Patents
Patents for G03F 7 - Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printed surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor (127,176)
02/2007
02/07/2007CN1299168C Press plate picture making equipment having offner type optical utensil
02/07/2007CN1299167C Image-making device with VCSEL light resource array for machine plate
02/07/2007CN1299166C Self-aligned pattern formation method using dual wavelengths
02/07/2007CN1299165C Stamp, method, and apparatus
02/07/2007CN1299145C Apparatus and method for projection exposure
02/07/2007CN1298827C Aqueous stripping and cleaning composition
02/06/2007US7173807 Organic electrolytic solution contains a pyrrolidinium salt electrolyte, a chain carbonates, sulfolane and a fluorobenzene; electroconductivity, high withstanding voltage, excellent low-temperature characteristic
02/06/2007US7173716 Alignment apparatus, exposure apparatus using the same, and method of manufacturing devices
02/06/2007US7173699 Spectroscopic scatterometer system
02/06/2007US7173689 Method and system for a pellicle frame with heightened bonding surfaces
02/06/2007US7173687 Lithographic apparatus, device manufacturing method, and device manufactured thereby
02/06/2007US7173685 Lithographic apparatus, a device manufacturing method, and a fastener for use in a lithographic apparatus
02/06/2007US7173363 System and method for moving an object employing piezo actuators
02/06/2007US7173263 Optical switching in lithography system
02/06/2007US7172996 Cleaning agent composition for a positive or a negative photoresist
02/06/2007US7172974 Methods for forming fine pattern of semiconductor device
02/06/2007US7172972 Semiconductor device manufacture method and etching system
02/06/2007US7172912 Pattern forming method and wiring pattern forming method, and electro-optic device and electronic equipment
02/06/2007US7172853 Method of manufacturing semiconductor integrated circuit devices
02/06/2007US7172851 Light sensitive composition, planographic printing plate material, and image formation method
02/06/2007US7172850 Polymerizing at least 50 percent (meth)acrylonitrile, poly(ethylene glycol) alkyl ether (meth)acrylate, and styrene in a solvent mixture of:at least 50 percent of a (C1-C6) alkanol and at least 10 percent water and a polymerizaton initiator; lithographic substrate coatings with longer press life
02/06/2007US7172849 Antireflective hardmask and uses thereof
02/06/2007US7172848 Chemical amplification type positive resist composition
02/06/2007US7172847 Capable of printing with an infrared laser for direct plate-making from digital signals in computers etc.
02/06/2007US7172788 Optical element and method for its manufacture as well as lithography apparatus and method for manufacturing a semiconductor device
02/06/2007US7172076 Internal die filters with multiple passageways which are fluidically in parallel
02/01/2007WO2007013802A1 Maskless lithography system with improved reliability
02/01/2007WO2007013676A1 Exposure head and exposure apparatus
02/01/2007WO2007013612A1 Plotting method and device
02/01/2007WO2007013540A1 Mask blank fabrication method and exposure mask fabrication method
02/01/2007WO2007013471A1 Compounds, process for production thereof, low-molecular compounds, positive resist compositions and process for formation of resist patterns
02/01/2007WO2007013459A1 Photosensitive resin composition
02/01/2007WO2007013351A1 Image recording device and method
02/01/2007WO2007013311A1 Cleaning liquid for lithography
02/01/2007WO2007013233A1 Photosensitive resin composition for liquid crystal display element, color filter using the same, process for manufacture of the color filter, and liquid crystal display element
02/01/2007WO2007013007A2 Composition and use thereof
02/01/2007WO2005104682A3 Non-fluoride containing supercritical fluid composition for removal of ion-implant photoresist
02/01/2007WO2005076935A3 Wavelength filtering in nanolithography
02/01/2007US20070027569 Semiconductor production system
02/01/2007US20070027298 Photosetting, thermosetting liquid ink
02/01/2007US20070027231 Photosensitive insulating resin composition and cured product thereof
02/01/2007US20070027052 Cleaning liquid used in photolithography and a method for treating substrate therewith
02/01/2007US20070026627 Well photoresist pattern of semiconductor device and method for forming the same
02/01/2007US20070026542 Formation of conductive templates employing indium tin oxide
02/01/2007US20070026509 Novel surface-active polysiloxane photoinitiators
02/01/2007US20070026323 silicon nitride antireflective coatings on EUV light absorber layer; defect inspection of mask with DUV light; eliminate the interference effect may cause reflectance oscillation near the absorber edges, increase the defect inspection sensitivity
02/01/2007US20070026134 Method for in situ photoresist thickness characterization
02/01/2007US20070025610 Method and apparatus for inspecting a substrate
02/01/2007US20070024961 High performance catadioptric imaging system
02/01/2007US20070024837 Microlithographic projection exposure apparatus with immersion projection lens
