Patents
Patents for G03F 7 - Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printed surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor (127,176)
06/2008
06/03/2008US7381506 Substrate coated with a mixture of a solvent and an imaging layer containing a photochromic material exhibiting a reversible homogeneous-heterogeneous transition between a dispersed colorless state and a colored state that separates out of the solvent in the form of opaque, polydisperse crystals.
06/03/2008US7381502 Apparatus and method to improve the resolution of photolithography systems by improving the temperature stability of the reticle
06/03/2008US7381272 Processing apparatus
06/03/2008US7380499 Image recording apparatus and printing plate material
05/2008
05/29/2008WO2008063387A1 Multilayer element with low ph developer solubility
05/29/2008WO2008063134A1 Method of producing a pattern of discriminative wettability
05/29/2008WO2008063056A2 Gas analyzing system, lithographic apparatus and method of improving the sensitivity of a gas analyzing system
05/29/2008WO2008063016A1 Hardmask composition for processing resist underlayer film, process for producing semiconductor integrated circuit device using the hardmask composition, and semiconductor integrated circuit device produced by the process
05/29/2008WO2008062888A1 Composition for resist lower layer film formation and method for pattern formation
05/29/2008WO2008062707A1 Curable composition containing hydroxyl group-containing thiol compound and cured product thereof
05/29/2008WO2008062513A1 Electron-beam exposing device, and electron-beam exposing method
05/29/2008WO2008061954A1 Novel co-initiators
05/29/2008WO2008061690A1 Method for removing contamination on optical surfaces and optical arrangement
05/29/2008WO2008061681A2 Illumination lens system for projection microlithography, and measuring and monitoring method for such an illumination lens system
05/29/2008WO2008045504A3 Hydraulic-facilitated contact lithography apparatus, system and method
05/29/2008WO2008035965A3 Apparatus comprising a rotating contaminant trap
05/29/2008WO2008021291A3 Fluorinated polymers for use in immersion lithography
05/29/2008WO2007069222A3 Analysis device with an array of focusing microstructures
05/29/2008US20080125903 Semiconductor production system
05/29/2008US20080125870 Nerve regeneration device
05/29/2008US20080124942 Method for forming thin film heads using a bi-layer anti-reflection coating for photolithographic applications and a device thereof
05/29/2008US20080124833 Applying solution of hydrazine-based precursor to a metal chalcogenide to hydrophilic surface to fill holes; annealing to convert precursor to metal chalcogenide; quality
05/29/2008US20080124663 Microfluidic systems including three-dimensionally arrayed channel networks
05/29/2008US20080124662 Wafer stage module of twin scan exposure system and method of controlling the same
05/29/2008US20080124661 Photochemical and photothermal rearrangements for optical data and image recording
05/29/2008US20080124660 HIGHLY PURIFIED LIQUID PERFLUORO-n-ALKANES AND METHOD FOR PREPARING
05/29/2008US20080124658 Rotary apertured interferometric lithography (rail)
05/29/2008US20080124657 Liquid photopolymer adapted to form a polymer printing plate and containing a photoinitiator which is activated by light at a wavelength of at least 370 nm; uses ambient light instead of UV radiation; cheaper to manufacture, operate and maintain
05/29/2008US20080124656 Novel sulfonate salts and derivatives, photoacid generators, resist compositions, and patterning process
05/29/2008US20080124655 Comprising polymer matrix, labeling dye which absorbs electromagnetic radiation in visible range of 400-700 nm to provide visible coloration, wherein labeling dye forms reaction product upon exposure to radiation energy at wavelength of 400-900 nm, and where product has color different from labeling dye
05/29/2008US20080124654 Positive Type Dry Film Photoresist And Composition For Preparing The Same
05/29/2008US20080124653 Positive resist compositions and patterning process
05/29/2008US20080124652 Positive resist composition and patterning process
05/29/2008US20080124651 Method of controlling the differential dissolution rate of photoresist compositions, polycyclic olefin polymers and monomers used for making such polymers
05/29/2008US20080124650 Tuned underlayers functioning as antireflective coatings, planarizing layers, and etch resistant hard masks; high resolution, residue free lithography; do not interact with the resist limiting interfacial mixing and contamination of resist by an outgassing product
05/29/2008US20080124649 Multilayered resist systems using tuned polymer films as underlayers and methods of fabrication thereof
05/29/2008US20080124648 Resist Pattern Forming Method, Supercritical Processing Solution For Lithography Process, And Antireflection Film Forming Method
05/29/2008US20080124647 Transfer substrate, transfer method, and organic electroluminescent device manufacturing method
05/29/2008US20080124633 Includes a mask substrate having patterns arranged at a pitch P; and a pellicle which protects the mask substrate; pellicle is configured so that transmittance of incident light of an incident angle theta is higher than transmittance of incident light of an incident angle 0 degrees
05/29/2008US20080124524 Composition For Forming Antireflection Film, Layered Product, And Method Of Forming Resist Pattern
05/29/2008US20080124490 Coating solution for forming wettability-varied pattern and method of producing pattern-formed body
05/29/2008US20080123095 On-Chip Spectroscopy
05/29/2008US20080123069 Projection Objective For a Microlithographic Projection Exposure Apparatus
05/29/2008US20080123065 Method and device for manufacturing a hologram recording medium
05/29/2008US20080123055 Exposure apparatus
05/29/2008US20080122395 Driving apparatus, exposure apparatus, and device manufacturing method
05/29/2008US20080121028 Scanning Probe Microscopy Inspection and Modification System
