Patents
Patents for G03F 7 - Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printed surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor (127,176)
07/2006
07/04/2006US7072025 Lithographic apparatus and device manufacturing method
07/04/2006US7072024 Lithographic projection method and apparatus
07/04/2006US7072023 Position detection apparatus having a plurality of detection sections, and exposure apparatus
07/04/2006US7072021 Lithographic apparatus and device manufacturing method
07/04/2006US7071548 Semiconductor coated with a mixture containing an adhesion promoter
07/04/2006US7071476 Illumination system with a plurality of light sources
07/04/2006US7071255 Radiation-sensitive composition capable of having refractive index distribution
07/04/2006US7071243 Heat resistance; waterproofing; adhesives; electrical properties
07/04/2006US7071121 Patterned ceramic films and method for producing the same
07/04/2006US7071088 Method for fabricating bulbous-shaped vias
07/04/2006US7070915 Method and system for drying a substrate
07/04/2006US7070914 Process for producing an image using a first minimum bottom antireflective coating composition
07/04/2006US7070911 Semiconductors; reducing vibration during lithography; depositing a multilayer antireflectivity coating
07/04/2006US7070910 Silazane compound amd methods for using the same
07/04/2006US7070908 Feature formation in thick-film inks
07/04/2006US7070906 Photosensitive resin laminate
07/04/2006US7070905 Pattern forming process
07/04/2006US7070904 High-temperature-stable polybenzoxazoles are formed from novel poly-o-hydroxyamides. The novel poly-o-hydroxyamides have low dielectric constants, are suitable for exposure at 248 nm or shorter wavelengths, and have hydroxyl groups at
07/04/2006US7070903 Coating formulation for printing plate precursor, printing plate precursor, printing press, fabrication process of printing plate, and regeneration process of printing plate
07/04/2006US7070902 Imageable elements containing cyanoacrylate polymer particles
07/04/2006US7070891 Photomask, method for manufacturing the same, and method for measuring optical characteristics of wafer exposure system using the photomask during operation
07/04/2006US7070890 Color filter and manufacturing method therefor
07/04/2006US7070889 Method for repairing a photomask, method for inspecting a photomask, method for manufacturing a photomask, and method for manufacturing a semiconductor device
07/04/2006US7070886 epoxides in the monomer or oligomer is linked by group comprising a siloxane to a silicon atom, a binder, an acid generator capable of producing an acid upon exposure to actinic radiation; decreased shrinkage, cracking and brittleness
07/04/2006US7070832 Sublimating process for cleaning and protecting lithography masks
07/04/2006US7070657 Method and apparatus for depositing antireflective coating
07/04/2006US7070406 Apparatus for embossing a flexible substrate with a pattern carried by an optically transparent compliant media
07/04/2006US7070289 Catoptric projection optical system
07/04/2006US7069859 Planographic printing plate packaging structure and method for packaging planographic printing plate
06/2006
06/29/2006WO2006068852A1 Solvent resistant imageable element
06/29/2006WO2006068737A1 Process for forming microstructures
06/29/2006WO2006068708A2 Lensed fiber array for sub-micron optical lithography patterning
06/29/2006WO2006068461A1 Support structure and lithographic apparatus
06/29/2006WO2006068288A1 Method for measuring position of mask surface in height direction, exposure apparatus and exposure method
06/29/2006WO2006068267A1 Compound for resist and radiation-sensitive composition
06/29/2006WO2006068233A1 Magnetic guiding apparatus, stage apparatus, exposure apparatus and device manufacturing method
06/29/2006WO2006068048A1 Material for pattern formation, apparatus for pattern formation, and method for pattern formation
06/29/2006WO2006067944A1 Resist composition for liquid immersion exposure and method for resist pattern formation
06/29/2006WO2006067814A1 Tridimensional structures for an ink jet printhead and relevant manufacturing process
06/29/2006WO2006067730A2 Device and method for holding a substrate
06/29/2006WO2006067694A2 Nanofabrication based on sam growth
06/29/2006WO2006067668A1 Surface patterning and via manufacturing employing controlled precipitative growth
06/29/2006WO2006066638A1 A filter device for the compensation of an asymmetric pupil illumination
06/29/2006WO2006039204A3 A method and apparatus for polarizing electromagnetic radiation
06/29/2006WO2006026765A3 Plasma ashing process for increasing photoresist removal rate and plasma apparatus wuth cooling means
06/29/2006WO2005103828A3 System and method for fabricating contact holes
06/29/2006WO2005088397A3 A process of imaging a deep ultraviolet photoresist with a top coating and materials thereof
06/29/2006US20060143172 Mask processing device, mask processing method, program and mask
06/29/2006US20060142890 Substrate processing apparatus, method of controlling substrate, and exposure apparatus
06/29/2006US20060142542 Phosphazene compound, photosensitive resin composition and use thereof
06/29/2006US20060142533 Process for preparing poly(arylene ethers) with pendant crosslinkable groups
06/29/2006US20060142409 Actinic ray curable ink-jet ink and printed matter
06/29/2006US20060142173 Solvent compositions containing chlorofluoroolefins or fluoroolefins
06/29/2006US20060141774 Pattern transfer mask related to formation of dual damascene structure and method of forming dual damascene structure
06/29/2006US20060141400 Immersion exposure process-use resist protection film forming material, composite film, and resist pattern forming method
06/29/2006US20060141399 Exposing a photoresist layer on a semiconductor and developing it using a first fluid including supercritical CO2 and a base such as tetramethylammonium hydroxide; cleaning using a second fluid including supercritical CO2 and a solvent such as methanol, ethanol, isopropanol, or xylene