02/01/2007US20070024836 Illumination system for a microlithographic projection exposure apparatus
02/01/2007US20070024834 Apparatus and process for determination of dynamic scan field curvature
02/01/2007US20070024832 Exposure apparatus and method for producing device
02/01/2007US20070024830 Illumination compensator for curved surface lithography
02/01/2007US20070024829 Driving unit, exposure apparatus using the same, and device fabrication method
02/01/2007US20070023712 System and method to pattern an object through control of a radiation source
02/01/2007US20070023711 Discharge produced plasma EUV light source
02/01/2007US20070023654 Charged particle beam application system
02/01/2007US20070023547 Aperture plate and methods for its construction and use
02/01/2007US20070022832 Sensor device for non-intrusive diagnosis of a semiconductor processing system
02/01/2007US20070022804 Scanning probe microscopy inspection and modification system
02/01/2007DE4203464B4 Katadioptrisches Reduktionsobjektiv A catadioptric reduction objective
02/01/2007DE112004002199T5 Verfahren zur Herstellung einer Extrem-Ultraviolettstrahlung reflektierenden Maske unter Verwendung von Rasterkraftmikroskop-Lithographie A process for producing extreme ultra-violet radiation of a reflective mask using atomic force microscope lithography
02/01/2007DE10243559B4 Photolithographie-Belichtungsvorrichtung und Photolithographie-Belichtungsverfahren Photolithography exposure apparatus and photolithography exposure method
02/01/2007DE10237042B4 Zusammensetzung und Verfahren zur Resistentfernung Composition and method for resist removal
02/01/2007DE10213285B4 Verfahren zur Steuerung eines fotolithografischen Gerätes A method for controlling a photolithographic device
02/01/2007DE102006030757A1 Illumination system for microlithography-projection illumination installation, has mirror arrangement that includes mirrors, and is so arranged that common-polarization degree change by arrangement is smaller than degree change by mirrors
02/01/2007DE102005035987A1 Verfahren zur Herstellung von dreidimensionalen Formkörpern A process for producing three-dimensional shaped bodies
02/01/2007DE102005035255A1 Ätzmedien für oxidische, transparente, leitfähige Schichten Etching media for oxidic, transparent, conductive layers
02/01/2007DE102005033564A1 Optisches System, insbesondere einer mikrolithographischen Projektionsbelichtungsanlage oder eines digitalen Projektionssystems An optical system, in particular of a microlithographic projection exposure apparatus or a digital projection system
02/01/2007DE102004024649B4 Justiereinrichtung und Vorrichtung zum Justieren eines Wafers And adjusting device for adjusting a wafer
02/01/2007DE102004016749B4 Verfahren und Anordnung zur Überlagerung von texturierten Oberflächen mit digitaler Grafik Method and arrangement for superposition of textured surfaces with digital graphics
02/01/2007DE10151919B4 Belichtungsobjektiv in der Halbleiterlithographie Exposure lens in semiconductor lithography
01/2007
01/31/2007EP1748469A1 Liquid for immersion exposure and immersion exposure method
01/31/2007EP1748318A2 Chemical amplification-type resist composition and production process thereof
01/31/2007EP1748317A1 Method for preparation of lithographic printing plate and lithographic printing plate precursor
01/31/2007EP1748316A2 Nanoimprint lithograph for fabricating nanoadhesive
01/31/2007EP1747884A2 Positive photosensitive lithographic printing plate
01/31/2007EP1747500A2 Image recording method
01/31/2007EP1747499A2 Apparatus and method for providing fluid for immersion lithography
01/31/2007EP1747498A2 Chemical compositions
01/31/2007EP1747175A2 Quartz glass blank and method for producing said blank
01/31/2007EP1586008A4 Binary half tone photomasks and microscopic three-dimensional devices and method of fabricating the same
01/31/2007EP1023129B1 Improvement in aqueous stripping and cleaning compositions
01/31/2007EP0809284B1 Method and system for transporting substrate wafers
01/31/2007CN2864746Y Continuously producing unit for superbranched polyester micro-optical photoetching adhesive
01/31/2007CN1906750A Substrate processing apparatus and substrate processing method
01/31/2007CN1906543A Improvement of printing plate heating oven and its related improvement
01/31/2007CN1906542A Apparatus and method for thermally developing flexographic printing elements
01/31/2007CN1906541A Holding device for an optical element in an objective
01/31/2007CN1906540A Improved lithographic process
01/31/2007CN1906539A Precision motion control using feed forward of acceleration
01/31/2007CN1906538A Photosensitive printing sleeves and method of forming the same
01/31/2007CN1906537A Positive-working photosensitive composition
01/31/2007CN1906536A Photosensitive resin composition, color filter and liquid crystal display device
01/31/2007CN1906535A Image forming device with brush type processing member
01/31/2007CN1906478A Advanced roughness metrology
01/31/2007CN1906258A Resin composition for coating
01/31/2007CN1906021A Dispense geometry and conductive template to achieve high-speed filling and throughput
01/31/2007CN1905151A Substrate carrier