Patents
Patents for G03F 7 - Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printed surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor (127,176)
12/2005
12/22/2005US20050281954 Method for producing a pellicle for lithography
12/22/2005US20050281639 Transport apparatus
12/22/2005US20050281638 Insertion device, lithographic apparatus with said insertion device and device manufacturing method
12/22/2005US20050280946 Wiring board, magnetic disc apparatus, and method of manufacturing wiring board
12/22/2005US20050280910 Method for the targeted deformation of an optical element
12/22/2005US20050280821 Illumination system having a light mixer for the homogenization of radiation distributions
12/22/2005US20050280799 Moving mechanism and stage system in exposure apparatus
12/22/2005US20050280798 Lithographic apparatus and device manufacturing method
12/22/2005US20050280797 Lithographic apparatus and device manufacturing method
12/22/2005US20050280796 Illumination optical system and method, and exposure apparatus
12/22/2005US20050280795 Lithographic apparatus and device manufacturing method
12/22/2005US20050280794 Illumination optical system, exposure apparatus, and device manufacturing method
12/22/2005US20050280792 Defining a pattern on a substrate
12/22/2005US20050280791 Exposure apparatus, exposure method, and method for producing device
12/22/2005US20050280790 Processing apparatus for processing object in vessel
12/22/2005US20050280789 Lithographic apparatus, device manufacturing method, and mask having a pellicle attached hereto
12/22/2005US20050280788 Lithographic apparatus and device manufacturing method
12/22/2005US20050280390 Electromagnetic alignment and scanning apparatus
12/22/2005US20050280314 Positioning mechanism for specimen inspection and processing
12/22/2005US20050280171 Mold for diffractive aspheric lenses and method for making the mold
12/22/2005US20050280150 Photolithographic techniques for producing angled lines
12/22/2005US20050280147 Imprinting lithography using the liquid/solid transition of metals and their alloys
12/22/2005US20050279951 Grazing incidence mirror, lithographic apparatus including a grazing incidence mirror, method for providing a grazing incidence mirror, method for enhancing EUV reflection of a grazing incidence mirror, device manufacturing method and device manufactured thereby
12/22/2005US20050279946 Systems and methods for deflecting plasma-generated ions to prevent the ions from reaching an internal component of an EUV light source
12/22/2005US20050279458 Plasma processing method and apparatus
12/22/2005US20050279453 System and methods for surface cleaning
12/22/2005US20050279380 Method for surface cleaning
12/22/2005US20050279234 Image recording material and lithographic printing plate precursor
12/22/2005DE4240747B4 Verfahren zum Herstellen einer Originalvorlage für eine Streuscheibe A method of manufacturing an original master for a diffuser
12/22/2005DE10356966A1 Verfahren zum Erstellen einer Steueranweisung für ein Maskenschreibgerät Procedure to create a control statement for a mask writing tool
12/22/2005DE10351607B4 Anordnung zur Projektion eines auf einer Photomaske gebildeten Musters auf einen Halbleiterwafer Arrangement for projecting a pattern formed on a photo mask onto a semiconductor wafer
12/22/2005DE10339786B4 Halbtonphasenmaske, Verfahren zur Herstellung derselben und Verfahren zur Projektion einer auf ihr gebildeten Struktur auf ein Substrat Halbtonphasenmaske, method for producing the same and method for projecting a film formed on their structure on a substrate
12/22/2005DE10254499B4 Schichtanordnung mit einer einen linsenartigen Effekt erzeugenden beugungsoptisch wirksamen Struktur Layer arrangement with a lens-like effect generating optically diffractive structure
12/22/2005DE102005009062A1 Heterodynlaserinterferometer zum Messen einer Waferstufentranslation Heterodynlaserinterferometer for measuring a wafer stage translation
12/22/2005DE102004027347A1 Wellenlängenselektor für den weichen Röntgen- und den extremen Ultraviolettbereich Wavelength for the soft X-ray and extreme ultraviolet region
12/22/2005DE102004026019A1 Programmable reflection mask, to structure micro-electronic and similar systems, has a matrix of micro-mirror pixel cells where photo elements convert optical signals into electrical signals for the control electrodes
12/22/2005DE102004025997A1 Einrichtung zur Erzeugung und Emission von XUV-Strahlung Means for generating and emission of XUV radiation
12/22/2005DE102004025837A1 Lithographic method for manufacture of resist pattern having line roughness involves unstructured exposure of resist to light e.g. floodlight of mercury vapor lamp and heating it so that its line roughness is reduced
12/22/2005DE102004025832A1 Optikmodul für ein Objektiv Optical module for a lens
12/22/2005DE102004015194B4 Printing plate illustrating device, has transport path for printing plates which is diagonally oriented in section between printing plate input and printing plate output, such that transport path runs in Z-form
12/22/2005DE10121179B4 Experimentelles Verfahren zur Verifikation von Abbildungsfehlern bei optischen Belichtungsgeräten Experimental procedure for the verification of aberrations in the optical exposure devices
12/22/2005CA2569777A1 Method and apparatus for the drying of the printing plates for flexography
12/22/2005CA2569749A1 Photosensitive resin for flexographic printing plate
