Patents
Patents for G03F 7 - Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printed surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor (127,176)
08/2010
08/25/2010CN1542551B Focus spot monitoring in a lithographic projection apparatus
08/25/2010CN101815969A Projection objective for microlithography
08/25/2010CN101815733A Polymers for use in photoresist compositions
08/25/2010CN101813896A Developing solution of low-tension positive photoresist
08/25/2010CN101813895A Exposure machine and exposure method using same
08/25/2010CN101813894A On-line detection device of wave aberration of projection lens of lithography machine with precision calibration function
08/25/2010CN101813893A Method for calibrating exposure energy demand distribution by adopting exposure mode
08/25/2010CN101813892A Environmental system including a transport region for an immersion lithography apparatus
08/25/2010CN101813891A Lithographic apparatus and device manufacturing method
08/25/2010CN101813890A A lithographic apparatus provided with a swap bridge
08/25/2010CN101813889A Spraying device of liquid material thin film and spraying method thereof
08/25/2010CN101813888A Method for regulating and controlling heat stability and photochemical activity of diazonium photoresists
08/25/2010CN101813887A Method for enhancing thermal stability of diazo photosensitive emulsion
08/25/2010CN101813886A Photoresist compound
08/25/2010CN101813885A Mould making process for multilayer acid-free metal plate
08/25/2010CN101813884A Method for preparing nano-structured matrix on surface of uneven substrate
08/25/2010CN101812173A N-hydroxy maleopimaric acid imide ester acetal polymer and preparation method thereof
08/25/2010CN101811963A Method for synthesizing photoresist-monomer carbon-rigid-skeleton acrylic ester compounds by transesterification
08/25/2010CN101520543B Deep ultraviolet projection photoetching object lens
08/25/2010CN101515118B Immersion self-adaptation rotary sealing device for photo-etching machine
08/25/2010CN101452163B TFT-LCD array substrate structure and method for manufacturing same
08/25/2010CN101424846B TFT-LCD array substrate, liquid crystal display panel and method for producing same
08/25/2010CN101424837B Method for manufacturing LCD array substrate
08/25/2010CN101403861B Immersion self-adapting seal control device used for photo-etching machine
08/25/2010CN101393009B Large stroke laser interferometer vertical measuring set and method
08/25/2010CN101387833B Projection objective magnification error and distortion detection device and method
08/25/2010CN101369096B Plug-pull type vibration amplitude mask plate for producing arbitrary refractive index modulation optical fiber optical grating
08/25/2010CN101327710B Method for decorating surface of metal
08/25/2010CN101320218B Three scanning type silicon slice focusing and leveling measurement apparatus, system and method
08/25/2010CN101303968B Substrate processing apparatus
08/25/2010CN101241319B Machine vision aligning system possessing mask target hierarchy and its alignment method
08/25/2010CN101233454B Polarization analyzer, polarization sensor and method for determining at least one polarization property and lithographic apparatus
08/25/2010CN101226340B A scatterometer, a lithographic apparatus and a focus analysis method
08/25/2010CN101226339B FIFO data storage system containing multiple capture channels and method thereof
08/25/2010CN101221364B Technology, device and device
08/25/2010CN101130577B Polymer, radiation sensitive resin composition and spacer for liquid crystal display element
08/25/2010CN101118378B Preparation method of diamond surface graphics
08/24/2010USRE41580 Lactone-containing compounds, polymers, resist compositions, and patterning method
08/24/2010USRE41579 ARE CAPABLE OF DIRECTLY MAKING A PRINTING PLATE USING AN INFRARED LASER BASED ON DIGITAL SIGNALS OUTPUTTED FROM A COMPUTER; improve plate wear resistance and sensitivity, and generates heat upon absorbing light
08/24/2010US7784020 Semiconductor circuit pattern design method for manufacturing semiconductor device or liquid crystal display device
08/24/2010US7784016 Method and system for context-specific mask writing
08/24/2010US7783213 Method and device for measuring surface potential distribution, method and device for measuring insulation resistance, electrostatic latent image measurement device, and charging device
08/24/2010US7781763 Composition for forming passivation layer and organic thin film transistor comprising the passivation layer
08/24/2010US7781750 Oblique mirror-type normal-incidence collector system for light sources, particularly EUV plasma discharge sources
08/24/2010US7781495 Addition polymer having two or more (meth)acryloyl groups per molecule at the molecular ends, and an addition polymer having one (meth)acryloyl group per molecule at the molecular end, e.g., halogen-terminated butyl acrylate-ethyl acrylate-methoxyethyl acrylate terpolymer reacted with acryloyl chloride
08/24/2010US7781342 between heat-processing and etching steps, supplying a fluorine-based liquid ( trifluoroethanol/2.2.2-/) to the heat processed resist pattern to form a protection film with a high fluorine density on a surface of the resist pattern; development, etching
08/24/2010US7781157 coating a substrate with a film containing terpolymer of 1,1,1-trifluoro-2-trifluoromethyl-2-hydroxy-6-methyl-hept-6-yl-methacrylate, 5-(3,3,3-trifluoro-2-hydroxy-2-(trifluoromethyl)propyl)bicyclo[2.2.1]heptanyl methacrylate and 4-oxa-tricyclo[4.2.1.03,7] non-5-one-2yl methacrylate, exposing, developing
08/24/2010US7781156 forming a resist pattern on metal layer covering a substrate, wet etching exposed metal layer, removing resist pattern forming metal layer pattern, exposing a portion of substrate, wet etching, removing metal layer pattern to form a recessed pattern, depositing a compensation layer(SiO2); slim profile
08/24/2010US7781153 Spin coating a substrate with a blocking layer containing a terpolymer prepared from benzyl methacrylate, methacrylic acid, and hydroxyethyl methacrylate; a cross-linking agent; a thermal acid generator such as toluenesulfonic acid, pyrimidine salt, exposing and developing to form blocking pattern
