Patents
Patents for G03F 7 - Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printed surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor (127,176)
07/2004
07/22/2004US20040141185 Compensation of refractivity perturbations in an interferometer path
07/22/2004US20040141168 Imprint lithography template comprising alignment marks
07/22/2004US20040141167 Optimization method of aperture type of projection aligner
07/22/2004US20040141166 Lithographic apparatus, device manufacturing method, and device manufactured thereby
07/22/2004US20040141165 Radiation source, lithographic apparatus, and device manufacturing method
07/22/2004US20040141164 Exposure method and exposure apparatus
07/22/2004US20040141163 Device for holding a template for use in imprint lithography
07/22/2004US20040140440 Illumination system, particularly for EUV lithography
07/22/2004US20040140439 Electrode insulator materials for use in extreme ultraviolet electric discharge sources
07/22/2004US20040140436 Transfer method and apparatus, exposure method and apparatus, method of manufacturing exposure apparatus, and device manufacturing method
07/22/2004US20040140418 System and method for lithography process monitoring and control
07/22/2004US20040139874 Conveying device
07/22/2004DE10361649A1 Verfahren zum Herstellen einer Flüssigkristallanzeigevorrichtung A method of manufacturing a liquid crystal display device
07/22/2004DE10361273A1 Vorrichtung und Verfahren zum Verbessern der Resistlinienrauhheit bei der Bearbeitung von Halbleiterscheiben Apparatus and method for improving the resist line roughness in the machining of semiconductor wafers
07/22/2004DE10356663A1 Übertragung von Strukturen bei der Herstellung von Bauelementen Transfer of structures in the manufacture of components
07/22/2004DE10334434A1 Verfahren und Gerät zum Reinigen eines Halbleitersubstrats Method and apparatus for cleaning a semiconductor substrate
07/22/2004DE10261845A1 Verfahren zur Behandlung eines Resistsystems und Vorrichtung dafür A method for treating a resist system and apparatus therefor
07/22/2004DE10260755A1 Verfahren zur Bildung eines Strukturelementes auf einem Wafer mittels einer Maske und einer ihr zugeordneten Trim-Maske A method for forming a structural element on a wafer with a mask and a trim mask assigned
07/22/2004DE10260235A1 Verfahren zum Aufbringen einer Resistschicht, Verwendungen von Klebematerialien sowie Klebematerialien und Resistschicht A method of applying a resist layer, uses of adhesive materials and adhesive materials and resist layer,
07/22/2004DE10259025A1 Verfahren zum Betreiben einer Entwicklermaschine und Entwicklermaschine Method for operating a developer machine and developing machine
07/22/2004DE10254990A1 Verfahren zum Entfernen von organischen Rückständen von feinstrukturierten Oberflächen A method for removing organic residues finely structured surfaces
07/22/2004CA2511790A1 Radiation curable aqueous compositions
07/22/2004CA2505474A1 Method for modifying the surface of a polymeric substrate
07/21/2004EP1439578A2 Method for dicing wafer
07/21/2004EP1439428A2 Level sensor for lithographic apparatus
07/21/2004EP1439427A2 Shearing interferometer for euv wavefront measurement
07/21/2004EP1439426A2 Diffuser plate and method of making same
07/21/2004EP1439425A1 Lithographic projection apparatus and device manufacturing method
07/21/2004EP1439424A2 Detection assembly and lithographic projection apparatus provided with such a detection assembly
07/21/2004EP1439423A2 Photosensitive lithographic printing plate
07/21/2004EP1439422A1 Method of forming fine pattern
07/21/2004EP1439421A2 Perfluoropolyether liquid pellicle and methods of cleaning masks using perfluoropolyether liquid
07/21/2004EP1439420A1 Simulation based method of optical proximity correction design for contact hole mask
07/21/2004EP1439419A2 Method and apparatus for providing optical proximity correction features to a reticle pattern for optical lithography
07/21/2004EP1439418A2 Embedded etch stop for phase shift masks and planar phase shift masks to reduce topography induced and wave guide effects
07/21/2004EP1439058A2 Planographic printing plate precursor
07/21/2004EP1439057A1 Image forming method
07/21/2004EP1438774A2 Very narrow band, two chamber, high rep rate gas discharge laser system
07/21/2004EP1438772A2 Line selected f 2? two chamber laser system
07/21/2004EP1438738A2 Methods and apparatus for patterning a surface
07/21/2004EP1438725A1 Optical element and method for its manufacture as well as lightography apparatus and method for manufacturing a semiconductor device
07/21/2004EP1438637A2 Lithographic apparatus and device manufacturing method
