Patents
Patents for G03F 7 - Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printed surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor (127,176)
12/2013
12/25/2013CN103474336A Method for manufacturing high-evenness grid electrode lines
12/25/2013CN103472944A Touch panel and manufacturing method thereof
12/25/2013CN103472703A Volume hologram laminate
12/25/2013CN103472694A Photoresist removal method, exposure device and display array substrate manufacturing method
12/25/2013CN103472693A Process spray nozzle for chip developing process
12/25/2013CN103472692A Developing tank
12/25/2013CN103472691A Exposure machine and method for controlling same
12/25/2013CN103472690A Axial adjusting device for optical element in projection objective system
12/25/2013CN103472689A Photoetching image device and method for realizing super-resolution imaging through enhancing illumination numerical aperture
12/25/2013CN103472688A Illumination device of deep ultraviolet projection mask aligner and application method
12/25/2013CN103472687A Photoetching annular-illumination-mode generating device
12/25/2013CN103472686A Method for simulating three-dimensional light intensity distribution in thick resist ultraviolet (UV) shifting mask lithography
12/25/2013CN103472685A Synchronizer, scanning type laser imaging system and synchronizing method
12/25/2013CN103472684A Substrate processing apparatus and device manufacturing method
12/25/2013CN103472683A Manufacturing device of digital photoetching microscopic carvings as well as carving method thereof
12/25/2013CN103472682A Method for preparing diffraction micro-optical elements based on mask lithography technique and injection molding
12/25/2013CN103472681A Lithography movement table reacting force neutralization apparatus and lithography applying the same
12/25/2013CN103472680A Silicon wafer pre-alignment apparatus
12/25/2013CN103472679A Double-workpiece table long travel measurement apparatus and use method thereof
12/25/2013CN103472678A Lithography and workpiece table system applied in lithography
12/25/2013CN103472677A Substrate vertical direction photoelectricity detection apparatus and method thereof
12/25/2013CN103472676A Wave aberration surveying marker and wave aberration measuring method
12/25/2013CN103472675A Processing technology for curved film
12/25/2013CN103472674A Radiation-sensitive resin composition, method for forming resist pattern, polymer and polymerizable compound
12/25/2013CN103472612A Array substrate preparation method, array substrate and liquid crystal display device
12/25/2013CN103472610A Substrate drying device and substrate cleaning system
12/25/2013CN103472586A Projection optical system
12/25/2013CN103472574A Photoetching projection objective with variable conjugate distance and photoetching method
12/25/2013CN103472559A Axial macro-micro adjusting device for optical element in photoetching projection objective lens system
12/25/2013CN103472555A Dual-motor optical element axial adjustment device
12/25/2013CN103472004A Photolithography process parameter measurement apparatus and method thereof
12/25/2013CN103467646A Alkali-soluble resin and preparation method thereof
12/25/2013CN103465015A Multi-degree-of-freedom adjusting mechanism
12/25/2013CN102880001B Laser thermal lithography organic photoresist and preparation method of photoresist
12/25/2013CN102707565B Manufacturing method of black matrix, color filter and display device
12/25/2013CN102645853B Diffractive annular illumination generator and method for manufacturing same
12/25/2013CN102633984B Polyurethane-acrylate oligomer, and synthesis method and application thereof
12/25/2013CN102540717B Photosensitive resin composition and light blocking layer using same
12/25/2013CN102495534B Galvanometer type laser direct writing photoetching machine
12/25/2013CN102460308B Preparing lithographc printing plates with enhanced contrast
12/25/2013CN102262361B Exposure apparatus and exposure process
12/25/2013CN102131958B Method of forming microstructure
12/25/2013CN102072742B Lithographic apparatus and device manufacturing method
12/25/2013CN101661873B Substrate processing system, carrying device and coating device
12/25/2013CN101622580B Resist underlayer film forming composition for electron beam lithography
12/24/2013US8614785 Microlithography projection system with an accessible diaphragm or aperture stop
12/24/2013US8614283 Resist polymer, resist composition, process for pattern formation, and starting compounds for production of the resist polymer
12/24/2013US8614053 Processess and compositions for removing substances from substrates
12/24/2013US8614051 Photosensitive resin composition and circuit formation substrate using the same
12/24/2013US8614050 Polymers, photoresist compositions and methods of forming photolithographic patterns
12/24/2013US8614049 Resist composition and method of forming resist pattern
12/24/2013US8614048 Resin, resist composition and method for producing resist pattern
