Patents
Patents for G03F 7 - Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printed surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor (127,176)
06/2005
06/30/2005WO2004083490A3 Methods and apparatus for patterned deposition of nanostructure-containing materials by self-assembly and related articles
06/30/2005US20050143271 with a sulfur-containing detergent that forms a protective film to prevent corrosion of aluminum wires; used in the manufacture of a highly integrated semiconductor with advanced scale-down; e.g. oxalic acid, ammonium sulfate, ultrapure water
06/30/2005US20050142881 Mask and method of using the same
06/30/2005US20050142855 Method for manufacturing semiconductor device
06/30/2005US20050142684 Method for fabricating a structure for a microelectromechanical system (MEMS) device
06/30/2005US20050142681 Mask and method of manufacturing liquid crystal display device using the same
06/30/2005US20050142501 Method of forming an isolated line pattern using photolithography
06/30/2005US20050142500 Exposure methods
06/30/2005US20050142497 Method of forming a pattern in a semiconductor device and method of forming a gate using the same
06/30/2005US20050142496 Method of fabricating bottom gate type organic thin film transistor
06/30/2005US20050142494 Photosensitivity; relief imaging; heating to liquify and absorbing via development medium
06/30/2005US20050142493 Aluminum support for lithographic printing plate and base plate for lithographic printing plate
06/30/2005US20050142491 Novel epoxy compounds having an alicyclic structure, polymer compounds, resist materials, and patterning methods
06/30/2005US20050142486 Chemically-amplified positive-acting resists that can be effectively imaged at short wavelengths; polymers containing acrylate/anhydride groups exhibit improved adhesion to underlying silicon oxynitride and silicon nitride surfaces; relief imaging
06/30/2005US20050142485 Image recording material
06/30/2005US20050142484 Image recording material
06/30/2005US20050142482 Photoresist for spacer and manufacturing method of liquid crystal display using the same
06/30/2005US20050142481 Poly(meth)acrolein acetalized with a hydroxyalkyl alkanoate, e.g., ethyl lactate; capable of preventing scattered reflection from a bottom film layer, eliminating standing wave effect due to alteration of of the photoresist film, and increasing thickness uniformity; increased etching velocity
06/30/2005US20050142480 a matted layer on a photopolymerizable layer which provides a unique surface topography to the photopolymerizable layer characterized by depressions that provide significantly improved printing quality; picks up less deposits of paper fibers and dried ink which would fill in reverses areas of the plate
06/30/2005US20050142479 Comprises epoxy compound and cationic photoinitiator; changes color as cures
06/30/2005US20050142465 Method for fabricating a liquid crystal display device
06/30/2005US20050142458 Exposure mask and exposure method using the same
06/30/2005US20050142454 Grid with a space smaller than a minimum pitch allowed by a design rule, and provides hole patterns at lattice points, which are the intersections of the grid; semiconductor integrated circuit manufacturing; flexibility of hole pattern arrangement and quality of hole pattern arrangement easily evaluated
06/30/2005US20050142452 Polycrystalline silicon thin film having uniform crystallization characteristics
06/30/2005US20050142320 Processing method for photoresist master, production method for recording medium-use mater, production method for recording medium, photoresist master, recording medium-use master and recording medium
06/30/2005US20050142298 Method for fabricating nano pore
06/30/2005US20050142292 Intaglio printing process using radically curable printing inks
06/30/2005US20050141891 Line width measuring method, substrate processing method, substrate processing apparatus and substrate cooling processing unit
06/30/2005US20050141761 Method and apparatus for measuring dimensions of a pattern on a semiconductor device
06/30/2005US20050141243 Differentially-cured materials and process for forming same
06/30/2005US20050141098 Very high-aperture projection objective
06/30/2005US20050140988 Optical critical dimension measurement equipment
06/30/2005US20050140986 Lithographic apparatus, overlay detector, device manufacturing method, and device manufactured thereby
06/30/2005US20050140967 Method for evaluating refractive index homogeneity of optical member
06/30/2005US20050140962 Lithographic apparatus and device manufacturing method
06/30/2005US20050140960 Method and device for alignment of a substrate
06/30/2005US20050140959 Exposure device, exposure method and device manufacturing method
06/30/2005US20050140958 Illumination system and polarizer for a microlithographic projection exposure apparatus
06/30/2005US20050140957 Optical attenuator device, radiation system and lithographic apparatus therewith and device manufacturing method
06/30/2005US20050140956 Lithographic apparatus, device manufacturing method, and device manufactured thereby
06/30/2005US20050140954 Projection optical system
06/30/2005US20050140952 Method of exposing a wafer to a light, and reticle, reticle assembly and exposing apparatus for performing the same
06/30/2005US20050140951 Lithographic apparatus
06/30/2005US20050140950 Lithographic apparatus and a method of compensating for thermal deformation in a lithographic apparatus
