Patents
Patents for G03F 7 - Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printed surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor (127,176)
01/2006
01/19/2006WO2006006730A1 Planar motor equipment, stage equipment, exposure equipment and device manufacturing method
01/19/2006WO2006006565A1 Exposure equipment and device manufacturing method
01/19/2006WO2006006562A1 Method of determining exposure conditions, exposure method, exposure apparatus, and method of producing device
01/19/2006WO2006005547A1 Catadioptric projection objective
01/19/2006WO2006005149A2 Method of producing polymer layer with latent polarized image
01/19/2006WO2005109585A3 Graphic-arts laser imaging with reduced-length laser cavities and improved performance
01/19/2006WO2005101122A3 Cleaning of multi-layer mirrors
01/19/2006WO2005059618A3 Microlithography projection objective with crystal lens
01/19/2006WO2004013693A3 Scatterometry alignment for imprint lithography
01/19/2006US20060014381 Method for forming interconnection line in semiconductor device using a phase-shift photo mask
01/19/2006US20060014110 Photoresist stripping solution and a method of stripping photoresists using the same
01/19/2006US20060014108 Resist pattern forming method based on near-field exposure, and substrate processing method and device manufacturing method using the resist pattern forming method
01/19/2006US20060014104 Method for making a lithographic printing plate
01/19/2006US20060014103 Exposing heat-sensitive, negative-working printing plate precursor which is not sensitive to visible and UV light comprising a support with a hydrophilic layer and a coating; developing the precursor by applying an aqueous alkaline solution
01/19/2006US20060014102 Lining board for lithographic plate and its manufacturing method. and protected lithographic plate and its stack
01/19/2006US20060014100 high resolution, favorable shape, wide depth of focus; acrylic ester copolymer
01/19/2006US20060014098 Process for producing photoresist composition, filter, coater and photoresist composition
01/19/2006US20060013960 Apparatus and method for processing a substrate
01/19/2006US20060012893 Objective, in particular a projection objective in microlithography
01/19/2006US20060012880 Optical device with refractive and diffractive properties
01/19/2006US20060012799 Method and apparatus for determining telecentricity and microlithography projection exposure apparatus
01/19/2006US20060012769 Illumination optical system and exposure apparatus using the same
01/19/2006US20060012768 Exposure apparatus and optical component for the same
01/19/2006US20060012765 Exposure apparatus and device fabrication method
01/19/2006US20060012764 Exposure apparatus and method
01/19/2006US20060012762 Method for cleaning semiconductor device
01/19/2006US20060012051 Production process and production apparatus of three-dimensionally structured material
01/19/2006US20060011912 Method of forming a metal pattern and a method of fabricating tft array panel by using the same
01/19/2006US20060011895 Pb free Ag paste composition for PDP address electrode
01/19/2006US20060011864 Radiation generating device, lithographic apparatus, device manufacturing method and device manufactured thereby
01/19/2006US20060011855 Movable carriage for a lithographic apparatus and device manufacturing method
01/19/2006DE4238404B4 Verfahren zur Herstellung einer Halbleiterspeichervorrichtung A method of manufacturing a semiconductor memory device
01/19/2006DE10239956B4 Katadioptrisches Mikroskopobjektiv A catadioptric microscope objective
01/19/2006DE102004059252A1 Optically active structure application method for Fresnel lens manufacture, involves photographic structuring photosensitive resist layer, coating substrate with optically active layer and lifting-off resist layer
01/19/2006DE102004031111A1 Sub lithographic structure production, involves removing etch resistant layer and hard mask layer, and providing eventually isotopic etching in such manner that sub lithographic conducting layer is obtained
01/19/2006DE102004030861A1 Structuring a semiconductor substrate in a lithographic manner comprises preparing a semiconductor substrate, applying a first layer containing a photoresist and further processing
01/19/2006DE102004030803A1 Hochreflektiv beschichteter mikromechanischer Spiegel, Verfahren zu dessen Herstellung sowie dessen Verwendung Highly reflective coated micro-mechanical mirror, process for its preparation and its use
01/19/2006DE102004030019A1 Photopolymerisierbare Zusammensetzung A photopolymerizable composition
01/19/2006DE102004020744A1 Test layout used in the production of deep trench capacitive memory elements comprises a first test pattern arranged in the middle position of a test region, a second test pattern close to the first test pattern and a third test pattern
01/19/2006DE102004016480B4 Vollintegrierte hybride optisch-elektrische Leiterplatte Fully integrated hybrid optical-electrical circuit board
01/19/2006DE10131488B4 Verfahren zur chemischen Nachverstärkung von Photoresists im UV-Bereich A method for chemical amplification of photoresists in the UV range
01/19/2006DE10131144B4 Verstärkung von Resiststrukturen aus fluorierten Resistpolymeren durch strukturelles Aufwachsen der Strukturen mittels gezieltem chemischem Anbinden von fluorierten Oligomeren Amplification of resist structures of fluorinated polymer resist by structural growth of the structures by means of targeted chemical binding of fluorinated oligomers
