Patents
Patents for G03F 7 - Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printed surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor (127,176)
02/2008
02/19/2008US7333178 Lithographic apparatus and device manufacturing method
02/19/2008US7333173 Method to simplify twin stage scanner OVL machine matching
02/19/2008US7332734 Lithography apparatus and pattern forming method using the same having an liquid crystal panel for a photo mask function
02/19/2008US7332732 Alignment systems and methods for lithographic systems
02/19/2008US7332616 Polymerizable compound, polymer, positive-resist composition, and patterning process using the same
02/19/2008US7332444 Method for smoothing areas in structures by utilizing the surface tension
02/19/2008US7332273 Multilayer dielectrics for solid phase synthesis
02/19/2008US7332266 Coating that prevents effectively reflection particularly when an irradiating light with a wavelength of 193 nm is used for microfabrication, and that can be rapidly removed; for use in manufacture of a semiconductor device
02/19/2008US7332264 Photo-definable self-assembled materials
02/19/2008US7332262 Forming amorphous carbon layer on semiconductor stack; etching; elimination of intermediate layer
02/19/2008US7332259 Aluminum support for planographic printing plate, its manufacturing process, and planographic printing plate material
02/19/2008US7332258 mixture a copolymer or terpolymer that is insoluble or slightly soluble in an alkali developer and becoming soluble in an alkali developer by an action of an acid, and acid generators, used in microlithography for production high capacity microelectronics
02/19/2008US7332257 Composition for optical film, and optical film
02/19/2008US7332255 enables the user to measure process line shortening on an overlay tool; means for determining the misalignment, means for determining total line shortening, means for determining the equipment line shortening, and means for determining process line shortening
02/19/2008US7332254 an alkali soluble resin, a compound having a quinonediazide group, and an epoxy resin having a softening point of not lower than 30 degrees C; cured product is excellent in resolution, electrical insulation, thermal shock resistance and adhesion, and exhibits reduced deformation after post-baking
02/19/2008US7332253 Shelf life, do not require the presence of a coated oxygen impermeable overcoat, avoids the use of a preheat step before development without any loss in imaging properties
02/19/2008US7332249 Holographic storage medium comprising polyfunctional epoxy monomers capable of undergoing cationic polymerization
02/19/2008US7331288 Apparatus for pulling a sleeve on and off
02/19/2008US7331250 Sensor device for non-intrusive diagnosis of a semiconductor processing system
02/19/2008CA2397070C X-ray measuring and testing complex
02/14/2008WO2008019249A1 Long length flexible circuits and method of making same
02/14/2008WO2008018749A1 Resin composition for forming fine patterns, method for fabricating semiconductor device using the composition and semiconductor device fabricated by the method
02/14/2008WO2008018580A1 Positive resist processing liquid composition and liquid developer
02/14/2008WO2008018530A1 Production method and production device of cylindrical print substrate
02/14/2008WO2008018352A1 Photosensitive polyimide composition, positive photosensitive resin composition, and fpc
02/14/2008WO2008018272A1 Photosensitive lithographic plate material
02/14/2008WO2008017954A2 Antireflective composition for photoresists
02/14/2008WO2008017490A2 Optical filter and method for the production of the same, and device for the examination of electromagnetic radiation
02/14/2008WO2007117808A3 Method of forming nanoscale features using soft lithography
02/14/2008WO2006048443A3 Photopolymerizable composition
02/14/2008US20080039354 Method of manufacturing a thin film transistor substrate and stripping composition
02/14/2008US20080038935 Aperture masks for circuit fabrication
02/14/2008US20080038678 ArF excimer laser beam (193 nm); lithography; photoresist; organic copolymer of pyrimidinetrione, imidazolidinedione, imidazolidinetrione or triazinetrione units and a diepoxide, and also a diacid to form a copolyester; solvent
02/14/2008US20080038676 Top coat material and use thereof in lithography processes
02/14/2008US20080038675 Exposure Method, Exposure Apparatus, Exposure System and Device Manufacturing Method
02/14/2008US20080038673 Method for adjusting a critical dimension in a high aspect ratio feature
02/14/2008US20080038669 Non-truly-spherical high-molecular fine particles, process for producing the same, inkjet ink composition containing fine particles, lithographic printing plate using the same, process for producing printing plate, and electrophoretic particles-containing composition containing fine particles
02/14/2008US20080038668 High speed violet or ultraviolet laser sensitive; exposed plate is preferably developed on a processor with an alkaline developer coupled with a replenisher having higher pH
02/14/2008US20080038666 Positive-Working Photoimageable Bottom Antireflective Coating
02/14/2008US20080038665 Photosensitive Resin Composition Having a High Refractive Index
02/14/2008US20080038664 Silsesquioxane compound mixture, method of making, resist composition, and patterning process
