Patents
Patents for G03F 7 - Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printed surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor (127,176)
04/2006
04/13/2006US20060078828 on semiconductor wafer; contamination prevented; exposure intensities assigned to each shot area based on location on wafer; linewidth of features formed on partial edge die increased relative to value with exposure intensity at wafer center to compensate for line width reduction occurring at wafer edge
04/13/2006US20060078827 Method to restore hydrophobicity in dielectric films and materials
04/13/2006US20060078826 Method for manufacture of lithographic printing plate precursor no dampening water
04/13/2006US20060078824 Photosensitive element, photosensitive element roll, process for the preparation of resist pattern using the same, resist pattern, resist pattern laminated substrate, process for the preparation of wiring pattern and wiring pattern
04/13/2006US20060078820 Resist with reduced line edge roughness
04/13/2006US20060078819 Photopolymer composition suitable for lithographic printing plates
04/13/2006US20060078818 Near-field exposure photoresist and fine pattern forming method using the same
04/13/2006US20060078407 System and method for reticle protection and transport
04/13/2006US20060078012 Optical element, optical system, laser device, exposure device, mask testing device and high polymer crystal processing device
04/13/2006US20060077506 Methods and systems for improved boundary contrast
04/13/2006US20060077374 Step and repeat imprint lithography systems
04/13/2006US20060077368 Exposure apparatus and device manufacturing method
04/13/2006US20060077367 Exposure apparatus and method for producing device
04/13/2006US20060077366 Catadioptric projection objective with geometric beam splitting
04/13/2006US20060077365 Exposure method and apparatus
04/13/2006US20060077363 Correcting device, exposure apparatus, device production method, and device produced by the device production method
04/13/2006US20060077362 Exposure apparatus and device manufacturing method
04/13/2006US20060076688 Semiconductor device having improved contact hole structure and method for fabricating the same
04/13/2006US20060076591 Solid state image pickup element and method of manufacturing solid state image pickup element
04/13/2006US20060076516 Reflective optical element, optical system and EUV lithography device
04/13/2006US20060075579 Two-stage laser system for aligners
04/13/2006DE19957034B4 Verfahren zur Behandlung von Oberflächen von Substraten und Vorrichtung A process for the surface treatment of substrates and device
04/13/2006DE19637425B4 Neue N-Vinyllactam-Derivate und deren Polymere New N-vinyl lactam derivatives and their polymers
04/13/2006DE19525745B4 Verfahren zur Bildung eines Abdeckungsmusters A method for forming a resist pattern
04/13/2006DE10314152B4 Herstellung von dielektrischen Zwischenschichtfilmen mit einem niedrigen K-Wert unter Verwendung von Si-haltigen Resists Production of interlayer dielectric films with a low K value using Si-containing resist
04/13/2006DE102005034991A1 System for radial redistribution of light intensities in an illumination system of a microlithographic projection system has a zoom objective either side of conversion elements
04/13/2006DE102004044039A1 Rapid development or production of semiconductor chips with an acid scavenger present is effected using lithographic simulation test runs to determine production parameters and product properties
04/13/2006DE102004040534A1 Diffraktives polarisationstrennendes Element für unpolarisierte elektromagnetische Strahlung im UV-Bereich, System mit zwei solchen Elementen und Verfahren zur Herstellung eines solchen Elementes Diffractive polarization-separating element for unpolarized electromagnetic radiation in the UV region, the system having two such elements and methods for manufacturing such element
04/13/2006DE10036867B4 Substrat-Bearbeitungsverfahren und -vorrichtung Substrate processing method and apparatus
04/12/2006EP1646075A1 Exposure apparatus and method for manufacturing device
04/12/2006EP1646074A1 Exposure apparatus and method for manufacturing device
04/12/2006EP1646073A1 Illuminating method, exposing method, and device for therefor
04/12/2006EP1645912A2 Lithographic printing method
04/12/2006EP1645911A1 Lithographic apparatus and device manufacturing method
04/12/2006EP1645910A1 Lithographic apparatus and position measuring method
04/12/2006EP1645909A2 Photo-curable resin composition comprising a polyimide, a process for forming a pattern therewith, and a substrate protecting film
04/12/2006EP1645908A1 Positive resist composition and pattern-forming method using the same
04/12/2006EP1645903A1 Wire grid polarizer and fabrication method thereof
04/12/2006EP1644778A1 Method for evaluating reproduced images of wafers
04/12/2006EP1644777A2 Resist composition
04/12/2006EP1644776A2 Methods of removing photoresist from substrates
04/12/2006EP1644775A2 Method for analysing objects in microlithography
04/12/2006EP1644427A2 Positive photoresist composition and method of forming resist pattern
