Patents
Patents for G03F 7 - Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printed surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor (127,176)
03/2006
03/02/2006WO2005029183A3 Method and apparatus for protecting a reticle used in chip production from contamination
03/02/2006US20060046497 Manufacturing method
03/02/2006US20060046451 Methods of forming transistor gates; and methods of forming programmable read-only memory constructions
03/02/2006US20060046361 Stripping composition for removing a photoresist and method of manufacturing tft substrated for a liquid crystal display device using the same
03/02/2006US20060046213 Method for optimizing wafer edge patterning
03/02/2006US20060046212 Integrated circuit lithography
03/02/2006US20060046211 Effectively water-free immersion lithography
03/02/2006US20060046210 photolithography; wafer blank
03/02/2006US20060046208 Film pattern producing method, and producing method for electronic device, electron-emitting device and electron source substrate utilizing the same
03/02/2006US20060046207 Exposure method
03/02/2006US20060046206 Photoactive resist capping layer
03/02/2006US20060046205 Mask pattern for semiconductor device fabrication, method of forming the same, and method of fabricating finely patterned semiconductor device
03/02/2006US20060046203 Method for producing a thin film transistor and a device of the same
03/02/2006US20060046202 forming circuit patterns on surfaces of clad metals, then applying photoresists, exposing, conditioning, stripping and plating with dielectrics, to form multilayer printed circuit with expandable electrical resistance; stability
03/02/2006US20060046201 Method to align mask patterns
03/02/2006US20060046200 Mask material conversion
03/02/2006US20060046199 Imagewise exposing printing plate precursor comprising a support,image recording layer andprotective layer; rubbing the plate surface by an automatic rubbing processor in the presence of a non-alkaline developerto remove the protective layer and the image recording layer in the unexposed area
03/02/2006US20060046168 Method for designing an illumination light source, method for designing a mask pattern, method for manufacturing a photomask, method for manufacturing a semiconductor device and a computer program product
03/02/2006US20060046162 Manufacturing method of semiconductor device
03/02/2006US20060046010 Stereolithographic seal and support structure for semiconductor wafer
03/02/2006US20060045988 Pretreatment process of a substrate in micro/nano imprinting technology
03/02/2006US20060044639 3-d holographic recording method and 3-d holographic recording system
03/02/2006US20060044537 Stage alignment apparatus and its control method, exposure apparatus, and semiconductor device manufacturing method
03/02/2006US20060044536 Exposure apparatus equipped with interferometer and exposure apparatus using the exposure apparatus
03/02/2006US20060044533 System and method for reducing disturbances caused by movement in an immersion lithography system
03/02/2006DE112004000566T5 Verfahren zum Herstellen eines Maskenrohlings und Verfahren zum Herstellen einer Maske A method for producing a mask blank and method for making a mask
03/02/2006DE102004055248B3 Verfahren zum Ausbilden eines Kontaktes in einer Halbleiterscheibe A method of forming a contact in a semiconductor wafer
03/02/2006DE102004041197A1 Strahlungsempfindliche Masse Radiation-sensitive composition
03/02/2006DE102004019835A1 Beleuchtungskondensor für ein Partikeloptik-Projektionssystem Illumination condenser for a particle optics projection system
03/02/2006DE10026029B4 Verfahren zum Ablösen von Photoresistlacken Method for stripping photoresists
03/02/2006CA2575991A1 Cleaning compositions for microelectronics substrates
03/02/2006CA2575238A1 Photopolymerizable silicone materials forming semipermeable membranes for sensor applications
03/01/2006EP1630857A1 Position information measuring method and device, and exposure method and system
03/01/2006EP1630856A1 Mutilayer film reflector and x-ray exposure system
03/01/2006EP1630618A2 Production method of lithographic printing plate, lithographic printing plate precursor and lithographic printing method
03/01/2006EP1630617A2 A method of performing resist process calibration and optimisation, and a method of performing optimisation of the diffractive optical element (DOE) for providing optical proximity effect (OPE) matching between different lithography systems
03/01/2006EP1630616A2 System for reducing movement induced disturbances in immersion lithography
03/01/2006EP1630615A2 Adjustable resolution interferometric lithography system
03/01/2006EP1630614A1 Method for designing an illumination light source, method for designing a mask pattern, method for manufacturing a photomask, method for manufacturing a semiconductor device and a computer program product
03/01/2006EP1630613A2 Patterned mask holding device and method using two holding systems
03/01/2006EP1630612A2 Method for manufacturing a microstructure, exposure device, and electronic apparatus
