Patents
Patents for G03F 7 - Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printed surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor (127,176)
06/2004
06/23/2004EP0898735B1 Holographic medium and process
06/23/2004CN1507649A Holding device, holding method, exposure device, and device manufacturing method
06/23/2004CN1507582A Resist remover composition
06/23/2004CN1507581A Resist remover composition
06/23/2004CN1507580A Positive type radiosensitive composition and method for forming pattern
06/23/2004CN1507579A Resist compositions with polymors having 2-cyano acrylic monomer
06/23/2004CN1507010A Technology for forming resist pattern, semiconductor device and production thereof
06/23/2004CN1506768A Alignment system and method for photoetching system
06/23/2004CN1506767A Method for detemining photoetching projection parameter, device producing method and device
06/23/2004CN1506766A Method for producing optical etching equipment and devices
06/23/2004CN1506765A Composition for forming conjugated polymer pattern and method for forming conjugated polymer pattern using the same composition
06/23/2004CN1506764A Method and equipment for heightening adhesive surface of film frame with porous filtering inset
06/23/2004CN1506763A Photoetching projector with multi-suppressing silk screen
06/23/2004CN1506762A Exposure equipment
06/23/2004CN1506761A Mask-free nano pattern making method and equipment
06/23/2004CN1506760A Method for producing micro structure
06/23/2004CN1506725A Method for producing colour filter base plate for liquid crystal display device
06/23/2004CN1155055C Novel detergent and cleaning method using it
06/23/2004CN1154869C Optical display device and producing method thereof thermal transfer of a black matrix containing carbon black
06/23/2004CN1154708C Chemical-ray sensitive polymer composition
06/23/2004CN1154695C Composition for manufacturing circuit element and printed circuit board
06/22/2004US6754303 Exposure apparatus and exposing method
06/22/2004US6754302 X-ray exposure apparatus
06/22/2004US6754161 Manufacturing method for optical recording medium and manufacturing device thereof
06/22/2004US6754002 Photolithography methods and systems
06/22/2004US6754000 Optical arrangement, and method for the deflection of light beams
06/22/2004US6753968 Optical storage system based on scanning interferometric near-field confocal microscopy
06/22/2004US6753963 Method of calibration of magnification of optical devices
06/22/2004US6753954 Method and apparatus for detecting aberrations in a projection lens utilized for projection optics
06/22/2004US6753948 Scanning exposure method and apparatus
06/22/2004US6753947 Lithography system and method for device manufacture
06/22/2004US6753946 Lithographic apparatus and device manufacturing method
06/22/2004US6753945 Transfer method for a mask or substrate, storage box, apparatus adapted for use in such method, and device manufacturing method including such a transfer method
06/22/2004US6753943 Scanning exposure apparatus and device manufacturing method using the same
06/22/2004US6753942 Environmental control chamber
06/22/2004US6753941 Lithographic apparatus and device manufacturing method
06/22/2004US6753896 Laser drawing apparatus and laser drawing method
06/22/2004US6753584 Semiconductor structure comprising substrate with antireflective coating comprising metal silicon nitride compound, metal being selected from scandium and cobalt, configured to minimize reflectivity of deep ultraviolet light
06/22/2004US6753540 Lithographic method using variable-area electron-beam lithography machine
06/22/2004US6753534 Positioning stage with stationary and movable magnet tracks
06/22/2004US6753448 Photoresist monomers, polymers thereof and photoresist compositions using the same
06/22/2004US6753240 Semiconductor device production method
06/22/2004US6753133 Method and manufacturing a semiconductor device having a ruthenium or a ruthenium oxide
06/22/2004US6753132 Pattern formation material and pattern formation method
06/22/2004US6753130 Removing mask utilizing thin metal layer as a wet strippable layer or as a plasma etch/ash stop
06/22/2004US6753129 Coating and drying a photosensitive formulation onto a substrate, and photosensitive formulation containing a water inoluble acid decomposable transparent polymer and an acid generating compound upon exposure; exposure and development
06/22/2004US6753128 Blocking acid generation during photolithography
06/22/2004US6753127 Using mixture of norbornene polymer, acid generator and solvent; prebaking, exposure to radiation
