Patents
Patents for G03F 7 - Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printed surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor (127,176)
04/2004
04/01/2004US20040063037 Irradiating far ultraviolet or vacuum ultraviolet exposure light from a second major surface side of a mask substrate; reduction-projecting, by a projection optical system, exposure light which has transmitted through mask substrate
04/01/2004US20040063036 Exposing the heat-sensitive pre-sensitized plate to light, and developing the plate using an alkaline developing solution comprising compound selected from cationic surfactants and compound having ethylene oxide-terminal groups
04/01/2004US20040063035 For formation of a three-dimensional object
04/01/2004US20040063034 Photosensitive composition
04/01/2004US20040063033 Presensitized plate
04/01/2004US20040063030 Photoresist
04/01/2004US20040063029 Usable for the image-forming layer of a positive type lithographic printing plate precursor for the so-called direct platemaking that can be directly achieved with the aid of digital signals from computers and the like
04/01/2004US20040063028 Heat-sensitive composition in which removal of the unexposed regions is unnecessary, negative lithographic plate coated with the said composition and method for forming a negative image on the said plate
04/01/2004US20040063027 Functional polymer
04/01/2004US20040063026 Dry film photoresist
04/01/2004US20040063025 Resist pattern, process for producing same, and utilization thereof
04/01/2004US20040063024 Capable of high resolution lithographic performance with good exposure dose latitude, reduced sensitivity to fluctuations in post- exposure bake and/or reduced line edge roughness
04/01/2004US20040063022 Providing a substrate; applying onto the surface of the substrate a photosensitive formulation comprising mixture of an aromatic diazonium salt containing compounds; treating photosensitive to form a layer that adheres
04/01/2004US20040063021 Diazonium salt and thermal recording material using the same
04/01/2004US20040063009 Comprehensive integrated lithographic process control system based on product design and yield feedback system
04/01/2004US20040063008 Post etch overlay metrology to avoid absorbing layers preventing measurements
04/01/2004US20040063007 Precision-of-register measuring mark and measuring method
04/01/2004US20040063003 Method of producing a patterned photoresist used to prepare high performance photomasks
04/01/2004US20040062999 Method for the manufacture of phase shifting masks for EUV lithography
04/01/2004US20040062939 Polymerizable composition and planogaphic printing plate precursor using the same
04/01/2004US20040062896 Fractionally-releasable bonding layer for use in photo-sensitive laminate films
04/01/2004US20040062876 Liquid phase; reducing precipitation in development process by adjustment pH; process control
04/01/2004US20040062867 Method to reduce photoresist poisoning
04/01/2004US20040061952 System for coverting optical beams to collimated flat-top beams
04/01/2004US20040061930 Narrow-band spectral filter and the use thereof
04/01/2004US20040061869 Compensation for errors in off-axis interferometric measurements
04/01/2004US20040061868 Figure correction of multilayer coated optics
04/01/2004US20040061857 Periodic patterns and technique to control misalignment between two layers
04/01/2004US20040061844 Lithographic apparatus and device manufacturing method
04/01/2004US20040061673 Imaging forming apparatus
04/01/2004US20040061385 Linear motor apparatus
04/01/2004US20040061151 Nanometer-scale semiconductor devices and method of making
04/01/2004US20040061080 Electron beam exposure apparatus, deflection apparatus, and electron beam exposure method
04/01/2004US20040061065 Electron beam exposure apparatus, electron beam exposure apparatus calibration method, and semiconductor element manufacturing method
04/01/2004US20040060949 Photoresist applying device and applying method therefor
04/01/2004US20040060731 Patterned electrically conductive polymers
04/01/2004US20040060466 Printing plate processing apparatus
04/01/2004DE20023408U1 Thermally stable layer system used for reflecting extreme UV rays consists of layer pairs made up of a barrier layer of molybdenum carbide between molybdenum layer and a silicon layer
04/01/2004DE10340382A1 Print form measurement method for determining difference between projection points on surface of a print form to enable location compensation of patterns projected by different illustrating units
04/01/2004DE10332855A1 Verfahren zum Bilden einer Mikrostruktur auf einem Substrat unter Verwendung einer Resiststruktur, und Restistoberflächenbehandlungsmittel A method of forming a microstructure on a substrate using a resist pattern, and Restistoberflächenbehandlungsmittel
03/2004
03/31/2004EP1403928A2 Nanometer-scale semiconductor devices and method of making
03/31/2004EP1403717A1 Resist pattern thickening material, process for forming resist pattern, and process for manufacturing semiconductor device