06/29/2006US20060141398 Method of producing semiconductor device
06/29/2006US20060141397 Exposing to a patterned light source a mixture a first photoresist having a glass transition point higher than and an operational absorption in the vicinity of a wavelength longer than those of a second photoresist; light source emits radiation at the wavelength absorbed by the first photoresist
06/29/2006US20060141394 Radiating material of octafunctional epoxidized novolac resin, solvent, photopolymerization initiator; dialkyl phthalate, malonate, sebacate, and/or adipate plasticizer; and adhesion promoter of glycidoxypropanetrimethoxysilane, mercaptopropyltrimethoxysilane, and/or aminopropyltrimethoxysilane
06/29/2006US20060141392 Photosensitive resin composition, method for preparing the same, and dry film resist comprising the same
06/29/2006US20060141385 Coating a substrate with a first photoresist, exposing the first photoresist with radiation, developing the first photoresist;applying a second photoresist layer onto the substrate, exposing the second photoresist with radiation in the second image area;developing the second photoresist
06/29/2006US20060141384 Process for refining crude resin for electronic material
06/29/2006US20060141383 Sulfonium salts, radiation- sensitive acid generators, and positive radiator-sensitive resin compositions
06/29/2006US20060141382 Resist composition and method of forming resist pattern using same
06/29/2006US20060141381 Photosensitive resin composition, and photosensitive element, method for forming resist pattern and printed wiring board using the composition
06/29/2006US20060141372 Mask pattern and method for forming resist pattern using mask pattern thereof
06/29/2006US20060141368 Designing the database patterns of the photo mask according to a design rule of a semiconductor element; performing optical proximity correction of the designed database patterns; detecting failure of the database patterns by obtaining a plurality of bias values based on at least two space width
06/29/2006US20060141209 Pellicle for photolithography and pellicle frame
06/29/2006US20060141000 Porous biodegradable polymeric materials for cell transplantation
06/29/2006US20060140624 Method of developing a resist film and a resist development processor
06/29/2006US20060139775 Optical element holding device, lens barrel, exposing device, and device producing method
06/29/2006US20060139614 Exposure method, substrate stage, exposure apparatus, and device manufacturing method
06/29/2006US20060139605 Lithographic apparatus and device manufacturing method that limits a portion of a patterning device used to pattern a beam
06/29/2006US20060139594 Exposure apparatus and device fabricating method
06/29/2006US20060139593 Exposure apparatus, exposure method and device manufacturing method
06/29/2006US20060139584 Holding mechanism in exposure apparatus, and device manufacturing method
06/29/2006US20060138682 Substrate provided with an alignment mark in a substantially transmissive process layer, mask for exposing said mark, device manufacturing method, and device manufactured thereby
06/29/2006US20060138422 Thin film transistor substrate of horizontal electric field type liquid crystal display device and fabricating method thereof
06/29/2006US20060138400 Novel compounds capable of forming photoconvertible organic thin film and articles having organic thin film
06/29/2006US20060138399 resist-removing solution for low-k film and a cleaning solution for via holes or capacitors; solutions comprising hydrogen fluoride (HF) and at least one member selected from organic acids and organic solvents (e.g. acetic acid, hexanol, lauryl alcohol, propylene glcol, glycerin, diethylene glycol)
06/29/2006US20060138366 Methods and systems for lithography process control
06/29/2006US20060138350 Lithographic apparatus, illumination system and method for mitigating debris particles
06/29/2006US20060138349 Lithographic apparatus and device manufacturing method
06/29/2006US20060138338 Mask blanks inspection tool
06/29/2006US20060138311 Irradiation device for testing objects coated with light-sensitive paint
06/29/2006US20060138080 Stamper, lithographic method of using the stamper and method of forming a structure by a lithographic pattern
06/29/2006US20060138078 Semiconductor device fabrication method
06/29/2006US20060137720 Method for the removal of organic residues from finely structured surfaces
06/29/2006US20060137430 Liquid flow proximity sensor for use in immersion lithography
06/29/2006DE112004001662T5 Laminierte fotoempfindliche Reliefdruckoriginalplatte und Verfahren zur Erzeugung der Reliefdruckplatte Laminated photosensitive relief printing original plate and method for producing the relief printing plate
06/29/2006DE10312204B4 Verwendung von N-Iminen in wärmeempfindlichen positiv arbeitenden Beschichtungen Use of N-imines in the heat-sensitive positive working coatings
06/29/2006DE10261035B4 Fotomasken-Reparaturverfahren und Vorrichtung Photomask repair method and apparatus
06/29/2006DE10256808B4 Projektionsbelichtungsanlage Projection exposure apparatus
06/29/2006DE102005045967A1 New top anti-reflective coating polymer compounds useful to fabricate a semiconductor device
06/29/2006DE102004059147A1 Rough and fine structures transferring method for dynamic random access memory substrate, involves mapping structures with different lithography techniques in resist using positive lacquer and providing negative lacquer based on epoxy resin
06/28/2006EP1675164A1 Multilayer film reflection mirror, production method for multilayer film reflection mirror, and exposure system
06/28/2006EP1674939A1 Level sensor, lithographic apparatus and device manufacturing method
06/28/2006EP1674936A2 Method and apparatus for thermal development of an imaging element having a textured support surface
06/28/2006EP1674935A2 Lithographic apparatus and device manufacturing method
06/28/2006EP1674934A1 Lithographic apparatus and device manufacturing method