06/22/2004US6753126 Polymer for chemically amplified resist and chemically amplified resist composition containing the same
06/22/2004US6753125 Photosensitive polymer having fused aromatic ring and photoresist composition containing the same
06/22/2004US6753124 Radiation-sensitive resin composition
06/22/2004US6753120 Alignment measuring method of photolithography process
06/22/2004US6753118 Optical grating fabrication process
06/22/2004US6753117 Method for reducing line edge roughness of patterned photoresist
06/22/2004US6753116 Multiple photolithographic exposures with different non-clear patterns
06/22/2004US6752966 Microfabrication methods and devices
06/22/2004US6752900 Vacuum loadlock ultraviolet bake for plasma etch
06/22/2004US6752872 Coating unit and coating method
06/22/2004US6752545 Alkali-based treating liquid, treating liquid adjusting method and equipment, treating liquid supplying method and equipment
06/22/2004US6752543 Substrate processing apparatus
06/22/2004US6752080 Sheet material holding device
06/17/2004WO2004051717A1 Illumination optical system, exposure system, and exposure method
06/17/2004WO2004051716A1 Exposure system, exposure method, and device fabricating method
06/17/2004WO2004051714A2 A polymer solution for nanoprint lithography to reduce imprint temperature and pressure
06/17/2004WO2004051709A2 Process for obtaining spatially-organised nanostructures on thin films
06/17/2004WO2004051706A2 ANTI-REFLECTIVE COATING COMPOSITIONS FOR USE WITH LOW k DIELECTRIC MATERIALS
06/17/2004WO2004051380A1 Method for forming resist pattern and resist pattern
06/17/2004WO2004051379A1 Rinse liquid for lithography and method for forming resist pattern using same
06/17/2004WO2004051378A1 Pattern transfer method and exposure system
06/17/2004WO2004051377A1 Device and method for producing flexographic plates using digital imaging, for newspaper printing
06/17/2004WO2004051376A1 Composition for forming antireflection coating
06/17/2004WO2004051375A1 Positive resist composition
06/17/2004WO2004051374A1 Radiation-sensitive resin composition
06/17/2004WO2004051373A2 Developing mixture, and preparation of lithographic printing plates with this developer
06/17/2004WO2004051372A2 Method of forming resist pattern, positive resist composition, and layered product
06/17/2004WO2004051371A2 Template
06/17/2004WO2004051370A1 Transfer mask blank, transfer mask, and transfer method using the transfer mask
06/17/2004WO2004051369A1 Photomask blank, and photomask
06/17/2004WO2004051330A1 Method of forming polymeric optical device structures
06/17/2004WO2004051206A1 Device for the optical mapping of an imaging system
06/17/2004WO2004051184A1 Shape measurement method, shape measurement device, tilt measurement method, stage device, exposure device, exposure method, and device manufacturing method
06/17/2004WO2004050728A2 Method of producing (meth) acrylic acid derivative polymer for resist
06/17/2004WO2004050725A1 Polymer compound, resist composition and dissolution inhibitor agent containing the polymer compound
06/17/2004WO2004050653A2 Oxime ester photoinitiators with heteroaromatic groups
06/17/2004WO2004050266A1 Contaminant removing method and device, and exposure method and apparatus
06/17/2004WO2004034132A3 Radiation welding and imaging apparatus and method for using the same
06/17/2004WO2004031859A3 Comprehensive integrated lithographic process control system based on product design and yield feedback system
06/17/2004WO2004022318A3 Method for making ophthalmic devices
06/17/2004WO2004021084A3 Decal transfer microfabrication
06/17/2004WO2004012232A3 Forming bilayer resist patterns
06/17/2004WO2003107494A3 Gas discharge ultraviolet wavemeter with enhanced illumination
06/17/2004WO2003077030A3 Detection of position and estimation of surface shape
06/17/2004WO2002099531A3 ANTI-REFLECTIVE COATING COMPOSITIONS FOR USE WITH LOW k DIELECTRIC MATERIALS
06/17/2004US20040117757 Method for creating charged-particle-beam exposure data, method for manufacturing semiconductor device, and program
06/17/2004US20040117056 Information processing apparatus, information processing method, and exposure apparatus
06/17/2004US20040117055 Configuration and method for detecting defects on a substrate in a processing tool
06/17/2004US20040116750 Photoresist film
06/17/2004US20040116702 Alkoxylated acyl-and bisacylphoshine derivatives
06/17/2004US20040116549 Solid mixtures of alpha-hydroxycarbonyl derivatives of alpha-methylstyrene oligomers and their use
06/17/2004US20040116548 Compositions for dark-field polymerization and method of using the same for imprint lithography processes