Patents
Patents for G03F 7 - Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printed surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor (127,176)
07/2004
07/08/2004US20040132855 Polymers, methods of use thereof, and methods of decomposition thereof
07/08/2004US20040132303 Membrane 3D IC fabrication
07/08/2004US20040132290 Method for the manufacture of micro structures
07/08/2004US20040132225 Method for reducing dimensions between patterns on a photoresist
07/08/2004US20040131980 Method for forming a pattern and substrate-processing apparatus
07/08/2004US20040131979 Apparatus and method to improve resist line roughness in semiconductor wafer processing
07/08/2004US20040131977 Critical dimension edge placement and slope enhancement with central pixel dose addition and modulated inner pixels
07/08/2004US20040131975 Photosensitive lithographic printing plate and method for making a printing plate
07/08/2004US20040131974 Preventing peppering in nonimage portions; reducing sludge and cleaning load of developer tank; prewashing, exposing, washing with recycled post-exposure water then fresh water
07/08/2004US20040131973 Imaging and developing layer containing binder, acid activated crosslinking agent and acid generator; simplification; infrared sensitive; arsenic and antimony free; easy handling and disposal
07/08/2004US20040131972 Shelf stable image recording materials; water soluble or swellable polymer containing monomer having hydrogen bonding group, ring structure and terminal ethylenic unsaturated side chain and free radical generating compound
07/08/2004US20040131971 Computer data direct recordable by infrared laser; high quality images; press life; support with layer containing carboxlyic acid functionalized acrylate or acrylamide binder, initiator, polyacrylated compound and infrared absorber
07/08/2004US20040131970 Mechanical strength, chemical resistance; blending with adhesion surface treated nanoparticle filler
07/08/2004US20040131968 Containing 2-hydroxyethyl-5-norbornene-2-carboxylate units; etch and heat resistance; substrate adhesiveness; tetramethylammonium hydroxide solution development; polymer and monomer synthesis
07/08/2004US20040131967 Image forming composition and photosensitive lithographic plate using same
07/08/2004US20040131965 Tetraisoprophyl methylene diphosphonate; ultra-UV light absorbance depressant
07/08/2004US20040131964 Thick film containing partially naphthoquinonediazidosulfonyl ester substituted novalak resin and methyl vinyl ether-monoalkyl maleate polymer; high sensitivity and resolution, perpendicular geometry and crack resistance during and after plating
07/08/2004US20040131963 Burr free lift off
07/08/2004US20040131957 Low cost, precise, reliable ink jet printing; rapid refill; optimizing fluid flow, suppressing meniscus vibration; utilizing dehydration crosslinked terpolymer of methyl methacrylate-methacrylic acid-sensitivity region widening factor monomer
07/08/2004US20040131956 Colored photosensitive resin composition and color filter comprising the same
07/08/2004US20040131952 Dry multilayer inorganic alloy thermal resist for lithographic processing and image creation
07/08/2004US20040131951 Mask, manufacturing method for mask, and manufacturing method for semiconductor device
07/08/2004US20040131949 Single ultraviolet radiation exposure
07/08/2004US20040131948 Having antireflective coating on absorber layer
07/08/2004US20040131946 System and method for fabrication and replication of diffractive optical elements for maskless lithography
07/08/2004US20040131843 Nanolithography methods and products therefor and produced thereby
07/08/2004US20040131352 Plate registering system and method of operation
07/08/2004US20040130809 Focusing-device for the radiation from a light source
07/08/2004US20040130806 Catadioptric system and exposure device having this system
07/08/2004US20040130785 Fabrication methods for micro compound optics
07/08/2004US20040130772 Compact imaging head and high speed multi-head laser imaging assembly and method
07/08/2004US20040130711 Method of detecting mask defects, a computer program and reference substrate
07/08/2004US20040130698 Managing method of exposure apparatus, managing method of mask, exposure method, and manufacturing method of semiconductor device
07/08/2004US20040130697 Reflection preventing film modifying apparatus and reflection preventing film modifying method
07/08/2004US20040130696 Method and apparatus for reducing focal-plane deviation in lithography
07/08/2004US20040130695 Kit for converting a photolithography machine for treating semiconductor wafers of certain diameter to a machine for treating semiconductor wafers of larger diameter
07/08/2004US20040130694 Reduced illumination radiation contamination
07/08/2004US20040130693 Lithographic apparatus, optical element and device manufacturing method
07/08/2004US20040130692 Substrate processing apparatus
07/08/2004US20040130690 Alignment system and methods for lithographic systems using at least two wavelengths
07/08/2004US20040130689 Defect compensation of lithography on non-planar surface
07/08/2004US20040130688 Temperature adjustment apparatus, exposure apparatus having the temperature adjustment apparatus, and semiconductor device manufacturing method
07/08/2004US20040130613 Method and and apparatus for imaging with multiple exposure heads
