Patents
Patents for G03F 7 - Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printed surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor (127,176)
09/2009
09/02/2009CN100535765C 6-freedom micro-motion platform capable of isolating exterior vibration
09/02/2009CN100535764C Method for detecting target position corresponding to designated lighting intensity value
09/02/2009CN100535763C Device for automatically focusing and leveling
09/02/2009CN100535762C Silicon slice fixing part
09/02/2009CN100535761C Lithography device sensor and detection method
09/02/2009CN100535760C On-line testing apparatus of projection objective
09/02/2009CN100535759C Method of determining semiconductor technological condition
09/02/2009CN100535758C Control method and operation system for wet photoetching process
09/02/2009CN100535757C Substrate processing apparatus
09/02/2009CN100535756C Control method for coaxial alignment signal acquisition and processing, and key subsystem thereof
09/02/2009CN100535755C Adaptive optimization method for coaxial-aligning vertical-scanning length
09/02/2009CN100535754C Mask frame conveying device and exposure device
09/02/2009CN100535753C Immersion lithography system, and method of performing irradiation to semiconductor structure having a photoresistive layer
09/02/2009CN100535752C Coating apparatus and operating method thereof
09/02/2009CN100535751C Coating and developing system and coating and developing method
09/02/2009CN100535750C Polyamide acid-containing composition for forming antireflective film
09/02/2009CN100535749C Chemically amplified positive photosensitive resin composition
09/02/2009CN100535748C Red photoresist combination of color light filter used for LCD device and its application
09/02/2009CN100535747C Photosensitive resin composition
09/02/2009CN100535746C 光致抗蚀剂树脂组合物 The photoresist resin composition
09/02/2009CN100535745C Phase conflict resolution for photolithographic masks
09/01/2009US7583433 Multi mirror system for an illumination system
09/01/2009US7582921 Semiconductor device and method for patterning
09/01/2009US7582718 Multi-functional linear siloxane compound, a siloxane polymer prepared from the compound, and a process for forming a dielectric film by using the polymer
09/01/2009US7582585 Coating compositions
09/01/2009US7582414 exposing thin film to a radiation source in a liquid immersion lithography, rotating the substrate and remove fluids; baking; development; transferring pattern
09/01/2009US7582413 photolithography for exposing semiconductor substrates; double exposure for enhancing the image resolution; controlling the lithographic exposure apparatus and spin-coat device
09/01/2009US7582412 Multilayer photoresist systems
09/01/2009US7582411 Antireflective film and exposure method
09/01/2009US7582410 Laser-decomposable resin composition and pattern-forming material using the same
09/01/2009US7582409 Negative resist composition and method of forming resist pattern
09/01/2009US7582408 Color forming compositions with a fluoran leuco dye having a latent developer
09/01/2009US7582407 Imageable elements with low pH developer solubility
09/01/2009US7582406 Resin exhibits changed alkali solubility under action of acid, oxime sulfonate-based acid generator, amine, and organic acid, all dissolved in solvent comprising methyl n-amyl ketone; heat treatment; semiconductors
09/01/2009US7582404 Photosensitive paste composition, PDP electrode manufactured using the composition, and PDP comprising the PDP electrode
09/01/2009US7582398 Photochromic dye dispersed in and attached to ionic polymer; reversible transition between colorless and colored state in response to light; UV light causes color change; erasing by heating; stability; ink jet printers; toner-free; cost efficiency; disposable paper reused; environmentally friendly
09/01/2009US7582397 Photomask, and method and apparatus for producing the same
09/01/2009US7582394 Photomask and method for forming pattern
09/01/2009US7582393 Charged-particle beam, X-ray, and extreme ultraviolet beam lithography masks
09/01/2009US7582360 Microelectronic wafers having photosensitive antireflective polyester and photoresist multilayers used to form integrated circuits; relief images
09/01/2009US7581305 Method of manufacturing an optical component
09/01/2009CA2628782C Method of forming antenna for radio frequency identification medium employing conductive paste, and method for mounting ic chip onto circuit on substrate
08/2009
08/27/2009WO2009105347A2 Process sequence for formation of patterned hard mask film (rfp) without need for photoresist or dry etch
08/27/2009WO2009105045A1 Patterning of nanostructures
08/27/2009WO2009104962A1 Lithographic apparatus comprising a magnet, method for the protection of a magnet in a lithographic apparatus and device manufacturing method
08/27/2009WO2009104748A1 Water-repellant composition for substrate to be exposed, method of forming resist pattern, electronic device produced by the formation method, method of imparting water repellency to substrate to be exposed, water-repellant set for substrate to be exposed, and method of imparting water repellency with the same to substrate to be exposed
