Patents
Patents for G03F 7 - Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printed surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor (127,176)
02/2006
02/21/2006US7001696 Near-field light exposure mask with avoidance of overlap of near-field light, method for manufacturing the same, exposure apparatus and method using near-field light exposure mask, and method for manufacturing device
02/21/2006US7001695 Multiple alternating phase shift technology for amplifying resolution
02/21/2006US7001674 Polishing semiconductors, integrated circuits; multistage process; transferring pattern, masking
02/21/2006US7001644 Surface-active photoinitiators
02/21/2006US7001462 Method for making an oriented optical fluoride crystal blank
02/21/2006US7001461 Crystallization apparatus, crystallization method, and phase shifter
02/21/2006US7001086 Developing method, substrate treating method, and substrate treating apparatus
02/16/2006WO2006017791A2 Aqueous developable photo-imageable composition precursors for use in photo-patterning methods
02/16/2006WO2006017035A1 Photosensitive dielectric resin compositions and their uses
02/16/2006WO2006016925A1 Photosensitive compositions based on polycyclic polymers
02/16/2006WO2006016619A1 Substrate processing apparatus, use state ascertaining method, and false use preventing method
02/16/2006WO2006016584A1 Optical characteristic measuring device, optical characteristic measuring method, exposure device, exposure method, and device manufacturing method
02/16/2006WO2006016551A1 Method for controlling exposure system, exposure method and system using same, and method for manufacturing device
02/16/2006WO2006016489A1 Substrate processing method
02/16/2006WO2006016469A1 Illumination optical equipment, exposure system and method
02/16/2006WO2005064412A3 Lithographic apparatus and device manufacturing method
02/16/2006WO2005045527A3 Method of lacquering semiconductor substrates
02/16/2006WO2004107413A3 Plasma ashing apparatus and endpoint detection process
02/16/2006WO2004097519A3 Method and mark for metrology of phase errors on phase shift masks
02/16/2006WO2004088414A3 Positive tone bi-layer imprint lithography method and compositions therefor
02/16/2006US20060036023 Color filter black matrix resist composition
02/16/2006US20060035472 Master base for fabrication and method for manufacturing the same
02/16/2006US20060035176 Photoresist stripping solution and a method of stripping photoresists using the same
02/16/2006US20060035174 Pixel structure of a thin film transistor liquid crystal display and fabricating method thereof
02/16/2006US20060035173 Patterning thin metal films by dry reactive ion etching
02/16/2006US20060035170 Negative photoresist compositions for the formation of thick films, photoresist films and methods of forming bumps using the same
02/16/2006US20060035169 Negative photoresist compositions for the formation of thick films, photoresist films and methods of forming bumps using the same
02/16/2006US20060035167 Ultrathin polymeric photoacid generator layer and method of fabricating at least one of a device and a mask by using said layer
02/16/2006US20060035165 Positive resist composition and method of forming a resist pattern using the same
02/16/2006US20060035164 Replication and transfer of microstructures and nanostructures
02/16/2006US20060035158 Flowing a reference pattern and an inspection pattern with a first line and a number of parallel second lines and a reference pattern in the orthogonal direction to that in which the first line extends by heating the resist; measuring the distance between the centers of the patterns; checking variations
02/16/2006US20060035157 Depositing resist on portion of workpiece, transferring pattern on mask by exposing to light from light guiding cable with connector, mask removable by connector, developing, forming pattern by etching
02/16/2006US20060034344 Apparatus and method for forming pattern
02/16/2006US20060034004 Optical element holder, exposure apparatus, and device fabricating method
02/16/2006US20060033917 Calibration wafer for a stepper
02/16/2006US20060033916 Selection method, exposure method, selection unit, exposure apparatus, and device manufacturing method
02/16/2006US20060033904 Substrate holding device, semiconductor manufacturing apparatus and device manufacturing method
02/16/2006US20060033901 Exposure apparatus and method for manufacturing device
02/16/2006US20060033900 Exposure method and apparatus
02/16/2006US20060033899 Environmental system including vacuum scavenge for an immersion lithography apparatus
02/16/2006US20060033898 Lithographic apparatus and device manufacturing method
02/16/2006US20060033895 Illumination system having a more efficient collector optic
02/16/2006US20060033894 Apparatus and method for maintaining immersion fluid in the gap under the projection lens during wafer exchange in an immersion lithography machine
02/16/2006US20060033893 Exposure technique
02/16/2006US20060033892 Lithographic apparatus and device manufacturing method
02/16/2006US20060033876 Liquid crystal displays with post spacers, and their manufacture
02/16/2006US20060033800 Exposure apparatus
02/16/2006US20060033055 Surface position detection apparatus and method, and exposure apparatus and device manufacturing method using the exposure apparatus
