Patents
Patents for G03F 7 - Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printed surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor (127,176)
08/2004
08/19/2004US20040161711 Stable non-photosensitive polyimide precursor compositions for use in bilayer imaging systems
08/19/2004US20040161710 Pattern formation method
08/19/2004US20040161707 Photomask and pattern forming method employing the same
08/19/2004US20040161706 Flash memory with reduced source resistance and fabrication method thereof
08/19/2004US20040161705 Relief images; applying curable compound
08/19/2004US20040161702 For fabricating circuitized substrates which reduces the formation of shorts
08/19/2004US20040161699 For providing relief images of enhanced resolution
08/19/2004US20040161698 Provide contrast upon exposure to photogenerated acid; photoimageable
08/19/2004US20040161697 For use in the production of a semiconductor
08/19/2004US20040161679 Loading into layout processing software the GDS data for two layers that define a transistor; generating a phase mask; inputting gate block data that includes assigned phase areas and polygate areas; generating a trim mask; providing a modified GDS
08/19/2004US20040161678 For forming a fine pattern in fabrication of semiconductor integrated circuit devices
08/19/2004US20040161677 Phase shift mask, method for forming pattern using phase shift mask and manufacturing method for electronic device
08/19/2004US20040161619 Overcoating substrate with polyamic acid and polylactone; baking while controlling temperature; then coating with photoresist; exposure to radiation; development
08/19/2004US20040160777 Illumination device, and coordinate measuring instrument having an illumination device
08/19/2004US20040160677 Catadioptric reduction lens
08/19/2004US20040160666 Catadioptric projection system for 157 nm lithography
08/19/2004US20040160653 Systems and methods for correcting for spherical aberration in a scanning imaging system
08/19/2004US20040160592 Scanning exposure apparatus
08/19/2004US20040160591 Diaphragm for an integrator unit
08/19/2004US20040160588 Method of determining stray radiation lithographic projection apparatus
08/19/2004US20040160587 Optical magnification adjustment system and projection exposure device
08/19/2004US20040160586 Exposure Method and Apparatus with Vibration-Preventative Control
08/19/2004US20040160585 Lithographic apparatus and device manufacturing method
08/19/2004US20040160584 Exposure apparatus and purging method for the same
08/19/2004US20040160583 Lithographic apparatus, device manufacturing method, and device manufactured thereby
08/19/2004US20040160582 Lithographic apparatus and device manufacturing method
08/19/2004US20040160203 System for reducing the effect of reactive forces on a stage using a balance mass
08/19/2004US20040160155 Discharge produced plasma EUV light source
08/19/2004US20040160132 System and method to reduce the effect of reactive forces on a stage using a balance mass
08/19/2004US20040159914 Method of deforming a pattern and semiconductor device formed by utilizing deformed pattern
08/19/2004US20040159890 Method of deforming a pattern and semiconductor device formed by utilizing deformed pattern
08/19/2004US20040159838 Method of deforming a pattern and semiconductor device formed by utilizing deformed pattern
08/19/2004US20040159636 Data path for high performance pattern generator
08/19/2004US20040159633 Methods of etching articles via micro contact printing
08/19/2004US20040159404 Apparatus for forming a photosensitive element having a layer of particulate material
08/19/2004US20040159397 Method and apparatus for controlling photolithography overlay registration incorporating feedforward overlay information
08/19/2004US20040159335 Radiation in the radio or microwave portion of the electromagnetic spectrum is applied to a substrate housed within a pressurized processing chamber to promote desirable chemical reactions involving the substrate; e.g., stripping doped photoresists
08/19/2004US20040158973 Spin-valve giant magnetoresistive head and method of manufacturing the same
08/19/2004DE10353029B3 Displacement spindle length variation measuring method, for printing plate exposure device, uses measurement of stepping motor clock pulses for displacement of exposure head carrier along reference path
08/19/2004DE10302111A1 Bebilderbare Elemente und Zusammensetzungen für Bebilderung mittels UV-Bestrahlung Imageable elements and compositions for imaging by means of UV irradiation
08/19/2004DE10258423A1 Verfahren und Maske zur Charakterisierung eines Linsensystems Process and mask for the characterization of a lens system
08/18/2004EP1447902A2 Linear motor, stage apparatus, exposure apparatus and device manufacturing method
08/18/2004EP1447838A2 System and method to reduce the effect of reactive forces on a stage using a balance mass
08/18/2004EP1447717A2 Exposure apparatus, cooling method and device manufacturing method
