Patents
Patents for G03F 7 - Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printed surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor (127,176)
05/2009
05/07/2009WO2009058278A1 Methods of cleaning semiconductor devices at the back end of line using amidoxime compositions
05/07/2009WO2009058277A1 Novel nitrile and amidoxime compounds and methods of preparation
05/07/2009WO2009057822A1 Optical unit, illumination optical apparatus, exposure apparatus, exposure method, and device manufacturing method
05/07/2009WO2009057769A1 Novel sulfonic acid salt and derivative thereof, photoacid generator agent, and resist material and pattern formation method using the photoacid generator agent
05/07/2009WO2009057700A1 Transfer method and transfer device
05/07/2009WO2009057638A1 Positive photosensitive resin composition, method for forming pattern, electronic component
05/07/2009WO2009057632A1 Apparatus for connecting utility medium supply member, stage apparatus, apparatus for supporting projection optical system, and exposure apparatus
05/07/2009WO2009057484A1 Radiation sensitive resin composition and polymer
05/07/2009WO2009057465A1 Planographic printing plate material and aluminum support
05/07/2009WO2009057458A1 Composition for forming resist underlayer film and method of forming resist pattern from the same
05/07/2009WO2009057411A1 Negative-working resist for formation of protrusions for liquid crystal alignment
05/07/2009WO2009057408A1 Photosensitive material for lithographic printing plate and process for producing lithographic printing plate
05/07/2009WO2009056908A1 Apparatus and method for removing coating material from a semiconductor wafer
05/07/2009WO2009056440A1 Pad microprinting device and methods, and pad for this device
05/07/2009WO2009035129A3 Illumination optical system, exposure apparatus, optical element and manufacturing method thereof, and device manufacturing method
05/07/2009WO2009014439A3 Debris prevention system and lithographic apparatus
05/07/2009WO2008051232A3 Compensation of effects of atmospheric perturbations in optical metrology
05/07/2009US20090119069 Method for determining relative swing curve amplitude
05/07/2009US20090117499 Cleaning solution for immersion photolithography system and immersion photolithograph process using the cleaning solution
05/07/2009US20090117498 forming photoresist layer including photosensitizer with high thermal decomposition temperature on semiconductor substrate, exposing photoresist layer, developing selectively exposed resist layer, decomposing photosensitizer; heat shrinkage
05/07/2009US20090117497 Method of forming pattern using fine pitch hard mask
05/07/2009US20090117496 Method for treating surface of element
05/07/2009US20090117495 Method for forming a pattern in a semiconductor device and method for manufacturing a flash memory device
05/07/2009US20090117494 Controller for optical device, exposure method and apparatus, and method for manufacturing device
05/07/2009US20090117493 Anti-Reflective Coating Forming Composition Containing Reaction Product of Isocyanuric Acid Compound with Benzoic Acid Compound
05/07/2009US20090117492 Method for forming fine pattern in semiconductor device
05/07/2009US20090117491 Resolution enhancement techniques combining interference-assisted lithography with other photolithography techniques
05/07/2009US20090117490 Positive resist composition for immersion lithography and method for forming resist pattern
05/07/2009US20090117489 Compositons and processes for immersion lithography
05/07/2009US20090117488 Compound, positive resist composition and resist pattern forming method
05/07/2009US20090117346 Photosensitive material for forming conductive film, conductive film, light transmitting electromagnetic wave shielding film and method for manufacturing the same
05/07/2009US20090117344 Method of correcting mask pattern, photo mask, method of manufacturing semiconductor device, and semiconductor device
05/07/2009US20090116786 Multi-Channel Dispersion Compensator
05/07/2009US20090116036 Device and Method for the Optical Measurement of an Optical System, Measurement Structure Support, and Microlithographic Projection Exposure Apparatus
05/07/2009US20090115989 Lighting optical system, exposure system, and exposure method
05/07/2009US20090115986 Microlithography projection objective
05/07/2009US20090115978 Method for treating substrate, method for conveying substrate, and apparatus for conveying substrate
05/07/2009US20090115675 Planar antenna
05/07/2009US20090114922 Semiconductor device and method for manufacturing the same, liquid crystal television, and el television
05/07/2009US20090114816 Advanced Roughness Metrology
05/07/2009US20090114618 Method of making hierarchical articles
05/07/2009US20090114108 Lithographic printing plate precursor and lithographic printing method
05/07/2009US20090114000 Nanoprobe tip for advanced scanning probe microscopy comprising a layered probe material patterned by lithography and/or fib techniques
