer processing
03/11/2004US20040048192 Radiation-sensitive resin composition
03/11/2004US20040048190 For producing semiconductor integrated- circuit elements, masks for integrated circuit production, printed wiring boards, liquid-crystal panels
03/11/2004US20040048189 Light sensitive composition and light sensitive planographic printing plate precursor
03/11/2004US20040048188 Positive photosensitive polyimide resin composition
03/11/2004US20040048187 High resolution
03/11/2004US20040048175 Receiver element for adjusting the focus of an imaging laser
03/11/2004US20040048174 Reticle focus measurement system using multiple interferometric beams
03/11/2004US20040048171 Applying photoresist to base layer; photoresist layer is subjected to masked exposure which is matched to a predetermined final surface patterning; developing; coating by sputtering to destabilize the sacrificial layer regions
03/11/2004US20040048169 For use in irradiating a wafer with an electron beam for cell projection
03/11/2004US20040048167 Method of illuminating a photomask using chevron illumination
03/11/2004US20040048166 Contact printing as second exposure of double exposure attenuated phase shift mask process
03/11/2004US20040048132 Fuel cell and electronic device using fuel cell
03/11/2004US20040047386 High repetition rate gas discharge laser with precise pulse timing control
03/11/2004US20040047385 Very narrow band, two chamber, high reprate gas discharge laser system
03/11/2004US20040047384 Gas laser apparatus for lithography
03/11/2004US20040047109 Method for forming a photoresist pattern, method for forming a capacitor using the same and capacitor
03/11/2004US20040047057 Substrate for material to be exposed
03/11/2004US20040047029 Optical member and projection optical system for photolithography using the same
03/11/2004US20040047027 Interferometer with reduced shear
03/11/2004US20040047023 Defective pixel compensation method
03/11/2004US20040047014 In-line holographic mask for micromachining
03/11/2004US20040046965 Interferometric stage metrology system
03/11/2004US20040046961 Reticle overlay correction
03/11/2004US20040046952 Supporting system in exposure apparatus
03/11/2004US20040046951 Printing by active tiling
03/11/2004US20040046950 Projection exposure apparatus and method with adjustment of rotationally asymmetric optical characteristics
03/11/2004US20040046949 Differential pumping system and exposure apparatus
03/11/2004US20040046948 Exposure apparatus and method of conveying mask and work
03/11/2004US20040046947 Image adjustor including damping assembly
03/11/2004US20040046503 Microcavity discharge device
03/11/2004US20040046287 Method for making opthalmic devices
03/11/2004US20040046271 Functional patterning material for imprint lithography processes
03/11/2004US20040045929 Mask and its manufacturing method, and method for manufacturing semiconductor device
03/11/2004US20040045866 Packaged radiation sensitive coated workpiece process for making and method of storing same
03/11/2004US20040045465 Four color digital printing process and color image element using color-sensitive photopolymers
03/11/2004DE10339717A1 Production of a microstructure, e.g. in the manufacture of semiconductor devices, comprises crosslinking a film with acid released by a resist structure
03/11/2004DE10304116A1 Optimierverfahren für ein Objektiv mit Fluorid-Kristall-Linsen sowie Objektiv mit Fluorid-Kristall-Linsen Optimization method for a lens with fluoride crystal lenses and lens with fluoride crystal lenses
03/11/2004DE10253353A1 Objective with doubly refracting lenses especially a projection objective for microphotolithography and compensation process has two different sets of doubly refracting lenses
03/11/2004DE10240115A1 Verfahren und System zum Handhaben von Substraten in einer Produktionslinie mit einer Cluster-Anlage und einer Messanlage Method and system for handling substrates in a production line with a cluster system and a measuring system
03/11/2004DE10240002A1 Optisches Teilsystem insbesondere für eine Projektionsbelichtungsanlage mit mindestens einem in mindestens zwei Stellungen verbringbaren optischen Element Optical subsystem particular for a projection exposure apparatus having at least one verbringbaren at least two positions optical element
03/11/2004DE10239956A1 Catadioptric microscopic objective for UV light in semiconductor production and testing has massive lens body in refractive section and off axis reflection
03/11/2004DE10239858A1 Verfahren und Anordnung zur Kompensation von Unebenheiten in der Oberfläche eines Substrates Method and apparatus for compensating for irregularities in the surface of a substrate
03/11/2004DE10239344A1 Device for sealing an optical projection unit flows noble gas or nitrogen around intermediate spaces to give contactless sealing