08/18/2004EP1447716A2 Lithographic apparatus with gas flushing system
08/18/2004EP1447715A2 Lithographic apparatus and method to detect correct clamping of an object
08/18/2004EP1447714A2 Method for generating a circular periodic structure on a basic support material
08/18/2004EP1447713A1 Electrode-forming composition for field emission type of display device and method using such a composition
08/18/2004EP1447712A1 METHODS OF PRODUCING PHOTOSENSITIVE CERAMIC COMPOSITION AND MULTI−LAYER SUBSTRATE USING IT
08/18/2004EP1447711A2 Photomask, pattern formation method using photomask and mask data creation method
08/18/2004EP1447440A1 Composition for cleaning
08/18/2004EP1447403A1 5-methylene-1,3-dioxolan-4-one derivatives, process for their production, polymers of the derivatives, resist compositions, and pattern formation process
08/18/2004EP1447238A2 Printing plate material, process of folding the same, and printing process
08/18/2004EP1447217A2 Heat-sensitive lithographic printing plate
08/18/2004EP1446829A2 Method for forming a structure in a semiconductor substrate
08/18/2004EP1446703A2 Optical spot grid array printer
08/18/2004EP1446702A2 Maskless printer using photoelectric conversion of a light beam array
08/18/2004EP1446701A1 Method for improving sensitometric response of photosensitive imaging media employing microcapsules
08/18/2004EP1446700A2 ANTI-REFLECTIVE COATING COMPOSITIONS FOR USE WITH LOW k DIELECTRIC MATERIALS
08/18/2004EP1446698A1 An interferometer system for a semiconductor exposure system
08/18/2004EP1446460A1 Aqueous cleaning composition containing copper-specific corrosion inhibitor for cleaning inorganic residues on semiconductor substrate
08/18/2004EP1446410A1 Multimer forms of acylphosphines and their derivatives
08/18/2004EP1353802B1 Method for the production of thermally cross-linked laser engravable flexographic elements and multi-layer composites
08/18/2004EP0927381B1 Phase shifting circuit manufacturing method and device
08/18/2004CN2634643Y Coated screen back side exposure device of color dispaly tube
08/18/2004CN1522484A Line narrowing unit with flexural grating mount
08/18/2004CN1522390A Electron beam exposure method and system therefor
08/18/2004CN1522389A Method of measuring critical dimension and overlay in single step
08/18/2004CN1522388A Photosensitive resin composition, method for producing pattern and electronic parts
08/18/2004CN1522387A Photosensitive resin composition and photosensitive dry film resist and photosensitive cover ray film using the same
08/18/2004CN1522381A Projection optical system and exposure device having the projection optical system
08/18/2004CN1522203A Photosenstivie resin compositive for printing plate precursor capable of laser engraving
08/18/2004CN1521803A Method for manufacturing semiconductor device
08/18/2004CN1521567A Lithographic apparatus and method to detect correct clamping of an object
08/18/2004CN1521566A Method of simulating patterns, computer program therefor, medium storing the computer program and pattern-simulating apparatus
08/18/2004CN1521565A Electronic device manufacture
08/18/2004CN1521564A Exposure unit and method for fabricating color light filter thereof
08/18/2004CN1162899C Monocrystalline silicon wafer crystal orientation calibrating method
08/18/2004CN1162754C Pattern forming material, pattern forming method, and manufacture method of mask for exposure
08/18/2004CN1162753C Polymer for chemically amplified resist and resist composition using the same
08/18/2004CN1162752C Cross linking agent for photoresist, and photoresist combination containing the same
08/18/2004CN1162745C Active matrix substrate, display device and image sensor
08/18/2004CN1162311C System for conveying and supporting sheets
08/17/2004US6779171 Field correction of overlay error
08/17/2004US6778911 Real time analysis of periodic structures on semiconductors
08/17/2004US6778753 Used to fabricate planar optical waveguides with low loss and low birefringence
08/17/2004US6778584 High power gas discharge laser with helium purged line narrowing unit
08/17/2004US6778285 Automatic in situ pellicle height measurement system
08/17/2004US6778260 Coordinate measuring stage and coordinate measuring instrument
08/17/2004US6778258 Wafer handling system for use in lithography patterning
08/17/2004US6778257 Imaging apparatus
08/17/2004US6778255 Exposure apparatus
08/17/2004US6777896 Methods and apparatus for initializing a planar motor
08/17/2004US6777698 Electron beam exposure apparatus exposing method using an electron beam
08/17/2004US6777697 Charged-particle beam exposure apparatus and device manufacturing method using the same
08/17/2004US6777694 Electron beam exposure system and electron lens
08/17/2004US6777693 Lithographic method using ultra-fine probe needle
08/17/2004US6777380 Stripping photoresists
08/17/2004US6777345 Patterning methods for fabricating semiconductor devices
08/17/2004US6777344 Post-etch photoresist strip with O2 and NH3 for organosilicate glass low-K dielectric etch applications