Patents
Patents for G03F 7 - Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printed surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor (127,176)
10/2004
10/14/2004US20040200411 Apparatus for fabricating nanoscale patterns in light curable compositions using an electric field
10/14/2004US20040200369 Method and system for printing press image distortion compensation
10/14/2004US20040200226 Exposure apparatus
10/14/2004DE4102731B4 Lithographieeinrichtung zum direkten Beschreiben eines Subtrates Lithography for directly describing a Subtrates
10/14/2004DE19906421B4 Verfahren zur Verminderung von Unschärfen und zur Einstellung der optischen Auflösung eines Belichtungsgerätes A method for reducing blur and to adjust the optical resolution of an exposure apparatus
10/14/2004DE10314104A1 Catadioptric projection lens for semiconductor photolithography, has device for absorbing stray light passing through beam splitter, comprising absorbing medium such as eloxal
10/14/2004DE10311855A1 Appliance for transfer of information or structures onto wafer, using stamp with raised structures produced by suitable method, e.g. photolithography in conjunction with etching
10/14/2004DE10297564T5 Verfahren und Vorrichtung zum Steuern der Photolithographie-Überlagerungsjustierung mit vorwärtsgekoppelter Überlagerungsinformation Method and apparatus for controlling the photolithography overlay adjustment with feedforward overlay information
10/14/2004CA2516603A1 Maskless optical interferometric lithography
10/13/2004EP1467554A2 Method and system for printing press image distortion compensation.
10/13/2004EP1467256A1 Device manufacturing method and mask set for use in the method
10/13/2004EP1467255A1 Lithographic apparatus, device manufacturing method and computer program
10/13/2004EP1467254A1 Lithographic apparatus and device manufacturing method
10/13/2004EP1467253A1 Lithographic apparatus and device manufacturing method
10/13/2004EP1467252A1 Device manufacturing method and mask set for use in the method
10/13/2004EP1467251A1 Positive resist composition
10/13/2004EP1467250A2 Photosensitive composition and litographic printing plate precursor
10/13/2004EP1467249A2 Resin composition, optical filter and plasma display
10/13/2004EP1466893A1 Polymerizable composition and compound therefor
10/13/2004EP1466216A1 Process for producing an image using a first minimum bottom antireflective coating composition
10/13/2004EP1466215A1 Negative deep ultraviolet photoresist
10/13/2004EP1466214A2 Negative-working photoimabeable bottom antireflective coating
10/13/2004EP1466213A2 Fabrication of high resolution biological molecule detection device
10/13/2004EP1466212A1 Multi-image reticles
10/13/2004EP1465877A1 Positive-working photoimageable bottom antireflective coating
10/13/2004EP1347461A4 Device for x-ray lithography
10/13/2004EP1086030A4 Smif pod including independently supported wafer cassette
10/13/2004EP0910612B1 Curing process for cationically photocurable formulations
10/13/2004CN1537124A Polymer suitable for photoresist compositons
10/13/2004CN1536640A Method for positioning substratge relatively to supporting table and its equipment
10/13/2004CN1536638A Method for defining substrate position prelatively to supporting table and equipment
10/13/2004CN1536624A Stripping device and method for protective layer
10/13/2004CN1536618A Method for mfg. semiconductor device
10/13/2004CN1536447A Photoresist removing composite
10/13/2004CN1536445A Photoetching equipment, device mfg. method and computer program
10/13/2004CN1536444A Functional polymer
10/13/2004CN1536443A Positive type photo erosion resistant agent composition used for outlet spray nozzle coating method and forming method anticorrosion picture
10/13/2004CN1536442A 正型光敏树脂组合物 The positive-type photosensitive resin composition
10/13/2004CN1536441A Optical cover process and method for making film transistor
10/13/2004CN1536437A Corrosion-proof film forming method and photomask making method
10/13/2004CN1536417A Method for making liquid crystal display panel
10/13/2004CN1536416A Method for making flm transistor liquid crystal display
10/13/2004CN1535965A cyanine compound, filter and optical recording material
10/13/2004CN1535763A Base plate processing device, coating device and coading method
10/13/2004CN1171288C Removal of photoresist and residue from substrate using supercritical carbon dioxide process
10/13/2004CN1171287C Trench-open on semiconductor substrate, method for making deep slot and opening contact hole
10/13/2004CN1171126C Optical proximity effect correcting method
10/13/2004CN1171125C Copolymer with nitrile and alcyl group and photoresist composition containing the copolymer
10/13/2004CN1171124C Radiation-sensitive resin composition
10/13/2004CN1171123C A process for making photoactive compound and photoresist therefrom
10/13/2004CN1171122C Optical polymerism composition
10/13/2004CN1170695C Component delivery device and method for mfg. planographic printing plate
10/12/2004US6804327 Method and apparatus for generating high output power gas discharge based source of extreme ultraviolet radiation and/or soft x-rays
