Patents
Patents for G03F 7 - Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printed surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor (127,176)
02/2005
02/17/2005US20050037290 Simple, low cost formation of highly precise micropatterns; utilizing photoresist film and electroless deposition metal plating
02/17/2005US20050037289 monomers that can be homopolymerized or copolymerized with other reactive components to make resins within sub-200 nanometer (nm) photoresist compositions
02/17/2005US20050037288 Adjustment of printed circuit incline when imaging photolithographic patterns having asymmetrical configuration,
02/17/2005US20050037287 Method for postbaking a lithographic printing plate
02/17/2005US20050037286 Cationic polymerizable acrylate-type monomer with oxetane or 7-oxabicyclo(4.1.0)heptane group and amide-containing acrylate-type monomer; iron-arene complex polymerization initiator and binder; printing durability; antisoilants
02/17/2005US20050037284 Resist composition
02/17/2005US20050037283 An addition copolymer having at least one (meth)acrylic monomer with an adamantane ring on the side chain; patterns with improved transparency against short-wavelength light and dry etch resistance
02/17/2005US20050037282 Support; image recording layer containing infrared radiation absorber,and initiator
02/17/2005US20050037281 for preparation of a printed circuit board; pattern with high resolution and a tough tenting film
02/17/2005US20050037278 Blck paste on radiation transparent glass substrate; exposure to actinic radiation; development
02/17/2005US20050037276 Photoresists processable under biocompatible conditions for multi-biomolecule patterning
02/17/2005US20050037275 Pattern forming method and wiring pattern forming method, and electro-optic device and electronic equipment
02/17/2005US20050037272 Method and apparatus for manufacturing semiconductor
02/17/2005US20050037271 For resist pattern; observation data such as electron microscopy is applied to model data created beforehand in accordance with the exposure conditions to estimate fluctuations in the exposure dose and the focal position
02/17/2005US20050037270 Method for measuring overlay shift
02/17/2005US20050037269 Determination defects; using laser beams
02/17/2005US20050037268 Apparatus for measuring an exposure intensity on a wafer
02/17/2005US20050037267 Illumination multilayer, vertical pattern through mask
02/17/2005US20050037266 Combines laser cladding technique along with automated direct feedback control to achieve a good quality clad in terms of dimensional and metallurgical characteristics
02/17/2005US20050036783 Pattern production system, exposure system, and exposure method
02/17/2005US20050036213 Projection objectives including a plurality of mirrors with lenses ahead of mirror M3
02/17/2005US20050036201 Correction of birefringence in cubic crystalline optical systems
02/17/2005US20050036184 Lithography apparatus for manufacture of integrated circuits
02/17/2005US20050036183 Immersion fluid for immersion Lithography, and method of performing immersion lithography
02/17/2005US20050036127 Aligning apparatus and its control method, and exposure apparatus
02/17/2005US20050036125 System for laser beam expansion without expanding spatial coherence
02/17/2005US20050036124 Scanning exposure technique
02/17/2005US20050036123 Lithographic apparatus and device manufacturing method
02/17/2005US20050036122 Evaluation mask, focus measuring method and aberration measuring method
02/17/2005US20050036121 Lithographic apparatus and device manufacturing method
02/17/2005US20050035983 Methods and apparatus for ink delivery to nanolithographic probe systems
02/17/2005US20050035684 Positioning mechanism, exposure apparatus and device manufacturing method
02/17/2005US20050035312 Arrangement for feeding or dissipating heat to/from a semiconductor substrate for the purpose of preparing or post-processing a lithographic projection step
02/17/2005US20050035308 Pattern writing equipment
02/17/2005US20050035307 Lithographic apparatus, device manufacturing method, and device manufactured thereby
02/17/2005US20050035306 Focused charged particle beam apparatus
02/17/2005US20050035299 Lens array with a laterally movable optical axis for corpuscular rays
02/17/2005US20050035290 Automatic methods for focus and astigmatism corrections in charged-particle beam instrument
02/17/2005US20050034810 Mask and container and manufacturing apparatus
02/17/2005US20050034744 Ashing photoresist pattern; srtripping residues; aqueous solution containing tetramethylammonium hydroxide
02/17/2005DE10392464T5 Maskenmuster-Korrekturverfahren, Herstellungsverfahren einer Halbleitervorrichtung, Maskenherstellungsverfahren und Maske Mask pattern correction method, a semiconductor device manufacturing method, mask fabrication method and mask
02/17/2005DE10336039A1 Positionierhilfe und Verfahren zur Unterstützung derAusrichtung von schweren Maschinen Positioning and procedures to support derAusrichtung of heavy machinery
02/17/2005DE10331686A1 Verfahren zur Bewertung von aufgenommenen Bildern von Wafern Procedures for the evaluation of captured images of wafers
02/17/2005DE10330456A1 Vorrichtung zum Erstellen einer Oberflächenstruktur auf einem Wafer Apparatus for creating a surface structure on a wafer