03/01/2006EP1630611A2 Planographic printing plate precursor
03/01/2006EP1630610A1 Protective film-forming composition for immersion exposure and pattern forming method using the same
03/01/2006EP1630609A1 Printing plate material and printing plate
03/01/2006EP1630608A2 Planographic printing plate precursor
03/01/2006EP1630607A2 Positive resist composition and pattern forming method utilizing the same
03/01/2006EP1630606A1 Positive photosensitive composition
03/01/2006EP1630605A1 Photosensitive resin composition, and electronic component and display using same
03/01/2006EP1630604A2 Photosensitive lithographic printing plate
03/01/2006EP1630603A1 Photosensitive composition, photosensitive lithography plate and method for producing lithography plate
03/01/2006EP1630602A2 Polymerizable composition, hydrophilic film formed by curing said composition and planographic printing plate precursor
03/01/2006EP1630601A2 A mask manufacturing method, a method for optical proximity correction, a device manufacturing method, a computer program and a computer readable storage medium
03/01/2006EP1630600A2 Hot melt composition and method involving forming a masking pattern
03/01/2006EP1630585A1 Projection optical system, and exposure apparatus and exposure method
03/01/2006EP1630575A1 Microlens array sheet having black matrix and method of manufacturing the same
03/01/2006EP1630127A1 Method for realising a hosting structure of nanometric elements
03/01/2006EP1629976A2 Planographic printing plate precursors, stacks of planographic printing plate precursors , and methods of making planographic printing plates
03/01/2006EP1629507A2 Scanning probe microscopy probe and method for scanning probe contact printing
03/01/2006EP1629316A2 Micro-lens array with precisely aligned aperture mask and methods of producing same
03/01/2006EP1629268A2 Method and device for cleaning at least one optical component
03/01/2006EP1629246A2 Heat pipe with temperature control
03/01/2006EP1629046A2 Curable polymer compound
03/01/2006EP1540459A4 Reticle manipulating device
03/01/2006EP1309437B1 Differentially cured materials and process for forming same
03/01/2006EP1252028A4 Temporary bridge for micro machined structures
03/01/2006EP1157310B1 A method for replicating a surface relief and an article for holding a surface relief
03/01/2006EP1157307B1 Photoresist dispense method by compensation for substrate reflectivity
03/01/2006EP1108275A4 Tangential fan with cutoff assembly and vibration control for electric discharge laser
03/01/2006EP1044074A4 Photoresist coating process control with solent vapor sensor
03/01/2006EP0980542A4 Method of patterning sub-0.25 lambda line features with high transmission, "attenuated" phase shift masks
03/01/2006CN2762187Y Nano-class pattern impression device
03/01/2006CN1742413A Injection seeded F2 laser with wavelength control
03/01/2006CN1742235A Binder diffusion transfer patterning of a thick film paste layer
03/01/2006CN1742234A 抗蚀剂组合物 The resist composition
03/01/2006CN1742233A Positive imageable thick film compositions
03/01/2006CN1742077A Detergent composition for alkali development apparatus
03/01/2006CN1742063A Coating composition, antireflection film, photoresist and pattern formation method using it
03/01/2006CN1742029A Process for refining crude resin for electronic material
03/01/2006CN1741863A Method for cleaning an article
03/01/2006CN1740916A System and method for reducing movement induced disturbances in immersion lithography
03/01/2006CN1740915A Method for manufacturing a microstructure, exposure device, and electronic apparatus
03/01/2006CN1740914A Exposure apparatus
03/01/2006CN1740913A Optical micro-electromechanical component and producing method thereof
03/01/2006CN1740912A Method for correcting photoetching technology and method for forming superimposed mark
03/01/2006CN1740911A Chemical amplification type positive resist composition, resist laminated material, resist pattern forming method and method of manufacturing semiconductor device
03/01/2006CN1740910A Patterned mask holding device and method using two holding systems
03/01/2006CN1740908A Method for producing quartz/Az photoresist ultraviolet photoetched mask
03/01/2006CN1740842A Lighting optical device
03/01/2006CN1740827A Method for producing reflective metal optical grating
03/01/2006CN1739976A Method for producing printing plate
03/01/2006CN1739912A Molding process
03/01/2006CN1244023C Stripping liquor for photoresist and photoresist stripping method therewith
03/01/2006CN1244022C 曝光装置 Exposure device
03/01/2006CN1244021C Photoetching device and exposure method
03/01/2006CN1244020C Exposure device
03/01/2006CN1244019C Exposure apparatus and exposure method
03/01/2006CN1244018C Exposure method and equipment
03/01/2006CN1244017C Method of molecular-scale pattern imprinting at surface
03/01/2006CN1244016C Exposure controlling light mask and production method thereof
03/01/2006CN1243744C Process for producing epoxy compound