Patents
Patents for G03F 7 - Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printed surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor (127,176)
01/2005
01/27/2005US20050019709 Method and apparatus for maintaining a machine part
01/27/2005US20050019707 Method for forming patterned insulating elements and methods for making electron source and image display device
01/27/2005US20050019706 Method for developing multilayer imageable elements
01/27/2005US20050019705 Applying iquid coating layer of a positive-acting photoresist comprising photoacid generator and resin on substrate surface; removing solvent; exposure to patterned activating radiation; heating; developing to form relief image
01/27/2005US20050019704 Coating substrates with subbing layers comprising terpolymers and acid generators, then covering with ultraviolet radiation layers, exposing and selectively etching to form patterns; miniaturization; microelectronics
01/27/2005US20050019703 Photocatalysts; color filters
01/27/2005US20050019702 Resist exposure system and method of forming a pattern on a resist
01/27/2005US20050019701 coating photoresist on substrate, exposing, developing, and etching
01/27/2005US20050019697 Method of treating wafers with photoresist to perform metrology analysis using large current e-beam systems
01/27/2005US20050019696 Photoresist composition
01/27/2005US20050019693 Photosensitive polymer and chemically amplified photoresist composition containing the same
01/27/2005US20050019692 Resist material and method for pattern formation
01/27/2005US20050019691 Positive photoresist composition and patterning process using the same
01/27/2005US20050019690 Positive photosensitive composition and method of forming resist pattern
01/27/2005US20050019689 Stimulus-sensitive composition, compound and pattern formation method using the stimulation-sensitive composition
01/27/2005US20050019688 Quaternary ammonium hydroxide with at least one alkyl having 3+ carbon atoms, a water soluble amine in given ratio to the ammonium hydroxide, water, a corrosion inhibitor and a water soluble organic solvent; corrosion protection of copper, aluminum with efficient stripping
01/27/2005US20050019675 Lithographic apparatus, device manufacturing method, and mask
01/27/2005US20050018997 Lithographic apparatus and device manufacturing method
01/27/2005US20050018990 Polymeric optical waveguide-forming master plate, method for producing polymer optical waveguide, and aperture changeable polymeric optical waveguide
01/27/2005US20050018739 Timing control for two-chamber gas discharge laser system
01/27/2005US20050018737 Discharge laser with porous insulating layer covering anode discharge surface
01/27/2005US20050018312 Projection lens for a microlithographic projection exposure apparatus
01/27/2005US20050018296 Diffractive optical element and method of making same
01/27/2005US20050018289 Simultaneously achieving circular symmetry and diminishing effects of optical defects and deviations during real time use of optical devices
01/27/2005US20050018278 Method for evaluating image formation performance
01/27/2005US20050018277 Method for evaluating image formation performance
01/27/2005US20050018269 Optical system
01/27/2005US20050018255 Image-recording apparatus using spatial light-modulation device on which divided reset actuation is performed
01/27/2005US20050018208 Method and apparatus for monitoring and controlling imaging in immersion lithography systems
01/27/2005US20050018206 Compensation for geometric effects of beam misalignments in plane mirror interferometer metrology systems
01/27/2005US20050018190 Overlay alignment metrology using diffraction gratings
01/27/2005US20050018169 Substrate holding device, semiconductor manufacturing apparatus and device manufacturing method
01/27/2005US20050018168 Substrate holding device, substrate processing apparatus using the same, and method for aligning and holding substrate
01/27/2005US20050018167 Method and apparatus for positioning a substrate on a substrate table
01/27/2005US20050018166 Stage system, exposure apparatus, and device manufacturing method
01/27/2005US20050018165 Stage system, exposure apparatus, and device manufacturing method
01/27/2005US20050018164 Exposure with intensity balancing to mimic complex illuminator shape
01/27/2005US20050018163 Lithographic apparatus, device manufacturing method, and computer-readable storage medium
01/27/2005US20050018162 Lithographic apparatus, device manufacturing method, and angular encoder
01/27/2005US20050018161 Positioning method, and positioning apparatus
01/27/2005US20050018160 Supporting device, lithographic apparatus, and device manufacturing method employing a supporting device, and a position control system arranged for use in a supporting device
01/27/2005US20050018157 Lithographic projection apparatus and device manufacturing method
01/27/2005US20050018156 Lithographic apparatus and device manufacturing method
01/27/2005US20050018155 Lithographic apparatus and device manufacturing method
01/27/2005US20050018154 Lithographic apparatus, device manufacturing method, and device manufactured thereby
01/27/2005US20050017831 Alignment apparatus
01/27/2005US20050017318 Circuit array substrate and method of manufacturing the same
01/27/2005US20050017198 Lithographic projection apparatus, gas purging method and device manufacturing method and purge gas supply system
01/27/2005US20050016685 Substrate holding technique
01/27/2005US20050016679 Plasma-based debris mitigation for extreme ultraviolet (EUV) light source
01/27/2005US20050016449 Photoresist coating system
