Patents
Patents for G03F 7 - Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printed surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor (127,176)
01/2009
01/15/2009WO2009007928A2 Methods for manufacturing integrated circuits
01/15/2009WO2009007128A1 Method and apparatus for analyzing a group of photolithographic masks
01/15/2009WO2009006783A1 Cleaning composition for removing resist
01/15/2009WO2008136666A3 Image sensor for lithography
01/15/2009WO2008122626A3 Optical element module with imaging error and position correction
01/15/2009WO2006080786A9 Thermally curable resin composition with extended storage stability and good adhesive property
01/15/2009US20090019418 Lithography simulation method, mask pattern preparation method, semiconductor device manufacturing method and recording medium
01/15/2009US20090018550 Fragmentation and extraction basket
01/15/2009US20090017401 Method of forming micropattern
01/15/2009US20090017400 Pattern forming method
01/15/2009US20090017398 Method for making a lithographic printing plate
01/15/2009US20090017397 Photosensitive resin composition and microlens formed with use thereof
01/15/2009US20090017387 Reflective mask blank for exposure, reflective mask for exposure, method of producing a semiconductor device, and substrate provided with multilayer reflective film
01/15/2009US20090017277 Photosensitive material, method of manufacturing conductive metal film, conductive metal film and light-transmitting film shielding electromagnetic wave for plasma display panel
01/15/2009US20090017268 Method and apparatus for selectively patterning free standing quantum dot (fsqdt) polymer composites
01/15/2009US20090017265 Negative photosensitive fluorinated aromatic resin composition
01/15/2009US20090016766 Control Method of Image Forming Apparatus and Image Forming Apparatus
01/15/2009US20090015951 Projection objective and method for its manufacture
01/15/2009US20090015816 Exposure method, substrate stage, exposure apparatus, and device manufacturing method
01/15/2009US20090015812 Illumination system particularly for microlithography
01/15/2009US20090015808 Exposure method, substrate stage, exposure apparatus, and device manufacturing method
01/15/2009US20090015807 Exposure apparatus and device manufacturing method
01/15/2009US20090014666 Optical system having a clearning arrangement
01/15/2009DE102008040218A1 Optical device e.g. illumination system, operating method for use in projection exposure system, involves storing element such that no parasitic adjustments or changes of element develop during or after rotation in imaging characteristics
01/15/2009DE102008001909A1 Projection exposure system, has multipolar lighting adjustment of imaging device and compensation unit is provided for compensation of image defect induced by multipolar lighting adjustment
01/15/2009DE102007033243A1 Verfahren und Anordnung zur Analyse einer Gruppe von Photolithographiemasken Method and apparatus for analyzing a group of photolithography masks
01/15/2009DE102007032958A1 Verfahren zur Ermittlung lithographisch relevanter Maskendefekte Method for determining lithographically relevant mask defects
01/14/2009EP2015140A1 Substrates and methods of using those substrates
01/14/2009EP2014624A2 Titania-doped quartz glass for nanoimprint molds
01/14/2009EP2013663A1 Illumination system for euv lithography as well as a first and second optical element for use in an illumination system of this type
01/14/2009EP2013662A1 Article for parallel lithography with two-dimensional pen arrays
01/14/2009EP2013659A2 Wet developable bottom antireflective coating composition and method for use thereof
01/14/2009EP1924889B1 Illuminator for a photolithography device
01/14/2009EP1690139B1 Projection optical system
01/14/2009EP1567518B1 Oxime ester photoinitiators with heteroaromatic groups
01/14/2009EP1555571B1 Cured material and flexographic plate using the same
01/14/2009EP1451642B1 Chemical rinse composition
01/14/2009EP1277815B1 Water-based coating composition curable with actinic energy ray, coated metallic material with cured film of the composition, production process, and method of bonding coated metallic material
01/14/2009CN201181391Y Unsymmetric phase shift optical grating mark
01/14/2009CN201181390Y Light shield guiding means
01/14/2009CN201181389Y Photo-etching machine silicon slice bench exchanging set adopting transition connection device
01/14/2009CN201181388Y Photo-etching machine silicon slice bench exchanging set adopting conveyor belt structure
01/14/2009CN201181387Y Photo-etching machine silicon slice bench exchanging set adopting cross sliding rail
01/14/2009CN101347054A Glass substrate having circuit pattern and process for producing the same
01/14/2009CN101346669A Writing apparatuses and methods
01/14/2009CN101346668A Writing apparatuses and methods
