Patents
Patents for G03F 7 - Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printed surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor (127,176)
05/2004
05/12/2004EP0991682B1 Coating method using a one-component aqueous coating system comprising thermally labile hydrophilic groups
05/12/2004CN1496497A Resist releasing composition
05/12/2004CN1496496A Protecting groups in polymers, photoresists and processes for microlithography
05/12/2004CN1496377A Ultraviolet-curable resin composition and photosolder resist ink containing the composition
05/12/2004CN1496198A Substrate and organic electroluminescent device using the same
05/12/2004CN1496197A Method for producing image element, equipment for producing image element and image element
05/12/2004CN1495861A Vapour as treating gas for removing hard shell, corrosion-resisting agent and residue produced by stripping corrosion-resisting agent after ion implantation
05/12/2004CN1495856A Orientation dependent on screen by adopting dipole illumination technigue
05/12/2004CN1495855A Method for mfg. semiconductor and solid photographic device
05/12/2004CN1495854A Image forming method
05/12/2004CN1495853A Method and system for mfg. semiconductor device
05/12/2004CN1495710A Method for foming single floating block air cushion surface by using forming polymer brush
05/12/2004CN1495540A Alignment system of photoetching system utilizing at least two wavelengths and its method
05/12/2004CN1495539A Production of automatic optical approximate correcting regulation
05/12/2004CN1495538A Alignment method of array optical probe scanning integrated circuit photoetching system and its equipment
05/12/2004CN1495537A Digital photoetching system for making smooth diagonal component
05/12/2004CN1495535A Etching solution for forming bimetallic mosaic structure craft and base phate treatment method
05/12/2004CN1495534A Detergent for removing resist and method for making semiconductor
05/12/2004CN1495533A Analogue method and system for designing aperture of exposure device and medium for recording analogue method
05/12/2004CN1495532A Photoetching projector and reflector assembly for the same
05/12/2004CN1495531A Photoetching projector and particle screen for said device
05/12/2004CN1495530A Photoetching equipment and device mfg. method
05/12/2004CN1495529A Method for managing photochemical light intensity transient change and its equipment
05/12/2004CN1495528A Photoetching projector and reflector assembly for said device
05/12/2004CN1495527A Method for mfg. photoetching device
05/12/2004CN1495526A Sulfonate and photoresist composition
05/12/2004CN1495525A Fine graphic forming material, method and semiconductor device making method
05/12/2004CN1495524A Polymeric composition and lithographic printing platemaking forebody
05/12/2004CN1495522A Fine pattern forming method and resist surface processing agent
05/12/2004CN1495491A Transferring plate for forming orientation film
05/12/2004CN1495472A Optical system for compensating spacial dispersion
05/12/2004CN1495461A Repeatered lens used in lighting system of photoetching system
05/12/2004CN1495444A Method for designing phase raster graphics and method for making photomask system containing it
05/12/2004CN1495443A Reflector utilizing microimage to make exposure and its production method
05/12/2004CN1495043A Lithographic printing carrier, method for mfg. carrier and pre-sensitized board
05/12/2004CN1495017A Screen printing and its making technology
05/12/2004CN1494956A Cleaning method for removing particles from surface, cleaning equipment and photo-engraving projection equipment
05/12/2004CN1494954A Method and composition for removing residue from microstructure of body
05/12/2004CN1149643C Pattern drawing method using charged particle beams and apparatus therefor
05/12/2004CN1149637C Electronic beam exposure system
05/12/2004CN1149538C Circuit substrate, circuit-formed suspension substrate, and production methods therefor
05/12/2004CN1149237C Copolymer resin, Preparation thereof, and photoresist using the same
05/11/2004US6735492 Feedback method utilizing lithographic exposure field dimensions to predict process tool overlay settings
05/11/2004US6735485 Overlay registration correction method for multiple product type microelectronic fabrication foundry facility
05/11/2004US6735275 X-ray exposure method, x-ray exposure apparatus, fine structure and semiconductor device
05/11/2004US6735236 High power gas discharge laser with line narrowing unit
05/11/2004US6735233 Gas discharge laser with means for removing gas impurities
05/11/2004US6735232 Laser with versatile output energy
05/11/2004US6734971 Method and apparatus for self-referenced wafer stage positional error mapping
05/11/2004US6734950 Load-lock chamber and exposure apparatus using the same
05/11/2004US6734949 Lithographic apparatus and device manufacturing method
05/11/2004US6734947 Quick chamber seals
05/11/2004US6734518 Surface treatment of DARC films to reduce defects in subsequent cap layers
05/11/2004US6734506 Semiconductor device including a plurality of kinds of MOS transistors having different gate widths and method of manufacturing the same
05/11/2004US6734445 Mechanized retractable pellicles and methods of use
05/11/2004US6734443 Irradiating reticle using ultraviolet light radiation beam; purification, neutralization
05/11/2004US6734442 Mapping method for a microscope slide
05/11/2004US6734258 Protective coating composition for dual damascene process
05/11/2004US6734248 Containing a 1h-tetrazole or a 5,5'-bis-1h-tetrazole
05/11/2004US6734120 Method of photoresist ash residue removal
05/11/2004US6734117 Periodic clamping method and apparatus to reduce thermal stress in a wafer
05/11/2004US6733957 Having a pit and a groove with different depth formed separately in the inner and outer circumference of the disk substrate
05/11/2004US6733953 Semitransparent phase shifting mask has, in the periphery of a pattern element area, a light shielding portion which is formed by a semitransparent phase shifting portion and a transparent portion with the optimal size combination.