02/14/2008US20080038542 Method for high resolution patterning using soft X-ray, process for preparing nano device using the method
02/14/2008US20080037905 Method and apparatus for determining the influencing of the state of polarization by an optical system, and an analyser
02/14/2008US20080037858 Simultaneous computation of multiple points on one or multiple cut lines
02/14/2008US20080037111 Catadioptric Projection Objective
02/14/2008US20080037017 Generic interface for an optical metrology system
02/14/2008US20080036988 Lithographic apparatus, level sensor, method of inspection, device manufacturing method, and device manufactured thereby
02/14/2008US20080036986 Photomask, method and apparatus that uses the same, photomask pattern production method, pattern formation method, and semiconductor device
02/14/2008US20080036982 Method For Structuring A Substrate Using Multiple Exposure
02/14/2008US20080036981 Stage Device And Exposure Apparatus
02/14/2008US20080036949 Substrate for a display apparatus
02/14/2008US20080035863 Single scan irradiation for crystallization of thin films
02/14/2008US20080035851 Processing method, manufacturing method of semiconductor device, and processing apparatus
02/14/2008DE102007034089A1 Synthetic quartz glass lens for micro-lithographic process
02/14/2008DE102007005780A1 Verbundstruktur für die Mikrolithographie und optische Anordnung Composite structure for microlithography and optical assembly
02/13/2008EP1887841A1 Plasma generating apparatus and plasma generating method
02/13/2008EP1887615A1 Sensor calibration method, exposure method, exposure device, device fabrication method, and reflection type mask
02/13/2008EP1887614A1 Patterning method
02/13/2008EP1887425A1 Photocuring/thermosetting resin composition, curing/setting product thereof and printed wiring board obtained using the same
02/13/2008EP1887424A1 Method for making a processless lithographic printing plate
02/13/2008EP1887423A1 Laser-decomposable resin composition and pattern-forming material using the same
02/13/2008EP1886989A1 Calixresorcinarene compound, photoresist base comprising the same, and composition thereof
02/13/2008EP1886829A1 Image recording material and image forming method of image recording material
02/13/2008EP1886191A2 Optical imaging arrangement
02/13/2008EP1886190A1 Microlithography projection objective
02/13/2008EP1886189A2 A method of nanopatterning, a cured resist film use therein, and an article including the resist film
02/13/2008EP1886187A2 Novel photosensitive resin compositions
02/13/2008EP1768846A4 Fluid dispensing and drop-on-demand dispensing for nano-scale manufacturing
02/13/2008EP1725330B1 Microfluidic chip
02/13/2008EP1428075A4 Method for high resolution patterning using low-energy electron beam, process for preparing nano device using the method
02/13/2008EP1428074A4 Method for high resolution patterning using soft x-ray, process for preparing nano device using the method
02/13/2008CN201021972Y Roller special for emulating PVC yarn product
02/13/2008CN101124859A Clamping apparatus and image forming apparatus
02/13/2008CN101124658A Developing device and developing method
02/13/2008CN101124653A Discharge lamp
02/13/2008CN101124521A 固态浸没透镜微影术 Solid immersion lens lithography
02/13/2008CN101124520A Single- and multi-photon polymerizable pre-ceramic polymeric compositions
02/13/2008CN101124519A Ink-jet recording head, manufacturing method of the head and composition for ink-jet recording head
02/13/2008CN101124518A Radiation-sensitive resin composition and color filter
02/13/2008CN101124517A Photosensitive resin composition and photosensitive dry film by the use thereof
02/13/2008CN101124516A Pattern formation material, pattern formation device, and pattern formation method
02/13/2008CN101124089A 纳米级电子光刻 Nanoscale electron lithography
02/13/2008CN101123192A Method of fabricating lateral double diffused metal oxide semiconductor field effect transistor
02/13/2008CN101123182A Pattern forming method and apparatus
02/13/2008CN101123181A Pattern forming method and apparatus
02/13/2008CN101122954A Method for diffuse reflection processing on metal cladding high polymer film
02/13/2008CN101122801A Exhaust control apparatus for gumming machine
02/13/2008CN101122752A Centering device and exposure device
02/13/2008CN101122751A Liquid reclamation device for developing machine platform and the developing machine platform comprising same
02/13/2008CN101122750A Exposure device
02/13/2008CN101122749A Method of forming photoresist pattern
02/13/2008CN101122748A Photo-etching machine off-axis level and focusing detection control system and its implement method
02/13/2008CN101122747A Slit coating apparatus
02/13/2008CN101122746A Photoresist coating system
02/13/2008CN101122745A Positive printing heat-sensitive lithographic printing planography and its preparation method
02/13/2008CN101122744A Light solidifying coloring composition and color filter using the same
02/13/2008CN101122743A Light solidifying coloring composition and color filter using the same
02/13/2008CN101122742A Superbranched poly-siloxane base photoresist
02/13/2008CN101122741A Photosensitive composition and imaging element comprising vinyl polymer
02/13/2008CN101122740A Photosensitive resin composition for layer insulation film and forming method for the layer insulation film