06/30/2005US20050140949 Lithographic apparatus, device manufacturing methods, mask and method of characterizing a mask and/or pellicle
06/30/2005US20050140948 Exposure apparatus and method
06/30/2005US20050140947 Exposure apparatus and device manufacturing method
06/30/2005US20050140946 Exposure system and method for manufacturing device
06/30/2005US20050140945 Lithographic apparatus having a debris-mitigation system, a source for producing EUV radiation having a debris mitigation system and a method for mitigating debris
06/30/2005US20050140943 Concentration measuring mechanism, exposure apparatus, and device production method
06/30/2005US20050140877 Trans-reflective type liquid crystal display device and method for fabricating the same
06/30/2005US20050140874 Transflective liquid crystal display device and fabricating method thereof
06/30/2005US20050140842 Substrate for a liquid crystal display device and fabricating method thereof
06/30/2005US20050140775 Film exposure method and apparatus using liquid crystal display
06/30/2005US20050140326 Positioning system and positioning method
06/30/2005US20050140017 Semiconductior device having improved contact hole structure and method for fabricating the same
06/30/2005US20050139935 Contactless flash memory array
06/30/2005US20050139790 Lithographic apparatus and device manufacturing method
06/30/2005US20050139785 Lithographic apparatus and radiation source comprising a debris-mitigation system and method for mitigating debris particles in a lithographic apparatus
06/30/2005US20050139576 Method and apparatus for fabricating flat panel display
06/30/2005US20050139242 Method for removing color photoresist
06/30/2005US20050139106 Image recording apparatus
06/30/2005US20050139103 Method and apparatus for micro-contact printing
06/30/2005US20050138988 Lithographic apparatus, method of calibration, calibration plate, device manufacturing method, and device manufactured thereby
06/30/2005DE10356668A1 Herstellungsverfahren für eine Hartmaske auf einer Halbleiterstruktur Production method of a hard mask on a semiconductor structure
06/30/2005DE10355725A1 Optisches System sowie Verfahren zur mikrolithographischen Herstellung mikrostrukturierter Bauteile Optical system and method for microlithographic production of microstructured components
06/30/2005DE10354582A1 Anordnung und Verfahren zur Unterdrückung von Speckle-Strukturen eines gepulsten Laserstrahles Arrangement and method for suppressing speckle structures of a pulsed laser beam
06/30/2005CA2549189A1 A process for the fabrication of optical microstructures
06/29/2005EP1548855A2 System and method for moving an object employing piezo actuators
06/29/2005EP1548816A2 Composition for cleaning semiconductor device
06/29/2005EP1548806A1 Alignment method, alignment substrate, production method for alignment substrate, exposure method, exposure system and mask producing method
06/29/2005EP1548805A1 Complementary division mask having alignment mark, method for forming alignment mark of the complementary division mask, semiconductor device manufactured by using the complementary division mask, and its manufacturing method
06/29/2005EP1548804A1 Illuminating optical system, exposure system and exposure method
06/29/2005EP1548803A1 Optical integrator, illumination optical device, exposure apparatus, and exposure method
06/29/2005EP1548802A1 Light conducting device
06/29/2005EP1548507A1 Method of measurement and a substrate
06/29/2005EP1548506A1 Lithographic apparatus and methods for use thereof
06/29/2005EP1548505A1 Lithographic projection apparatus and device manufacturing method
06/29/2005EP1548504A1 Thermal deformation of a wafer in a lithographic process
06/29/2005EP1548503A2 Lithographic apparatus and device manufacturing mehtod
06/29/2005EP1548502A1 Lithographic apparatus and device manufacturing method
06/29/2005EP1548501A2 Laser unit, exposure apparatus for micro-lithiographie and associated method
06/29/2005EP1548500A2 Patterning apparatus and method for fabricating continuous patterns using the same
06/29/2005EP1548499A1 Photosensitive composition for interlayer dielectric and method of forming patterned interlayer dielectric
06/29/2005EP1548498A1 Composition sensitive to visible light
06/29/2005EP1548497A1 Radiation sensitive composition, microlens, process for forming the microlens and use of the microlens
06/29/2005EP1548062A1 Optical material containing photocurable fluoropolymer and photocurable fluororesin composition
06/29/2005EP1547802A2 Image recording apparatus
06/29/2005EP1547801A2 Aluminum support for lithographic printing plate and base plate for lithographic printing plate
06/29/2005EP1547769A2 Printing process and manufacturing process of printing plate material
06/29/2005EP1547132A1 Surface processing method
06/29/2005EP1547126A2 System and method for manufacturing embedded conformal electronics
06/29/2005EP1546944A1 Methods and systems for process control of corner feature embellishment
06/29/2005EP1546813A1 Low silicon-outgassing resist for bilayer lithography
06/29/2005EP1546812A2 Lithographic method for wiring a side surface of a substrate
06/29/2005EP1546811A2 Lithographic printing members and a method and a system for preparation of lithographic printing members
06/29/2005EP1546809A2 Multiphoton photosensitization system
06/29/2005EP1546808A1 Photopolymerizable resin composition for sandblast resist
06/29/2005EP1546807A2 Planar inorganic device
06/29/2005EP1546806A2 Resist system, use of a resist system and lithography method for the production of semiconductor elements