03/31/2004EP1403716A2 Process for developing lithographic printing plate
03/31/2004EP1403715A2 Lithographic apparatus and device manufacturing method
03/31/2004EP1403714A2 Lithographic apparatus and a measurement system
03/31/2004EP1403713A1 Lithographic apparatus and device manufacturing method
03/31/2004EP1403712A2 Lithographic apparatus and device manufacturing method
03/31/2004EP1403711A1 PATTERN−FORMING MATERIAL AND METHOD OF FORMING PATTERN
03/31/2004EP1403710A1 Polymerizable composition
03/31/2004EP1403709A2 Photoinitiator
03/31/2004EP1403708A2 Photoresist
03/31/2004EP1403663A1 Optical member, process for producing the same, and projection aligner
03/31/2004EP1403295A2 Ester compounds, polymers, resist compositions and patterning process
03/31/2004EP1403042A2 Planographic printing plate precursor
03/31/2004EP1403041A2 Infrared-sensitive composition
03/31/2004EP1403040A1 Printing plate material and image formation method employing the same
03/31/2004EP1403039A1 Infrared sensitive composition and lithographic printing plate precursor
03/31/2004EP1402605A1 High repetition rate gas discharge laser with precise pulse timing control
03/31/2004EP1402570A2 Control of solid state dimensional features
03/31/2004EP1402569A2 Lithography method for forming semiconductor devices on a wafer and apparatus
03/31/2004EP1402543A1 Material and method for making an electroconductive pattern
03/31/2004EP1402321A1 Resist curable resin composition and cured article thereof
03/31/2004EP1402320A1 Method for the production of a printing plate using particle growing acceleration by an additive polymer
03/31/2004EP1402319A1 Material having a conductive pattern; and a material and method for making a conductive pattern
03/31/2004EP1402318A1 A stamp having an antisticking layer and a method of forming of repairing such a stamp
03/31/2004EP1402317A2 Plastic male mold for producing microstructures and nanostructures using imprint lithography
03/31/2004EP1401994A1 Aqueous buffered fluoride-containing etch residue removers and cleaners
03/31/2004EP1320913B1 High-peak-power laser device and application to the generation of light in the extreme ultraviolet
03/31/2004EP0958255A4 Silica with low compaction under high energy irradiation
03/31/2004CN1486449A Multilayer elements containing photoresist compositions and their use in microlithography
03/31/2004CN1485885A Pattern formation material, water-soluble material and pattern formation method
03/31/2004CN1485702A Display panel and the multilayer pole plate made of the same
03/31/2004CN1485694A Step-by-step projection photo-etching machine double set shifting exposure ultra-sophisticated positioning silicon chip bench system
03/31/2004CN1485693A Photosensitive heat convertible resin and welder-proof ink composition containing the same
03/31/2004CN1485662A Protective covers for gas sensor, gas sensor and gas sensor manufacturing method
03/31/2004CN1485200A Presensitized lithographic plate comprising microcapsules
03/31/2004CN1144267C Electron-beam exposing method
03/31/2004CN1144265C Electron beam exposure mask and method for making semiconductor device with the same
03/31/2004CN1144264C Mask blank and method of producing mask
03/31/2004CN1144263C Exposure device and method for exposure
03/31/2004CN1144237C Integral lens for high energy particle flow, method for producing such lenses and use thereof
03/31/2004CN1144196C Manufacturing method of master disk for forming optical disk
03/31/2004CN1144096C 感光性树脂组成物 The photosensitive resin composition
03/30/2004US6714892 Three dimensional reconstruction metrology
03/30/2004US6714842 Synchronous position control apparatus and method
03/30/2004US6714691 Exposure method and apparatus, and device manufacturing method using the same
03/30/2004US6714625 Lithography device for semiconductor circuit pattern generation
03/30/2004US6714624 Discharge source with gas curtain for protecting optics from particles
03/30/2004US6714577 Energy stabilized gas discharge laser
03/30/2004US6714302 Aligning method, aligner, and device manufacturing method
03/30/2004US6714282 Position detecting method optical characteristic measuring method and unit, exposure apparatus, and device manufacturing method
03/30/2004US6714281 Exposure apparatus and device manufacturing method
03/30/2004US6714280 Projection optical system, projection exposure apparatus, and projection exposure method
03/30/2004US6714279 Lithographic projection apparatus, device manufacturing method and device manufactured thereby
03/30/2004US6714278 Exposure apparatus
03/30/2004US6714277 Exposure apparatus, gas replacement method, semiconductor device manufacturing method, semiconductor manufacturing factory and exposure apparatus maintenance method
03/30/2004US6713959 Plasma display panel and method for producing the same
03/30/2004US6713903 Motor system for positioning a load
03/30/2004US6713900 Linear motors and stages comprising same that produce reduced magnetic fields at an optical axis for charged-particle-beam lithography
03/30/2004US6713772 Free-form fabrication using multi-photon excitation