Patents
Patents for G03F 7 - Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printed surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor (127,176)
06/2007
06/21/2007CA2632992A1 Biosensors and methods for making and using them
06/20/2007EP1798758A1 Lighting optical device, regulation method for lighting optical device, exposure system, and exposure method
06/20/2007EP1798599A1 Antireflection film composition, patterning process and substrate using the same
06/20/2007EP1798598A1 Positive photosensitive composition
06/20/2007EP1798597A2 Cationically polymerizable photoimageable thick film compositions, electrodes, and methods of forming thereof
06/20/2007EP1798596A2 Positive photoresist composition
06/20/2007EP1798595A1 Fabrication mehod for photomask, fabrication method for device and monitoring method for photomask
06/20/2007EP1797584A2 Methods and devices for forming nanostructure monolayers and devices including such monolayers
06/20/2007EP1797479A1 Device obtained by nanoprinting comprising metallic patterns and method for nanoprinting of metallic patterns
06/20/2007EP1797146A1 Cyanopyridine-based azo dyes
06/20/2007EP1664925A4 Imprint lithography templates having alignment marks
06/20/2007EP1311908B1 Photoresist composition for deep uv and process thereof
06/20/2007EP1257924A4 Process monitoring system for lithography lasers
06/20/2007EP1237824B1 A method and apparatus for treating a substrate with an ozone-solvent solution
06/20/2007EP1200879B1 Control of the illumination distribution in the exit pupil of an EUV illumination system
06/20/2007EP1044074B1 Photoresist coating process control with solvent vapor sensor
06/20/2007CN2914146Y Lithium niobate wafer photolith whirl coating vacuum cups
06/20/2007CN1985357A Substrate heating equipment and substrate heating method
06/20/2007CN1985355A Determination method of exposure conditions, exposure method, exposure device and device manufacturing method
06/20/2007CN1985354A Exposure device, exposing method, and device manufacturing method
06/20/2007CN1985344A Apparatus for shielding a charged particle beam
06/20/2007CN1985217A Non-aqueous microelectronic cleaning compositions containing fructose
06/20/2007CN1985216A Improved method for bump exposing relief image printing plates
06/20/2007CN1985206A Catadioptric projection objective with intermediate images
06/20/2007CN1984975A Pigment dispersion composition, use thereof and compound for treating pigment
06/20/2007CN1984938A Photocurable/thermosetting resin composition and cured product thereof
06/20/2007CN1983520A Production of semiconductor anti-reflective layer
06/20/2007CN1983510A Method of manufacturing semiconductor device
06/20/2007CN1983038A 曝光装置 Exposure device
06/20/2007CN1983037A Exposure method, exposure device, and method of manufacturing device
06/20/2007CN1983036A Binary sinusoidal sub-wavelength gratings as alignment marks
06/20/2007CN1983035A Method for reducing mask precipitation defects
06/20/2007CN1983034A A method for preventing or reducing contamination of an immersion type projection appartus and an immersion type lithographic apparatus
06/20/2007CN1983033A Mask pattern arrangement
06/20/2007CN1983032A Scale and method for measuring photoetching alignment precision
06/20/2007CN1983031A Photosensitive resin composition for organic light emitting diodes
06/20/2007CN1983030A Cationically polymerizable photo imageable thick film compositions, electrodes, and methods of forming thereof
06/20/2007CN1983029A Method and device using arf photoresist
06/20/2007CN1983028A Mask blank and method for manufacturing transfer mask
06/20/2007CN1983027A Color filter mask layout
06/20/2007CN1983026A Polymer for hardmask of semiconductor device and composition containing the same
06/20/2007CN1983025A Fabrication method for photomask, fabrication method for device and monitoring method for photomask
06/20/2007CN1983024A Pattern formation method using levenson-type mask and method of manufacturing levenson-type mask
06/20/2007CN1983023A Method and system for detecting corrugation defect and manufacturing method of photomask
06/20/2007CN1983003A Manufacturing method of dsplay device and mold therefor
06/20/2007CN1983002A Liquid crystal display device and method for fabricating the same
06/20/2007CN1982997A Thin-film transistor base plate and its production
06/20/2007CN1982967A Liquid crystal display device and method of manufacturing the same
06/20/2007CN1982953A Method for adjusting display device white balance and liquid-crystal display device
06/20/2007CN1982924A Color optical filter and its production
06/20/2007CN1982425A Detergent
06/20/2007CN1982388A Organic anti-reflective coating polymer, anti-reflective coating polymer and preparing method thereof
06/20/2007CN1982202A Method for producing nano-stamped template by laminated sided-wall technology
06/20/2007CN1982083A Production of planar relief flat based on corrosion
06/20/2007CN1322608C Process for preparing carbon electrode array with high surface area and high gap filling capacity
06/20/2007CN1322591C Method for processing and manufacturing components and parts applied in micro-electronics and mechanical system
06/20/2007CN1322580C 胶粘带 Adhesive tape
06/20/2007CN1322550C Liquid supplying device and substrate processing device