07/21/2004EP1438636A2 Real-time prediction of and correction of proyimity resist heating in raster scan particle beam lithography
07/21/2004EP1438635A1 Fluorinated polymers having ester groups and photoresists for microlithography
07/21/2004EP1438634A1 Holographic recording material and method for creating a light-resistant hologram
07/21/2004EP1438633A2 Method for forming elliptical and rounded mask features using beam shaping
07/21/2004EP1438628A2 Method and device for reducing speckle in an optical system
07/21/2004EP1438347A1 Deodorizing agent for sulfur- or nitrogen-containing initiators
07/21/2004EP1438128A2 Methods of patterning a monolayer
07/21/2004EP1376242A9 Over-coating agent for forming fine patterns and a method of forming fine patterns using it
07/21/2004EP1360881B1 Method for producing wirings with rough conducting structures and at least one area with fine conducting structures
07/21/2004EP1269261B1 Solid imaging compositions for preparing polypropylene-like articles
07/21/2004EP0900674A4 Method for forming a micro-relief on a metallic article and variants
07/21/2004CN2627537Y Thin film semiconductor device, electrolight device and intermediate mask
07/21/2004CN1514956A Thick film photoresists and methods for use thereof
07/21/2004CN1514955A Lithographic template
07/21/2004CN1514954A Semiconductor package and method of preparing same
07/21/2004CN1514953A Exposure control for phase shifting photolithographic masks
07/21/2004CN1514943A Preferred crystal orientation optical elements from cubic materials
07/21/2004CN1514845A Oxime ester photoinitiatros having combined structure
07/21/2004CN1514675A Mask and its mfg. method, electroluminescent apparatus and its mfg. method, and electronic apparatus
07/21/2004CN1514307A Photoetching projection device
07/21/2004CN1514306A Manufacturing method of photoetching equipment and device, and device obtained therefrom
07/21/2004CN1514305A Manufacturing method of photoctching equipment having residue inhibiting device and device
07/21/2004CN1514303A Graph of liquid crystal display device and its forming method
07/21/2004CN1514302A Improved photo anticorrosion agent
07/21/2004CN1514301A 改进的光引发剂 Improved photoinitiators
07/21/2004CN1514280A Colour filter of liquid crystal display and liquid crystal display using said colour filter
07/21/2004CN1513884A Photopolymerization initiator and composition capable of photopolymerization
07/21/2004CN1158570C Phase shifting mask etching process of producing T-shaped grid through one photo-etching step
07/21/2004CN1158569C Positive photo-resist composition
07/21/2004CN1158161C Laser processing power output stabilization method
07/20/2004US6766507 Mask/wafer control structure and algorithm for placement
07/20/2004US6766339 Method and system for efficient and accurate filtering and interpolation
07/20/2004US6766212 Identifying relationships among constituent parts of a wafer fabrication system
07/20/2004US6766211 Mmeasuring and controlling single nanometer alignment; using unique mark combined with mathematical analysis
07/20/2004US6765946 Fan for gas discharge laser
07/20/2004US6765945 Injection seeded F2 laser with pre-injection filter
07/20/2004US6765934 Laser repetition rate multiplier
07/20/2004US6765729 Catadioptric reduction lens
07/20/2004US6765724 Diffraction grating-based wavelength selection unit having improved polarization dependent performance
07/20/2004US6765717 Preferred crystal orientation optical elements from cubic materials
07/20/2004US6765712 Lithographic apparatus, device manufacturing method, and device manufactured thereby
07/20/2004US6765683 Interferometer system and method of manufacturing projection optical system using same
07/20/2004US6765673 Pattern forming method and light exposure apparatus
07/20/2004US6765651 Fast image simulation for photolithography
07/20/2004US6765650 Vacuum compatible air bearing stage
07/20/2004US6765649 Exposure apparatus and method
07/20/2004US6765647 Exposure method and device
07/20/2004US6765645 De-pellicle tool
07/20/2004US6765604 Banding-reduced imaging of a printing form
07/20/2004US6765282 Semiconductor structure and method for determining critical dimensions and overlay error
07/20/2004US6765279 Membrane 3D IC fabrication
07/20/2004US6765267 Pixel structure
07/20/2004US6765218 Lithographic projection apparatus with positioning system for use with reflectors
07/20/2004US6765204 Microstructured pattern inspection method
07/20/2004US6765061 Holography; polyurethane coating; waterproofing
07/20/2004US6764964 Method for forming patterns of a semiconductor device
07/20/2004US6764946 Method of controlling line edge roughness in resist films
07/20/2004US6764944 Low viscosity antireflectivity pattern