05/29/2008DE19632122B4 Photovernetzende Kunstharzzusammensetzung deren Verwendung und daraus erhältliches vernetztes Produkt Photo-crosslinking resin composition whose use and resulting cross-linked product available
05/29/2008DE102007055408A1 Illumination optics for use in microlithography projection illumination system, has place and time-dissolved detection device arranged such that device detects light intensity distribution based on light intensity distribution in plane
05/29/2008DE102007055097A1 Scattered radiation measuring method for use in optical system, involves passing radiation from radiation source through mask, and measuring intensity of radiation passed through another mask with locally resolving detector
05/29/2008DE102007055096A1 Optical characteristic determining method for illustrating optical system, involves determining image produced on image recording device in each relative position by device, where device is provided opposite to image plane
05/29/2008DE102006056035A1 Beleuchtungsoptik für die EUV-Projektions-Mikrolithographie, Beleuchtungssystem mit einer derartigen Beleuchtungsoptik, Projektionsbelichtungsanlage mit einem derartigen Beleuchtungssystem, Verfahren zur Herstellung eines mikrostrukturierten Bauteils sowie durch das Verfahren hergestelltes mikrostrukturiertes Bauteil Illumination optics for EUV projection microlithography, illumination system with an illumination optics, the projection exposure apparatus produced with such a lighting system, method for producing a microstructured component as well as by the process of micro-structured component
05/29/2008DE102006054820A1 Positioning error correction process for structural element on substrate involves finding lateral position, comparing with preset one and applying light beam dose
05/28/2008EP1926129A1 Beam transforming element, illumination optical apparatus, exposure apparatus, and exposure method
05/28/2008EP1926128A1 Exposure apparatus, method and process for producing device
05/28/2008EP1926127A1 Exposure apparatus, exposure method, and device manufacturing method
05/28/2008EP1925981A2 Lithographic apparatus, device manufacturing method and computer program product
05/28/2008EP1925980A2 Positive type resisit composition and resisit pattern formation method using same
05/28/2008EP1925979A1 Positive photosensitive composition, polymer compound used for the positive photosensitive composition, production method of the polymer compound, and pattern forming method using the positive photosensitive composition
05/28/2008EP1925978A2 A method and a computer program for performing decomposition of a pattern for use in a DPT process and a mask
05/28/2008EP1925609A1 Novel-co-initiators
05/28/2008EP1924890A1 Optical system of a microlithographic exposure system
05/28/2008EP1924889A1 Illuminator for a photolithography device
05/28/2008EP1924888A1 Microlithography projection optical system, method for manufacturing a device and method to design an optical surface
05/28/2008EP1924887A1 Photocurable compositions for preparing abs-like articles
05/28/2008EP1554324B1 Polymer for heat-sensitive lithographic printing plate precursor
05/28/2008EP1319247B1 Correction of overlay offset between inspection layers in integrated circuits
05/28/2008CN201066434Y Ultra-large table astigmatism and exposure machine
05/28/2008CN101189557A Permanent patterning method
05/28/2008CN101189556A Exposure apparatus and exposure method
05/28/2008CN101189555A Drawing device and method
05/28/2008CN101189554A Image exposure device
05/28/2008CN101189553A Conductive lithographic polymer and method of making devices using same
05/28/2008CN101189552A Radiation-sensitive resin composition, layered product, and process for producing the same
05/28/2008CN101189551A 固化性树脂组合物及其固化物 The curable resin composition and a cured product
05/28/2008CN101189550A Photocuring/thermosetting resin composition, curing/setting product thereof and printed wiring board obtained using the same
05/28/2008CN101187789A Formulation for removal of photoresist, etch residue and BARC
05/28/2008CN101187788A Low etching relative thick photoresist cleaning liquor
05/28/2008CN101187787A Low etching photoresist cleaning agent and its cleaning method
05/28/2008CN101187786A Aluminum gate surface passivatation processing method and reaction device
05/28/2008CN101187785A Lithographic method
05/28/2008CN101187784A Lithographic method
05/28/2008CN101187783A Focusing and leveling measuring system and its measuring method
05/28/2008CN101187782A Conduit system for a lithographic apparatus, lithographic apparatus, pump, and method for substantially reducing vibrations in a conduit system
05/28/2008CN101187781A Pattern describing device and pattern describing method
05/28/2008CN101187780A Method for determining lens thermal deformation correctional parameter
05/28/2008CN101187779A Method for monitoring defocusing of zero mark
05/28/2008CN101187778A Photosensitive transfer printing material, color filtering sheet and displaying device
05/28/2008CN101187777A Template for imprint lithography and imprint lithography method using same
05/28/2008CN101187776A Method for transferring self-assembled dummy pattern to substrate
05/28/2008CN101187765A Film transistor array substrate for liquid crystal display and manufacture thereof
05/28/2008CN101187752A Colorful filter and its making method and LCD device
05/28/2008CN101187713A Method for manufacturing products with birefringent pattern
05/28/2008CN101186678A Acid-degradable resin compositions containing ketene-aldehyde copolymer
05/28/2008CN100391220C Printing plate handling system
05/28/2008CN100390956C Alignment stage apparatus
05/28/2008CN100390938C Method for removal of material by polarized radiation and back side application of radiation
05/28/2008CN100390935C Exposure apparatus and method for producing device
05/28/2008CN100390931C Substrate processing device and method, and pattern forming method
05/28/2008CN100390668C Sub-50nm graph exposuring method by negative chemical amplifying resist