Patents
Patents for G03F 7 - Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printed surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor (127,176)
12/2006
12/21/2006WO2006134854A1 Image processing device, image drawing device, and system
12/21/2006WO2006134846A1 Curing accelerator, thermosetting resin composition, photosensitive composition, photosensitive film, permanent pattern and method for forming same
12/21/2006WO2006134814A1 Compound, positive resist composition, and method of forming resist pattern
12/21/2006WO2006134811A1 Polyhydric phenol compound, compound, positive resist composition, and method of forming resist pattern
12/21/2006WO2006134806A1 Positive resist composition and method of forming resist pattern
12/21/2006WO2006134793A1 Projector
12/21/2006WO2006134761A1 Drawing device and drawing method
12/21/2006WO2006134739A1 Positive resist composition and method of forming resist pattern
12/21/2006WO2006133956A2 Removal of thin structured polymer layers by means of atmospheric plasma
12/21/2006WO2006133907A2 Passive reticle tool, lithographic apparatus and method of patterning a device
12/21/2006WO2006133906A1 Lithographic projection system and projection lens polarization sensor
12/21/2006WO2006133884A2 Optical element with an antireflection coating, projection objective, and exposure apparatus comprising such an element
12/21/2006WO2006133801A1 Projection objective having a high aperture and a planar end surface
12/21/2006WO2006133800A1 Lithography projection objective, and a method for correcting image defects of the same
12/21/2006WO2006133729A1 Method and system for photolithography
12/21/2006WO2006086486A3 Apparatus for projecting a reduced image of a photomask using a schwarzschild objective
12/21/2006WO2006078857A3 Single wavelength stimulated emission depletion microscopy
12/21/2006WO2006051448A3 Array of spatial light modulators and method of production of a spatial light modulator device
12/21/2006WO2006039161A3 Method and system for contamination detection and monitoring in a lithographic exposure tool and operating method for the same under controlled atmospheric conditions
12/21/2006WO2005119366A3 Method for pre-exposing relief image printing plate
12/21/2006WO2005103824A3 Method of forming a metal pattern on a substrate
12/21/2006WO2005094304A3 Catadioptric imaging system employing immersion liquid for use in broad band microscopy
12/21/2006WO2004081057A3 Novel photosensitive resin compositions
12/21/2006US20060287558 The monomer: 3-Hydroxy-3,3-bis(trifluoromethyl)-2-methylpropyl vinyl ether; for preparing chemical amplification resists that are transparent to deep ultraviolet radiation used in the manufacture of integrated circuits
12/21/2006US20060286809 Method for etching a patterned silicone layyer
12/21/2006US20060286488 Methods and devices for fabricating three-dimensional nanoscale structures
12/21/2006US20060286487 Process for coating thick resist over polymer features
12/21/2006US20060286486 First organic layer, silicon-containing sacrificial layer, and second organic layer; photolithographically patterning the 2nd organic layer and using it as a mask to etch the sacrificial layer; using the etched sacrificial layer as a mask to etch first organic layer; using product to etch the substrate
12/21/2006US20060286485 Substrate structure and the fabrication method thereof
12/21/2006US20060285098 Method for determining focus deviation amount in pattern exposure and pattern exposure method
12/21/2006US20060285097 Lithographic apparatus and device manufacturing method
12/21/2006US20060285092 Exposure apparatus and device fabrication method
12/21/2006US20060285091 Lithographic projection apparatus, gas purging method, device manufacturing method and purge gas supply system related application
12/21/2006US20060284162 Programmable optical component for spatially controlling the intensity of beam of radiation
12/21/2006US20060284120 Method for correcting electron beam exposure data
12/21/2006US20060284110 Demagnification measurement method for charged particle beam exposure apparatus, stage phase measurement method for charged particle beam exposure apparatus, control method for charged particle beam exposure apparatus, and charged particle beam exposure apparatus
12/21/2006DE10258715B4 Verfahren zur Herstellung eines optischen Abbildungssystems A process for producing an optical imaging system
12/21/2006DE102005027046A1 Assembly to generate periodic high-resolution laser image on substrate has diffraction beam divider
12/21/2006DE102005026569A1 Light integrator for microlithographic projection lighting equipment`s lighting system, has integrator rod possessing dimensions selected such that number of total reflections occurring at coating surfaces of rod is not more than fifteen
12/21/2006DE102004006262B9 Abbildungseinrichtung und Verfahren zum Entwerfen einer Abbildungseinrichtung Imaging device and method for designing an imaging device
12/21/2006DE10151661C5 Tiefdruckverfahren mit radikalisch härtbaren Druckfarben Gravure printing process with radically curable inks
12/21/2006CA2611689A1 Methods for reclaiming developing solvents
12/20/2006EP1734409A2 Lithographic apparatus and controllable patterning device utilizing a spatial light modulator with distributed digital to analog conversion
