Patents
Patents for G03F 7 - Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printed surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor (127,176)
04/2008
04/23/2008CN101167019A Convey error measuring method, calibration method, plotting method, exposure plotting method, plotting device, and exposure plotting device
04/23/2008CN101167018A Exposure method and tool
04/23/2008CN101167017A Photosensitive lithographic printing plate
04/23/2008CN101165598A Lithography apparatus, lithography apparatus and processing module combination and device production method
04/23/2008CN101165597A Bi-directional beam divider, aligning system using same and lithography device using the system
04/23/2008CN101165596A Lithography device sensor and detection method
04/23/2008CN101165595A Precision balance vibration-damping wafer stage movement system
04/23/2008CN101165594A Illuminating optic system for microlithography
04/23/2008CN101165593A Photosensitive composition and image forming method
04/23/2008CN101165592A Dry film, micro-lens and manufacturing method thereof
04/23/2008CN101165591A Method for producing two-dimensional polymer photon crystal using flexible offset printing
04/23/2008CN101165579A Array substrate for liquid crystal display device and method of fabricating the same
04/23/2008CN101165533A High speed variable attenuator
04/23/2008CN100383977C Method for making solid camera device
04/23/2008CN100383927C Substrate making method and apparatus
04/23/2008CN100383913C Method of processing substrate and chemical used in the method
04/23/2008CN100383667C Semiconductor element pattern transferring method
04/23/2008CN100383666C Photoresist composition and method for forming photoresist pattern
04/23/2008CN100383665C Onium salts and the use therof as latent acids
04/23/2008CN100383664C Low cost photo etching technique
04/23/2008CN100383646C Method for manufacturing liquid crystal display device array substrate
04/23/2008CN100383629C Device for manufacturing mesh points of a light conducting plate
04/23/2008CN100383627C Manufacturing method of light board
04/23/2008CN100383565C Radioactive ray sensitive composition for forming coloring layer, color filter and color liquid crystal display plate
04/23/2008CN100383195C Method for synthesizing polymeric azo dyes
04/23/2008CN100382871C Special defoamer for printed circuit board
04/22/2008US7363611 Printing a mask with maximum possible process window through adjustment of the source distribution
04/22/2008US7362556 Combination current sensor and relay
04/22/2008US7362520 Device for the low-deformation mounting of a rotationally asymmetric optical element
04/22/2008US7362508 Projection optical system and method for photolithography and exposure apparatus and method using same
04/22/2008US7362447 Low walk-off interferometer
04/22/2008US7362436 Method and apparatus for measuring optical overlay deviation
04/22/2008US7362414 Optical system having an optical element that can be brought into at least two positions
04/22/2008US7362387 Programmable mask and method for fabricating biomolecule array using the same
04/22/2008US7362347 Image recording apparatus having a recording drum rotatable with a recording medium mounted peripherally thereof
04/22/2008US7362013 Linear motor, exposure apparatus using the same, and device manufacturing method
04/22/2008US7361918 High repetition rate laser produced plasma EUV light source
04/22/2008US7361910 Movable stage apparatus
04/22/2008US7361718 Alkali-soluble gap fill material forming composition for lithography
04/22/2008US7361709 Colored composition, method of manufacturing color filter, and method of manufacturing black matrix substrate
04/22/2008US7361631 corrosion resistance; removing photoresist residues; using aqueous solution containing fluoride compound
04/22/2008US7361609 Mask patterns for semiconductor device fabrication and related methods
04/22/2008US7361604 Method for reducing dimensions between patterns on a hardmask
04/22/2008US7361600 Semiconductor manufacturing apparatus having a built-in inspection apparatus and a device manufacturing method using said manufacturing apparatus
04/22/2008US7361530 Method of fabricating a semiconductor integrated circuit that includes patterning a semiconductor substrate with a first photomask that uses metal for blocking light and patterning the same substrate with a second photomask that uses organic resin for blocking light
04/22/2008US7361457 Hardware and software for directing a beam through a mask onto a wafer surface to outline a circuit pattern; photolithography system including an exposure tool, a mask, array of micromechanical mirrors capable of real time configurable imaging, and addressing circuitry
04/22/2008US7361456 Method of manufacturing master disk, apparatus of manufacturing master disk, method of detecting moving distance difference of master disk, and apparatus of detecting moving distance difference of master disk
04/22/2008US7361455 Anti-reflective coatings
04/22/2008US7361454 Exposing a resist film formed on semiconductor substrate to a light using photomask in which patterns are arranged two-dimensionally at a predetermined altitude; development; reducing an opening size; setting a reflow start temperature, heating; coating with water soluble resin; crosslinking; etching
04/22/2008US7361453 using a first and a second pattern, the patterns being identical but displaced over a distance with respect to each other; second pattern is created on the upper mask layer or on the lower mask layer at locations where the upper mask layer has been removed
04/22/2008US7361452 Methods for forming a metal line in a semiconductor manufacturing process
04/22/2008US7361451 Lithographic printing plate precursor and lithographic printing method using the same
04/22/2008US7361450 optical waveguide for use in photoelectronic substrates; cured products excellent in workability, transparency, developability, adhesiveness and solder heat resistance