08/27/2009WO2009104727A1 Method for producing acrylate derivative, acrylate derivative, and intermediate thereof
08/27/2009WO2009104726A1 (meth)acrylate derivative, intermediate thereof, and polymer compound
08/27/2009WO2009104722A1 Acrylate ester derivatives and polymer compounds
08/27/2009WO2009104717A1 Polymer compound
08/27/2009WO2009104685A1 Composition for forming resist underlayer film and method for forming resist pattern using the same
08/27/2009WO2009104680A1 Radiation-sensitive resin composition, cured product thereof, interlayer insulating film using the composition, and optical device
08/27/2009WO2009104643A1 Photocurable film-forming composition and method of forming a photocurable film
08/27/2009WO2009104552A1 Silicon-containing resist underlayer film-forming composition containing cyclic amino group
08/27/2009WO2009104059A1 Multiplexing of pulsed sources
08/27/2009WO2009103964A1 Laser processing a multi-device panel
08/27/2009WO2009103631A1 Lithography apparatus using extreme uv radiation and having a volatile organic compounds sorbing member comprising a getter material
08/27/2009WO2009103485A2 Gas gauge compatible with vacuum environments
08/27/2009WO2009083161A3 Folded optical encoder and applications for same
08/27/2009WO2009061159A3 Colored dispersion, photoresist composition and black matrix
08/27/2009WO2009019574A8 Photoresist composition for deep uv and process thereof
08/27/2009WO2008139320A3 Antireflective coating compositions
08/27/2009WO2006104100A8 Water purge agent, and method for resist pattern formation using the same
08/27/2009US20090217218 Opc simulation model using socs decomposition of edge fragments
08/27/2009US20090215659 Composition useful for removal of post-etch photoresist and bottom anti-reflection coatings
08/27/2009US20090215233 Photoresist composition and method of manufacturing array substrate using the same
08/27/2009US20090215228 Wafer lever fixture and method for packaging micro-electro-mechanical-system devices
08/27/2009US20090215156 Method for Fabricating Nanogap and Nanogap Sensor
08/27/2009US20090214986 Lithographic apparatus and device manufacturing method
08/27/2009US20090214985 Method for reducing surface defects on patterned resist features
08/27/2009US20090214984 Methods for enhancing photolithography patterning
08/27/2009US20090214983 Laser-engraveable flexographic printing plate precursors
08/27/2009US20090214982 Positive resist composition, method of forming resist pattern, and polymeric compound
08/27/2009US20090214981 Photoresists and methods for optical proximity correction
08/27/2009US20090214980 Melts
08/27/2009US20090214964 Semiconductor device manufacturing method, semiconductor device manufacturing equipment, and computer readable medium
08/27/2009US20090214963 Substrate processing method, computer-readable storage medium, and substrate processing system
08/27/2009US20090214962 Exposure apparatus
08/27/2009US20090214960 Resist composition and patterning process
08/27/2009US20090214959 Photoresist compositions and methods related to near field masks
08/27/2009US20090214689 Imprint Lithography Templates Having Alignment Marks
08/27/2009US20090214686 Formation of Conductive Templates Employing Indium Tin Oxide
08/27/2009US20090213389 Wavefront aberration measuring method, mask, wavefront aberration measuring device, exposure apparatus, and device manufacturing method
08/27/2009US20090213367 Transmissive element
08/27/2009US20090213353 Lithographic Apparatus and Device Manufacturing Method
08/27/2009US20090212963 Resistor structures to electrically measure unidirectional misalignment of stitched masks
08/27/2009DE102008054779A1 Projection exposure system for use in microlithography for production of semiconductor components, has optical element statically deformable by force effect, where electrostatic force field acts between subelements of optical element
08/27/2009DE102008011501A1 Verfahren zum Betreiben eines Beleuchtungssystems einer mikrolithographischen Projektionsbelichtungsanlage A method of operating an illumination system of a microlithographic projection exposure apparatus
08/27/2009CA2711616A1 Lithography apparatus using extreme uv radiation and having a volatile organic compounds sorbing member comprising a getter material
08/26/2009EP2093616A1 Split and design guidelines for double patterning
08/26/2009EP2093615A1 Method of ultraviolet photolithography by immersion
08/26/2009EP2093614A1 Split and design guidelines for double patterning
08/26/2009EP2093613A1 Composition for upper surface antireflection film, and method for pattern formation using the same
08/26/2009EP2093612A1 A method of applying a pattern of metal, metal oxide and/or semiconductor material on a substrate
08/26/2009EP2093611A2 Particle inspection apparatus, exposure apparatus, and device manufacturing method
08/26/2009EP2093269A1 Photobase generator and photocurable resin composition
08/26/2009EP2093213A1 Positive resist composition, method of forming resist pattern, and polymeric compound
08/26/2009EP2093059A2 Extended print sleeve and method for preparing a printing form from the sleeve
08/26/2009EP2092394A2 Radiation system and lithographic apparatus
08/26/2009EP2092393A2 Double patterning for lithography to increase feature spatial density