Patents
Patents for G03F 7 - Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printed surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor (127,176)
03/2004
03/11/2004DE10237508A1 Verfahren zum Bilden einer Maskierschicht auf einem Substrat A method of forming a masking layer on a substrate
03/11/2004CA2495978A1 Decal transfer microfabrication
03/10/2004EP1396873A1 Electron beam writing equipment
03/10/2004EP1396761A2 An alignment tool, a lithographic apparatus, an alignment method and a device manufacturing method
03/10/2004EP1396760A2 Differential pumping system and exposure apparatus
03/10/2004EP1396759A2 Lithographic apparatus, device manufacturing method, and device manufactured thereby
03/10/2004EP1396758A2 Differential pumping system and exposure apparatus
03/10/2004EP1396757A2 Reticle focus measurement system and method using multiple interferometric beams
03/10/2004EP1396756A2 Planographic printing plate precursor
03/10/2004EP1396349A2 Method for production of support for lithographic printing plate precursor and support for lithographic printing plate precursor
03/10/2004EP1396338A1 Heat-sensitive lithographic printing plate precursor
03/10/2004EP1395878A1 Photoresists processable under biocompatible conditions for multi-biomolecule patterning
03/10/2004EP1395877A2 Lithographic method of manufacturing a device
03/10/2004EP1395857A2 Method for controlled modification of the reflective qualities of a multi-layer
03/10/2004EP1395615A1 Oxime ester photoinitiators having a combined structure
03/10/2004EP1395428A1 Chemical imaging of a lithographic printing plate
03/10/2004EP1002242A4 Stepper or scanner having two energy monitors for a laser
03/10/2004EP0954384B1 Method for coating a plurality of fluid layers onto a substrate
03/10/2004EP0883892B1 Vacuum compatible linear motion device
03/10/2004CN1481519A Process for removal of photoresis after post ion implantation
03/10/2004CN1481392A Surface-active photoinitiators
03/10/2004CN1480996A Method for etching photoresistive layer deposited on substrat of semiconductor
03/10/2004CN1480994A Substrate processing system and its processing method
03/10/2004CN1480986A Bearing appts. its mfg. method, bearing table appts, and exposure appts.
03/10/2004CN1480985A Method of peripheral auxiliary graphics for determining algnment mark of wafer and photoresist mask utilized
03/10/2004CN1480788A Analyzing system of exposuring device, analyzing method, and program, and semiconductor element mfg. method
03/10/2004CN1480787A Damping device, flat table device and exposuring device
03/10/2004CN1480749A Method of producing polymer light pipe
03/10/2004CN1480746A Diffusion reflector, its mfg. method and proximity exposure method
03/10/2004CN1480491A Light sensitivity resin precursor compsn.
03/10/2004CN1141733C Array type optical probe scanning IC photoetching method
03/10/2004CN1141732C Method of improving outline of photoresist pattern
03/10/2004CN1141622C Aqueous developing solutions for reduced developer residue
03/10/2004CN1141621C Aliali aqueous developing solutions and method for preparing photoresist pattrn with pattern
03/10/2004CN1141620C Scanner with array light source for IC photo etching system
03/10/2004CN1141619C Chemically amplitied resist composition
03/10/2004CN1141618C Photosensitive composition and method of pattern formation
03/09/2004US6704920 Process control for micro-lithography
03/09/2004US6704661 Real time analysis of periodic structures on semiconductors
03/09/2004US6704340 Lithography laser system with in-place alignment tool
03/09/2004US6704339 Lithography laser with beam delivery and beam pointing control
03/09/2004US6704096 Exposure apparatus and exposure method
03/09/2004US6704095 Control of a distribution of illumination in an exit pupil of an EUV illumination system
03/09/2004US6704094 Correction of leveling tilt induced by asymmetrical semiconductor patterns
03/09/2004US6704093 Scanning exposure apparatus, scanning exposure method, and device manufacturing method
03/09/2004US6704092 Projection exposure method and apparatus that produces an intensity distribution on a plane substantially conjugate to a projection optical system pupil plane
03/09/2004US6704091 Exposure apparatus and exposure method
03/09/2004US6704090 Exposure method and exposure apparatus
03/09/2004US6704089 Lithographic projection apparatus, a method for determining a position of a substrate alignment mark, a device manufacturing method and device manufactured thereby
03/09/2004US6704088 Environmental-control method and apparatus for an exposure system
03/09/2004US6704075 Color filter substrate, method of fabricating color filter substrate, liquid crystal device, method of fabricating liquid crystal device, and electronic apparatus
