Patents
Patents for G03F 7 - Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printed surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor (127,176)
01/2007
01/17/2007CN1295562C Radiation-curable resin composition and rapid prototyping process using the same
01/17/2007CN1295548C Frame glue refiller for display panel and filling method therefor
01/17/2007CN1295544C Vanadium oxide film micro photo-switch and its making method
01/17/2007CN1295528C Method for preparing integrated Prague plane waveguide grating by primary ion exchange process
01/17/2007CN1295121C Method and device for conveying and installing feeding board using executor in end of feeding board of robot
01/16/2007US7165235 Exposure pattern forming method and exposure pattern
01/16/2007US7165233 Test ket layout for precisely monitoring 3-foil lens aberration effects
01/16/2007US7164961 Modified photolithography movement system
01/16/2007US7164960 Apparatus for correcting a plurality of exposure tools, method for correcting a plurality of exposure tools, and method for manufacturing semiconductor device
01/16/2007US7164571 Wafer stage with a magnet
01/16/2007US7164534 Diffuser plate and method of making same
01/16/2007US7164523 Image exposure system
01/16/2007US7164464 Exposure apparatus and aberration correction method
01/16/2007US7164463 Lithographic tool with dual isolation system and method for configuring the same
01/16/2007US7164144 EUV light source
01/16/2007US7164141 Charged particle beam photolithography machine, standard substrate for correcting misalignment factor of charged particle beam photolithography machine, correcting method for charged particle beam photolithography machine, and method of manufacturing electronic device
01/16/2007US7163982 Process for preparing fluorine-containing polymer and method of forming fine pattern using same
01/16/2007US7163781 Using resist composition having high transparency against short-wavelength light and high dry-etching resistance, capable of forming a resist pattern excellent in adhesion and resolution by means of alkali development
01/16/2007US7163780 Disposing on a substrate surface a B-staged dielectric matrix comprising dielectric matrix materials and a removable porogen; curing; patterning the dielectric matrix material; depositing a metal layer; removing porogen
01/16/2007US7163779 Planographic printing plate material process, planographic printing plate and printing process
01/16/2007US7163778 Anti-reflection film material and a substrate having an anti-reflection film and a method for forming a pattern
01/16/2007US7163777 Thermally sensitive imageable element
01/16/2007US7163776 Positive-working resist composition
01/16/2007US7163770 Multilayer imageable element containing sulfonamido resin
01/16/2007US7163769 Suitable for image-wise recording, for example holographic recording of data or volume holograms
01/16/2007US7163751 Coating compositions for use with an overcoated photoresist
01/16/2007US7163301 Method and apparatus for managing actinic intensity transients in a lithography mirror
01/16/2007US7162881 Thermophoretic wand to protect front and back surfaces of an object
01/16/2007CA2275625C Method and apparatus for controlling a photomechanical exposure device
01/11/2007WO2007006040A1 Reflector
01/11/2007WO2007004995A1 Radiation crosslinker
01/11/2007WO2007004681A1 Method for producing photosensitive laminate original printing plate for letterpress printing, photosensitive laminate original printing plate for letterpress printing, and method for producing letterpress printing plate
01/11/2007WO2007004619A1 Photosensitive resin composition, and, photosensitive element, method for forming resist pattern, method for manufacturing printed wiring board and method for manufacturing partition wall for plasma display panel using the composition
01/11/2007WO2007004612A1 Method of producing substrate under controlling organic matter concentration in stripping liquor
01/11/2007WO2007004569A1 Photosensitive adhesive composition, and obtained using the same, adhesive film, adhesive sheet, semiconductor wafer with adhesive layer, semiconductor device and electronic part
01/11/2007WO2007004567A1 Exposure apparatus, exposure method, device manufacturing method, and system
01/11/2007WO2007004566A1 Compound, positive resist composition and method for forming resist pattern
01/11/2007WO2007004552A1 Exposure apparatus and method, exposure apparatus maintenance method, and device manufacturing method
01/11/2007WO2007004431A1 Method of forming high-resolution pattern and apparatus therefor
01/11/2007WO2007004358A1 Exposure apparatus
01/11/2007WO2007004345A1 Photosensitive resin composition and adhesion enhancer
01/11/2007WO2007004334A1 Photosensitive resin composition
01/11/2007WO2007004317A1 Toner, and toner production process
01/11/2007WO2007003563A1 Projection light facility provided with a plurality of projective lenses
01/11/2007WO2007003507A1 Sulphonium salt initiators
01/11/2007WO2007003359A1 Collector unit for a lighting system having wavelengths < 193 nm
01/11/2007WO2007003030A1 Thermally reactive near-infrared absorbing acetal copolymers, methods of preparation and methods of use
01/11/2007WO2007002965A1 Rapid-prototyping method and radiation-hardenable composition of application thereto
01/11/2007WO2006124321A3 Treatment of substrate using fuctionalizing agent in supercritical carbon dioxide
01/11/2007WO2006117642A3 Lithographic method for maskless pattern transfer onto a photosensitive substrate
01/11/2007WO2006084136A3 Computer to plate curing system
01/11/2007WO2006079788A3 Method of making a photopolymer plate
01/11/2007WO2005109108A8 Composition for removing a (photo) resist
