Patents
Patents for G03F 7 - Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printed surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor (127,176)
06/2004
06/03/2004US20040106737 Heat shrinkage photoresist pattern; using mixture of polyvinyl alcohol and another water soluble polymer
06/03/2004US20040106718 Ultraviolet curable silver composition and related method
06/03/2004US20040106692 Resin composition and three dimensional object
06/03/2004US20040106532 Cleaning liquid used in photolithography and a method for treating substrate therewith
06/03/2004US20040106531 Using mixture of hydrogen fluoride salt ,base and acid
06/03/2004US20040106530 Using mixture containing hydroxylamine compound
06/03/2004US20040106298 Development apparatus for manufacturing semiconductor device
06/03/2004US20040106278 Method of eliminating photoresist poisoning in damascene applications
06/03/2004US20040106073 Forming method of resist pattern for improving accuracy of dimension of pattern, manufacturing method of semiconductor apparatus using the same and heat treatment apparatus for the same
06/03/2004US20040106072 Pretreatment; determination, calibration of photoresist dissolving concentration of developer, speed; for semiconductors
06/03/2004US20040106071 Uniformity of pattern
06/03/2004US20040106070 Method to enhance resolution of a chemically amplified photoresist
06/03/2004US20040106068 Lithographic apparatus and device manufacturing method
06/03/2004US20040106067 Miniaturization of electrical and electronic apparatus by forming patterns on photoresists containing acid generators, then exposing, developing and heating, to diffuse acids formed and to equalize glass transition temperature
06/03/2004US20040106066 Pattern-forming process using photosensitive resin composition
06/03/2004US20040106064 Silicon-containing polymer, negative type resist composition comprising the same, and patterning method for semiconductor device using the same
06/03/2004US20040106063 Photoresist solutions comprising mixtures of polymers, acid generators, bases, dissolution inhibitors, curing agents and solvents used in microlithography
06/03/2004US20040106062 Photoacid generators in photoresist compositions for microlithography
06/03/2004US20040106061 temporary supports having thermoplastic resins layers, intermediate layers, and light sensitive recording layers, used to form color filters used in liquid crystal displays or printed circuits
06/03/2004US20040106051 Projectors comprising quartz substrates having light diversion and absorption stacks, and electroconductive layers, that can be chucked to substrate holders to which an electrostatic potential is applied
06/03/2004US20040106050 coating radiation transparent substrates with photoresists, then scanning with lasers light in controlled patterns, development and etching to form optical fibers; communication
06/03/2004US20040106048 Modular containment cell arrangements
06/03/2004US20040105652 Polysilsesquioxane; exposure to actinic radiation; development
06/03/2004US20040105577 Method and system for phase/amplitude error detection of alternating phase shifting masks in photolithography
06/03/2004US20040105177 Method of supporting and adjusting optical element in exposure apparatus
06/03/2004US20040105170 Objective with fluoride crystal lenses
06/03/2004US20040105085 Image formation characteristics adjustment method for projection optical system
06/03/2004US20040105084 Projection system configured to project patterned beam onto target portion of substrate, wherein a space in comprises perhaloalkane and nitrogen compound; damage prevention to optical surfaces
06/03/2004US20040105083 Lithographic apparatus and device manufacturing method
06/03/2004US20040105082 Radiation source, lithographic apparatus and device manufacturing method
06/03/2004US20040105081 Lithographic apparatus, device manufacturing method, and device manufactured thereby
06/03/2004US20040105080 Lithographic apparatus and device manufacturing method
06/03/2004US20040104641 Method of separating a template from a substrate during imprint lithography
06/03/2004US20040104359 Illumination apparatus, exposure method, exposure apparatus, and device manufacturing method
06/03/2004US20040104326 Device for fixing thin and flexible substrates
06/03/2004US20040104206 Methods for preparing ball grid array substrates via use of a laser
06/03/2004US20040104196 Method of forming fine patterns
06/03/2004US20040103950 Liquid quantity determination unit, photolithography apparatus, and liquid quantity determination method
06/03/2004US20040103924 Gas-expanded liquids, methods of use thereof, and systems using gas-expanded liquids for cleaning integrated circuits
06/03/2004US20040103922 Method of high pressure treatment
06/03/2004US20040103917 Method of cleaning by removing particles from surfaces, a cleaning apparatus and a lithographic projection apparatus
06/03/2004US20040103805 Printing plate material
06/03/2004DE10352740A1 Hilfsstrukturmerkmale mit einer unter der Auflösung liegenden Grösse Auxiliary structural features with a sub-resolution size
06/03/2004DE10307381B3 Printing plate recording device with pivoted sensor finger for detecting edge of printing plate incorporated in surface of printing plate exposure drum