05/07/2009DE102007051671A1 Abbildende Optik sowie Projektionsbelichtungsanlage für die Mikrolithographie mit einer derartigen abbildenden Optik The imaging optics and projection exposure system for microlithography with such imaging optics
05/06/2009EP2056165A1 Photo plot method and assembly for recording a halftone image stored on a computer on a level photosensitive recording medium
05/06/2009EP2056164A1 Cleaning apparatus and immersion lithographic apparatus
05/06/2009EP2056163A1 Positive photosensitive resin composition
05/06/2009EP2056162A1 Compositions and processes for immersion lithography
05/06/2009EP2056129A1 Optical element, method for manufacturing master for manufacturing optical element, and photoelectric conversion device
05/06/2009EP2055726A1 Thiourethane compound and photosensitive resin composition
05/06/2009EP2054772A2 Exposure apparatus
05/06/2009EP2054771A2 Lithography system, method of heat dissipation and frame
05/06/2009EP2054770A2 Sensitizer dyes for photoacid generating systems using short visible wavelengths
05/06/2009EP2054769A1 Uv-dosis indicators
05/06/2009EP2003161A9 Multifunctional oxetanyl group-containing ultraviolet-curable resin composition
05/06/2009EP1789849B1 Use of methanofullerene derivatives as resist materials and method for forming a resist layer
05/06/2009EP1633545A4 Method to reduce adhesion between a conformable region and a pattern of a mold
05/06/2009EP1574528B1 Novel photosensitive resin based on saponified polyvinyl acetate, photosensitive resin composition, method of forming aqueous gel from the same, and compound
05/06/2009EP1567915A4 Pattern forming materials and pattern formation method using the materials
05/06/2009CN201233505Y Immersion control device used for photo-etching machine
05/06/2009CN101427184A 光刻系统和投影方法 Projection lithography system and method
05/06/2009CN101427183A Composition for forming lower layer film and pattern forming method
05/06/2009CN101427182A Composite patterning devices for soft lithography
05/06/2009CN101426957A Substrate support system and method
05/06/2009CN101426659A 印刷版材料 Printing plate material
05/06/2009CN101424889A Method for regenerating stripping solution from stripping waste liquid and regeneration device
05/06/2009CN101424888A Combination for tripping photoresist, tripping method and making method of display divice
05/06/2009CN101424887A Semiconductor wafer metal substrate web corrosion prevention liquid and its use method
05/06/2009CN101424886A Developing method and developer coating apparatus
05/06/2009CN101424885A Mask alignment system and method thereof
05/06/2009CN101424884A Lithographic apparatus immersion damage control
05/06/2009CN101424883A Exposure system and device producing method
05/06/2009CN101424882A Exposing device, methods for forming pattern, channel, and hole by using the same, and liquid crystal display device therewith and method for fabricating the same
05/06/2009CN101424881A Lithography protection apparatus
05/06/2009CN101424880A Straight writing photolithography method by utilizing micro-nano fiber
05/06/2009CN101424879A Resistance straining reaction type closed-loop two-dimension flexible hinge work bench
05/06/2009CN101424878A Method for making high W/N ratio T-shaped gate by once electron beam exposure
05/06/2009CN101424877A Photoresists comprising novolak resin blends
05/06/2009CN101424876A Pattern formation method
05/06/2009CN101424846A TFT-LCD array substrate, liquid crystal display panel and method for producing same
05/06/2009CN101424844A Method for manufacturing LCD array substrate
05/06/2009CN101424837A Method for manufacturing LCD array substrate
05/06/2009CN101424836A Method for manufacturing LCD array substrate
05/06/2009CN101424835A Method for manufacturing LCD array substrate
05/06/2009CN101424814A PDLC grating of lcd equipment and making method
05/06/2009CN101424760A Color filter and method for manufacturing the same
05/06/2009CN101424758A Negative refraction artificial material based on iron-clad
05/06/2009CN101424751A Optical element and method for manufacturing master for producing optical element
05/06/2009CN101424513A Position measurement system and lithographic apparatus
05/06/2009CN101423682A Co-extruded compositions for high aspect ratio structures
05/06/2009CN100485953C Substrate for organic EL and method for manufacturing the same
05/06/2009CN100485883C Plasma ashing method
05/06/2009CN100485865C Exposure device and device manufacturing method
05/06/2009CN100485864C EUV light source, EUV exposure equipment and semiconductor device manufacturing method
05/06/2009CN100485863C Substrate processing method and substrate processing apparatus
05/06/2009CN100485862C Exposure apparatus, exposure method, and method for producing device
05/06/2009CN100485535C Step scan projection photoetching machine synchronous controller
05/06/2009CN100485534C Step scan projection photoetching machine synchronous control system
05/06/2009CN100485533C Substrate processing system and method
05/06/2009CN100485532C Antireflective film and exposure method