02/16/2006US20060033051 Lithographic apparatus, device manufacturing method, device manufactured thereby, and computer program
02/16/2006US20060033050 Electron-beam drawing apparatus and electron-beam drawing method
02/16/2006US20060033019 Polarization state detecting system, light source, and exposure apparatus
02/16/2006US20060033012 System for compensating for dark current in sensors
02/16/2006US20060032835 Method and apparatus for simulating standard test wafers
02/16/2006US20060032569 Tire with raised indicia
02/16/2006DE10323664B4 Belichtungsvorrichtung mit Dosissensorik Exposure apparatus with dose Sensors
02/16/2006DE102005033916A1 Ausrichtung eines MTJ-Stapels an Leiterbahnen in Abwesenheit von Topographie Orientation of a MTJ stack of printed conductors in the absence of topography
02/16/2006DE102005026632A1 Illumination system for a microlithographic projector comprises a transmission filter for correcting the light distribution reaching a mask
02/16/2006DE102005021346A1 Adjustable layer (reversibly adjusted from hydrophobic to hydrophilic condition), useful e.g. in printing plate surfaces, comprises oxide of e.g. titanium; heteroanalogous carbonyl compounds; and carbonyl compounds formed as polymer
02/15/2006EP1626310A1 Lithographic projection apparatus and device manufacturing method
02/15/2006EP1626309A2 Hologram recording material, hologram recording method and holographic optical element
02/15/2006EP1626106A2 Method of forming a conductive wiring pattern by laser irradiation and a conductive wiring pattern
02/15/2006EP1625952A1 Tire with raised indicia
02/15/2006EP1625610A2 Plasma ashing apparatus and endpoint detection process
02/15/2006EP1625580A1 Multi-layer structure and method of drawing microscopic structure therein
02/15/2006EP1625447A2 Photoacid generators with perfluorinated multifunctional anions
02/15/2006EP1418059B1 Multicolor image forming material and multicolor image forming method using the same
02/15/2006EP1360554B1 Process control
02/15/2006EP1086156B1 Production of acetal derivatized hydroxyl aromatic polymers and their use in radiation sensitive formulations
02/15/2006EP0728788B1 Process for producing photosensitive resin and liquid photosensitive resin composition
02/15/2006CN1735959A Exposure device, exposure method, and semiconductor device manufacturing method
02/15/2006CN1735839A Device and method for producing flexographic plates using digital imaging, for newspaper printing
02/15/2006CN1735655A Organic bottom anti-reflective composition and patterning method using the same
02/15/2006CN1735319A Photomask apparatus, photomask manufacturing method, and mask pattern forming method
02/15/2006CN1735171A Method of manufacturing substrate having recessed portions for microlenses and transmissive screen
02/15/2006CN1734715A Small lot size lithography bays
02/15/2006CN1734713A Substrate treating apparatus
02/15/2006CN1734355A Apparatus for forming image on plate and inter-sleeve raster scanning method
02/15/2006CN1734354A Lithographic apparatus, an apparatus comprising an illumination system, and device manufacturing method
02/15/2006CN1734353A Photolithography device and method for manufacturing the same
02/15/2006CN1734352A Mask pattern for semiconductor device fabrication, method of forming the same, and method of fabricating finely patterned semiconductor device
02/15/2006CN1734351A Photosensitive resin composition for isolator
02/15/2006CN1734350A Composition for forming organic insulating film and method for forming pattern of organic insulating film using the same
02/15/2006CN1734349A Photosensitive dielectric compositions, tapes, and method of application of a dielectric sheet using the same
02/15/2006CN1734337A 掩模 Mask
02/15/2006CN1734334A Liquid crystal display device and fabrication method thereof
02/15/2006CN1734332A Pixel structure of thin film transistor LCD and manufacturing method thereof
02/15/2006CN1734327A Method for preparing photo-patterned light polarizing films
02/15/2006CN1734302A Process for producing optical waveguide
02/15/2006CN1734296A Radiation inductive combination used for color screen, color screen and color liquid crystal display element
02/15/2006CN1242465C Interface device for transmitting filling box
02/15/2006CN1242455C Patterning method for integrated circuit
02/15/2006CN1242452C Image forming method, exposure mask for forming image and its making process
02/15/2006CN1242303C Agent for lowering dependence of substrate
02/15/2006CN1241950C Polymerizable composition
02/15/2006CN1241737C Chemical imaging of a lithographic printing plate
02/14/2006USRE38980 forms highly resolved relief images of submicron dimension with vertical sidewalls, uniformly imaged across the full width of a wafer over which the photoresist is coated, regardless of the temperature differential across the surface of resist
02/14/2006US7000216 Exposure pattern forming method and exposure pattern
02/14/2006US7000215 Method of and computer program product for designing patterns, and method of manufacturing semiconductor device
02/14/2006US6999893 Position detecting device and position detecting method
02/14/2006US6999254 Refractive index system monitor and control for immersion lithography