Patents
Patents for G03F 7 - Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printed surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor (127,176)
07/2005
07/07/2005DE10255605B4 Reflektionsmaske zur Projektion einer Struktur auf einen Halbleiterwafer sowie Verfahren zu deren Herstellung Reflection mask for projecting a pattern on a semiconductor wafer, as well as processes for their preparation
07/07/2005DE102004059034A1 Ein Verfahren zum Herstellen einer Hartmaske in einem Kondensatorbauelement und eine Hartmaske zur Verwendung in einem Kondensatorbauelement A process for producing a hard mask in a capacitor device and a hard mask for use in a capacitor device
07/07/2005DE10137100B4 Transparenzverbesserung von Resist-Copolymeren für die 157 nm-Fotolithografie durch Einsatz von fluorierten Zimtsäurederivaten Improving transparency resist copolymers for 157 nm photolithography through the use of fluorinated cinnamic acid derivatives
07/07/2005CA2550676A1 Polyamide acid resin containing unsaturated group, photosentive resin composition using same, and cured product thereof
07/06/2005EP1551066A1 Material with pattern surface for use as template and process for producing the same
07/06/2005EP1551055A1 Method for manufacturing semiconductor device
07/06/2005EP1551020A1 Method of producing optical disk-use original and method of producing optical disk
07/06/2005EP1550912A1 Method for removing photoresist
07/06/2005EP1550677A1 Composition for holography, method of curing the same, and cured article
07/06/2005EP1550654A1 Aryl sulfonium salt, polymerizable composition and polymerization method of the same
07/06/2005EP1550004A2 Lighting system comprising a device for adjusting the light intensity
07/06/2005EP1550003A1 193nm resist
07/06/2005EP1549984A2 Retainer, exposure apparatus, and semiconductor device fabrication method
07/06/2005EP1549920A2 Irradiation device for testing objects coated with light-sensitive paint
07/06/2005EP1549481A2 Film having a patterned fibrillar surface, and method and apparatus for making the film
07/06/2005EP1549475A1 Imprint lithography processes and systems
07/06/2005EP1444551B1 Photoresist composition for deep uv radiation containing an additive
07/06/2005EP1430361B1 Carl for bioelectronics: substrate linkage using a conductive layer
07/06/2005EP1171292A4 Process for direct digital printing of circuit boards
07/06/2005CN1636268A Exposure apparatus, substrate processing system, and device manufacturing method
07/06/2005CN1636166A Composition for forming anti-reflective coating
07/06/2005CN1636165A Phase conflict resolution for photolithographic masks
07/06/2005CN1636040A Process for making green pigment compositions useful for colour filters and lcd's
07/06/2005CN1635611A Structure for lithography process and method for manufacturing semiconductor component
07/06/2005CN1635433A Heat-pipe constant-temperature high-precision sampling resistor
07/06/2005CN1635427A Frame of display panel and constructing method thereof
07/06/2005CN1635426A Frame glue refiller for display panel and filling method therefor
07/06/2005CN1635425A Method for restoring chromium pollution point on mask and used positioning board
07/06/2005CN1635424A Light shield processor and method for processing light shield using same
07/06/2005CN1635413A Method for making metallic reflective layer of silicon based LCD device
07/06/2005CN1635407A Method for manufacturing light guiding plate
07/06/2005CN1635406A Method for manufacturing light guiding plate core
07/06/2005CN1634909A 3- or 4- carbonyl substituted coumarin connected with naphthenones and its synthesis method and use
07/06/2005CN1634865A Photosensitive quaternary ammonium salt and its preparation method and use
07/06/2005CN1209686C Chemical-amplifying type positive photoetching gel composition
07/06/2005CN1209685C Photosensitive resin composition, photosensitive element using the same, method for producing resist pattern, and method for producing printed wiring board
07/06/2005CN1209684C Portrait appraising method and lithographic printing quality management method
07/06/2005CN1209682C Method for manufacturing semiconductor integrated circuit device, optical mask used therefor, method for manufacturing the same, and mask blanks used therefor
07/06/2005CN1209440C Composition containing azacyclic compound and glycol for grain decoration of resin material, removal of stain and removal of resin material
07/06/2005CN1209417C Active energy line solidified polyimide resin composition
07/06/2005CN1209388C Resin for chemically amplified resist
07/06/2005CN1209383C Method for manufacturing optical element by radiation curable fluorinated compound
07/06/2005CN1209349C Sulfonium salt preparation method
07/05/2005US6915505 Method and apparatus for performing rule-based gate shrink utilizing dipole illumination
07/05/2005US6915179 Pipe structure, alignment apparatus, electron beam lithography apparatus, exposure apparatus, exposure apparatus maintenance method, semiconductor device manufacturing method, and semiconductor manufacturing factory
