Patents
Patents for G03F 7 - Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printed surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor (127,176)
04/2005
04/06/2005CN1603960A Process for writing registration photoetching grating into crystals
04/06/2005CN1603959A Etching method and computer storage medium storing program for controlling same
04/06/2005CN1603957A Chemical amplification type positive resist composition and a resin therefor
04/06/2005CN1603956A Image-forming composition for heat-sensitive CTP image base, acid generating source for the composition and preparation thereof
04/06/2005CN1603955A Holotype photoresist composite
04/06/2005CN1603954A Holotype photoresist composite for discharge nozzle type coating method and resist pattern forming method
04/06/2005CN1603953A Photoresist composite and image forming method using the same
04/06/2005CN1603952A 光致抗蚀剂组合物 The photoresist composition
04/06/2005CN1603950A Method for making patterns of phase shift transformation light shield used in semiconductor chips manufacturing and structure thereof
04/06/2005CN1603949A Photomask, photomask manufacturing method and semiconductor device manufacturing method using photomask
04/06/2005CN1603870A Cubic MgZnO crystal thin film optical waveguide device and preparation process thereof
04/06/2005CN1603869A Fabrication method for ridge circular waveguide device
04/06/2005CN1603114A Substrate for inkjet printing and method of manufacturing the same
04/06/2005CN1196161C Thermal transfer film and its using method
04/06/2005CN1196139C 介电组合物 Dielectric compositions
04/06/2005CN1196072C Digital photolithography system for making smooth diagonal components
04/06/2005CN1196032C Stripping agent, stripping method, stripping agent circulation equipment and stripping agent controller
04/06/2005CN1196031C Method for error reduction in lithography
04/06/2005CN1196030C Antireflective coating for photoresist compositions
04/06/2005CN1196029C Positive radiation-sensitive composition
04/06/2005CN1196028C Stereolithographic composition for preparing polyethylene-like articles
04/06/2005CN1195603C Laser processor
04/05/2005US6877152 Method of inter-field critical dimension control
04/05/2005US6876494 Imaging forming apparatus
04/05/2005US6876451 Monolithic multiaxis interferometer
04/05/2005US6876440 Methods and systems to compensate for a stitching disturbance of a printed pattern in a maskless lithography system utilizing overlap of exposure zones with attenuation of the aerial image in the overlap region
04/05/2005US6876439 Method to increase throughput in a dual substrate stage double exposure lithography system
04/05/2005US6876438 Semiconductor exposure apparatus, control method therefor, and semiconductor device manufacturing method
04/05/2005US6876437 Illumination optical system, exposure method and apparatus using the same
04/05/2005US6876435 Exposure method, plane alignment method, exposure apparatus, and device manufacturing method
04/05/2005US6876378 Apparatus for producing a printing form
04/05/2005US6876092 Substrate provided with an alignment mark, method of designing a mask, computer program, mask for exposing said mark, device manufacturing method, and device manufactured thereby
04/05/2005US6875992 Position measuring device, position measuring system, lithographic apparatus, and device manufacturing method
04/05/2005US6875987 Substrate holding unit, exposure apparatus, and device manufacturing method
04/05/2005US6875971 Wafer edge exposure apparatus, and wafer edge exposure method
04/05/2005US6875956 Used to flow photoresist under the high pressure in the sealed oven during a resist flow process
04/05/2005US6875704 Method for forming pattern using printing process
04/05/2005US6875699 Method for patterning multilevel interconnects
04/05/2005US6875695 System and method for analog replication of microdevices having a desired surface contour
04/05/2005US6875624 Combined E-beam and optical exposure semiconductor lithography
04/05/2005US6875622 Method and apparatus for determining electromagnetic properties of a process layer using scatterometry measurements
04/05/2005US6875559 Method of etching materials patterned with a single layer 193nm resist
04/05/2005US6875557 Photopolymerization; development using alkalinity developer
04/05/2005US6875556 Resist compositions and patterning process
04/05/2005US6875555 Preparation and use of EXO-2-fluoroalkyl(bicyclo[2.2.1] hept-5-enes)
04/05/2005US6875554 Positive photosensitive polyimide resin composition
04/05/2005US6875553 Method of casting photoresist onto substrates
04/05/2005US6875552 Photoresist composition and method of making
04/05/2005US6875545 Performing a first exposure of the substrate utilizing a x-dipole illumination, and a second exposure of the substrate utilizing a y-dipole illumination; using optical proximity correction
04/05/2005US6875544 Method for the fabrication of three-dimensional microstructures by deep X-ray lithography
04/05/2005US6875542 Joining substrates by anode coupling; positioning marking; forming penetration aperture
04/05/2005US6875466 Coating a resist on the substrate, and placing in a vapor atmosphere
04/05/2005US6875283 Film forming apparatus and film forming method
04/05/2005US6875281 Method and system for coating and developing
03/2005
03/31/2005WO2005029559A1 Exposure apparatus and device producing method
03/31/2005WO2005029201A1 Holographic recording medium, holographic recording method, and holographic information medium
03/31/2005WO2005029193A2 Interferometric analysis of surfaces.