01/11/2007WO2005043241A3 Method for simultaneous patterning of features with nanometer scale gaps
01/11/2007US20070011112 Method of determining movement sequence, alignment apparatus, method and apparatus of designing optical system, and medium in which program realizing the designing method
01/11/2007US20070010412 Process solutions containing surfactants
01/11/2007US20070010409 Reducing defects in the manufacture of semiconductor devices by contacting with acetylenic diol derivatives, amines, hydroxyamine modified polyethers, esters, quaternaryammonium compounds as surfactant, aqueous (water)and nonaqueous (ethanol, methanol, tetrahydrofuran etc) solvents
01/11/2007US20070010038 Pattern forming method and wiring pattern forming method, and electro-optic device and electronic equipment
01/11/2007US20070009841 Semiconductor fabrication apparatus and pattern formation method using the same
01/11/2007US20070009840 Method of fabricating a semiconductor device
01/11/2007US20070009839 Pattern forming method, film forming apparatus and pattern forming apparatus
01/11/2007US20070009838 Method of manufacturing a pattern structure and method of forming a trench using the same
01/11/2007US20070009837 Electronic substrate and its manufacturing method, electro-optical device manufacturing method, and electronic apparatus manufacturing method
01/11/2007US20070009836 Method of manufacturing semiconductor device
01/11/2007US20070009828 Positive resist composition, resist laminates and process for forming resist patterns
01/11/2007US20070009827 Lamination and delamination technique for thin film processing
01/11/2007US20070009816 Method and system for photolithography
01/11/2007US20070009815 Method of wafer edge exposure
01/11/2007US20070009812 Low-expansion glass substrate for a reflective mask and reflective mask
01/11/2007US20070009147 Mask pattern inspecting method, inspection apparatus, inspecting data used therein and inspecting data generating method
01/11/2007US20070008609 Ultraviolet laser apparatus and exposure apparatus using same
01/11/2007US20070008390 Methods and apparatus for ink delivery to nanolithographic probe systems
01/11/2007US20070007196 Filter cartridge for fluid for treating surface of electronic device substrate
01/11/2007DE19734059B4 Anordnung für Schattenwurflithographie Arrangement of shadows lithography
01/11/2007DE112005000504T5 Mehrschichtüberlagerungsmessungs- und Korrekturtechnik für die IC-Herstellung Mehrschichtüberlagerungsmessungs- and correction technique for the IC fabrication
01/11/2007DE102005032320A1 Decontaminating optical element surface, especially in projection illumination plant for microlithography, using cleaning device applying activated reducing gas to the surface under atmospheric pressure
01/11/2007DE102005031792A1 Verfahren zur Entfernung von Kontamination von optischen Elementen, insbesondere von Oberflächen optischer Elemente sowie ein optisches System oder Teilsystem hierfür A process for removing contamination of the optical elements, in particular of surfaces of optical elements and an optical system or subsystem thereof
01/11/2007DE102005030839A1 Projektionsbelichtungsanlage mit einer Mehrzahl von Projektionsobjektiven Projection exposure apparatus having a plurality of projection lenses
01/11/2007DE102005028427B3 Verfahren zur optischen Aufnahme und Inspektion eines Wafers im Rahmen der Randentlackung A method for optical recording and inspecting a wafer under the EBR
01/11/2007DE102004010902B4 Verfahren zum Übertragen eines kritischen Layouts einer Ebene einer integrierten Schaltung auf ein Halbleitersubstrat Method for transferring a layout of a critical level of an integrated circuit on a semiconductor substrate
01/10/2007EP1742111A2 Imaging optical system and exposure apparatus
01/10/2007EP1742110A2 Lithographic apparatus, contaminant trap, and device manufacturing method
01/10/2007EP1742109A2 Hydrophilic substrate for lithographic printing plate
01/10/2007EP1742108A1 Coating compositions for use with an overcoated photoresist
01/10/2007EP1742107A1 Photoimageable composition
01/10/2007EP1742091A1 Optical device with refractive and diffractive properties
01/10/2007EP1742058A2 Substrate for analyte determination and methods for manufacturing such substrates
01/10/2007EP1741730A1 Resist protecting film forming material for immersion exposure process and resist pattern forming method using the protecting film
01/10/2007EP1741705A1 Fluorinated cyclic structure-bearing silicon compounds and silicone resins, resist compositions using the same, and patterning process
01/10/2007EP1741545A2 Compositions and methods for use in three dimensional model printing
01/10/2007EP1741485A1 Photoreactive thin film processing method and photoreactive thin film processing apparatus
01/10/2007EP1741321A2 Atomic beam to protect a reticle
01/10/2007EP1741130A1 Device and method for treating a substrate in the field of semiconductor technology, in addition to a system comprising a device for treating a substrate
01/10/2007EP1741006A2 Photosensitive resin composition, cured product thereof and production method of printed circuit board using the same
01/10/2007EP1740393A1 Security mark for a data carrier, corresponding data carrier and method for the production of a security mark
01/10/2007EP1740392A1 System for thermal development of flexographic printing plates
01/10/2007EP1740373A2 Compliant template for uv imprinting
01/10/2007EP1566422B1 Uv-cure adhesive composition for optical disk, cured material and goods
01/10/2007EP1291910B1 Wafer chuck, exposure system, and method of manufacturing semiconductor device
01/10/2007EP1262509B1 Imide-benzoxazole polycondensate and process for producing the same