Patents
Patents for G03F 7 - Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printed surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor (127,176)
03/2006
03/15/2006CN1748181A Radiation-sensitive resin composition, process for producing the same and process for producing semiconductor device therewith
03/15/2006CN1748180A Process for refining crude resin for resist
03/15/2006CN1747917A Radiation durable organic compounds with high transparency in the vaccum ultraviolet, and method for preparing
03/15/2006CN1746878A Parameter adaptive method of analog photoetching process of computer
03/15/2006CN1746776A Substrate processing apparatus and substrate positioning device
03/15/2006CN1746775A Lithographic apparatus and device manufacturing method
03/15/2006CN1746774A Exposure system and pattern formation method
03/15/2006CN1746773A Pattern transferring method of conductive structure
03/15/2006CN1746772A Method for reducing lead wire figure by T-shaped photoresist pattern
03/15/2006CN1746771A Improved cylinder gluer
03/15/2006CN1746770A 光敏糊状物组合物 The photosensitive paste composition
03/15/2006CN1746769A Lithographic apparatus, method and a computer program product for generating a mask pattern on an addressable mask and device manufacturing method using same
03/15/2006CN1746726A Polarizing reticle
03/15/2006CN1746705A Production of differential silica waveguide with high refractive index by ultraviolet laser written in
03/15/2006CN1746204A Water photosensitive resin emulsion and preparation thereof
03/15/2006CN1245669C Micro imaging method capable of reducing influence of lens aberration
03/15/2006CN1245668C Exposure system and method thereof
03/15/2006CN1245667C Graph forming method
03/15/2006CN1245666C Method for baking photoresistive in multistage in order to improve photolithograph quality
03/15/2006CN1245665C Positive photosensitive polyimide resin composition
03/15/2006CN1245664C Radiation-sensitive composition changing in refractive index and method of changing refractive index
03/15/2006CN1245662C Optical hood for reducing lens aberration and pattern shifting and method
03/15/2006CN1245657C Method for producing light interference type display unit
03/14/2006US7013453 Full sized scattering bar alt-PSM technique for IC manufacturing in sub-resolution ERA
03/14/2006US7012763 Aperture plate for lithography systems
03/14/2006US7012690 Substrate processing apparatus
03/14/2006US7012674 Maskless optical writer
03/14/2006US7012673 Lithographic apparatus and device manufacturing method
03/14/2006US7012672 Lithographic apparatus, system, method, computer program, and apparatus for height map analysis
03/14/2006US7012671 Exposure apparatus and method
03/14/2006US7012670 Method and apparatus for adjusting a photo-exposure time
03/14/2006US7012629 Temperature compensating image recording device
03/14/2006US7012398 Electromagnetic alignment and scanning apparatus
03/14/2006US7012291 Monolithic three-dimensional structures
03/14/2006US7012270 Photolithography system having multiple adjustable light sources
03/14/2006US7012265 Lithographic apparatus, integrated circuit device manufacturing method, and integrated circuit device manufactured thereby
03/14/2006US7012264 Lithographic apparatus and device manufacturing method
03/14/2006US7012161 Compound, fluorine-containing polymerizable cyclic olefin compound
03/14/2006US7012125 Spin-on-glass anti-reflective coatings for photolithography
03/14/2006US7012051 Using mixture containing hydroxylamine compound
03/14/2006US7012031 Photoresist pattern, method of fabricating the same, and method of assuring the quality thereof
03/14/2006US7011936 Photomask and method of structuring a photoresist by double exposure with imaging auxiliary structures and different exposure tools
03/14/2006US7011935 Method for the removal of an imaging layer from a semiconductor substrate stack
03/14/2006US7011934 Forming a first molecular layer of trimethylsilyl groups on underlying film by reaction with hexamethyldisilazane while annealing; allowing the film to stand outside the firstchamber; forming a trimethylsilyl layer on the first
03/14/2006US7011933 photoresist patterning and development method for achieving convex or concave micro-structural features
03/14/2006US7011931 For front or back plate of panel, comprises conductive paste and black pigment
03/14/2006US7011929 Forming barrier sidewall spacers; overcoating substrate with dielectric; anisotropic etching
03/14/2006US7011928 Image formation method of planographic printing plate material
03/14/2006US7011926 Gap forming pattern fracturing method for forming optical proximity corrected masking layer
03/14/2006US7011924 Photoresist polymers and photoresist compositions comprising the same
03/14/2006US7011923 Negative photoresist and method of using thereof
03/14/2006US7011922 Thermal recording material
03/14/2006US7011915 Exposure parameter obtaining method, exposure parameter evaluating method, semiconductor device manufacturing method, charged beam exposure apparatus, and method of the same
03/14/2006US7011889 Organosiloxanes
03/14/2006US7011381 Counter top ticket dispenser, display, and writing stand
