Patents
Patents for G03F 7 - Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printed surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor (127,176)
04/2006
04/19/2006CN1760757A Radioactivity sensitive resin composition
04/19/2006CN1760756A Radioactivity sensitive resin composition
04/19/2006CN1760755A Apparatus for exposing a substrate, photomask and modified illuminating system of the apparatus, and method of forming a pattern on a substrate using the apparatus
04/19/2006CN1760754A Methods for aligning patterns on a substrate based on optical properties of a mask layer and related devices
04/19/2006CN1760743A Etching composition of thin-film transistor LCD
04/19/2006CN1760742A Etching composition of thin-film transistor LCD
04/19/2006CN1252800C Method for mfg. semiconductor
04/19/2006CN1252798C Nozzle cleaning device and substrate processing device with the nozzle cleaning device
04/19/2006CN1252544C Proximity effect correction method of electronic beam exposure and use thereof
04/19/2006CN1252543C Monitoring and etching method
04/19/2006CN1252542C Ultra-precise silicon wafer positioning system with balance weight damping apparatus
04/19/2006CN1252541C Photoresist composition containing cycloolefine polymer and hydrophobic-non-stero superfatted cyclic additive
04/19/2006CN1252540C Negative pressure fully automatic upper/lower sheet device of laser plotter
04/19/2006CN1252539C Reflector utilizing microimage to make exposure and its production method
04/19/2006CN1252538C Lithographic apparatus and device manufacturing method
04/19/2006CN1252530C Method for producing light interference display unit
04/19/2006CN1252529C Method of increasing the conductivity of a transparent conductive layer
04/19/2006CN1252514C Videograph processing devices
04/19/2006CN1252504C Correction component, holding device exposure device and equipment manufacturing method
04/19/2006CN1252501C Severeness type Mach-Zehnder interference structure and fabricating method thereof
04/19/2006CN1252042C Oximate light initiator
04/19/2006CN1251961C Soft lithography and tearing technology for colloid crystal microprocessing of pattern
04/19/2006CN1251864C Lithographic printing plate front body and method for producing lithographic printing plate
04/18/2006US7032209 Mask pattern and method for forming resist pattern using mask pattern thereof
04/18/2006US7031848 Real time analysis of periodic structures on semiconductors
04/18/2006US7031796 Radiation damage reduction
04/18/2006US7031082 Retainer, exposure apparatus, and device fabrication method
04/18/2006US7031077 Optical reduction method with elimination of reticle diffraction induced bias
04/18/2006US7031069 Microlithographic illumination method and a projection lens for carrying out the method
04/18/2006US7030998 Phase measurement apparatus for measuring characterization of optical thin films
04/18/2006US7030997 Characterizing aberrations in an imaging lens and applications to visual testing and integrated circuit mask analysis
04/18/2006US7030994 Method and apparatus to measure fiber optic pickup errors in interferometry systems
04/18/2006US7030993 Athermal zero-shear interferometer
04/18/2006US7030984 Fast wafer positioning method for optical metrology
04/18/2006US7030967 Lithographic apparatus, device manufacturing method and substrate holder
04/18/2006US7030966 Lithographic apparatus and method for optimizing an illumination source using photolithographic simulations
04/18/2006US7030965 Catadioptric system and exposure device having this system
04/18/2006US7030964 Stage system, exposure apparatus, and device manufacturing method
04/18/2006US7030963 Lithographic apparatus and device manufacturing method
04/18/2006US7030962 Projection exposure mask, projection exposure apparatus, and projection exposure method
04/18/2006US7030961 Lithographic apparatus, device manufacturing method, and device manufactured thereby
04/18/2006US7030960 Exposure apparatus and purging method for the same
04/18/2006US7030958 Optical attenuator device, radiation system and lithographic apparatus therewith and device manufacturing method
04/18/2006US7030957 Monitoring apparatus and method particularly useful in photolithographically processing substrates
04/18/2006US7030506 Mask and method for using the mask in lithographic processing
04/18/2006US7030467 Method of deforming a pattern and semiconductor device formed by utilizing deformed pattern
04/18/2006US7030201 of a polymer containing units of an imide-substituted acrylate type monomer and a crosslinking agent; making the monomer by reacting glycidyl methacrylate and succinimide for example; useful in making semiconductor devices by photolithographic techniques, improved etch-rate
04/18/2006US7030170 Photosensitive resin composition, dry film, and workpiece using the same
04/18/2006US7030169 Arylsulfinate salts in initiator systems for polymeric reactions
04/18/2006US7030040 Selectively growing a polymeric material on a semiconductor substrate
04/18/2006US7030039 Method of uniformly coating a substrate
04/18/2006US7029996 Methods for producing uniform large-grained and grain boundary location manipulated polycrystalline thin film semiconductors using sequential lateral solidification
