Patents
Patents for G03F 7 - Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printed surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor (127,176)
01/2007
01/03/2007CN1293618C Rotary etcher with thickness measuring system
01/03/2007CN1293609C Film photoetching method
01/03/2007CN1293605C Semiconductor device mfg. method
01/03/2007CN1293603C Remodeling technique of semiconductor pattern photoresist layer
01/03/2007CN1293427C Photoelectric device, its substrate and manufacture, and electronic apparatus
01/03/2007CN1293426C Method and apparatus for definiting mask pattern by doubling space frequency technology
01/03/2007CN1293411C Manufacture for photosensitive insulating film pattern and reflection electrode and its liquid crystal display device
01/03/2007CN1293116C Photocurable/thermoseting composition for forming matte film
01/03/2007CN1293105C Preparation of homo-, co- and terpolymers of substituted styrenes
01/03/2007CN1292844C Coated device and method
01/02/2007US7158307 Efficiently illuminating a modulating device
01/02/2007US7158280 Methods and systems for improved boundary contrast
01/02/2007US7158275 Polarization modulator
01/02/2007US7158238 System and method for calibrating a spatial light modulator array using shearing interferometry
01/02/2007US7158237 Interferometric measuring device and projection exposure installation comprising such measuring device
01/02/2007US7158236 Heterodyne laser interferometer for measuring wafer stage translation
01/02/2007US7158233 Alignment mark, alignment apparatus and method, exposure apparatus, and device manufacturing method
01/02/2007US7158232 Substrate processing apparatus
01/02/2007US7158215 Large field of view protection optical system with aberration correctability for flat panel displays
01/02/2007US7158213 Lithographic tool with dual isolation system and method for configuring the same
01/02/2007US7158212 Scanning exposure apparatus and device manufacturing method
01/02/2007US7158211 Lithographic apparatus and device manufacturing method
01/02/2007US7158210 Projection exposure apparatus
01/02/2007US7158209 Holding mechanism in exposure apparatus, and device manufacturing method
01/02/2007US7158196 Substrate for liquid crystal display with a substantially u-shaped black matrix and method of fabricating the same
01/02/2007US7157722 Positioning device and method of initializing a positioning device
01/02/2007US7157507 Mixture of photopolymers, silver flakes or powder and photoinitiator
01/02/2007US7157415 Post etch cleaning composition for dual damascene system
01/02/2007US7157319 A high-precision patterning is conducted with a half-tone resist thickness being prevented from different due to the presence/ absence of a base film. A transmitting portion and two kinds of semi-transmitting portions providing different
01/02/2007US7157215 Optics; semiconductors; photosensitive polymer which absorbs exposure light sources
01/02/2007US7157213 for gravure printing, water, a tetraalkylammonium hydroxide and/or benzyltrialkylammonium hydroxide and/or ammonium hydroxide, sodium hydroxide or potassium hydroxide, and hexametaphosphoric soda, triphosphate soda and/or monophosphate soda for preventing a reduction in pH
01/02/2007US7157212 Photoimaging using a hybrid organic-inorganic polymer such as POSS (Polyhedral Oligomeric Silsesquioxane)-based polymers and multi-photon exposure; making waveguides for example; polysilsesquioxanes can be used in high temperature process without decomposing
01/02/2007US7157211 Method of fabricating a semiconductor device
01/02/2007US7157210 Plate-making method, plate-making apparatus used in such plate-making method, and image recording material
01/02/2007US7157209 Electrolytically surface-roughening an aluminum plate in an electrolyte solution of hydrochloric acid, using a sine-wave alternating current and a controlled sine-wave alternating current with a thyristor, and then anodizing the surface-roughened aluminum plate; for laser exposure
01/02/2007US7157208 Resin containing a specific alkoxyhydroxystyrene skeleton, which is insoluble or hardly soluble in an alkali developer and becomes soluble in an alkali developer, an acid generator and an organic base; use in ultramicrolithography; resolution, sensitivity, good pattern profile, line edge roughness
01/02/2007US7157207 Acrylic ester terpolymer having units of a C5-C6 cycloalkyl (meth)acrylate, a hydroxy-adamantanyl acrylate, and acrylate of cyclic lactone; high resolution, patterns with less sidewall roughness, acceptable dry etch resistance, and a good margin allowed for heat treatment temperature after exposure
01/02/2007US7157206 Positive resist composition
01/02/2007US7157205 Interface containing organosilicon polymer
01/02/2007US7157204 Mixture of polyamic acids and acid generator; high resolution patterns
01/02/2007US7157203 Image forming method and image forming apparatus for planographic printing plate
01/02/2007US7157194 Integrated circuits; data processing; electronics
01/02/2007US7157193 An image recording layer including a polymer compound which contains a functional group with a hydrophilic/hydrophobic character being changable by heat, acid or irradiation and is directly chemically bonded to the substrate
01/02/2007US7157189 Covering the mask layer with photoresist which contains a film forming polymer containing acid-labile group to be cleaved by an acid for liberating a polymer with increased solubility in alkaline developer
01/02/2007US7157036 Method to reduce adhesion between a conformable region and a pattern of a mold
01/02/2007US7157002 from mixtures of anionic surfactants, water and carbon dioxide by dehydrating to remove water
01/02/2007US7156630 Apparatus for the rapid development of photosensitive printing elements
12/2006
12/28/2006WO2006137582A1 Exposure method and apparatus