12/20/2006EP1734408A1 Measurement setup with improved sensor lifetime, in particular for measuring EUV energy
12/20/2006EP1734407A2 Chemically amplified resist material and pattern formation method using the same
12/20/2006EP1734406A1 Resist composition, method of forming resist pattern, semiconductor device and method od manufacturing thereof
12/20/2006EP1734074A1 Photofunctional optical material comprising fluorinated acrylate polymer
12/20/2006EP1734032A1 Calixresorcinarene compounds, photoresist base materials, and compositions thereof
12/20/2006EP1733866A2 Improved edge smoothness with low resolution projected images for use in 3D modeling
12/20/2006EP1733421A2 Aqueous solution for removing post-etch residue
12/20/2006EP1733281A2 Method of forming a metal pattern on a substrate
12/20/2006EP1733272A1 Catadioptric projection objective with mirror group
12/20/2006EP1733271A1 Catadioptric projection objective
12/20/2006EP1733229A1 Patterning method for biosensor applications and devices comprising such patterns
12/20/2006EP1733001A2 Composition useful for removal of bottom anti-reflection coatings from patterned ion-implanted photoresist wafers
12/20/2006EP1521797A4 Antireflective silicon-containing compositions as hardmask layer
12/20/2006EP1488284B1 Photomask and method for photolithographic patterning of a substrate by use of phase shifted assist features
12/20/2006EP1330859B1 Smart laser with fast deformable grating
12/20/2006EP1192798B1 Multiple-beam, diode-pumped imaging system
12/20/2006CN1883030A Method and apparatus for printing patterns with improved CD uniformity
12/20/2006CN1883029A Light flux conversion element, lighting optical device, exposure system, and exposure method
12/20/2006CN1882883A System and method for characterizing lithography effects on a wafer
12/20/2006CN1882882A Method for forming multilayer resist
12/20/2006CN1882881A 感光聚合物印刷版前体 Photopolymer printing plate precursor
12/20/2006CN1882880A Aqueous resist composition
12/20/2006CN1882879A Photopolymerizable composition
12/20/2006CN1882878A Patterned ceramic films and method for producing the same
12/20/2006CN1882877A Process for the manufacture of flexographic printing plates
12/20/2006CN1882876A Polarized reticle, photolithography system, and method of forming a pattern using a polarized reticle in conjunction with polarized light
12/20/2006CN1882875A Defect mitigation in spatial light modulator used for dynamic photolithography
12/20/2006CN1882874A Real time image resizing for dynamic digital photolithography
12/20/2006CN1882664A Formation of self-assembled monolayers
12/20/2006CN1881440A Disk original version making method
12/20/2006CN1881091A Off-axis projection optical system and extreme ultraviolet lithography apparatus using the same
12/20/2006CN1881090A Substrate processing system for performing exposure process in gas atmosphere
12/20/2006CN1881089A Substrate processing system for performing exposure process in gas atmosphere
12/20/2006CN1881088A 扫描仪系统 The scanner system
12/20/2006CN1881087A Mask CD correction based on global pattern density
12/20/2006CN1881086A Photomask, method of making a photomask and photolithography method and system using the same
12/20/2006CN1881085A Compositions and processes for immersion lithography
12/20/2006CN1881084A Chemically amplified resist material and pattern formation method using the same
12/20/2006CN1881083A Negative-type photosensitive resin composition
12/20/2006CN1881082A Radiation sensitive resin composition, protrusion and spacer made therefrom, and liquid crystal display device comprising them
12/20/2006CN1881081A Radiation sensitive composition and color filter for forming coloration layer
12/20/2006CN1881080A Photosensitive resin composition, partition of display panel and display panel
12/20/2006CN1881079A Method and apparatus for creating a topographically patterned substrate
12/20/2006CN1881078A Method for forming an anti-etching shielding layer
12/20/2006CN1881077A Surface reforming method of polymer
12/20/2006CN1881076A Levenson phase transfer mask and preparation method thereof, and method for preparing semiconductor element
12/20/2006CN1881015A Liquid crystal display panel and fabricating method thereof
12/20/2006CN1880080A Method for manufacturing liquid discharge head, liquid discharge head, and liquid discharge recording apparatus
12/20/2006CN1880078A Liquid discharge head and liquid discharge head manufacturing method, chip element, and printing apparatus
12/20/2006CN1291479C A method for reducing dimension differences between isolated contact aperture and dense contact aperture
12/20/2006CN1291281C Detergent used in photolithography and a method for treating substrate therewith
12/20/2006CN1291280C Method for forming pattern on substrate and method for fabricating liquid crystal display using same
12/20/2006CN1291279C Photosensitive resin composition for gap
12/20/2006CN1291278C Radiation-sensitive resin composition
12/20/2006CN1291277C Holotype photoresist composite
12/20/2006CN1291276C Method for fabricating thin film transistors
12/20/2006CN1291275C Surface conductive electronic emitting component and mfg. method for image forming device