01/14/2009CN101346667A Blended sensor system and method
01/14/2009CN101346666A Pattern-forming material, pattern-forming apparatus and pattern-forming method
01/14/2009CN101346665A Surface-protective film
01/14/2009CN101346664A Mask blank and photomask
01/14/2009CN101345191A Re-working method and patterning technique for photoresist layer
01/14/2009CN101345188A Plate, apparatus for adjusting temperature of substrate having the plate and apparatus for processing substrate having the plate
01/14/2009CN101344734A Silicon slice focusing and leveling measurement device
01/14/2009CN101344733A Photoresist coating and developing apparatus
01/14/2009CN101344732A Maskless lithography systems and methods utilizing spatial light modulator arrays
01/14/2009CN101344731A Device and method for transmission image sensing
01/14/2009CN101344730A Position control method and device based on H type structure two-sided driving system
01/14/2009CN101344729A Method for measuring rotation degree of mask bench relative to workpiece bench
01/14/2009CN101344728A On-line measurement apparatus and method for wave aberration of photo-etching machine projection objective
01/14/2009CN101344727A Focusing and leveling detection device and method
01/14/2009CN101344726A Stepping arrangement type interference microlithography and device thereof
01/14/2009CN101344725A Coating apparatus, substrate exchanging method and coating method
01/14/2009CN101344724A Sensitive imaging composition, its preparation method and uses
01/14/2009CN101344723A Layer-by-layer automatic forming method and device for micro photo-curing thick film
01/14/2009CN101344722A Process for manufacturing Colorful filtering substrates
01/14/2009CN101344721A Photo-etching method
01/14/2009CN101344720A Gray level mask, defect correcting method, manufacturing method and design transfer method
01/14/2009CN101344662A Production method of display substrates
01/14/2009CN101344604A Reflection type quartz polarization beam splitting optical grating based on metal layer reflection
01/14/2009CN101344511A Screening method for photoresist recovery, reclaiming method and equipment for photoresist recovery
01/14/2009CN101344375A High resolution heterodyne laser interference system and method for improving definition
01/14/2009CN101343422A Pigment dispersion liquid, curable composition, color filter produced using the same, and solid state imaging device
01/14/2009CN101343343A Novolac resin, preparation method and photoresist composition containing the resin
01/14/2009CN101342840A Method for manufacturing integrated molding module directly with paper card design diagram
01/14/2009CN100452296C Substrate heating equipment and substrate heating method
01/14/2009CN100452294C Substrate treatment device control method and substrate treatment device
01/14/2009CN100452293C Exposure apparatus, method for producing device, and method for controlling exposure apparatus
01/14/2009CN100451843C Liquid sprayer
01/14/2009CN100451842C Exposure device and exposure method
01/14/2009CN100451841C Method of producing semiconductor integrated circuit device and method of producing multi-chip module
01/14/2009CN100451840C Method for constructing micrometre, submicrometre structural surface
01/14/2009CN100451839C Alignment method of exposure mask and manufacturing method of thin film element substrate
01/14/2009CN100451838C Aligning system and aligning method
01/14/2009CN100451837C Pattern writing apparatus and pattern writing method
01/14/2009CN100451836C Lithographic apparatus and device manufacturing method
01/14/2009CN100451835C Lithographic apparatus, device manufacturing method, and device manufactured thereby
01/14/2009CN100451834C Substrates carrier and method of mfg. same
01/14/2009CN100451833C Device and method for wafer alignment with reduced tilt sensitivity
01/14/2009CN100451832C Lithographic apparatus and device manufacturing method
01/14/2009CN100451831C Method of reducing size of pattern interval of opening
01/14/2009CN100451830C Organic polymeric antireflective coatings deposited by chemical vapor deposition
01/14/2009CN100451781C Liquid crystal display device including polycrystalline silicon thin film transistor and method of fabricating the same
01/14/2009CN100451778C Liquid crystal display and method for fabricating the same
01/14/2009CN100451734C Human eyes high order optical aberration orthopraxy method
01/14/2009CN100451723C Method and device for correcting SLM stamp image imperfections
01/14/2009CN100451705C Design and manufacture technology of optical switch
01/14/2009CN100450703C Molding process
01/14/2009CN100450556C Method for immobilizing hydrogel-bonding polymers on polymer substrate surfaces
01/13/2009US7477959 Photoresist system
01/13/2009US7477405 Method and system for measuring patterned structures