05/11/2004US6733952 Resist composition
05/11/2004US6733951 High resolution in pattern formation by irradiation with acitinic ray; for production of lithographic printing plates and semiconductors/integrated circuits for liquid crystals and thermal heads
05/11/2004US6733949 Novolak resin mixtures and photosensitive compositions comprising the same
05/11/2004US6733948 Negative image-recording material
05/11/2004US6733946 Irradiation photobleaching nanocomposite
05/11/2004US6733937 Exposure method for liquid crystal display device
05/11/2004US6733936 Method for generating a swing curve and photoresist feature formed using swing curve
05/11/2004US6733935 Colored resist material set and color filter
05/11/2004US6733934 Color filter array having a red filter layer
05/11/2004US6733933 Mask for manufacturing semiconductor device and method of manufacture thereof
05/11/2004US6733932 Mask lithography data generation method
05/11/2004US6733931 Symmetrical mask system and method for laser irradiation
05/11/2004US6733930 Photomask blank, photomask and method of manufacture
05/11/2004US6733929 Phase shift masking for complex patterns with proximity adjustments
05/11/2004US6733873 Satisfies requirements for transparency, slipperiness, winding properties, resolution and recyclability; residual polycondensation metal catalyst content of less than 150 ppm, and an antimony content of 15 mmol % or less
05/11/2004US6733686 Method and device for removing an unnecessary film
05/11/2004US6733250 Filter unit, chemical liquid supply system, and chemical liquid supply method
05/11/2004US6733165 Optical integrator for an illumination device
05/11/2004US6733147 Backlighting system for displays
05/11/2004US6732864 Method for measuring strength of image forming surface of planographic printing plate, planographic printing plate and packaging structure for planographic printing plates
05/11/2004US6732649 Methods for providing custom rubber stamps
05/11/2004US6732610 Slide apparatus and its stage mechanism for use in vacuum
05/06/2004WO2004038773A1 Extreme ultraviolet light exposure system and vacuum chamber
05/06/2004WO2004038761A2 Self-aligning contacts for stacked electronics
05/06/2004WO2004038509A2 Lithography system
05/06/2004WO2004038508A1 Electron beam exposure method and electron beam exposure system
05/06/2004WO2004038506A1 Chemically amplified positive photosensitive resin composition
05/06/2004WO2004038505A1 Aqueous developable, photosensitive benzocyclobutene-based oligomers and polymers with high moisture resistance
05/06/2004WO2004038504A2 Nanometer-scale engineered structures, methods and apparatus for fabrication thereof, and applications to mask repair, enhancement, and fabrication
05/06/2004WO2004038503A1 Curable resin composition and flexographic plate material using the curable resin composition
05/06/2004WO2004038502A1 Pattern forming materials and pattern formation method using the materials
05/06/2004WO2004038481A1 Device for holding a beam splitter element
05/06/2004WO2004038467A2 Improvements in or relating to multiple exposures of photosensitive material
05/06/2004WO2004038458A2 Apparatus for producing approximately collimated light and method of curing a photopolymerisable layer using the apparatus
05/06/2004WO2004037885A1 Capsule type hardener and composition
05/06/2004WO2004037877A2 Organosiloxanes
05/06/2004WO2004037866A2 Photoresists containing sulfonamide component