03/14/2006US7010958 High-resolution gas gauge proximity sensor
03/10/2006CA2502123A1 Substituted benzene developing solvent for photopolymerizable printing plates
03/09/2006WO2006026765A2 Plasma ashing process for increasing photoresist removal rate and plasma apparatus wuth cooling means
03/09/2006WO2006026665A2 Increasing adhesion in an imprinting procedure
03/09/2006WO2006025760A2 Method for producing an image on a material sensitive to a used radiation, method for obtaining a binary hologram (variants) and methods for producing an image by using said hologram
03/09/2006WO2006025408A1 Exposure apparatus and device manufacturing method
03/09/2006WO2006025389A1 Pattern-forming material, pattern-forming apparatus and pattern-forming method
03/09/2006WO2006025386A1 Aligning method, processing system, substrate loading repeatability measuring method, position measuring method, exposure method, substrate processing apparatus, measuring method and measuring apparatus
03/09/2006WO2006025341A1 Substrate holder, stage apparatus, and exposure apparatus
03/09/2006WO2006025292A1 Developing solution composition for lithography and method for resist pattern formation
03/09/2006WO2006025266A1 Display member exposing method and plasma display member manufacturing method
03/09/2006WO2006025023A1 A collimator for use in a backlight liquid crystal display system
03/09/2006WO2006024998A2 A laser projection system
03/09/2006WO2006024908A2 Imprint lithographic apparatus, device manufacturing method and device manufactured thereby
03/09/2006WO2006024618A1 Cyanopyridine-based azo dyes
03/09/2006WO2006024373A2 Device for producing molded bodies
03/09/2006WO2006009626A3 Imprinting lithography using the liquid/solid transition of metals and their alloys
03/09/2006WO2005081299A3 Device manufacturing method and substrate comprising radiation sensitive material
03/09/2006WO2005064409A3 Removable pellicle for immersion lithography
03/09/2006WO2005064405A3 Lithographic apparatus and device manufacturing method
03/09/2006WO2005064400A3 Chuck system, lithographic apparatus using the same and device manufacturing method
03/09/2006WO2004107051A3 Photoacid generators with perfluorinated multifunctional anions
03/09/2006US20060052569 Silyl alkyl esters of anthracene-and phenanthrene carboxylic acids
03/09/2006US20060052498 Applicability improver for photosensitive resin composition and photosensitive resin composition containing the same
03/09/2006US20060051979 Apparatus and method of exposing a semiconductor device having a curved surface to light
03/09/2006US20060051956 Imageable bottom anti-reflective coating for high resolution lithography
03/09/2006US20060051709 Exposure system and pattern formation method
03/09/2006US20060051706 Chemicallyamplified positive tone photoresist comprising a phenolic resin; a sulfonium or iodinium photoacid-generating compound; and an ether, ester, or amide; relief images; enhanced resolution
03/09/2006US20060051703 decreased fish eye defects; improved workability
03/09/2006US20060051699 Coating on hydrophilic surface a free-radical polymerizable monomer, oligomer, polymer or mixture thereof with at least one ethylenically unsaturated group; photoinitiator or sensitizer; and stabilizer comprising organic phosphonate, phosphate, or phosphoamidate; lithographic printing
03/09/2006US20060051685 Negative dye-containing curable composition, color filter and method of producing the same
03/09/2006US20060051679 Lithographic method for wiring a side surface of a substrate
03/09/2006US20060050400 Correction of birefringence in cubic crystalline optical systems
03/09/2006US20060050274 Management system, apparatus, and method, exposure apparatus, and control method therefor
03/09/2006US20060050259 Exposure apparatus and method, and device fabricating method using the same
03/09/2006US20060050258 Projection system for EUV lithography
03/09/2006US20060050257 Exposure apparatus and device manufacturing method
03/09/2006US20060050255 Multiple level photolithography
03/09/2006US20060050254 Projection exposure apparatus and method for producing a printed circuit board
03/09/2006US20060049838 Pattern evaluation method, manufacturing method of semiconductor device, correction method of mask pattern and manufacturing method of exposure mask
03/09/2006US20060048893 Atmospheric pressure plasma processing reactor
03/09/2006DE19721694B4 N-Vinyllactamderivate enthaltende Copolymere, Herstellungsverfahren hierfür und hieraus hergestellte Photoresists N-vinyllactam containing copolymers, manufacturing method thereof, and produced therefrom photoresist
03/09/2006DE19623450B4 Fotomaske und deren Verwendung Photomask and their use
03/09/2006DE10215193B4 Verfahren zur Kompensation von Streu-/Reflexionseffekten in der Teilchenstrahllithographie A method for compensating for scattering / reflection effects in the Teilchenstrahllithographie
03/09/2006DE102005038913A1 Oberste Antireflektionsbeschichtungszusammensetzung und Verfahren zur Musterausbildung für eine Halbleitervorrichtung unter Verwendung derselbigen Top anti-reflective coating composition and method for patterning a semiconductor device using derselbigen