Patents
Patents for G03F 7 - Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printed surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor (127,176)
12/2013
12/12/2013US20130330670 Electron Beam Lithography System and Method for Improving Throughput
12/12/2013US20130330669 Photoresist composition
12/12/2013US20130330668 Neutral layer polymer composition for directed self assembly and processes thereof
12/12/2013US20130329210 Roll-printing apparatus and roll-printing method using the same
12/12/2013US20130329208 Position measurement method, position control method, measurement method, loading method, exposure method and exposure apparatus, and device manufacturing method
12/12/2013US20130329207 Exposure apparatus and device manufacturing method
12/12/2013US20130329206 Exposure apparatus, exposure method, and device manufacturing method
12/12/2013US20130329205 Maskless lithography system
12/12/2013US20130329204 Photon Source, Metrology Apparatus, Lithographic System and Device Manufacturing Method
12/12/2013US20130329203 Method and apparatus for printing high-resolution two-dimensional periodic patterns
12/12/2013US20130329201 Position measurement method, position control method, measurement method, loading method, exposure method and exposure apparatus, and device manufacturing method
12/12/2013US20130329200 Position measurement method, position control method, measurement method, loading method, exposure method and exposure apparatus, and device manufacturing method
12/12/2013US20130329199 Coating and developing apparatus
12/12/2013DE102013003582A1 Method for determination and/or optimization of focus setting in optical arrangement i.e. measuring device, for measurement of structures of photomasks, involves determining parameter for determination of sharpness of image in image regions
12/12/2013DE102012223034A1 Illumination system for extreme UV-projection exposure system used for projecting reflecting structures arranged on lower side in mask on photo resist, has solid body joint including three joint legs, which bend during deflecting rod
12/12/2013DE102012011343A1 Vorrichtung und Verfahren zur Interferenzstrukturierung von Proben sowie dergestalt strukturierte Proben Apparatus and method for interference structuring of samples and such structured samples
12/11/2013EP2672321A1 Device for positioning a waferchuck
12/11/2013EP2672320A1 Method for producing three-dimensional metal micro-parts by growth in a mixed cavity and micro-parts obtained by the method
12/11/2013EP2672319A1 Method for producing three-dimensional metal micro-parts by growth in a mixed cavity and micro-parts obtained by the method
12/11/2013EP2672307A2 Projection optical system, exposure apparatus, and exposure method
12/11/2013EP2671118A1 Chamber apparatus and extreme ultraviolet (euv) light generation apparatus including the chamber apparatus
12/11/2013EP1849600B1 Bakeable radiation-sensitive elements with a high resistance to chemicals
12/11/2013CN1758141B Coating compositions for use with an overcoated photoresist
12/11/2013CN103443711A Composition for forming pattern reversal film, and method for forming reversal pattern
12/11/2013CN103443710A Lithography rinsing fluid and pattern formation method using same
12/11/2013CN103443709A Surface planarisation
12/11/2013CN103443708A Negative photosensitive resin composition
12/11/2013CN103443707A 树脂组合物和半导体元件基板 The resin composition and a semiconductor element substrate
12/11/2013CN103443206A Water-insoluble coloring compound, ink, resist composition for color filter, and thermal transfer recording sheet
12/11/2013CN103443161A Antireflective coating composition and process thereof
12/11/2013CN103443155A Black resin composition, resin black matrix substrate, and touch panel
12/11/2013CN103442900A Lithographic printing plate precursor and plate making method thereof
12/11/2013CN103441708A Modularization moving-iron type six-freedom-degree maglev motion platform
12/11/2013CN103441086A Method for detecting light resistance layer ion implantation stopping capacity
12/11/2013CN103441071A Method for shrinking critical size in polysilicon gate dry etching
12/11/2013CN103441067A Dual pattern forming method applied to grid line end cutting
12/11/2013CN103439869A Method for measuring graphic density
12/11/2013CN103439868A Device and method for measuring numerical aperture of projection objective
12/11/2013CN103439867A Cable table for workpiece table of lithography machine
12/11/2013CN103439866A VxWorks-based lithography machine double-workbench communication method and device
12/11/2013CN103439865A Scanning slit device used in stepping scan lithography machine
12/11/2013CN103439864A Environmental system including vaccum scavange for an immersion lithography apparatus
12/11/2013CN103439863A Exposure device and exposure method, maintenance method, and device manufacturing method
12/11/2013CN103439862A 栅极lele双重图形成型方法 Lele double gate patterning method
12/11/2013CN103439861A Radiation-sensitive resin composition and compound
12/11/2013CN103439762A Method for ruling and manufacturing concave blazed gratings
12/11/2013CN103438926A Photosensitive wet film imaging point testing device for PCB (Printed circuit board)
12/11/2013CN103437240A 纸芯片及其制备方法 Paper chip and its preparation method
12/11/2013CN103436923A Method for increasing interfacial bonding strength between SU-8 photoresist and metal substrate by ultrasound