03/09/2004US6703630 Exposure method, electron beam exposure apparatus and fabrication method of electronic device
03/09/2004US6703629 Charged beam exposure apparatus having blanking aperture and basic figure aperture
03/09/2004US6703625 Methods and apparatus for off-axis lithographic illumination
03/09/2004US6703623 Electron beam proximity exposure apparatus
03/09/2004US6703328 Semiconductor device manufacturing method
03/09/2004US6703323 Method of inhibiting pattern collapse using a relacs material
03/09/2004US6703190 Method for producing resist structures
03/09/2004US6703188 Method of fabricating optical waveguide structure
03/09/2004US6703187 Method of forming a self-aligned twin well structure with a single mask
03/09/2004US6703185 Aggregating a hydrophobizing precursor mingled in a fountain solution or adding a coagulant to the solution and removing the precursor by filtration
03/09/2004US6703184 Organic light-emitting diode devices
03/09/2004US6703183 (meth)acrylic acid adamantane or norbornane ester derivatives
03/09/2004US6703182 Unsaturated oxime derivatives and the use thereof as latent acids
03/09/2004US6703181 Comprising at least one of: imidazole compound, an alanine compound, an adenine compound, an adenosine compound, and a quaternary ammonium salt compound, and which increases miscibility in a resist film
03/09/2004US6703178 Comprises a polymer containing a novel lactone alicyclic unit; well-balanced outcome of etching resistance and substrate adhesion
03/09/2004US6703171 Photomask, the manufacturing method, a patterning method, and a semiconductor device manufacturing method
03/09/2004US6703169 Applying an organic antireflection coating over a metal-containing layer; applying a chemically-amplified positive tone or negative tone deep ultraviolet photoresist; baking; exposure to radiation; baking
03/09/2004US6703167 Calibration using scattering bars; lithography tools
03/09/2004US6701972 Vacuum load lock, system including vacuum load lock, and associated methods
03/09/2004US6701843 Gentle cleaning using a water emulsion of an alcohol and cyclic hydrocarbon having at least one double bond with phosphoric acid, a phosphate salt, or a polyvinylphosphonic acid
03/04/2004WO2004019667A1 Method for forming bump on electrode pad with use of double-layered film
03/04/2004WO2004019389A1 Mark position detection device, mark position detection method, superimposing measurement device, and superimposing measurement method
03/04/2004WO2004019134A1 Removing solution
03/04/2004WO2004019133A2 Method for forming a masking layer on a substrate
03/04/2004WO2004019132A1 Photosensitive composition for interlayer dielectric and method of forming patterned interlayer dielectric
03/04/2004WO2004019131A1 Composition sensitive to visible light
03/04/2004WO2004019130A1 Process for producing a patterned oxide film on a substrate
03/04/2004WO2004019128A2 Projection optical system and method for photolithography and exposure apparatus and method using same
03/04/2004WO2004019105A1 Catadioptric reduction lens having a polarization beamsplitter
03/04/2004WO2004019104A1 Device for receiving an optical module in an imaging unit
03/04/2004WO2004019079A2 Continuous direct-write optical lithography
03/04/2004WO2004019077A2 Structures and methods for reducing retardance
03/04/2004WO2004018908A2 Mems-based fluid valve device
03/04/2004WO2004018622A2 Selective and alignment-free molecular patterning of surfaces
03/04/2004WO2003104897A3 Objective, especially a projection objective for microlithography
03/04/2004WO2003096122A3 Method for producing a unit comprising three-dimensional surface structuring and use of said method
03/04/2004WO2003087943A3 Method for producing a mask adapted to a lighting device
03/04/2004WO2003087939A3 On-press developable ir sensitive printing plates using binder resins having polyethylene oxide segments
03/04/2004WO2003081712A3 Grating element for filtering wavelengths ≤ 100nm
03/04/2004WO2003021728A3 Very narrow band, two chamber, high rep rate gas discharge laser system
03/04/2004WO2003001633A3 Method and device utilizing driving force to deliver deposition compound
03/04/2004US20040044982 Reticles and methods of forming and using the same
03/04/2004US20040044981 Reticle fabrication method
03/04/2004US20040044435 Method and system for handling substrates in a production line including a cluster tool and a metrology tool
03/04/2004US20040044102 Mixture of addition polymer and epoxy resin
03/04/2004US20040043337 Stripping photoresists using water which decomposes into hydrogen, oxygen free radicals
03/04/2004US20040043336 Method of manufacturing print belts
03/04/2004US20040043335 Applying layer of polymerizable initiator to bearings; then polymer
03/04/2004US20040043334 Method of manufacturing for conductive pattern substrate