Patents
Patents for G03F 7 - Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printed surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor (127,176)
02/2005
02/02/2005CN1573558A Light mask manufacturing method capable of avoiding electron beam offset due to charge effect
02/02/2005CN1573557A Method for removing shading defects of light mask and semiconductor device manufacturing method thereof
02/02/2005CN1573556A Position correction in y of mask object shift due to Z offset and non-perpendicular illumination
02/02/2005CN1573555A Patten drawing device
02/02/2005CN1573554A Method of optical proximity correction design for contact hole mask
02/02/2005CN1573553A Composition for forming wiring protective film and uses thereof
02/02/2005CN1573552A Plus photoresist composition and resist pattern forming method
02/02/2005CN1573551A Chemical amplification type plus photoresist composition and resist pattern forming method
02/02/2005CN1573550A Plus photoresist composition and resist pattern forming method
02/02/2005CN1573549A Chemical amplification type plus photoresist composition and resist pattern forming method
02/02/2005CN1573548A Method for evaluating sensitivity of photoresist, method for preparation of photoresist
02/02/2005CN1573547A Pad for display panel, radiosensitive resin composition, and liquid crystal display device
02/02/2005CN1573546A Positive-working photosensitive resin composition, method for producing pattern-formed resin film, semiconductor device, display device, and method for producing the semiconductor device and the displ
02/02/2005CN1573545A Light-sensitive sheet, light-sensitive layers, image pattern forming method, and wiring pattern forming method
02/02/2005CN1573544A Plus photoresist composition for manufacturing system LCD and method for making resist pattern
02/02/2005CN1573543A Photosensitive metal nanoparticle and method of forming conductive pattern using the same
02/02/2005CN1573542A Colored photoresist composition
02/02/2005CN1573541A Method for coating a substrate for EUV lithography and substrate with photoresist layer
02/02/2005CN1573540A Water soluble negative photoresist and method for forming photoresist pattern
02/02/2005CN1573538A Attenuated phase shifting mask having embedded bi-layer structure for and method for making same
02/02/2005CN1573471A Method and apparatus of manufacturing reflector
02/02/2005CN1573414A Pixel position specifying method, method of correcting image offset, and image forming device
02/02/2005CN1573410A Laser device
02/02/2005CN1573406A Apparatus and method for projection exposure
02/02/2005CN1573405A Optical projection system
02/02/2005CN1573404A Projection optical system, exposure apparatus, and device manufacturing method
02/02/2005CN1573370A Colored composition, method of manufacturing color filter, and method of manufacturing black matrix substrate
02/02/2005CN1573369A Sensitive black composition, black substrate using same and color filter
02/02/2005CN1187655C Retaining device for photo blanks
02/02/2005CN1187654C Radiation-sensitive resin composition
02/02/2005CN1187653C Manufacturing method of micro-pipeline
02/02/2005CN1187190C Making image on printing plate using ultrashort laser pulse
02/01/2005USH2114 Inspection tool for testing and adjusting a projection unit of a lithography system
02/01/2005US6851103 Method and apparatus for decomposing semiconductor device patterns into phase and chrome regions for chromeless phase lithography
02/01/2005US6850854 Semiconductor production system
02/01/2005US6850371 Optical member and method of producing the same, and projection aligner
02/01/2005US6850367 Light exposure apparatus and light emitting device therefor
02/01/2005US6850332 Method for measuring step difference in a semiconductor device and apparatus for performing the same
02/01/2005US6850330 Reticle focus measurement system using multiple interferometric beams
02/01/2005US6850327 Inspection method and apparatus for projection optical systems
02/01/2005US6850229 Capacitive sensing and data input device power management
02/01/2005US6849870 Organic gate insulating film and organic thin film transistor using the same
02/01/2005US6849668 For radiation curable compositions, especially for photocurable compositions
02/01/2005US6849558 Replication and transfer of microstructures and nanostructures
02/01/2005US6849540 Method of fabricating semiconductor integrated circuit device and method of producing a multi-chip module that includes patterning with a photomask that uses metal for blocking exposure light and a photomask that uses organic resin for blocking exposure light
02/01/2005US6849391 Alkali-soluble novolak resin and a photosensitive compound having a naphthoquinone diazide group; absorption coefficient alpha of the photoresist for an exposure light falls in the range of 0.5<alpha</=7
02/01/2005US6849389 Lower sulfite/sulfate concentration on the wafer due to plasma treatment translates into less moisture pick up and prevents high aspect ratio collapse; microelectronics
02/01/2005US6849388 Self-aligning contacts for stacked electronics
02/01/2005US6849386 Stable adhesiveness between a heat-sensitive layer and a silicone rubber layer as well as a high aging stability of a coating solution.