01/27/2005DE20320446U1 Aufspannvorrichtung zum Modulieren von Formen und Substraten Clamping device for modulating shapes and substrates
01/27/2005DE10350705A1 Method for manufacturing integrated circuit by lithographic structuring illuminates mask film on substrate by two mask patterns from two radiation sources via two exposure masks
01/27/2005DE10332112A1 Manufacturing semiconductor, other finely-structured components involves setting working distance at least temporarily to less than maximum size of optical near field of emanating projection light
01/27/2005DE10332059A1 Analysis of microlithography objects, especially masks using aerial image measurement systems, whereby a detected image is corrected using a transfer function correction filter
01/27/2005DE10329793A1 Microlithographic projection illumination system projection objective has gray filter with locally varying gray value for compensating polarization distribution disturbance caused by optical element
01/27/2005DE10328811A1 Verbindung zur Bildung einer selbstorganisierenden Monolage, Schichtstruktur, Halbleiterbauelement mit einer Schichtstruktur und Verfahren zur Herstellung einer Schichtstruktur Compound to form a self-assembled monolayer layer structure semiconductor device having a layer structure and process for producing a layer structure
01/27/2005DE10328302A1 Niedrigviskose, strahlungshärtbare Formulierung, insbesondere für die Stereolithographie, zum Einsatz in der Medizintechnik, insbesondere zur Herstellung von Ohrstücken Low viscosity, radiation curable formulation, in particular for stereolithography, for use in medical technology, in particular for the production of earpieces
01/26/2005EP1500987A1 Lithographic apparatus, device manufacturing method, and device manufactured thereby
01/26/2005EP1500986A1 Lithographic apparatus and device manufacturing method
01/26/2005EP1500985A2 Safety mechanism for a lithographic patterning device
01/26/2005EP1500984A2 Lithographic apparatus, device manufacturing method, and device manufactured thereby
01/26/2005EP1500983A2 Isolation mounts for use with vacuum chambers and their application in lithographic projection apparatus
01/26/2005EP1500982A1 Lithographic apparatus and device manufacturing method
01/26/2005EP1500981A1 Lithographic apparatus and device manufacturing method
01/26/2005EP1500980A1 Lithographic apparatus, device manufacturing method, and device manufactured thereby
01/26/2005EP1500979A1 Lithographic apparatus and device manufacturing method
01/26/2005EP1500978A2 Photosensitive metal nanoparticle and method of forming conductive pattern using the same
01/26/2005EP1500977A1 Radiation-sensitive composition, compound and pattern formation method using the radiation-sensitive composition
01/26/2005EP1500976A1 Dissolution inhibitors in photoresist compositions for microlithography
01/26/2005EP1500975A2 Process for the fabrication of optical microstructures
01/26/2005EP1500974A2 A method, program product and apparatus of simultaneous optimization for na-sigma exposure settings and scattering bars opc using a device layout
01/26/2005EP1500515A2 Addressing the imaging elements of a spatial light modulator in an image recording apparatus
01/26/2005EP1500498A2 Lithographic printing plate precursour and lithographic printing method
01/26/2005EP1499926A1 Method for producing microhole structures
01/26/2005EP1499925A2 Lighting system, particularly for use in extreme ultraviolet (euv) lithography
01/26/2005EP1499924A2 Imaging method
01/26/2005EP1499923A1 Photopolymerizable compositions and flexographic printing plates derived therefrom
01/26/2005EP1499646A1 Photocrosslinkable multi-coating system having improved gas-barrier properties
01/26/2005EP1499490A1 Method for producing three-dimensional bodies or three-dimensional surfaces by laser radiation
01/26/2005EP1499464A1 Method and apparatus for production of a cast component
01/26/2005EP1235863B1 Use of an additive composition for increasing the storage stability of ethylenically unsaturated resins
01/26/2005EP0898732B1 Black-and-white photothermographic and thermographic elements comprising 3-heteroaromatic-substituted acrylonitrile compounds as co-developers
01/26/2005CN1572128A Photoimageable dielectric material for circuit protection
01/26/2005CN1571943A A method of illuminating a photomask using chevron illumination
01/26/2005CN1571788A Photoactivable nitrogen bases
01/26/2005CN1571118A Remodeling technique of semiconductor pattern photoresist layer
01/26/2005CN1570773A 等离子体反应室 A plasma reaction chamber
01/26/2005CN1570772A Anticorrosive developing composition
01/26/2005CN1570771A Exposing method and manufacturing method of semiconductor device using the same
01/26/2005CN1570770A 装置制造方法 Apparatus manufacturing method
01/26/2005CN1570769A Device manufacturing method, mask set for use in the method, data set for controlling a programmable patterning device, method of generating a mask pattern and a computer program
01/26/2005CN1570768A Three dimensional microstructure processing method based on thick rubber photoetching
01/26/2005CN1570767A Discharging unit for discharging a photosensitive material, coater and apparatus for coating a photosensitive material
01/26/2005CN1570766A Photoresist coating device
01/26/2005CN1570765A Positive photoresistive agent composition and method for forming photoresistive pattern
01/26/2005CN1570764A Light-sensitive resin composition for black matrix
01/26/2005CN1570763A Fluorinated si-polymers and photoresists comprising same
01/26/2005CN1570762A Polymers and photoresists comprising same
01/26/2005CN1570761A Method and apparatus for maintaining a machine part