Patents
Patents for G03F 7 - Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printed surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor (127,176)
05/2011
05/18/2011EP2321703A2 Optical element for a lithographic apparatus, lithographic apparatus comprising such optical element and method for making the optical element
05/18/2011EP2321702A2 Exposure apparatus and methods
05/18/2011EP2321701A2 Method for optical proximity correction, design and manufacturing of a reticle using character projection lithography
05/18/2011EP2321700A2 Low-contamination optical arrangement
05/18/2011EP1958025B1 Method for expelling gas positioned between a substrate and a mold
05/18/2011EP1896903B1 Debris mitigation system with improved gas distribution
05/18/2011EP1820377B1 Method and apparatus for operating an electrical discharge device
05/18/2011CN201837832U Silicon chip drying controllable device
05/18/2011CN201837831U Exposure frame with improved anti-welding window size
05/18/2011CN1932650B Lithographic apparatus and device manufacturing method
05/18/2011CN1892437B Lithografic apparatus and device manufacturing method
05/18/2011CN1821871B Resist pattern thickening material and process for forming resist pattern, and process for manufacturing the same
05/18/2011CN1716095B Radiation sensitive resin composition, cured resin and liquid crystal display device
05/18/2011CN1573564B Lithographic apparatus and device manufacturing method
05/18/2011CN102067282A Method for forming fine pitch structures
05/18/2011CN102067041A Method of resist treatment
05/18/2011CN102067040A Overlay measurement apparatus, lithographic apparatus, and device manufacturing method using such overlay measurement apparatus
05/18/2011CN102067039A Lithographic apparatus and device manufacturing method
05/18/2011CN102067038A Exposure apparatus, exposure method, and device manufacturing method
05/18/2011CN102067037A Photosensitive resin composition, photosensitive element wherein same is used, method for forming a resist-pattern, and method for producing a printed wiring board
05/18/2011CN102066509A Aqueous composition for coating over a photoresist pattern
05/18/2011CN102066439A Monomer having lactone skeleton, polymer compound and photoresist composition
05/18/2011CN102066124A Substrate and imageable element with hydrophilic interlayer
05/18/2011CN102064102A Methods and devices for forming nanostructure monolayers and devices including such monolayers
05/18/2011CN102063025A Measurement method of two-faced registration error and lithographic equipment applying measurement method
05/18/2011CN102063024A Developing solution composition
05/18/2011CN102063023A Lithographic apparatus and device manufacturing method
05/18/2011CN102063022A A method of performing model-based scanner tuning
05/18/2011CN102063021A Attenuation device capable of adjusting light beam energy
05/18/2011CN102063020A Exposure device and exposure method
05/18/2011CN102063019A Lithographic method and apparatus
05/18/2011CN102063018A Lithographic apparatus and device manufacturing method
05/18/2011CN102063017A Exposure apparatus and method of manufacturing device
05/18/2011CN102063016A Aligning mark detecting method
05/18/2011CN102063015A Semiconductor wafer and pattern alignment method
05/18/2011CN102063014A Illumination optical system for microlithography
05/18/2011CN102063013A Method for manufacturing patterning substrate by nano-microspheres
05/18/2011CN102061228A Microelectronic cleaning compositions containing oxidizers and organic solvents
05/18/2011CN102060981A Aromatic ring-containing polymer and hard mask composition containing the polymer
05/18/2011CN102060980A Resist underlayer polymer, resist underlayer composition including the same, and method of patterning using the same
05/18/2011CN101675500B Exposure apparatus, exposure method and device manufacturing method
05/18/2011CN101666982B Bearing box for photomask box and buffering and positioning device thereof
05/18/2011CN101611130B Peroxide activated oxometalate based formulations for removal of etch residue
05/18/2011CN101589453B Device and method for wet treating plate-like-articles
05/18/2011CN101515117B Lithographic apparatus having a chuck with a visco-elastic damping layer
05/18/2011CN101369054B Beam transforming element, illumination optical apparatus, exposure apparatus, and exposure method
05/18/2011CN101362809B Anti-reflective polymer, anti-reflective composition, and method for forming pattern using the same
05/18/2011CN101226336B Method for forming a coating with a liquid, and method for manufacturing a semiconductor device
05/18/2011CN101216673B Stage device, exposure device, and device manufacturing method
05/18/2011CN101206408B Exposure data generating apparatus
05/18/2011CN101190903B Oxetane-containing compound, photoresist composition having the same, method of preparing pattern, and inkjet print head
05/18/2011CN101154053B Resonant scanning mirror
05/18/2011CN101151338B Colorant dispersion, coloring resin composition, color filter, and liquid-crystal display device