01/19/2006CA2573328A1 Microstructuring of mesogens using contact printing
01/18/2006EP1617292A2 Light source unit and exposure apparatus having the same
01/18/2006EP1617291A2 Immersion exposure liquid and pattern formation method
01/18/2006EP1617290A1 Apparatus and method for maskless lithography
01/18/2006EP1617289A1 Composition for formation of underlayer film for lithography containing epoxy compound and carboxylic acid compound
01/18/2006EP1617288A1 Photosensitive composition and lithographic printing plate precursor
01/18/2006EP1617287A1 Method of manufacturing mask blank
01/18/2006EP1616888A1 Resin for under-layer material, under-layer material, laminate and method for forming resist pattern
01/18/2006EP1616854A1 Polymerizable fluorinated ester, manufacturing method, polymer, photoresist composition and patterning process
01/18/2006EP1616344A2 Creation of a permanent structure with high three-dimensional resolution
01/18/2006EP1616225A2 Precision motion control using feed forward of acceleration
01/18/2006EP1616224A2 Micromachining process, system and product
01/18/2006EP1616220A2 Maintaining immersion fluid under a lithographic projection lens
01/18/2006EP1616211A1 Exposure control
01/18/2006EP1615695A2 Collector for euv light source
01/18/2006EP1540287A4 Backlighting system for displays
01/18/2006EP1258060A4 Fast wavelength correction technique for a laser
01/18/2006CN1723594A Ultraviolet light source, laser treatment apparatus comprising ultraviolet light source, and exposure apparatus comprising ultraviolet light source
01/18/2006CN1723542A Exposure apparatus and device manufacturing method
01/18/2006CN1723541A Exposure apparatus and method for producing device
01/18/2006CN1723540A Exposure apparatus and method for producing device
01/18/2006CN1723539A Exposure apparatus, exposure method, and method for producing device
01/18/2006CN1723538A Exposure apparatus and method for producing device
01/18/2006CN1723537A Exposure apparatus and method for producing device
01/18/2006CN1723536A Exposure apparatus and method for producing device
01/18/2006CN1723519A Field emission device, and method of manufacturing such a device
01/18/2006CN1723499A Liquid removal in a method and device for irradiating spots on a layer
01/18/2006CN1723419A Resistor structures to electrically measure unidirectional misalignment of stitched masks
01/18/2006CN1723418A Composition for forming antireflection film for lithography
01/18/2006CN1723417A Apparatus and method for making a forming structure
01/18/2006CN1723416A Picture dimension correcting unit and method, photomask and test used photomask
01/18/2006CN1723384A Method to detect a defective element
01/18/2006CN1723222A Novel photosensitive resin based on saponified polyvinyl acetate, photosensitive resin composition, method of forming aqueous gel from the same, and compound
01/18/2006CN1722426A Semiconductor unit
01/18/2006CN1722380A Manufacture method of semiconductor device for improving photo resist remainder after etch
01/18/2006CN1722366A Method for manufacturing semiconductor device
01/18/2006CN1722361A Substrate processing device and method, and pattern forming method
01/18/2006CN1722002A Photoresistive desquamation process and apparatus thereof
01/18/2006CN1722001A Lithographic projection apparatus and device manufacturing method
01/18/2006CN1722000A Exposure apparatus and aberration correction method
01/18/2006CN1721999A Radiation generating device, lithographic apparatus, device manufacturing method and device manufactured thereby
01/18/2006CN1721998A Lithographic apparatus and device manufacturing method
01/18/2006CN1721997A Multi-focus scanning with a tilted mask or wafer
01/18/2006CN1721996A Image drawing apparatus and image drawing method
01/18/2006CN1721995A Optical magnification adjustment system and projection exposure device
01/18/2006CN1721994A Lithographic apparatus, control system and device manufacturing method
01/18/2006CN1721993A System and method for moving an object employing piezo actuators
01/18/2006CN1721992A Star polymer
01/18/2006CN1721991A Production method for photosensitive resin composition and element and related members
01/18/2006CN1721990A Composition for forming sheet materials, production method thereof, and sheet-shape unsintered materials for producing display screen
01/18/2006CN1721989A Photoresist composition
01/18/2006CN1721986A Mask pattern for manufacturing semiconductor device and its forming method, method for manufacturing coating composition for forming micropattern, and method for manufacturing semiconductor device
01/18/2006CN1721962A Gray mask and manufacturing method thereof
01/18/2006CN1721960A Gray mask and method for manufacturing gray mask
01/18/2006CN1721959A Liquid crystal display picture element structure and manufacturing method thereof and liquid crystal display panel
01/18/2006CN1721925A Liquid crystal display apparatus and method of manufacturing the same
01/18/2006CN1721888A Colored photosensistive resin composition, coating film of colored photosensitive resin composition, photosensitive resin transfer material
01/18/2006CN1721880A Optical devices made from radiation curable fluorinated compositions