Patents
Patents for G03F 7 - Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printed surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor (127,176)
02/2010
02/24/2010EP1438774B1 Very narrow band, two chamber, high rep rate gas discharge laser system
02/24/2010CN101657761A Photoresist developing solution
02/24/2010CN101657760A Radiation source and method for generating electromagnetic radiation
02/24/2010CN101657759A Alkali-developable photosensitive resin composition and ss-diketone
02/24/2010CN101657758A Alkaline-resistant negative photoresist for silicon wet-etch without silicon nitride
02/24/2010CN101657757A Methods of forming a stamp, methods of patterning a substrate, and a stamp and a patterning system for same
02/24/2010CN101655672A Liquor circulation pipeline
02/24/2010CN101655671A Lithographic apparatus and device manufacturing method
02/24/2010CN101655670A On-line detection device with function of calibrating systematic error for wave aberration of projection objective of photoetching machine
02/24/2010CN101655669A Multiple exposure method for thick photoresist
02/24/2010CN101655668A Micro-image device and chip-balancing method for micro-image device
02/24/2010CN101655667A Lithographic equipment with fiber module
02/24/2010CN101655666A Photoetching method and system
02/24/2010CN101655665A Film as well as manufacturing and use method thereof
02/24/2010CN101655664A Photosensitive resin composition and method for preparing color filter
02/24/2010CN100592214C Device and method for focusing and leveling based on microlens array
02/24/2010CN100592213C System and method for using a two part cover for protecting a reticle
02/24/2010CN100592212C Grating ion beam etching optical on-line detection device and detection method
02/24/2010CN100592211C Equipment for manufacturing liquid crystal display
02/24/2010CN100592210C Projection objective for a microlithographic projection exposure apparatus
02/24/2010CN100592209C Method for manufacturing photoelectric circuit board
02/24/2010CN100592208C Photoresist coater carrying disc for preventing static assembly
02/24/2010CN100592207C Binder diffusion transfer patterning of a thick film paste layer
02/24/2010CN100592206C Resist for forming pattern and method for forming pattern using the same
02/24/2010CN100592205C Tinted photosensitive resin composition
02/24/2010CN100592204C Components pattern, wiring structural body and manufacturing method for image display device
02/24/2010CN100592203C Asymmetric high-pressure MOS component grid oxidizing layer protection method and uses thereof
02/23/2010US7669174 Pattern generation method and charged particle beam writing apparatus
02/23/2010US7666722 Manufacturing method of semiconductor device, and IC card, IC tag, RFID, transponder, bill, securities, passport, electronic apparatus, bag, and garment
02/23/2010US7666695 Array substrates of liquid crystal display and fabrication method thereof
02/23/2010US7666580 System and method for contrast enhanced zone plate array lithography
02/23/2010US7666578 Efficient pitch multiplication process
02/23/2010US7666577 Mixture of photomasks; controlling incline of pattern; lithography; phase shifting; removal of mask by etching
02/23/2010US7666576 lithography; semiconductors
02/23/2010US7666575 Antireflective coating compositions
02/23/2010US7666574 Mixture of resin that is decomposable with an acid, adjust solubility of alkali developer with an acid; irradiating with actinic radiation
02/23/2010US7666573 Positive photosensitive resin composition and method for forming pattern
02/23/2010US7666572 Resist top coat composition and patterning process
02/23/2010US7666571 High sensitivity and resolution, decreased pattern collapse during development, and minimized mask error factor, for micropatterning material for integrated circuit manufacture; heat treatment
02/23/2010US7666570 lamination; magnetism
02/23/2010US7666569 Positive resist composition and method for forming resist pattern
02/23/2010US7666558 Inkless reimageable printing paper and method
02/23/2010US7666554 Method and apparatus for performing model-based layout conversion for use with dipole illumination
02/23/2010US7666553 positional accuracy assurance, dimensional accuracy assurance; halftone type phase shift mask; forming a fine pattern in a semiconductor device, a magnetic device
02/23/2010US7665983 Microcontact printing
02/23/2010US7665916 Coater/developer and coating/developing method
02/18/2010WO2010018825A1 Light exposure device, maintenance method, and device manufacturing method
02/18/2010WO2010018806A1 Method for manufacturing color filter, color filter substrate and color filter
02/18/2010WO2010018753A1 Deformable mirror, mirror apparatus, and exposure apparatus
02/18/2010WO2010018430A1 A hardmask process for forming a reverse tone image
02/18/2010WO2010018046A1 Mirror, lithographic apparatus and device manufacturing method
02/18/2010WO2010018039A1 Radiation source, lithographic apparatus and device manufacturing method