07/05/2005US6915177 Comprehensive integrated lithographic process control system based on product design and yield feedback system
07/05/2005US6914927 Laser discharge chamber passivation by plasma
07/05/2005US6914919 Six to ten KHz, or greater gas discharge laser system
07/05/2005US6914732 Support stand
07/05/2005US6914723 Reflective lithography mask inspection tool based on achromatic Fresnel optics
07/05/2005US6914708 Apparatus and method for selectively exposing photosensitive materials using a spatial light modulator
07/05/2005US6914703 Capable of permanently forming a hologram having a low light scattering loss and high diffraction efficiency
07/05/2005US6914667 Exposure apparatus and purging method for the same
07/05/2005US6914666 Method and system for optimizing parameter value in exposure apparatus and exposure apparatus and method
07/05/2005US6914665 Exposure apparatus, exposure method, and device manufacturing method
07/05/2005US6914664 Lithographic apparatus, alignment method and device manufacturing method
07/05/2005US6914663 Exposure apparatus
07/05/2005US6914252 Charged beam exposure apparatus having blanking aperture and basic figure aperture
07/05/2005US6914114 Absorbing compounds for spin-on-glass anti-reflective coatings for photolithography
07/05/2005US6914017 Residue free overlay target
07/05/2005US6913873 Photoresist amplification; phenolic resin, acrylic polymer and acid generator
07/05/2005US6913872 Forming a photoresist structure having reduced thickness and rounded corners
07/05/2005US6913871 Fabricating sub-resolution structures in planar lightwave devices
07/05/2005US6913868 Conductive bi-layer e-beam resist with amorphous carbon
07/05/2005US6913867 Negative photosensitive resin composition, negative photosensitive dry film and method of forming pattern
07/05/2005US6913866 Multicolor image-forming material and multicolor image-forming method
07/05/2005US6913865 For patterning semiconductor wafers
07/05/2005US6913861 Method of observing exposure condition for exposing semiconductor device and its apparatus and method of manufacturing semiconductor device
07/05/2005US6913859 Mask for differential curing and process for making same
07/05/2005US6913858 Plurality of apertures expose first surface and second opaque pattern formed on transparent substrate; semiconductors, liquid crystal displays
07/05/2005US6913857 Reduced deformation due to heat generation
07/05/2005US6913781 Substrate processing apparatus and method including a device for applying a coating and a device for measuring the film quality of the coating
07/05/2005US6913373 Optical illumination device, exposure device and exposure method
07/05/2005US6913027 Resist stripping method and apparatus
07/05/2005US6912956 printing plate material comprising a substrate and a component layer provided thereon, the substrate having a center line average surface roughness Ra of from 0.2 to 1.0 mu m, and an oil-retention volume A2 of from 1 to 10, wherein
07/05/2005CA2352168C Color filters for flat panel displays
06/2005
06/30/2005WO2005060055A2 Gas discharge laser light source beam delivery unit
06/30/2005WO2005059977A1 Stage apparatus, exposure apparatus, and exposure method
06/30/2005WO2005059976A1 Substrate processing method, substrate processing apparatus and computer-readable recording medium
06/30/2005WO2005059655A2 A process for the fabrication of optical microstructures
06/30/2005WO2005059654A1 Objective as a microlithography projection objective with at least one liquid lens
06/30/2005WO2005059653A2 Polarization optically effective delay system for a microlithographic projection illumination device
06/30/2005WO2005059652A2 Photoresist composition for deep uv and process thereof
06/30/2005WO2005059649A2 Liquid crystal cell that resists degradation from exposure to radiation
06/30/2005WO2005059648A2 Deffect mitigation in spatial light modulator used for dynamic photolithography
06/30/2005WO2005059647A2 Real time image resizing for dynamic digital photolithography
06/30/2005WO2005059646A2 Photosensitive composition remover
06/30/2005WO2005059645A2 Microlithography projection objective with crystal elements
06/30/2005WO2005059618A2 Microlithography projection objective with crystal lens
06/30/2005WO2005059617A2 Projection objective having a high aperture and a planar end surface
06/30/2005WO2005059598A2 Spatial light modulator and method for performing dynamic photolithography
06/30/2005WO2005059531A1 Advanced roughness metrology
06/30/2005WO2005043603A3 Integrated ashing and implant annealing method
06/30/2005WO2005040890A3 Catadioptric projection objective with real intermediate images
06/30/2005WO2005038865A3 Amorphous carbon layer to improve photoresist adhesion
06/30/2005WO2005024325A3 Method and system for drying a substrate
06/30/2005WO2005000552A3 Method to reduce adhesion between a conformable region and a pattern of a mold
06/30/2005WO2004105096A3 Method of making barrier layers
06/30/2005WO2004105093A3 Tetra-organic ammonium fluoride and hf in supercritical fluid for photoresist and residue removal
06/30/2005WO2004093145A3 Voltage tunable photodefinable dielectric and method of manufacture therefore