07/08/2004US20040130561 Maskless lithography with multiplexed spatial light modulators
07/08/2004US20040130220 Tube carrier reaction apparatus
07/08/2004US20040129900 Device inspection
07/08/2004US20040129898 Electron beam writing equipment and electron beam writing method
07/08/2004US20040129896 Method and device for generating extreme ultravilolet radiation in particular for lithography
07/08/2004US20040129895 Source multiplexing in lithography
07/08/2004US20040129159 Plate material for printing and printing machine
07/08/2004US20040128918 Control system and method for improving tracking accuracy of a stage through processing of information from previous operations
07/08/2004DE4328838B4 Verfahren zur Herstellung von cyclischen N-Azidosulfonylarylimiden A process for producing cyclic N-Azidosulfonylarylimiden
07/08/2004DE4116519B4 Licht-empfindliche Zusammensetzung Light-sensitive composition
07/08/2004DE19502827B4 Projektions-Belichtungsgerät A projection exposure apparatus
07/08/2004DE10259186A1 Receptacle for measuring instruments, such as interferometers has structural parts attached so that thermal expansion of structural side parts and connects has no effect in measuring direction
07/08/2004DE10255667A1 Strahlungsempfindliche Elemente mit ausgezeichneter Lagerbeständigkeit Radiation-sensitive elements with excellent storage stability
07/08/2004DE10255664A1 Für lithographische Druckplatten geeignete Photopolymerzusammensetzung For lithographic printing plates suitable photopolymer composition
07/08/2004DE10255663A1 Strahlungsempfindliche Elemente A radiation-sensitive elements
07/08/2004DE10253919A1 Verfahren zur Justage eines Substrates in einem Gerät zur Durchführung einer Belichtung A method for adjusting a substrate in an apparatus for performing an exposure
07/07/2004EP1435640A2 Electron beam writing equipment and method
07/07/2004EP1435544A1 Method for forming image through reaction development
07/07/2004EP1435289A1 Plate registering system and method of operation
07/07/2004EP1435022A1 Aqueous developable photoimageable thick film compositions with photospeed enhancer
07/07/2004EP1435021A1 Aqueous developable photoimageable thick film compositions for making photoimageable black electrodes
07/07/2004EP1435020A2 Aqueous developable photoimageable thick film compositions
07/07/2004EP1435012A1 Method for apodizing a planar waveguide grating
07/07/2004EP1435010A1 Photolithographic uv transmitting mixed fluoride crystal
07/07/2004EP1292361A4 Methods utilizing scanning probe microscope tips and products therefor or produced thereby
07/07/2004EP1274581B1 A method and an apparatus for controlling light intensity in connection with the exposure of photosensitive material
07/07/2004EP1089871A4 Directed energy assisted in vacuo micro embossing
07/07/2004CN1511166A Photo initiator compositions
07/07/2004CN1510719A Mask and producing method, producing method for semiconductor device with this mask
07/07/2004CN1510525A Dividing scale focus measuring system and method by multiple interferometric beams
07/07/2004CN1510524A 微晶芯片像素位移方法 Microcrystalline chip pixel displacement method
07/07/2004CN1510523A Impurity shielding with extendable slice
07/07/2004CN1510522A Device manufacturing method
07/07/2004CN1510521A Manufacturing method for photoetching device and component, substrate fixer
07/07/2004CN1510520A Method and apparatus for providing lens aberration compensation by lighting source optimization
07/07/2004CN1510519A Photoetching device with aligning subsystem, manufacturng method for device with alignment and aligning structure
07/07/2004CN1510518A Photoetching device, manufacturing method for the component, and component therefrom
07/07/2004CN1510517A Photoetching device and component producing meethod
07/07/2004CN1510516A Photoetching device, manufacturing method for the component and component therefrom
07/07/2004CN1510515A Photoetching device and method for manufacturing the apparatus
07/07/2004CN1510394A High seeparation sharpness gasometer-type approach sensor
07/07/2004CN1509869A Lithographic printing plate forebody
07/07/2004CN1509838A Method for manufacturing non-lead solder lug
07/07/2004CN1156900C Method and apparatus for quantifying proximity effect by measuring device performance
07/07/2004CN1156389C Mechanism and method for transferring workpieces carriers between distributing box and receiving container
07/07/2004CA2449619A1 Apparatus for producing a printing form
07/06/2004US6760901 Trough adjusted optical proximity correction for dual damascene vias which takes into account the topography on a wafer created by prior wafer processing operations
07/06/2004US6760892 Apparatus for evaluating lithography process margin simulating layout pattern of semiconductor device
07/06/2004US6760641 Discrete time trajectory planner for lithography system
07/06/2004US6760406 Method and apparatus for generating X-ray or EUV radiation
07/06/2004US6760400 Exposing method and semiconductor device fabricated by the exposing method
07/06/2004US6760167 Apparatus, system, and method for precision positioning and alignment of a lens in an optical system
07/06/2004US6760101 Method for inspecting exposure apparatus
07/06/2004US6760095 EUV condenser with non-imaging optics
07/06/2004US6760094 Aligner
07/06/2004US6760093 Image forming method and image forming apparatus
07/06/2004US6760054 Imaging apparatus utilizing laser beams