05/18/2011CN101135840B Method of forming a mask structure and method of forming a minute pattern using the same
05/18/2011CN101118379B Microlenses of cmos image sensor and method for fabricating the same
05/17/2011US7944540 Color filter on thin film transistor type liquid crystal display device and method of fabricating the same
05/17/2011US7944025 Wafers supporting photoresists with channels containing an effervescent, gas-fortified liquid to help with scum removal
05/17/2011US7943516 Manufacturing method for semiconductor device
05/17/2011US7943290 Method of forming fine pattern using azobenzene-functionalized polymer and method of manufacturing nitride-based semiconductor light emitting device using the method of forming fine pattern
05/17/2011US7943289 Forming submicron lithographic features using currently available resist materials and radiation sources; simple, efficient, high fidelity
05/17/2011US7943287 Improved energy efficiency with simplified manufacturing process; a dielectric layer is formed over a light absorbing layer, selective exposure, forming a conductive film; televisions, video cameras, cellular phones, computers
05/17/2011US7943286 Reproducible, high yield method for fabricating ultra-short T-gates on HFETs
05/17/2011US7943285 Forming intermediate layer pattern by etching intermediate film with first resist pattern used as a mask; high resolution attained by double patterning; treatment with acetic, formic, methansulfonic, or butanesulfonic acid; immersion lithography; crosslinking, annealing
05/17/2011US7943284 Compound, dissolution inhibitor, positive type resist composition, and method of forming resist pattern
05/17/2011US7943275 Structure for pattern formation, method for pattern formation, and application thereof
05/17/2011US7943203 Colored curable composition, colored pattern and color filter using the same
05/17/2011US7942967 Method and system of coating polymer solution on a substrate in a solvent saturated chamber
05/17/2011US7942379 Active vibration isolation system with a combined position actuator
05/12/2011WO2011056905A2 Negative-working lithographic printing plate precursors
05/12/2011WO2011056777A1 Method of producing color change in overlapping layers
05/12/2011WO2011056358A2 Lithographic printing plate precursors
05/12/2011WO2011055860A1 Exposure apparatus, exposure method, exposure apparatus maintenance method, exposure apparatus adjustment method and device manufacturing method
05/12/2011WO2011055826A1 Mask holding mechanism
05/12/2011WO2011055758A1 Focus test mask, focus measuring method, exposure apparatus, and exposure method
05/12/2011WO2011055209A1 Antifeflective composition for photoresists
05/12/2011WO2011054818A2 Novel non-crystallizing methacrylates, production and use thereof
05/12/2011WO2011054799A2 Urethanes used as additives in a photopolymer formulation
05/12/2011WO2011054797A1 Photopolymer formulation having different writing comonomers
05/12/2011WO2011054796A1 Selection method for additives in photopolymers
05/12/2011WO2011054795A1 Fluorourethane as an additive in a photopolymer formulation
05/12/2011WO2011054749A1 Photopolymer formulations having the adjustable mechanical modulus guv
05/12/2011WO2011054572A1 Silicon containing coating compositions and methods of use
05/12/2011WO2011054538A1 Light exposure apparatus and method for exposing substrates to light
05/12/2011US20110111351 Photosensitive Ink Composition for Screen Printing and Method of Forming Positive Relief Pattern with Use Thereof
05/12/2011US20110111350 Conjugated Polymers
05/12/2011US20110111349 Resin composition for making resist pattern insoluble, and method for formation of resist pattern by using the same
05/12/2011US20110111348 Semiconductor device fabrication using a multiple exposure and block mask approach to reduce design rule violations
05/12/2011US20110111347 Method for making a lithographic printing plate
05/12/2011US20110111346 Positive Photosensitive Resin Composition
05/12/2011US20110111345 Silicon containing coating compositions and methods of use
05/12/2011US20110111344 Photosensitive resin composition, photosensitive element, method for forming resist pattern and method for manufacturing printed wiring board
05/12/2011US20110111343 Positive resist composition and method of forming resist pattern
05/12/2011US20110111342 Photoresist composition
05/12/2011US20110111341 Polyimide and photoresist resin composition comprising thereof
05/12/2011US20110111340 Novel siloxane polymer compositions
05/12/2011US20110111339 Bilayer systems including a polydimethylglutarimide-based bottom layer and compositions thereof
05/12/2011US20110110104 Optical plate and method of manufacturing the same
05/12/2011US20110109894 Polarization-modulating optical element and method for manufacturing thereof
05/12/2011US20110109893 Microlithographic projection exposure apparatus
05/12/2011US20110108316 Axiocentric scrubbing land grid array contacts and methods for fabrication