04/12/2006EP1644426A1 Positive photoresist composition and method of forming resist pattern
04/12/2006EP1502335A4 Automatic gas control system for a gas discharge laser
04/12/2006EP1478516B1 Ir-sensitive composition and on-press developable ir-sensitive printing plates
04/12/2006EP1430360A4 Screen printing process
04/12/2006EP1391017A4 FOUR KHz GAS DISCHARGE LASER SYSTEM
04/12/2006EP1285221B1 In-situ mirror characterization
04/12/2006EP1123520A4 Wavelength tuning of photo-induced gratings
04/12/2006EP1046958B1 Use of a composition for bottom reflection preventive film
04/12/2006CN1759467A Extreme ultraviolet light source and target for extreme ultraviolet light source
04/12/2006CN1759348A Chemical amplification type positive resist composition
04/12/2006CN1759314A Micro fluid device and process for producing the same
04/12/2006CN1759088A Alicyclic unsaturated compound, polymer, chemically amplified resist composition and method for forming pattern using said composition
04/12/2006CN1758818A Donor substrate for laser induced thermal imaging and method of fabricating organic light emitting display using the same substrate
04/12/2006CN1758144A Photorresist stripping liquid composite
04/12/2006CN1758143A Lithographic apparatus and device manufacturing method
04/12/2006CN1758142A Decompression dry device and method
04/12/2006CN1758141A Coating compositions for use with an overcoated photoresist
04/12/2006CN1758140A Lithographic apparatus and position measuring method
04/12/2006CN1758139A A method of performing resist process calibration and optimisation diffractive optical element (DOE)
04/12/2006CN1758138A Multi-exposure semiconductor fabrication mask sets and methods of fabricating such multi-exposure mask sets
04/12/2006CN1758121A Method for improving assembling deviation of liquid crystal display panel and manufacturing technology of liquid crystal panel
04/12/2006CN1758073A Micro mirror and method of manufacturing the same
04/12/2006CN1758014A Interferometer systems for measuring displacement and exposure systems using the same
04/12/2006CN1757622A 2-hydroxy-3-alkoxypropyl sulfides, sulfones, and sulfoxides: new surface active agents
04/12/2006CN1757439A Substrate processing device and method
04/12/2006CN1251309C Inorganic anti-reflection film SiON surface treating method for photo-etching
04/12/2006CN1251305C Offset printing equipment, device producing method and produced device thereby
04/12/2006CN1251304C Manufacturing process of integrated aligning mark and channel component element
04/12/2006CN1251303C Method for producing integrated circuit
04/12/2006CN1251030C Photoresist developer compositions
04/12/2006CN1251029C Photo-etching equipment and device making process
04/12/2006CN1251028C Lighting device and method for producing exposure device using same and device thereof
04/12/2006CN1251027C Concave spherical photo-etching rose engine
04/12/2006CN1251026C Offset printing projection device
04/12/2006CN1251025C Pattern plotter method and mfg. method of pattern plotter body
04/12/2006CN1251024C Method for making micro-structure unit
04/12/2006CN1251023C Lithographic printing fore-body
04/12/2006CN1251022C Photoresist and associated processes for microlithography
04/12/2006CN1251021C Photoresist compositions comprising polycyclic polymers with acid labile pendant groups
04/12/2006CN1251020C Light mask and making method thereof
04/12/2006CN1250962C Preparing method of integrated capillary electrophoresis electrochemical luminescence detecting chip
04/12/2006CN1250574C Free-radical polymerised compound
04/11/2006US7028285 Standard cell design incorporating phase information
04/11/2006US7027888 Semiconductor manufacturing apparatus
04/11/2006US7027381 Laser drawing apparatus, laser drawing method, a master for manufacturing hologram, and manufacturing method thereof
04/11/2006US7027237 Method for improving the imaging properties of at least two optical elements and photolithographic fabrication method
04/11/2006US7027235 Optical system for providing a useful light beam influenced by polarization
04/11/2006US7027227 Three-dimensional structure forming method
04/11/2006US7027226 Diffractive optical element for extreme ultraviolet wavefront control
04/11/2006US7027206 Spatial light modulator, spatial light modulator array, and image formation apparatus
04/11/2006US7027164 Speckle reduction method and system for EUV interferometry
04/11/2006US7027156 patterned layer is formed by curing an activating light curable liquid disposed on a substrate in the presence of a patterned template; particularly useful for micro- and nano-imprint lithography processes
04/11/2006US7027132 Lithographic apparatus and device manufacturing method
04/11/2006US7027131 Exposure apparatus
04/11/2006US7027130 Device and method for determining an illumination intensity profile of an illuminator for a lithography system
04/11/2006US7027129 System for laser beam expansion without expanding spatial coherence
04/11/2006US7027128 Exposure apparatus, maintenance method therefor, semiconductor device manufacturing method, and semiconductor manufacturing factory