06/03/2004DE10253679A1 Optical arrangement used in the production of semiconductor components comprises a lens system arranged behind a mask, and a medium having a specified refractive index lying between the mask and the lens system
06/02/2004EP1424767A2 Magnetic actuator under piezoelectric control
06/02/2004EP1424599A1 Lithographic apparatus and device manufacturing method
06/02/2004EP1424598A1 Lithographic projection apparstus and device manufacturing method
06/02/2004EP1424597A2 Lithographic apparatus and device manufacturing method
06/02/2004EP1424596A2 First approximation for OPC significant speed-up
06/02/2004EP1424595A2 Automatic calibration of a masking process simulator
06/02/2004EP1424577A2 Process for producing polyimide optical waveguide
06/02/2004EP1424537A1 DISPLACEMENT DETECTING METHOD, DISPLACEMENT DETECTING DEVICE AND CALIBRATING METHOD THEREOF, AND RECORDING DEVICE OF INFORMATION RECORDING MEDIUM ORIGINAL DISK
06/02/2004EP1424309A2 Hardened nano-imprinting stamp
06/02/2004EP1424210A1 Photosensitive resin composition for printing plate precursor capable of laser engraving
06/02/2004EP1423759A2 Method and device for control of the data flow on application of reticles in a semiconductor component production
06/02/2004EP1423758A1 A zoom system, in particular, a zoom system for an illumination device of a microlithographic projection system
06/02/2004EP1423757A1 Bathochromic mono- and bis-acylphosphine oxides and sulfides and their use as photoinitiators
06/02/2004EP1423756A2 Method of lift-off microstructuring deposition material on a substrate, substrates obtainable by the method, and use thereof
06/02/2004EP1194815B1 Ceramic blank with a photostructurable functional layer containing platinum and method for production thereof
06/02/2004EP1165704B1 Utilization of phenylglyoxilic acid esters as photoinitiators
06/02/2004EP1085971B1 Application of textured or patterned surfaces to a prototype
06/02/2004CN1502122A Method to restore hydrophobicity in dielectric films and materials
06/02/2004CN1502064A Lithograph with one-dimensional trigger mask and method for production of digital holograms in a storage medium
06/02/2004CN1502063A Process for producing acid sensitive liquid composition containing a carbonate
06/02/2004CN1502062A Composition for forming antireflection film for lithography
06/02/2004CN1501443A Method and apparatus for coating anti-corrosion liquid
06/02/2004CN1501442A Photoresist deposition apparatus and method for forming photoresist film with the same
06/02/2004CN1501179A Cleaning liquid used in photolithography and a method for treating substrate therewith
06/02/2004CN1501177A Developing method and apparatus
06/02/2004CN1501175A Lithographic apparatus and device manufacturing method
06/02/2004CN1501174A Method, inspection system, computer program and reference substrate for detecting mask defects
06/02/2004CN1501173A Lithographic apparatus and device manufacturing method
06/02/2004CN1501172A Lithographic apparatus and device manufacturing method
06/02/2004CN1501171A 曝光装置 Exposure device
06/02/2004CN1501170A Lithographic apparatus and device manufacturing method
06/02/2004CN1501169A Solid state image pickup element and method of manufacturing a solid state pickup element
06/02/2004CN1501168A Lithographic apparatus, device manufacturing method, and device manufactured thereby
06/02/2004CN1501167A Radiation-sensitive resin composition
06/02/2004CN1501166A Radiation-sensitive resin composition
06/02/2004CN1501165A Device manufacturing method with reversed alignment markers
06/02/2004CN1501151A Method for improving contact hole patterning
06/02/2004CN1500911A Lithographic apparatus and method to determine beam size and divergence
06/02/2004CN1500715A Lamination and picture composition method utilizing chemical self-assembly process
06/02/2004CN1152074C Composition for radiation absorption film formation and the antireflection film formed from the same
06/01/2004US6744851 Linear filament array sheet for EUV production
06/01/2004US6744802 Laser oscillating apparatus with slotted waveguide
06/01/2004US6744511 Stage device having drive mechanism for driving a movable stage, and exposure apparatus and method of detecting position of the stage
06/01/2004US6744494 Continuously adjustable neutral density area filter
06/01/2004US6744493 In-vacuum exposure shutter
06/01/2004US6744492 Exposure apparatus
06/01/2004US6744491 Method of and apparatus for recording image by exposure to light beams
06/01/2004US6744490 Device for processing of a strip-shaped workpiece
06/01/2004US6744489 Semiconductor exposure apparatus and method of driving the same
06/01/2004US6744143 Semiconductor device having test mark
06/01/2004US6744060 Pulse power system for extreme ultraviolet and x-ray sources
06/01/2004US6744054 Evacuation use sample chamber and circuit pattern forming apparatus using the same
06/01/2004US6743881 High resolution microlithography; post exposure delay stability; heat resistance; terpolymer containing styrenic, p-vinylphenol and vinylbenzene containing branched ester substitution
06/01/2004US6743851 Polyimide film
06/01/2004US6743735 Photoresist removal from alignment marks through wafer edge exposure