10/12/2004US6804323 Mask pattern magnification correction method, magnification correction apparatus, and mask structure
10/12/2004US6804288 Electron beam exposure apparatus and electron beam deflection apparatus
10/12/2004US6804014 Method and apparatus for determining contact opening dimensions using scatterometry
10/12/2004US6804005 Overlay measurements using zero-order cross polarization measurements
10/12/2004US6803996 Device manufacturing-related apparatus, gas purge method, and device manufacturing method
10/12/2004US6803995 Projecting energy beam through lithographic mask to form setting target; measuring defocus sensitive dimension and adjusting; semiconductor wafers for microelectronic circuits
10/12/2004US6803994 Wavefront aberration correction system
10/12/2004US6803993 Lithographic apparatus and device manufacturing method
10/12/2004US6803992 Projection exposure apparatus
10/12/2004US6803991 Exposure amount control method in exposure apparatus
10/12/2004US6803990 Exposure apparatus and pressure correction method
10/12/2004US6803589 Apparatus and method applied to exposure by charged beam
10/12/2004US6803554 System and method for lithography process monitoring and control
10/12/2004US6803434 Providing a reaction mixture of an ethylenically unsaturated anhydride monomer, a ethylenically unsaturated non-anhydride monomer, a free radical initiator and an alkyl substituted tetrahydrofuran solvent, polymerizing the reaction mixture
10/12/2004US6803392 Photoinitiator formulations
10/12/2004US6803316 Method of planarizing by removing all or part of an oxidizable material layer from a semiconductor substrate
10/12/2004US6803292 Method for manufacturing a semiconductor device and semiconductor device with overlay mark
10/12/2004US6803178 Two mask photoresist exposure pattern for dense and isolated regions
10/12/2004US6803176 Methods for forming line patterns in semiconductor substrates
10/12/2004US6803175 Method of producing pattern-formed structure and photomask used in the same
10/12/2004US6803174 Forming photosensitive dielectric film pattern; reflection electrode; liquid crystals display
10/12/2004US6803173 A polymer having a silicon atom in a side chain, which is insoluble in aqueous alkali solution and becomes soluble in aqueous alkali solution by the action of an acid, generated by acid generator on exposure to active light radiation
10/12/2004US6803172 Organic anti-reflective coating material and preparation thereof
10/12/2004US6803171 For forming relief images; manufacturing electronic and optoelectronic device; useful as photoresists
10/12/2004US6803170 Resist composition and method for manufacturing semiconductor device using the resist composition
10/12/2004US6803169 Deep ultraviolet radiation photoresists
10/12/2004US6803168 Composition for anti-reflective coating or radiation absorbing coating and compounds used in the composition
10/12/2004US6803167 Preparation of lithographic printing plates
10/12/2004US6803160 Multi-tone photomask and method for manufacturing the same
10/12/2004US6803157 Making added features of sub-resolution size that do not produce features on the exposed wafer
10/12/2004US6803154 Such as a phase type computer generated hologram (cgh), a two-dimensional binary structure or a phase modulation plate, for example, usable as an optical component of a semiconductor manufacturing reduction exposure apparatus
10/12/2004US6803093 Ceramic blank with a photostructurable functional layer containing platinum and method for production thereof
10/12/2004US6802986 Low-aberration deflectors for use in charged-particle-beam optical systems, and methods for fabricating such deflectors
10/07/2004WO2004086471A1 Uv nanoimprint lithography process using elementwise embossed stamp and selectively additive pressurization
10/07/2004WO2004086470A1 Exposure system and device production method
10/07/2004WO2004086469A1 Inline connection setting method and device and substrate processing device and substrate processing system
10/07/2004WO2004086468A1 Exposure apparatus and method, and method of producing apparatus
10/07/2004WO2004086467A1 Extreme ultraviolet light source and target for extreme ultraviolet light source
10/07/2004WO2004086151A1 Holographic recording medium and recording method therefor
10/07/2004WO2004086148A1 Device for the low-deformation replaceable mounting of an optical element
10/07/2004WO2004086147A2 Method of imparting patterns of surface relief to rigid substrates
10/07/2004WO2004086146A1 Transparent, highly heat-resistant polyimide precursor and photosensitive polyimide composition thereof
10/07/2004WO2004086145A1 Curable resin composition, photosensitive pattern-forming curable resin composition, color filter, substrate for liquid crystalline panel, and liquid crystalline panel
10/07/2004WO2004086144A1 Photosensitive resin composition
10/07/2004WO2004086121A1 Optical element, optical system, laser device, exposure device, mask testing device, and high polymer crystal processing device
10/07/2004WO2004085993A2 Generic interface for an optical metrology system
10/07/2004WO2004066026A3 Imageable elements and compositions for imaging by means of uv irradiation