02/01/2005US6849385 Polyamide or polyamideimide from an aromatic diamine having a carboxy photosensitive group, e.g., 2-methacryloyloxyethyl 3,5-diaminobenzoate; unsaturated silane coupler; monomer having at least 5 unsaturated bonds
02/01/2005US6849384 Photoacid generators, photoresist compositions containing the same and pattering method with the use of the compositions
02/01/2005US6849383 Photosensitive resin laminate, and signboard plate and signboard made of the laminate
02/01/2005US6849382 Photosensitive polymer containing silicon and a resist composition using the same
02/01/2005US6849381 Copolymers and photoresist compositions comprising same
02/01/2005US6849380 Positive heat-sensitive lithographic printing plate
02/01/2005US6849378 Photosensitive polymers, resist compositions comprising the same, and methods for forming photoresistive patterns
02/01/2005US6849377 Fluorine-containing copolymer comprising a repeat unit derived from a polycyclic ethylenically unsaturated compound (e.g, a tricyclo(4.2.1.0(2,5))nonane) having a fluorine atom, perfluoroalkyl group, or perfluoroalkoxy group
02/01/2005US6849376 Polymers and photoresist compositions comprising same
02/01/2005US6849375 Photoresist monomers, polymers thereof and photoresist compositions containing the same
02/01/2005US6849374 Can be imaged with short wavelength radiation
02/01/2005US6849373 Antireflective coating compositions comprising photoacid generators
02/01/2005US6849363 Method for repairing a photomask, method for inspecting a photomask, method for manufacturing a photomask, and method for manufacturing a semiconductor device
02/01/2005US6849308 Method of forming a masking pattern on a surface
02/01/2005US6849293 Method to minimize iso-dense contact or via gap filling variation of polymeric materials in the spin coat process
02/01/2005US6849200 Composition and process for wet stripping removal of sacrificial anti-reflective material
02/01/2005US6849153 Supplying a mixture of etching gas and an acid neutralizing gas into a vacuum chamber in which a water soluble material of sidewall polymer rails left behind on aluminum/copper line from reactive ion etching, removing it with deionized water
02/01/2005US6848876 Workpiece sorter operating with modular bare workpiece stockers and/or closed container stockers
02/01/2005US6848782 Color filter and process for producing the same
02/01/2005US6848455 Comprises simultaneous application of ultraviolet radiation and hydrogen peroxide and dissolved ozone
02/01/2005US6848175 Method of forming an out-of-plane structure
01/2005
01/27/2005WO2005008754A1 Flare measurement method, exposure method, and flare measurement mask
01/27/2005WO2005008753A1 Template creation method and device, pattern detection method, position detection method and device, exposure method and device, device manufacturing method, and template creation program
01/27/2005WO2005008752A1 Exposure device, exposure method, and device manufacturing method
01/27/2005WO2005008747A2 Methods and systems for inspection of wafers and reticles using designer intent data
01/27/2005WO2005008700A1 Electric double layer capacitor
01/27/2005WO2005008636A1 Process for producing magnetic recording medium, stamper for magnetic recording medium and intermediate body for magnetic recording medium
01/27/2005WO2005008340A1 Material for forming fine pattern and method for forming fine pattern using the same
01/27/2005WO2005008339A2 Lithographic projection apparatus, purge gas supply system and gas purging method
01/27/2005WO2005008338A1 Negative photosensitive resin composition and negative photosensitive element
01/27/2005WO2005008337A1 Photosensitive resin composition
01/27/2005WO2005008336A2 Dissolution inhibitors in photoresist compositions for microlithography
01/27/2005WO2005008335A2 Method for analysing objects in microlithography
01/27/2005WO2005008321A1 Method of manufacturing a reflector, and liquid crystal display device including such a reflector
01/27/2005WO2005007759A2 Viscosity reducible radiation curable resin composition
01/27/2005WO2005007747A2 Photosensitive silsesquioxane resin
01/27/2005WO2005007719A2 Positive photoresist composition and method of forming resist pattern
01/27/2005WO2005007718A1 Positive photoresist composition and method of forming resist pattern
01/27/2005WO2005007564A1 Method for fixing metal particle, and method for producing metal particle-containing substrate, method for producing carbon nanotube-containing substrate and method for producing semiconductor crystalline rod-containing substrate respectively using such fixing method
01/27/2005WO2004095110A8 Exposure control
01/27/2005WO2004092837A3 Positive photoresist compositions having enhanced processing time
01/27/2005WO2004077161A3 Method for producing resist substrates
01/27/2005WO2004025364A3 Four color digital printing process and color image element using color-sensitive photopolymers
01/27/2005WO2004010227A3 Recording an image with multiple intensity levels
01/27/2005US20050022150 Optical proximity correction method
01/27/2005US20050020793 Fluorinated copolymers for microlithography
01/27/2005US20050020711 acrylated diisocyanates derived from isocynaurate trimers; automobile paint
01/27/2005US20050020710 Hybrid onium salt
01/27/2005US20050020087 Method and apparatus for removing an edge region of a layer applied to a substrate and for coating a substrate and a substrate
01/27/2005US20050020055 Semiconductor processing methods
01/27/2005US20050019962 Plasma monitoring method, plasma processing method, method of manufacturing semiconductor device, and plasma processing system