02/18/2010WO2010017952A2 Low-contamination optical arrangement
02/18/2010WO2010017892A1 Radiation source, lithographic apparatus and device manufacturing method
02/18/2010WO2010017890A1 Radiation source, lithographic apparatus, and device manufacturing method
02/18/2010WO2009142869A3 Methods of forming structures supported by semiconductor substrates
02/18/2010WO2009135102A3 Low ph mixtures for the removal of high density implanted resist
02/18/2010WO2009129443A3 Diaphragm flexure with large range and high load capacity
02/18/2010WO2009103485A3 Gas gauge compatible with vacuum environments
02/18/2010US20100040988 Spin bowl compatible polyamic acids/imides as wet developable polymer binders for anti-reflective coatings
02/18/2010US20100040987 Method for Exposing an Area on a Substrate to a Beam and Photolithographic System
02/18/2010US20100040986 Process for manufacturing light guide
02/18/2010US20100040985 Fine mold and method for regenerating fine mold
02/18/2010US20100040984 Method of fabricating micro electro-mechanical component
02/18/2010US20100040983 Compensation of Process-Induced Displacement
02/18/2010US20100040982 Method for forming an opening
02/18/2010US20100040981 Tuning Optical Cavities
02/18/2010US20100040980 Method and apparatus for reforming film and controlling slimming amount thereof
02/18/2010US20100040979 Systems and method for fabricating substrate surfaces for sers and apparatuses utilizing same
02/18/2010US20100040978 Photosensitive lithographic printing plate material
02/18/2010US20100040977 Radiation-sensitive resin composition
02/18/2010US20100040976 Heat-sensitive imaging element
02/18/2010US20100040975 Positive resist composition and pattern forming method using the positive resist composition
02/18/2010US20100040974 Upper layer film forming composition and method of forming photoresist pattern
02/18/2010US20100040973 Composition for formation of resist protection film, and method for formation of resist pattern using the same
02/18/2010US20100040972 Pattern forming method, and resist composition, developer and rinsing solution used in the pattern forming method
02/18/2010US20100040971 Pattern forming method, and resist composition, developer and rinsing solution used in the pattern forming method
02/18/2010US20100040970 Positive resist composition and method of forming resist pattern
02/18/2010US20100040965 Exposure control for phase shifting photolithographic masks
02/18/2010US20100040964 Exposure apparatus, exposure method and method of manufacturing display panel substrate
02/18/2010US20100040963 Color filter and production method thereof, and solid-state image sensor using the same
02/18/2010US20100040957 Method of measuring dimension of pattern and method of forming pattern
02/18/2010US20100040848 Nano material cluster structure
02/18/2010US20100040847 Methods utilizing scanning probe microscope tips and products therefor or produced thereby
02/18/2010US20100040830 Droplet Deposition Component
02/18/2010US20100040340 Electro-Optic Crystal-Based Structures and Method of Their Fabrication
02/18/2010US20100040324 Optical element and method for its manufacture
02/18/2010US20100039685 Volume hologram optical recording medium, composition for forming volume hologram recording layer, volume hologram recording material, and volume hologram optical recording method
02/18/2010US20100039684 Sensitizer dyes for photoacid generating systems using short visible wavelengths
02/18/2010US20100039633 Source optimization for image fidelity and throughput
02/18/2010US20100039632 Radiation source, lithographic apparatus and device manufacturing method
02/18/2010US20100038798 Method for correcting mask pattern, photomask, method for fabricating photomask, electron beam writing method for fabricating photomask, exposure method, semiconductor device, and method for fabricating semiconductor device
02/18/2010US20100037954 Flat light concentration device with reduced thickness
02/18/2010US20100037791 Method of making a lithographic printing plate
02/18/2010DE202009013625U1 Fixierungs- und Justierungseinrichtung für eine Lithographie-Direkt-Belichtungseinrichtung Fixing and adjustment device for a lithographic direct exposure device
02/18/2010DE19781041B4 Optische Vorrichtung An optical device
02/18/2010DE102009035505A1 Verfahren zum Belichten eines Bereichs auf einem Substrat mit einem Strahl und Photolithographisches System A method of exposing an area on a substrate with a beam and photolithography system
02/18/2010DE102009034166A1 Kontaminationsarme optische Anordnung Low-contamination optical arrangement
02/18/2010DE102008041222A1 Microlithographic projection exposure system has lightening system with multi-mirror array for adjusting intensity distribution in pupil level
02/18/2010DE102008038910A1 Verfahren und Vorrichtung zur Herstellung eines strukturierten Gegenstands sowie strukturierter Gegenstand Method and apparatus for producing a patterned article, and structured object