Patents
Patents for G03F 7 - Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printed surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor (127,176)
09/2004
09/16/2004WO2004079454A1 Photosensitive resin composition and cured coating film
09/16/2004WO2004079453A1 Resist material for liquid immersion exposure process and method of forming resist pattern with the resist material
09/16/2004WO2004079452A1 Photosensitive resin composition and curing product thereof
09/16/2004WO2004079451A2 Method for creating lithophane-type images from digital images
09/16/2004WO2004079450A1 Method for manufacturing a patterned structure
09/16/2004WO2004078930A2 Nanometer-controlled polymeric thin films that resist adsorption of biological molecules and cells
09/16/2004WO2004078803A1 Polymer and positive type resist composition
09/16/2004WO2004078703A1 Acid generators, sulfonic acids, sulfonyl halides, and radiation-sensitive resin compositions
09/16/2004WO2004078688A1 Alicyclic unsaturated compound, polymer, chemically amplified resist composition and method for forming pattern using said composition
09/16/2004WO2004059394A3 Determining lithographic parameters to optimise a process window
09/16/2004WO2004057421A3 Process for the production of negative working lithographic printing plate precursors with a coating comprising diazo resin
09/16/2004WO2004050653A3 Oxime ester photoinitiators with heteroaromatic groups
09/16/2004WO2004006021A3 Optical device comprising an light source
09/16/2004WO2003099463A3 Method and device for transferring a pattern from a stamp to a substrate
09/16/2004WO2003092256A3 Projection method and projection system comprising an optical filtering process
09/16/2004WO2003087945A3 Interferometric measuring device and projection illumination installation comprising one such measuring device
09/16/2004WO2003082937A9 Polymerisable composition
09/16/2004WO2003067334A3 Polarisation-optimised illumination system
09/16/2004US20040181770 Method and apparatus for controlling rippling during optical proximity correction
09/16/2004US20040181768 Model pattern simulation of semiconductor wafer processing steps
09/16/2004US20040181728 Methods and systems for estimating reticle bias states
09/16/2004US20040181097 Allowing a compound having a hydroxyl group to react with an alkenyl ether compound in presence of an acid catalyst; forming a protected hydroxy compound
09/16/2004US20040181023 Novel thiol compound, copolymer and method for producing the copolymer
09/16/2004US20040180984 Composition for forming a conjugated polymer pattern and process of forming a conjugated polymer pattern using the same
09/16/2004US20040180537 Semiconductor processing methods of forming and utilizing antireflective material layers, and methods of forming transistor gate stacks
09/16/2004US20040180435 Process for producing a substrate for attachment of cells and a substrate for attachment of cells
09/16/2004US20040180300 Photoresist removal
09/16/2004US20040180299 supercritical and/or liquid carbon dioxide may be used at various steps in an immersion lithography process and, thereby, replace the use of some or all solvents that have been heretofore been used
09/16/2004US20040180297 spacing between neighboring lines is reduced to be less than the resolution limit of a lithographic process, thereby increasing the integration density of the semiconductor device
09/16/2004US20040180295 Method for fabricating a dual damascene structure using a single photoresist layer
09/16/2004US20040180294 Lithographic printing with polarized light
09/16/2004US20040180293 Cleaning solution for photoresist and method for forming pattern using the same
09/16/2004US20040180291 lithographic printing plate precursors; suited for use with direct digital ultraviolet imaging devices
09/16/2004US20040180290 Planographic printing plate precursor and its fixing method on plate cylinder
09/16/2004US20040180288 Postitive resist composition
09/16/2004US20040180287 Fluorinated polymers having ester groups and photoresists for microlithography
09/16/2004US20040180286 Photosensitive resin composition, process of forming patterns with the same, and electronic components
09/16/2004US20040180278 measuring a change of transmittance depending on a light path of the projection optical system, based on a pattern image of the diffraction light transferred to the wafer
09/16/2004US20040180277 Substrate treating method and apparatus
09/16/2004US20040180276 Determining the maximum number of dies fitting on a semiconductor wafer
09/16/2004US20040180273 Methods of forming aligned structures with radiation-sensitive material
09/16/2004US20040180272 Methods of printing structures
09/16/2004US20040180270 Container for a mask, method of transferring lithographic masks therein and method of scanning a mask in a container
09/16/2004US20040180226 Radiation curable aqueous compositions for low extractable film packaging
09/16/2004US20040180142 For forming a coating film on a polygonal substrate by spin coating in an ambient with a descending clean air flow
09/16/2004US20040180141 For coating a coating solution and removing an unnecessary coating solution deposited on the side and back surfaces of a quadrangular substrate
09/16/2004US20040179922 Apparatus for loading and unloading a supply of plates in an automated plate handler
09/16/2004US20040179808 Particle guidance system
09/16/2004US20040179726 Process for detecting defects in photomasks
09/16/2004US20040179564 Method for manufacturing an optical element having a structured surface, such optical element, and projection illumination system having such an optical element