08/24/2010US7781152 Magnetic read sensors that utilize the giant magnetoresistive (GMR) effect for their operation are patterned to produce a required trackwidt; forming a bilayer lift-off mask having sharply defined edge and corner regions, includes use of ozone to assist in the controlled dissolution of mask underlayer
08/24/2010US7781151 depositing first polymer layer, first lithography, depositing chromium layer, depositing gold layer, removing first photo-resist layer, depositing second polymer layer, second lithography, plasma etching step, removing second photoresist layer; protective coatings for sensor; cost efficiency
08/24/2010US7781150 Two layers of photoresist; second layer chemically amplified resist of photosensitive diazonaphtoquinone and novolac resin; second resist layer possesses a transmission which first increases then decreases as exposure dose increases
08/24/2010US7781149 Reduced pitch multiple exposure process
08/24/2010US7781148 Substrate with hydrophilic surface, polymer soluble or swellable in aqueous alkaline developer and solvent
08/24/2010US7781147 Imide-urethane resin, photosensitive resin composition including the same and cured product
08/24/2010US7781145 Method for forming a photoresist pattern
08/24/2010US7781144 Positive resist composition and resist pattern forming method
08/24/2010US7781143 Imagable layer, polyvinyl alcohol protective overcoarting on hydrophilic substrate; including an infrared sensitive cyanine dyes ; antifogging by white light; high speed images
08/24/2010US7781142 Copolymer and top coating composition
08/24/2010US7781141 Compositions and processes for immersion lithography
08/24/2010US7781140 presoaking, turbulently exposing, spraying, scouring and rinsing each take place automatically in the single tool and in more than one processing station of the tool for removing dry film resist (DFR) from a fine pitch solder bump array on a semiconductor wafer
08/24/2010US7781131 alkali-soluble resin having a polybenzoxazole precursor structure, a sensitizer, and alcoholic compounds having cyclohexane, norbornane or adamantane rings; semiconductor device and a display element ; high reliability when cured at low temperature
08/24/2010US7781129 Green pigment for color filter, green pigment dispersion, photosensitive color composition, color filter, and liquid crystal panel
08/24/2010US7780366 Resist pattern forming method
08/24/2010US7779890 Method and apparatus for production of a cast component
08/24/2010US7779781 Lithographic apparatus and device manufacturing method
08/19/2010WO2010094017A1 Process for thick film circuit patterning
08/19/2010WO2010093415A1 Developer waste reuse
08/19/2010WO2010093413A1 Negative-working imageable elements
08/19/2010WO2010093210A2 Photoactive compound and photosensitive resin composition containing the same
08/19/2010WO2010093004A1 Photosensitive lithographic printing plate material
08/19/2010WO2010092824A1 Positive photosensitive resin composition, cured film using same, protective film, insulating film, semiconductor device, and display device
08/19/2010WO2010092420A1 A hardmask process for forming a reverse tone image using polysilazane
08/19/2010WO2010092128A1 Multi-table lithographic systems
08/19/2010WO2010091977A1 Actuator having at least one magnet for a projection exposure system, production method therefor and projection exposure system having a magnet
08/19/2010WO2010091927A1 Photoresist compositions and methods of use
08/19/2010WO2010091907A1 Multilayer mirror and lithographic apparatus
08/19/2010WO2010091840A1 Imaging optical system and projection exposure installation for microlithography with an imaging optical system of this type
08/19/2010WO2010091807A1 Photo polymer compositions as printable formulations
08/19/2010WO2010091800A1 Imaging optical system and projection exposure installation for microlithography with an imaging optical system of this type
08/19/2010WO2010091795A1 Method for producing holographic photopolymers on polymer films
08/19/2010US20100211207 Manufacturing apparatus for semiconductor device, controlling method for the manufacturing apparatus, and storage medium storing control program for the manufacturing apparatus
08/19/2010US20100210475 Microarray having bright fiducial mark and method of obtaining optical data from the mircoarray
08/19/2010US20100209857 Lithography Process for the Continuous Direct Writing of an Image
08/19/2010US20100209856 Lithographic apparatus and device manufacturing method for writing a digital image
08/19/2010US20100209855 Method and apparatus for manufacturing semiconductor device and resist material
08/19/2010US20100209854 Method For Producing An Electro-Optical Printed Circuit Board With Optical Waveguide Structures
08/19/2010US20100209853 Method for selectively adjusting local resist pattern dimension with chemical treatment
08/19/2010US20100209852 Track nozzle system for semiconductor fabrication
08/19/2010US20100209851 Method of making a lithographic printing plate
08/19/2010US20100209850 Pattern forming method
08/19/2010US20100209849 Pattern forming process and resist-modifying composition
08/19/2010US20100209848 Positive resist composition, method of forming resist pattern, and polymeric compound
08/19/2010US20100209847 Copolymer, resin composition, spacer for display panel, planarization film, thermosetting protective film, microlens, and process for producing copolymer
08/19/2010US20100209846 Negative-working imageable elements
08/19/2010US20100209845 Dispersion composition, photosensitive resin composition for light-shielding color filter, light-shielding color filter, method of producing the same, and solid-state image sensor having the color filter
08/19/2010US20100209844 Method and apparatus for preparing a printing form using vibrational energy
08/19/2010US20100209843 Process for thick film circuit patterning
08/19/2010US20100209834 Mask pattern correction device, method of correcting mask pattern, light exposure correction device, and method of correcting light exposure
08/19/2010US20100209833 Charged particle beam writing method and charged particle beam writing apparatus