02/17/2005DE10329325A1 Structuring treatment of surface with edge, on which protection layer is deposited and then removed by etching together with edge
02/17/2005CA2532440A1 Photocrosslinkable polyurethanes
02/16/2005EP1507286A2 Formation process under a thin layer of a first material from portions of another material and/or from vacuum gaps
02/16/2005EP1507173A1 Lithographic apparatus and apparatus adjustment method
02/16/2005EP1507172A1 Lithographic apparatus and apparatus adjustment method
02/16/2005EP1507171A2 Light-Sensitive sheet comprising support, first and second light-sensitive layers and barrier layer
02/16/2005EP1507170A2 Polymerizable composition and image-recording material using the same
02/16/2005EP1507169A1 Photosensitive thick-film paste materials for forming light-transmitting electromagnetic shields, light-transmitting electromagnetic shields formed using the same, and method of manufacture thereof
02/16/2005EP1507168A2 Developer exit tank for immersion type printing plate processor
02/16/2005EP1506983A2 Copolymers useful for the preparation of thermal digital lithographic printing plates
02/16/2005EP1506855A2 Lithographic printing plate precursor and lithographic printing method
02/16/2005EP1506854A1 Method for postbaking a lithographic printing plate
02/16/2005EP1506456A1 Radiation filter element and manufacturing processes therefore
02/16/2005EP1506455A2 Method for the targeted deformation of an optical element
02/16/2005EP1506454A2 Sensitized chemically amplified photoresist for use in photomask fabrication and semiconductor processing
02/16/2005EP1055251A4 Large area silent discharge excitation radiator
02/16/2005CN1582417A Agent for forming coating for narrowing pattern and method for forming fine pattern using the same
02/16/2005CN1582416A Photosensitive film and photosensitive composition for printed wiring board and production processes
02/16/2005CN1582415A Photosensitive ceramics composition and method for making multi-layer substrate using it
02/16/2005CN1582414A Composition having permitivity being radiation-sensitively changeable and method for forming permitivity pattern
02/16/2005CN1582407A Improved method and apparatus using an slm
02/16/2005CN1582267A Novel difunctional photoinitiators
02/16/2005CN1582202A Nozzle device and substrate treating apparatus having using the device
02/16/2005CN1582094A Figure-forming method and wire-layout figure forming method and photoelectronic device
02/16/2005CN1582093A Figure-forming method and wire-layout figure forming method, photoelectronic device and electronic apparatus
02/16/2005CN1582091A Method for forming store grid cofferdam and pattern , photoelectronic device and electronic machine
02/16/2005CN1582090A Method for making circuit substrate
02/16/2005CN1581651A Reacting force treating system of operation table device
02/16/2005CN1581499A Method for making solid camera device
02/16/2005CN1581437A Optical mask, method for making figure and method for making semiconductor device
02/16/2005CN1581436A Method for forming corrosion-resisting pattern and distribution pattern, and method for making semiconductor device
02/16/2005CN1581434A Design of pivture, optical mask and photoetching colloid figure, and method for making smiconductor device
02/16/2005CN1581432A Processing method and method for making semiconductor device
02/16/2005CN1581402A Array type filter for colour picture tube exposure platform
02/16/2005CN1580959A Diluent composition for removing photosensitive resin
02/16/2005CN1580958A Modulation of exposure duration and/or power to achieve gray-scaling in maskless photolithography
02/16/2005CN1580956A Lithographic apparatus and apparatus adjustment method
02/16/2005CN1580955A Charged particle beam exposure method and apparatus and device manufacturing method using the apparatus
02/16/2005CN1580954A Photosensitive resin composition and transparent material for colour filter made therefrom
02/16/2005CN1580953A Light-sensitive transfer sheet, light-sensitive layers, picture pattern forming method and layout pattern forming method
02/16/2005CN1580952A Light guide board module core manufacturing method
02/16/2005CN1580951A Method for manufacturing light guide board module core
02/16/2005CN1580950A Pattern production system, exposure system, and exposure method
02/16/2005CN1580865A Beam homogenizing device, laser radiating device and method for making semiconductor device
02/16/2005CN1580864A 曝光头 Exposure head
02/16/2005CN1580835A 感光性树脂组成物 The photosensitive resin composition
02/16/2005CN1580221A Stripping and cleaning compositions for microelectronics
02/16/2005CN1579893A Positive PS plate vacuum package
02/16/2005CN1579816A Method for manufacturing coloured copperplate etching
02/16/2005CN1579804A 平版印刷版前体和平版印刷方法 Lithographic printing plate precursor and lithographic methods
02/16/2005CN1189932C Detection method of electric defect in inner conduting layer of tested area
02/16/2005CN1189794C Improved pattern generator
02/16/2005CN1189793C Dry film photoresist
02/16/2005CN1189792C Photoresist composition and its structure and forming method
02/16/2005CN1189791C Production process of photoresist composite and production process of semiconductor element with the composite
02/16/2005CN1189330C Imaging media containing heat developable photosensitive microcapsule