03/31/2005WO2005029192A2 Surface triangulation and profiling through a thin film coating
03/31/2005WO2005029191A2 Method and device for lithography by extreme ultraviolet radiation
03/31/2005WO2005029190A1 Photopolymer printing plate precursor
03/31/2005WO2005029189A1 Compound for resist and radiation-sensitive composition
03/31/2005WO2005029188A1 Photosensitive element, method of forming resist pattern, and process for producing printed wiring board
03/31/2005WO2005029187A1 Photopolymerizable composition.
03/31/2005WO2005029186A1 Light sensitive coating compositions useful for lithographic elements
03/31/2005WO2005029184A2 Positive photoresist composition and resist pattern formation
03/31/2005WO2005029183A2 Method and apparatus for protecting a reticle used in chip production from contamination
03/31/2005WO2005029182A2 Method and apparatus for protecting a reticle used in chip production from contamination
03/31/2005WO2005029181A2 Method and apparatus for compensating for the effects of gravity on a pellicle used for protecting a reticle from contamination
03/31/2005WO2005029178A2 A system and method for the direct imaging of color filters
03/31/2005WO2005029177A1 Liquid photo solder resist composition and photo solder resist film thereof
03/31/2005WO2005029138A2 Systems and methods for inducing crystallization of thin films using multiple optical paths
03/31/2005WO2005028537A1 Photocuring resin composition containing organic polymer having epoxy group and/or oxethane group-containing silicon group at end, and method for producing same
03/31/2005WO2005007719A3 Positive photoresist composition and method of forming resist pattern
03/31/2005WO2005000909A3 Multiphoton photosensitization system
03/31/2005WO2004114371A3 Compound used to form a self-assembled monolayer, layer structure, semiconductor component having a layer structure, and method for producing a layer structure
03/31/2005WO2004109757A3 Heat pipe with temperature control
03/31/2005WO2004108414A3 Lithographic printing plate system and method for manufacturing the plate system
03/31/2005WO2004092843A3 Projection lens, microlithographic projection exposure system and method for producing a semiconductor circuit
03/31/2005WO2004088425A3 Contact masks and lithographic patterning methods using said masks
03/31/2005US20050070624 Arylsulfinate salts in photoinitiator systems for polymerization reactions
03/31/2005US20050070622 Arylsulfinate salts in initiator systems for polymeric reactions
03/31/2005US20050070621 sulfur compounds that generate free radical upon exposure to actinic radiation, for use as activators for addition polymerization reactions; photopolymerization
03/31/2005US20050070125 Photo resist dispensing system and method
03/31/2005US20050070124 Direct photo-patterning of nanoporous organosilicates, and method of use
03/31/2005US20050070111 Etching method and computer storage medium storing program for controlling same
03/31/2005US20050070069 Raised-lines overlay semiconductor targets and method of making the same
03/31/2005US20050069821 reduce developing process defects; improve the development process time and the uniformity of the resist
03/31/2005US20050069819 Method for forming resist pattern and method for manufacturing semiconductor device
03/31/2005US20050069818 Absorption photoresists thinning to form image with secindary capture of electrons formed by ionizing radiation
03/31/2005US20050069817 Providing a substrate, forming a photoresists layer, masking a pattern and illuminaation through a mask, development to form pattern dry etching and stripping to form a mold
03/31/2005US20050069816 Process for forming a fine pattern using a top-coating composition for a photoresist and product formed by same
03/31/2005US20050069815 Forming a water soluble protective film on substrate irradiation with light followed by removal with water
03/31/2005US20050069814 Pattern formation method
03/31/2005US20050069813 Photoresists film with aperture patterns and swelling with liquid in apertures for reverse tapering of apertures for semiconductors
03/31/2005US20050069812 Planographic printing plate precursor
03/31/2005US20050069811 Actinic radiation absorber, polymerization initiator and a polymerzation monomer to form polymer layer that will carry ink that can be removed and forming images with exposure to laser beams
03/31/2005US20050069810 Lithographic printing plate precursor
03/31/2005US20050069809 Coating solution with organic solvents for applying defect-free coating to substrate
03/31/2005US20050069808 An acid generator, a solubilizing PFA copolymer; high precision patterns by using a vacuum ultraviolet ray with a wavelength less than 160 nm; microlithography
03/31/2005US20050069807 Photoresist composition