12/22/2005CA2568795A1 Building up diffractive optics by structured glass coating
12/22/2005CA2567930A1 Methods and devices for forming nanostructure monolayers and devices including such monolayers
12/21/2005EP1608210A1 Wiring Board, Magnetic Disc Apparatus, and Method of Manufacturing Wiring Board
12/21/2005EP1608004A1 Projection optical system, exposure system, and exposure method
12/21/2005EP1608003A1 Mask repeater and mask manufacturing method
12/21/2005EP1606834A1 Uv nanoimprint lithography process using elementwise embossed stamp and selectively additive pressurization
12/21/2005EP1606671A2 Method and device for wetting a substrate with a liquid
12/21/2005EP1606670A2 Applications of semiconductor nano-sized particles for photolithography
12/21/2005EP1606657A1 Maskless optical interferometric lithography
12/21/2005EP1606326A2 Novel photosensitive resin compositions
12/21/2005EP1307777B1 Pneumatic control system and method for shaping deformable mirrors in lithographic projection systems
12/21/2005EP1154325B1 Flexographic printing plate and original plate therefor
12/21/2005EP0870188B1 Variable spot-size scanning apparatus
12/21/2005CN1711505A Protective layers compatible with thick film pastes
12/21/2005CN1711504A 抗蚀组合物 The resist composition
12/21/2005CN1711503A 负型感光性树脂组合物 The negative photosensitive resin composition
12/21/2005CN1711295A Photosensitive resin composition and process for the formation of hydrogel
12/21/2005CN1711290A Process for the preparation of hydroxy-vinyl-aromatic polymers or copolymers by anionic or controlled radical polymerization
12/21/2005CN1710490A Nano photoetching optical apparatus based on plasma ion wave
12/21/2005CN1710489A Chemical application apparatus and chemical application method
12/21/2005CN1710488A Resist for forming pattern and method for forming pattern using the same
12/21/2005CN1710447A Mould core of non-spherical diffraction lens and mfg. method thereof
12/21/2005CN1233022C Pattern formation material, water-soluble material and pattern formation method
12/21/2005CN1233021C Method for forming pattern of semiconductor device
12/21/2005CN1232885C Positive type photosensitive epoxy resin composition and printed circuit board using same
12/21/2005CN1232884C Photoresisting agent composition
12/21/2005CN1232875C Color light filter substrate and its mfg. method, liquid crystal device and mfg. method thereof and electronic machine
12/20/2005US6978436 Design data format and hierarchy management for phase processing
12/20/2005US6978191 Overlay registration control system and method employing multiple pilot lot in-line overlay registration measurement
12/20/2005US6978041 Review work supporting system
12/20/2005US6977728 Projection exposure apparatus and aberration measurement method
12/20/2005US6977718 Lithography method and system with adjustable reflector
12/20/2005US6977717 Method and device for determining projection lens pupil transmission distribution and illumination intensity distribution in photolithographic imaging system
12/20/2005US6977716 Catadioptric lithography system and method with reticle stage orthogonal to wafer stage
12/20/2005US6977714 Lithographic manufacturing process, lithographic projection apparatus, and device manufactured thereby
12/20/2005US6977713 Lithographic apparatus and device manufacturing method
12/20/2005US6977461 System and method for moving an object employing piezo actuators
12/20/2005US6977422 Method of deforming a pattern and semiconductor device formed by utilizing deformed pattern
12/20/2005US6977387 an opaque plate having an aperture with a central opening and a peripheral opening of an on-axis component and one off-axis component of illumination light to compensate for aberrations in optics of the imaging tool.
12/20/2005US6977364 System and method for compensating for dark current in photosensitive devices
12/20/2005US6977219 Solvent vapor-assisted plasticization of photoresist films to achieve critical dimension reduction during temperature reflow
12/20/2005US6977135 Photosensitive material for immersion photolithography
12/20/2005US6977133 Photomask and pattern forming method
12/20/2005US6977131 Selected polymeric sulfonate acid generators and their use in processes for imaging radiation-sensitive elements
12/20/2005US6977128 Multi-layered semiconductor structure
12/20/2005US6977025 Method of forming a monolayer of particles having at least two different sizes, and products formed thereby
12/20/2005US6976428 Wet offset printing form
12/20/2005US6976424 substrate having a two-sided rigid carrier layer providing on its first side a rigid patterned layer and the second softer layer; soft layer absorbs the deformation by distributing the load and leaves the pattern structure unchanged
12/15/2005WO2005119802A2 Adaptive shape substrate support system and method
12/15/2005WO2005119801A2 Compliant device for nano-scale manufacturing
12/15/2005WO2005119742A1 Exposure apparatus, exposure method, and device producing method
12/15/2005WO2005119729A2 Apparatus for generating and emitting xuv radiation
12/15/2005WO2005119592A1 Method for characterizing a digital imaging system
12/15/2005WO2005119395A2 Method and system to control movement of a body for nano-scale manufacturing
12/15/2005WO2005119372A1 Developer for a photopolymer protective layer
12/15/2005WO2005119371A1 Ultraviolet-transparent alkanes and processes using same in vacuum and deep ultraviolet applications
12/15/2005WO2005119370A2 High speed lithography machine and method