04/22/2008US7361448 resist pattern thickening material contains a resin and a polyhydric alcohol; water-soluble or alkali-soluble; using the thickened resist pattern as a mask, a high-quality, high-performance semiconductor device having an extremely fine pattern can be produced
04/22/2008US7361447 Photoresist polymer and photoresist composition containing the same
04/22/2008US7361446 Positive resist composition
04/22/2008US7361445 Mixture of alkali soluble resin, quinonediazide compound and alcohol
04/22/2008US7361444 tuned underlayers functioning as ARCs, planarizing layers, and etch resistant hard masks; high resolution, residue free lithography; do not interact with the resist limiting interfacial mixing and contamination of resist by an outgassing product
04/22/2008US7361437 Thermal transfer donor element with a carboxylated binder and a hydroxylated organic compound
04/22/2008US7361436 Light shield zones; chromium film and phase shifting mask on radiation transparent substrate; design masking pattern
04/22/2008US7361435 Alternating phase shifting masking; generating destructive interference
04/22/2008US7361432 Composition for hologram-recording material, hologram-recording medium, and process for producing the same
04/22/2008US7361285 Method for fabricating cliche and method for forming pattern using the same
04/22/2008US7361234 Photolithographic stepper and/or scanner machines including cleaning devices and methods of cleaning photolithographic stepper and/or scanner machines
04/22/2008US7360953 Light guiding device
04/17/2008WO2008045545A2 Deformation-based contact lithography systems, apparatus and methods
04/17/2008WO2008044925A2 Lithographic apparatus, and device manufacturing method
04/17/2008WO2008044924A2 Cleaning method, apparatus and cleaning system
04/17/2008WO2008044921A1 Method for regenerating a surface of an optical element in an xuv radiation source and xuv radiation source
04/17/2008WO2008044741A1 Resist composition for use in lithography method utilizing electron beam, x-ray or euv light
04/17/2008WO2008044612A1 Exposure apparatus, exposure method, and device manufacturing method
04/17/2008WO2008044479A1 Electron beam lithography system and electron beam lithography
04/17/2008WO2008044326A1 Positive- or negative-working chemical amplification-type photoresist composition for low-temperature dry etching, and method for photoresist pattern formation using the same
04/17/2008WO2008044319A1 Euv light generating apparatus and euv exposure apparatus
04/17/2008WO2008043577A1 Coated mirrors and their fabication
04/17/2008WO2008043351A1 Method for producing holograms and documents containing a hologram
04/17/2008WO2008021125A3 Method of preparing a patterned film with a developing solvent
04/17/2008WO2008019936A3 Microlithographic projection exposure apparatus and microlithographic exposure method
04/17/2008WO2008008344A3 Microphotonic maskless lithography
04/17/2008WO2007147782A3 Oxime sulfonates and the use therof as latent acids
04/17/2008WO2006133907A8 Passive reticle tool, lithographic apparatus and method of patterning a device
04/17/2008US20080090185 Method and apparatus for rinsing a substrate during lithographic development processing
04/17/2008US20080090184 copolymer containing monomers selected from acrylic acid, methacrylic acid, vinyl alcohol, hydroxystyrenes, acrylic ester of chromophore group or 1,1,1,3,3,3-hexafluoro-2-propanol group; vinyl ether terminated crosslinking agent; solvent resistant, impervious to interdiffusion of photoresist
04/17/2008US20080090183 depositing a catalyst aluminum oxide and iron on a substrate, flowing a mixture of argon, hydrogen, and ethylene over the catalyst, heating in a furnace and chemical vapor deposition to grow carbon at accurate position; use in interconnect applications
04/17/2008US20080090182 Method for manufacturing microlens
04/17/2008US20080090181 Method For Producing Submicron Structures
04/17/2008US20080090180 increase adhesion between photoresist layer and wafer, by first depositing hexamethyldisilazane on wafer, heating to induce silylation chemical reaction between HMDS and photoresist material that generates siloxane (Si O Si) bonding
04/17/2008US20080090175 aluminum support, a lower light sensitive layer and an upper light sensitive layer, each contains carbon black pigment chemically combined with the development inhibitor polyoxyethylene glycol; development latitude, chemical resistance, and safelight property
04/17/2008US20080090173 alkali-soluble acrylate copolymer for use in photoresists, having a weight average molecular weight of 1,000 to 500,000; prevents water penetration during immersion lithography; fluoropolymers; photolithography for the microfabrication of semiconductor devices
04/17/2008US20080090172 Resist composition and patterning process
04/17/2008US20080090170 nano-imprinting pattern having concave and convex portions; Dummy grooves are formed in the template to absorb the liquid overflow for suppress friction force; photolithography method for semiconductor devices
04/17/2008US20080090058 Thin-film layer structure and method for manufacturing same
04/17/2008US20080090054 Thin film device having thin film elements and thin film pattern on thin film elements, and method of fabricating the same
04/17/2008US20080090052 Nanoimprint Mold, Method of Forming a Nonopattern, and a Resin-Molded Product
04/17/2008US20080089073 Dynamic Liquid Crystal Gel Holograms
04/17/2008US20080088816 Microlithograph system
04/17/2008US20080088813 Pattern Forming Material, Pattern Forming Apparatus and Pattern Forming Process
04/17/2008US20080087548 Mandrels for Electroforming Printing Screens, and Electroforming Apparatus
04/17/2008US20080087215 Method and system of coating polymer solution on a substrate in a solvent saturated chamber
04/17/2008DE19924182B4 Träger für zu bearbeitende, aufzubewahrende und/oder zu transportierende Halbleiterwafer Support for to be processed, to be stored and / or transported semiconductor wafer