12/11/2013CN103435722A Photoinitiators for UV-LED curable compositions and inks
12/11/2013CN102736410B Method for machining large-area nanoimprint silicon die under multi-point contact mode
12/11/2013CN102687071B Reflective-layer-equipped substrate for EUV lithography, reflective mask blank for EUV lithography, reflective mask for EUV lithography, and process for producing reflective-layer-equipped substrate
12/11/2013CN102636965B Super-resolution dry-method surface plasma photo-etching method
12/11/2013CN102621668B Projection optical system
12/11/2013CN102597116B Curable composition, method of coating a phototool, and coated phototool
12/11/2013CN102540737B Photomask for photoetching machine testing and testing method of photoetching machine
12/11/2013CN102540730B Positive image ultraviolet-computer-to-plate ((UV-CTP) planographic printing plate
12/11/2013CN102193336B 光刻设备和方法 Lithographic apparatus and method
12/11/2013CN102131766B New propanoates and processes for preparing the same
12/11/2013CN102060980B Resist underlayer polymer, resist underlayer composition including the same, and method of patterning using the same
12/11/2013CN102037409B Orthogonal processing of organic materials used in electronic and electrical devices
12/11/2013CN101943860B Processes for photolithography
12/11/2013CN101884017B Method of producing a relief image arrangement
12/11/2013CN101288028B Photopolymerizable silicone materials forming semipermeable membranes for sensor applications
12/11/2013CN101261442B Device manufacturing method and lithographic apparatus
12/11/2013CN101176041B Positive resist composition and method of forming resist pattern
12/11/2013CN101030037B Coating compositions for use with an overcoated photoresist
12/10/2013US8605257 Projection system with compensation of intensity variations and compensation element therefor
12/10/2013US8605252 Exposure apparatus, exposure method, and method for producing device
12/10/2013US8603733 Pattern forming method, and resist composition, developer and rinsing solution used in the pattern forming method
12/10/2013US8603732 Resist underlayer film-forming composition, process for forming resist underlayer film and patterning process
12/10/2013US8603731 Resist underlayer film forming composition for electron beam lithography
12/10/2013US8603730 Photopolymerisable composition
12/10/2013US8603729 Lithographic printing plate precursor and plate making method thereof
12/10/2013US8603728 Polymer composition and photoresist comprising the polymer
12/10/2013US8603727 Active light ray sensitive or radioactive ray sensitive resin composition, and active light ray sensitive or radioactive ray sensitive film and pattern forming method using the same
12/10/2013US8603726 Radiation-sensitive resin composition, polymer and compound
12/10/2013US8603724 Negative resist composition and patterning process
12/10/2013US8603708 Dye-containing negative curable composition, color filter using same, method of producing color filter, and solid-state imaging device
12/10/2013US8603619 Heat-resistant brittle label
12/10/2013US8603383 Original and article manufacturing method using same
12/05/2013WO2013181175A1 Silica-modified-fluoride broad angle anti-reflection coatings
12/05/2013WO2013181107A1 Bioactive agent delivery devices and methods of making and using the same
12/05/2013WO2013180419A1 Photoactive compound and light-sensitive resin composition comprising same
12/05/2013WO2013180386A1 Photosensitive resin composition and touch panel or display device including bezel pattern prepared by using same
12/05/2013WO2013180314A1 Actinic ray-sensitive or radiation-sensitive resin composition, resist film and pattern forming method using the same, manufacturing method of semiconductor device, and semiconductor device
12/05/2013WO2013180187A1 Method and device for measuring wavefront, and exposure method and device
12/05/2013WO2013180131A1 Photosensitive resin composition, photosensitive element, method for forming resist pattern, and method for producing wiring board
12/05/2013WO2013180035A1 Dispersion composition, polymerizable composition using same, light-blocking color filter, solid-state imaging element, liquid crystal display device, wafer-level lens, and imaging unit
12/05/2013WO2013179977A1 Illumination device, processing device, and device manufacturing method
12/05/2013WO2013179863A1 Photosensitive composition and printed circuit board having hardened layer thereof
12/05/2013WO2013179237A1 Black colorant mixture
12/05/2013WO2013178775A1 Determining position and curvature information directly from a surface of a patterning device.
12/05/2013WO2013178695A1 Lithography apparatus and method for producing a mirror arrangement
12/05/2013WO2013178484A1 Support apparatus, lithographic apparatus and device manufacturing method
12/05/2013WO2013178459A1 Gradient-based pattern and evaluation point selection
12/05/2013WO2013178438A1 Object holder and lithographic apparatus
12/05/2013WO2013178432A1 Illumination optical unit for projection lithography
12/05/2013WO2013178429A1 An assembly for modifying properties of a plurality of radiation beams, a lithography apparatus, a method of modifying properties of a plurality of radiation beams and a device manufacturing method
12/05/2013WO2013178422A1 Metrology method and apparatus, substrate, lithographic system and device manufacturing method
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