04/18/2006US7029992 Low oxygen content photoresist stripping process for low dielectric constant materials
04/18/2006US7029954 Tape stiffener, semiconductor device component assemblies including same, and stereolithographic methods for fabricating same
04/18/2006US7029832 Patterning substrate of photoresist; removal immersion layer; development
04/18/2006US7029830 1-10 micrometer thick crystaline membrane surrounded by a frame of a bulk type crystalline material
04/18/2006US7029827 After forming a resist film from a positive chemically amplified resist material, performing insolubilization treatment for making the surface of resist film insoluble in developer, pattern exposing, then developing the film
04/18/2006US7029826 Contacting silica dielectric film with plasma comprising at least one surface modification agent, at a concentration, and for a time period, effective to render the silica dielectric film hydrophobic
04/18/2006US7029825 Uniformity in thickness and high dimensional precision, but also enables easy laser engraving without suffering problems caused by the generation of debris
04/18/2006US7029824 Color proofing films and photoresists produced with aluminum or polyester substrates
04/18/2006US7029823 Resist composition
04/18/2006US7029822 Photoresists; non-aromatic cyclic olefin (homo or co )polymer
04/18/2006US7029821 Porosity filter; microelectronics ; filtration using polyamide filter; reduction of defects
04/18/2006US7029820 Support for lithographic printing plate and presensitized plate and method of producing lithographic printing plate
04/18/2006US7029808 Photosensitive coating material for a substrate and process for exposing the coated substrate
04/18/2006US7029805 Imageable element with masking layer comprising betaine-containing co-polymers
04/18/2006US7029802 Embedded bi-layer structure for attenuated phase shifting mask
04/18/2006US7029799 Dividing pattern into zones; drawing
04/18/2006US7029526 shearing/salt-kneading a halogenated phthalocyanine pigment with a yellow pigment of the disazo condensation, barbituric acid or azoquinolone series
04/13/2006WO2006039204A2 A method and apparatus for polarizing electromagnetic radiation
04/13/2006WO2006039161A2 Method and system for contamination detection and monitoring in a lithographic exposure tool and operating method for the same under controlled atmospheric conditions
04/13/2006WO2006038723A1 Matte agent for infrared-sensitive planographic printing plate and use thereof
04/13/2006WO2006038635A1 Positive resist composition and method of forming resist pattern
04/13/2006WO2006038563A1 Linear motor, stage apparatus and exposure apparatus
04/13/2006WO2006038477A1 Polymer compound, positive resist composition and method for forming resist pattern
04/13/2006WO2006038387A1 Polymer, positive resist composition, and method of forming resist pattern
04/13/2006WO2006037651A1 Optical projection system
04/13/2006WO2006037494A2 Device for adjusting the temperature of elements
04/13/2006WO2006019581A3 Apparatus and method for thermally developing flexographic printing elements
04/13/2006WO2006008251A3 Process for the photoactivation and use of a catalyst by an inverted two-stage procedure
04/13/2006WO2006008250A3 Oxime derivatives and the use therof as latent acids
04/13/2006WO2005124456A3 Photopolymerisable composition
04/13/2006WO2005114328A3 Quartz glass blank and method for producing said blank
04/13/2006WO2005106593A3 Method and apparatus for measurement of exit pupil transmittance
04/13/2006WO2005093517A3 Information management and tracking system (imts)
04/13/2006WO2005091075A3 Method for producing a base material for screen printing, and base material of this type
04/13/2006WO2005083517A3 Illumination system for a microlithography projection exposure installation
04/13/2006WO2005083512A3 Illumination system for a microlithography projection exposure installation
04/13/2006WO2005054948A3 Device and method for large area lithography
04/13/2006WO2005029178A8 A system and method for the direct imaging of color filters
04/13/2006WO2005007747A3 Photosensitive silsesquioxane resin
04/13/2006US20060079985 Inline connection setting method and device and substrate processing devices and substrate processing system
04/13/2006US20060079628 Over-coating agent for forming fine patterns and a method of forming fine patterns using such agent
04/13/2006US20060079593 Hexaarylbiimidazole compounds and photopolymerization initiator compositions containing the same
04/13/2006US20060079592 Photo-curable coating composition for hard protective coat and coated article
04/13/2006US20060079096 Substrate processing method and substrate processing apparatus
04/13/2006US20060079091 Mask, method of producing the same, and method of producing semiconductor device
04/13/2006US20060079067 Methods for aligning patterns on a substrate based on optical properties of a mask layer and related devices
04/13/2006US20060078831 Multiphoton curing to provide encapsulated optical elements
04/13/2006US20060078829 surface of the resist-material layer is modified, and then the thick-film-paste-material layer is formed thereon, so that there can be reliably avoided the problem that the resist-material layer is dissolved by the thick-film-paste-material layer