12/24/2013US8614047 Photodecomposable bases and photoresist compositions
12/24/2013US8614046 Salt and photoresist composition containing the same
12/24/2013US8614037 Dye-containing negative working curable composition, color filter and method of producing thereof
12/24/2013US8613999 Laser-engraveable compositions and flexographic printing precursors comprising organic porous particles
12/24/2013DE102013206981A1 Facet mirror for e.g. extreme UV (EUV) projection exposure system used in lighting system, has mirror facet unit that varies radius of curvature of mirror facet from specific radius of curvature to another radius of curvature
12/24/2013DE102012224359A1 Verfahren zur Herstellung von Stempeln für Vorrichtungen für die plasmonische Nanolithographie und Vorrichtung für die plasmonische Nanolithographie A process for the production of stamps for devices for the plasmonic nanolithography and apparatus for the plasmonic nanolithography
12/19/2013WO2013188547A1 Linear stage and metrology architecture for reflective electron beam lithography
12/19/2013WO2013187577A1 Photocurable composition, barrier layer including same, and encapsulated device including same
12/19/2013WO2013187530A1 Pattern forming method, composition used therein, method for manufacturing electronic device, and electronic device
12/19/2013WO2013187520A1 Pattern forming method, actinic ray-sensitive or radiation-sensitive resin composition and resist film used therefor, and electronic device manufacturing method and electronic device using the same
12/19/2013WO2013187493A1 Colored photosensitive resin composition
12/19/2013WO2013187313A1 Liquid composition for cleaning, method for cleaning semiconductor element, and method for manufacturing semiconductor element
12/19/2013WO2013187300A1 Light irradiating device, and exposure device
12/19/2013WO2013187299A1 Light irradiating device, and exposure device
12/19/2013WO2013187209A1 Photosensitive composition
12/19/2013WO2013186929A1 Mask protection device, exposure apparatus, and method for manufacturing device
12/19/2013WO2013186307A1 Positioning system, lithographic apparatus and device manufacturing method
12/19/2013WO2013186136A2 Lithographic apparatus and device manufacturing method
12/19/2013WO2013185990A1 Negative-working thick film photoresist
12/19/2013WO2013185989A1 Positive photosensitive material
12/19/2013WO2013185919A1 Projection exposure apparatus and method for controlling a projection exposure apparatus
12/19/2013WO2013185822A1 Maskless lithographic apparatus and method for generating an exposure pattern
12/19/2013WO2013185422A1 Method for producing motherboard alignment film, transfer plate, and alignment liquid
12/19/2013WO2013185401A1 Mask and correction method thereof
12/19/2013WO2013139483A3 Measuring system for measuring an imaging quality of an euv lens
12/19/2013WO2013124052A3 Lithography device with eddy-current brake
12/19/2013WO2013100205A3 Exposure apparatus and exposure method
12/19/2013WO2013064890A8 Nanocomposite negative photosensitive composition and use thereof
12/19/2013US20130337649 Compound for forming organic film, and organic film composition using the same, process for forming organic film, and patterning process
12/19/2013US20130337387 Resist composition and method of forming resist pattern
12/19/2013US20130337386 Processing apparatus for processing a flexographic plate, a method and a computer program product
12/19/2013US20130337385 Negative pattern-forming method and photoresist composition
12/19/2013US20130337384 Positive resist composition for immersion exposure and pattern forming method
12/19/2013US20130337383 Patterning process and resist composition
12/19/2013US20130337382 Compound, resist composition and method of forming resist pattern
12/19/2013US20130337381 Negative-working thick film photoresist
12/19/2013US20130337380 Positive photosensitive material
12/19/2013US20130337379 Antireflective compositions and methods of using same
12/19/2013US20130337378 Sulfonium salt, polymer, resist composition, and patterning process
12/19/2013US20130337372 Method and System for Design of a Reticle to be Manufactured Using Variable Shaped Beam Lithography
12/19/2013US20130337370 Photomask and method for forming the same
12/19/2013US20130337231 Substrate having etching mask and method for producing same
12/19/2013US20130337168 Method for forming silicon-containing resist underlayer film
12/19/2013US20130335723 Movable body apparatus, exposure apparatus, exposure method, and device manufacturing method
12/19/2013US20130335722 Lithographic apparatus and device manufacturing method
12/19/2013US20130335721 Measurement of the position of a radiation beam spot in lithography
12/19/2013US20130335720 Reflecting optical member, optical system, exposure apparatus, and device manufacturing method
12/19/2013US20130335719 Exposure method, exposure apparatus, and photomask
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