06/20/2007CN1322546C Design of pivture, optical mask and photoetching colloid figure, and method for making smiconductor device
06/20/2007CN1322545C Light carving projection device and method for producing device with it and produced device
06/20/2007CN1322374C Exposure device and aberration correcting method
06/20/2007CN1322373C Projection optical system, exposure device and its assembly mfg. method
06/20/2007CN1322372C Optical cover process and method for making film transistor
06/20/2007CN1322371C Solid imaging compsns. for preparing polypropylene-like articles
06/20/2007CN1322351C Crystallizer and crystallizing method
06/20/2007CN1322105C Cleaning solution and manufacturing method for semiconductor device
06/20/2007CN1321737C Process for producing film forming resins for photoresist compositions
06/19/2007US7234128 Method for improving the critical dimension uniformity of patterned features on wafers
06/19/2007US7233836 Exposure apparatus and device manufacturing method
06/19/2007US7233445 Method of manufacturing microlens array
06/19/2007US7233387 Image forming apparatus
06/19/2007US7233386 Method of optimizing imaging performance
06/19/2007US7233383 Exposure apparatus, device manufacturing method, pattern generator and maintenance method to check for pixel deterioration
06/19/2007US7233010 Radiation system and lithographic apparatus
06/19/2007US7233009 Lithographic projection apparatus and reflector assembly for use therein
06/19/2007US7232917 Cyclic fluorine compounds, polymerizable fluoromonomers, fluoropolymers, and resist materials containing the fluoropolymers and method for pattern formation
06/19/2007US7232850 Composition of a cationically curable compound, an acrylate-containing compound; a hydroxyl-containing compound; a cationic photoinitiator; and a free radical photoinitiator; epoxy-containing compounds are the cationically curable groups
06/19/2007US7232768 Hydrogen plasma photoresist strip and polymeric residue cleanup process for low dielectric constant materials
06/19/2007US7232758 Method of correcting lithographic process and method of forming overlay mark
06/19/2007US7232651 Optical recording materials
06/19/2007US7232650 Forming a porous optical structure, by heating at high temperature for a time to pyrolyze a photopatterning structure, which is formed with a mixture of epoxy resins, a photoinitiator, silica sol particles; optical waveguides
06/19/2007US7232649 Method for thermally processing photosensitive printing sleeves
06/19/2007US7232648 Photosensitive resin composition and coating film cured product thereof
06/19/2007US7232647 For laser scanning exposure; irradiation polymerizaion with high pressure mercury lamp
06/19/2007US7232646 Low-viscous, radiation curable formulation, particularly for the stereo-lithographical production of earpiece
06/19/2007US7232645 obtained by electrochemical graining treatment on an aluminum plate, which contains 0.02-0.29 wt % Fe, 0.03-0.15% Si, 0.020-0.040% Cu, and 0.050% or less Ti; surface area ratio and steepness each satisfies specified conditions
06/19/2007US7232644 Polymerization using free radical catalyst
06/19/2007US7232643 Composition of a resin which contains an acid dissociable dissolution inhibiting group, an acid generator and a cycloalkylester or ether substituted triphenyl methane compound; semiconductor elements and liquid crystal display elements
06/19/2007US7232642 Resin of an acrylic ester with pendant cyclic or heterocyclic groups and an acid generator; suitable for ArF excimer laser lithography, showing excellent resolution, sensitivity, pattern shape, excellent line edge roughness
06/19/2007US7232641 Base resin polymer for a positive-resist composition of acrylic ester monomers with pendant adamantine and norbornene groups ; high sensitivity, high resolution in exposure with a high energy beam, reduced line edge roughness due to suppressed swelling at the time of development
06/19/2007US7232640 Polymer of styrene modified with alkoxy or alcohol substituents capable of increasing its solubility in an alkali developer under action of an acid, a compound capable of generating an acid upon irradiation with an actinic ray or radiation, and a solvent; nanolithography processes for manufacturing VLSI
06/19/2007US7232639 Monomer having fluorine-containing acetal or ketal structure, polymer thereof, and chemical-amplification-type resist composition as well as process for formation of pattern with use of the same
06/19/2007US7232638 Resist composition and patterning process
06/19/2007US7232637 Light sensitive media for optical devices using organic mesophasic materials
06/19/2007US7232629 Method of forming and testing a phase shift mask
06/19/2007US7232498 Applying layers of curable elastomer composition to prepared sidewall surface until a predetermined raised thickness is obtained; curing the curable elastomer by application of heat or electromagnetic radiation
06/19/2007US7232233 Catoptric reduction projection optical system and exposure apparatus using the same
06/19/2007CA2221014C New family of monomeric or polymeric photoinitiators in which sulfonic groups are fso2 groups
06/14/2007WO2007067706A2 Pressurized aerosol formulation for use in radiation sensitive coatings
06/14/2007WO2007067039A1 Radiation system and lithographic apparatus