12/28/2006WO2006137486A1 Image exposure device
12/28/2006WO2006137440A1 Measuring apparatus, exposure apparatus, and device manufacturing method
12/28/2006WO2006137429A1 Frame data creation device, creation method, creation program, storage medium containing the program, and plotting device
12/28/2006WO2006137410A1 Exposure apparatus, exposure method, maintenance method and device manufacturing method
12/28/2006WO2006137349A1 Catadioptric projection optical system, and exposure apparatus having the same
12/28/2006WO2006137343A1 Production method of color filter, and color filter and display unit
12/28/2006WO2006137340A1 Negative resist composition and method of forming resist pattern
12/28/2006WO2006137336A1 Positive resist composition and method of forming resist pattern
12/28/2006WO2006137326A1 2-dimensional image display device, illumination light source, and exposure illumination device
12/28/2006WO2006137261A1 Photosensitive composition, photosensitive lithographic printing plate material, and method for image formation of lithographic printing plate material
12/28/2006WO2006137257A1 Colored alkali-developable photosensitive resin composition and color filters made by using the same
12/28/2006WO2006137243A1 Photoresist film roll and method for manufacturing same
12/28/2006WO2006137241A1 Patterning method
12/28/2006WO2006137194A1 Method and apparatus for removing organic film on substrate surface
12/28/2006WO2006137014A1 Method of cleaning and after treatment of optical surfaces in an irradiation unit
12/28/2006WO2006136353A1 A double-facetted illumination system with attenuator elements on the pupil facet mirror
12/28/2006WO2006136352A2 Lens featuring determination of the relative position of optical elements
12/28/2006WO2006136184A1 Projection lens for microlithograpy and corresponding terminal element
12/28/2006WO2006094729A3 Microlithography projection system with an accessible diaphragm or aperture stop
12/28/2006WO2006085962A3 Photogenerated polyelectrolyte bilayers from an aqueous-processible photoresist
12/28/2006WO2006047012A3 Apparatus for the rapid development of photosensitive printing elements
12/28/2006WO2006007192A3 Three-dimensional photoresist structures and method of making
12/28/2006US20060293199 Removing agent composition and removing/cleaning method using same
12/28/2006US20060292628 Compositions and methods involving direct write optical lithography
12/28/2006US20060292501 Lithography process with an enhanced depth-on-focus
12/28/2006US20060292500 Cure during rinse to prevent resist collapse
12/28/2006US20060292498 Method for forming contact hole in semiconductor device
12/28/2006US20060292497 Method of forming minute pattern of semiconductor device
12/28/2006US20060292496 Circuit pattern forming method, circuit pattern forming device and printed circuit board
12/28/2006US20060292495 Thermal development system and method of using the same
12/28/2006US20060292490 Positive photosensitive composition and pattern forming method using the same
12/28/2006US20060292460 Etching photomasks, photoresists; excimer lasers
12/28/2006US20060292456 Reticle constructions, and methods for photo-processing photo-imageable material
12/28/2006US20060292454 photoresists; photomasks; etching; semiconductors
12/28/2006US20060292296 Process of producing optical element and optical element
12/28/2006US20060291862 Laser light source device, exposure device, and mask inspection device using this laser light source device
12/28/2006US20060291855 Substrate processing apparatus
12/28/2006US20060291062 Collector with fastening devices for fastening mirror shells
12/28/2006US20060291060 Optical element and exposure apparatus
12/28/2006US20060291031 Arrangement of aperture diaphragms and/or filters, with changeable characteristics for optical devices
12/28/2006US20060291024 In-line holographic mask for micromachining
12/28/2006US20060290429 Composition form forming anti-reflective coating for use in lithography
12/28/2006US20060289412 Laser beam irradiation apparatus and pattern drawing method
12/28/2006DE4418620B4 Photopolymerisierbare Zusammensetzung A photopolymerizable composition
12/28/2006DE19817714B4 Verfahren zur Messung der Lage von Strukturen auf einer Maskenoberfläche Method for measuring the position of structures on a mask surface
12/28/2006DE10245621B4 Verfahren zur Übergabe einer Meßposition eines auf einer Maske zu bildenden Strukturelementes Method for transferring a measurement position of a forming on a mask to pattern element
12/28/2006DE10203838B4 Fluorhaltiger Fotoresist mit Reaktionsankern für eine chemische Nachverstärkung und verbesserten Copolymerisationseigenschaften The fluorine-containing photoresist with response anchors for chemical amplification and improved copolymerization
12/28/2006DE102006026248A1 Photo mask for use in photolithography system has polarizing structure that is formed in either peripheral circuit region or memory cell region of substrate
12/28/2006DE102005051629A1 Flat panel display device fabricating method for liquid crystal display device, involves removing hydrophilic resin patterns to form hydrophobic nano powder thin film patterns over substrate, and treating patterns to form thin film pattern
12/28/2006DE102005028232A1 Latent sub-wavelength lattice structure producing method for producing sub-wavelength lattice, involves selecting interference pattern and function structure such that lattice structure with period less than minimum wavelength is produced
12/28/2006DE102005024980B3 Optical unit manufacturing method, e.g. for photo-sensor, involves removing segment of carrier layer from substrate and adhering segment to cover foil with adhesive force larger than force between carrier layer and substrate
12/27/2006EP1737024A1 Exposure equipment, exposure method and device manufacturing method