09/16/2004US20040179560 Gas discharge laser light source beam delivery unit
09/16/2004US20040179272 Objective with lenses made of a crystalline material
09/16/2004US20040179270 Illumination system and method for efficiently illuminating a pattern generator
09/16/2004US20040179269 Beam shaping element for use in a lithographic system
09/16/2004US20040179192 Positioning apparatus, exposure apparatus, and method for producing device
09/16/2004US20040179190 Optical properties measurement method, exposure method, and device manufacturing method
09/16/2004US20040179184 Lithographic apparatus with alignment subsystem, device manufacturing method, and device manufactured thereby
09/16/2004US20040179183 Lithographic apparatus, device manufacturing method and substrate holder
09/16/2004US20040179182 Lithographic apparatus with debris suppression, and device manufacturing method
09/16/2004US20040179180 Exposure apparatus, exposure method, and device manufacturing method
09/16/2004US20040179179 Exposure apparatus
09/16/2004US20040179178 Processing apparatus for processing object in vessel
09/16/2004US20040179177 Exposure method
09/16/2004US20040179176 Exposure apparatus
09/16/2004US20040179175 Exposure apparatus and aberration correction method
09/16/2004US20040179174 Method and device for controlling fluid flow in an optical assembly
09/16/2004US20040179173 Multi-stage type processing apparatus
09/16/2004US20040179086 Image recording apparatus
09/16/2004US20040179050 Pattern drawing apparatus and pattern drawing method for forming patterns, that have mirror image relationship to each other with respect to a substrate, on both sides of the substrate, and test apparatus for use in the pattern drawing apparatus
09/16/2004US20040178986 Recording material and image forming method
09/16/2004US20040178570 Device and method for detecting the edge of a recording material
09/16/2004US20040178405 Emitter for electron-beam projection lithography system and manufacturing method thereof
09/16/2004US20040178366 Electron-beam drawing apparatus and electron-beam drawing method
09/16/2004US20040178365 Electrode in a discharge produced plasma extreme ultraviolet source
09/16/2004US20040178364 Electron beam lithography apparatus using a patterned emitter and method of fabricating the patterned emitter
09/16/2004US20040178362 Lithographic apparatus and method of manufacturing a device
09/16/2004US20040177867 Tetra-organic ammonium fluoride and HF in supercritical fluid for photoresist and residue removal
09/16/2004US20040177782 Flexographic printing
09/16/2004US20040177520 Positioning apparatus
09/16/2004DE20122196U1 Imprint lithography template for producing microelectronic devices, has multiple recesses of specified size and alignment marks and is transparent to activating light
09/16/2004DE20122179U1 Patterning method used in semiconductor device manufacture involves forming light curable liquid between template and substrate, curing the liquid and forming a pattern of template in the liquid, and separating template from liquid
09/16/2004DE10351977A1 Maskenmanagementvorrichtung in einem Halbleiter-Wafer-Herstellungsverfahren Mask management device in a semiconductor wafer manufacturing process
09/16/2004DE10310168A1 Wässrige Entwicklerlösung für Offset-Druckplatten Aqueous solution developer for offset printing plates
09/16/2004DE10310136A1 Set of masks for projection of structure patterns on each mask to photosensitive layer on semiconductor wafer as trim or correction mask in lithographic process in manufacture of integrated circuits
09/16/2004DE10309084A1 Reflektives optisches Element und EUV-Lithographiegerät The reflective optical element and EUV lithography machine
09/16/2004DE10308271A1 Verfahren und System zum Verbessern der Belichtungsgleichförmigkeit in einem schrittweisen Belichtungsprozess A method and system for improving the Belichtungsgleichförmigkeit in a stepwise exposure process
09/16/2004DE10307453A1 Oxazol-Derivate enthaltende strahlungs empfindliche Zusammensetzungen und darauf basierende bebilderbare Elemente Oxazole derivatives containing radiation- sensitive compositions and imageable elements based thereon
09/16/2004DE10307451A1 Strahlungsempfindliche Zusammensetzungen und darauf basierende bebilderbare Elemente Radiation-sensitive compositions and imageable elements based thereon
09/16/2004DE102004009336A1 Verfahren zum Unterdrücken eines Lithographievorgangs am Rand einer Halbleiterscheibe A method of suppressing a lithography process at the edge of a semiconductor wafer
09/16/2004CA2518457A1 Photosensitive resin composition and curing product thereof
09/15/2004EP1458066A2 Line selected F2 two chamber laser system
09/15/2004EP1458015A2 Spin coating apparatus for coating photoresist
09/15/2004EP1458013A1 A method and an apparatus for determining a position of a substrate relative to a support stage
09/15/2004EP1457979A2 Electron beam recording substrate
09/15/2004EP1457838A1 Method to reduce precipitation in developers for lithographic printing plates
09/15/2004EP1457837A2 Developing solution for heat-sensitive lithographic printing plate precursor and method for peparing lithographic printing plate
09/15/2004EP1457836A2 Developing solution for lithographic printing plate precursor and method for preparing lithographic printing plate
09/15/2004EP1457835A2 Exposure apparatus
09/15/2004EP1457834A2 Positioning apparatus, exposure apparatus and method for producing device
09/15/2004EP1457833A2 Lithographic apparatus, device manufacturing method, and device manufactured thereby